JP4209194B2 - 浸透率の測定及び検査方法並びに測定及び検査装置 - Google Patents
浸透率の測定及び検査方法並びに測定及び検査装置 Download PDFInfo
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- JP4209194B2 JP4209194B2 JP2002577538A JP2002577538A JP4209194B2 JP 4209194 B2 JP4209194 B2 JP 4209194B2 JP 2002577538 A JP2002577538 A JP 2002577538A JP 2002577538 A JP2002577538 A JP 2002577538A JP 4209194 B2 JP4209194 B2 JP 4209194B2
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- 229910001868 water Inorganic materials 0.000 claims abstract description 20
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- 229910052791 calcium Inorganic materials 0.000 claims abstract description 8
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- 239000011575 calcium Substances 0.000 claims description 33
- 238000007789 sealing Methods 0.000 claims description 27
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- 238000002834 transmittance Methods 0.000 claims description 16
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- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 9
- 239000001301 oxygen Substances 0.000 claims description 9
- 229910052760 oxygen Inorganic materials 0.000 claims description 9
- 230000035515 penetration Effects 0.000 claims description 8
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims description 7
- 239000001257 hydrogen Substances 0.000 claims description 7
- 229910052739 hydrogen Inorganic materials 0.000 claims description 7
- 238000000151 deposition Methods 0.000 claims description 6
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- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 5
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims description 3
- 239000008393 encapsulating agent Substances 0.000 claims description 3
- 229910052688 Gadolinium Inorganic materials 0.000 claims description 2
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- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 claims description 2
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
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- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
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- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
- G01N15/082—Investigating permeability by forcing a fluid through a sample
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
- G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
- G01N15/131—Details
- G01N15/132—Circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
- G01N2015/086—Investigating permeability, pore-volume, or surface area of porous materials of films, membranes or pellicules
Landscapes
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Dispersion Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP01201229 | 2001-03-29 | ||
| EP02075202 | 2002-01-17 | ||
| PCT/IB2002/000754 WO2002079757A2 (en) | 2001-03-29 | 2002-03-13 | Method and device for measuring a permeation rate |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004531711A JP2004531711A (ja) | 2004-10-14 |
| JP2004531711A5 JP2004531711A5 (enExample) | 2005-06-09 |
| JP4209194B2 true JP4209194B2 (ja) | 2009-01-14 |
Family
ID=26076870
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002577538A Expired - Fee Related JP4209194B2 (ja) | 2001-03-29 | 2002-03-13 | 浸透率の測定及び検査方法並びに測定及び検査装置 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US6993956B2 (enExample) |
| EP (1) | EP1373861A2 (enExample) |
| JP (1) | JP4209194B2 (enExample) |
| KR (1) | KR100859818B1 (enExample) |
| CN (1) | CN1242250C (enExample) |
| AU (1) | AU2002237478A1 (enExample) |
| TW (1) | TWI229733B (enExample) |
| WO (1) | WO2002079757A2 (enExample) |
Families Citing this family (41)
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| US5110713A (en) * | 1987-10-30 | 1992-05-05 | Fuji Photo Film Co., Ltd. | Method for processing silver halide color photographic material |
| KR100859818B1 (ko) * | 2001-03-29 | 2008-09-24 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 기판의 침투율을 측정하는 방법 및 장치, 배치로부터 기판 세트를 침투율에 대해 테스트하는 방법 및 캡슐화의 침투율을 측정하는 방법 |
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| US7344901B2 (en) * | 2003-04-16 | 2008-03-18 | Corning Incorporated | Hermetically sealed package and method of fabricating of a hermetically sealed package |
| GB0316106D0 (en) * | 2003-07-09 | 2003-08-13 | Cambridge Display Tech Ltd | Test structures and methods |
| US7178384B2 (en) * | 2004-02-04 | 2007-02-20 | General Atomics | Method and apparatus for measuring ultralow permeation |
| US7256542B2 (en) * | 2004-02-20 | 2007-08-14 | Au Optronics Corporation | Method and device for detecting moisture in electroluminescence display devices |
| JP4460000B2 (ja) | 2004-03-31 | 2010-04-28 | エージェンシー フォー サイエンス,テクノロジー アンド リサーチ | 試験材料のガス透過率を測定するためのセンサ |
| CN100507510C (zh) * | 2004-09-30 | 2009-07-01 | 清华大学 | 一种水氧渗透率的测试方法及其测试设备 |
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| DE102005057031B4 (de) * | 2005-11-25 | 2011-04-21 | Innovent E.V. Technologieentwicklung | Vorrichtung für Permeations-oder Stoffdurchgangsuntersuchungen |
| US20080124558A1 (en) * | 2006-08-18 | 2008-05-29 | Heather Debra Boek | Boro-silicate glass frits for hermetic sealing of light emitting device displays |
| EP1983079A1 (en) | 2007-04-17 | 2008-10-22 | Nederlandse Organisatie voor Toegepast-Natuuurwetenschappelijk Onderzoek TNO | Barrier layer and method for making the same |
| CN101246095B (zh) * | 2008-01-07 | 2011-03-30 | 电子科技大学 | 阻隔材料气体渗透率的测量装置 |
| US20100095705A1 (en) | 2008-10-20 | 2010-04-22 | Burkhalter Robert S | Method for forming a dry glass-based frit |
| WO2010093237A1 (en) | 2009-02-11 | 2010-08-19 | Nederlandse Organisatie Voor Toegepast- Natuurwetenschappelijk Onderzoek Tno | Optoelectronic device and method for fabricating such device |
| US8388742B2 (en) * | 2010-01-13 | 2013-03-05 | E I Du Pont De Nemours And Company | Apparatus to measure permeation of a gas through a membrane |
| EP2476784A1 (en) | 2011-01-18 | 2012-07-18 | Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO | Method for manufacturing an electronic device by electrodeposition from an ionic liquid |
| CN102141504B (zh) * | 2011-01-27 | 2013-06-12 | 中国商用飞机有限责任公司 | 在铺层厚度方向上测试气体渗透率的测试装置及其方法 |
| CN102183444B (zh) * | 2011-01-27 | 2013-09-25 | 中国商用飞机有限责任公司 | 在铺层面内方向上测试气体渗透率的测试装置及其方法 |
| JP5810556B2 (ja) * | 2011-03-09 | 2015-11-11 | 凸版印刷株式会社 | ガス透過性試験片及びガス透過性評価方法 |
| US9356070B2 (en) | 2012-08-15 | 2016-05-31 | Epistar Corporation | Light-emitting device |
| US20140048824A1 (en) | 2012-08-15 | 2014-02-20 | Epistar Corporation | Light-emitting device |
| US9086351B1 (en) * | 2013-03-14 | 2015-07-21 | The United States Of America As Represented By The Secretary Of The Army | Fixture for system-level glove testing of contact permeation |
| CN103217459A (zh) * | 2013-05-06 | 2013-07-24 | 深圳市华星光电技术有限公司 | Oled面板封装效果的检测方法 |
| KR101469533B1 (ko) * | 2013-05-30 | 2014-12-05 | 전자부품연구원 | 외기 침투율 측정을 위한 반응 물질 카트리지 및 이를 포함하는 기판의 외기 침투율 측정 장치 |
| DE102013022032A1 (de) | 2013-12-19 | 2015-06-25 | Technische Universität Ilmenau | Verfahren zum Nachweis von Fremdstoffen oder Degradationsprodukten in verkapselten Systemen sowie dessen Verwendung |
| JP6635033B2 (ja) * | 2014-06-17 | 2020-01-22 | コニカミノルタ株式会社 | 水蒸気透過度評価方法及び水蒸気透過度評価装置 |
| CN104048901B (zh) * | 2014-06-26 | 2016-03-30 | 河南省嵩阳高速公路有限公司 | 透层乳化沥青渗透效果测试方法 |
| CN104465622B (zh) * | 2014-12-08 | 2017-09-15 | 京东方科技集团股份有限公司 | 检测背板水氧透过率的方法和封装结构 |
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| CN105043935A (zh) * | 2015-05-18 | 2015-11-11 | 华南理工大学 | 基于数字图像处理多孔金属材料浸润性能测量装置及方法 |
| CN106442260B (zh) * | 2016-09-27 | 2019-11-01 | 江西理工大学 | 一种测量稀土浸矿过程中渗透系数的方法 |
| US11181460B1 (en) * | 2019-06-20 | 2021-11-23 | The United States Of America As Represented By The Secretary Of The Army | Apparatus and method for measuring permeation of contaminants through a complex protective material swatch |
| CN110993521B (zh) * | 2019-12-11 | 2025-09-09 | 浙江清华柔性电子技术研究院 | 封装测试方法和设备 |
| US11624672B2 (en) * | 2020-06-23 | 2023-04-11 | Ateq | Apparatus and method for automatic leak detection |
| CN114295602B (zh) * | 2021-12-30 | 2024-03-01 | 中国石油大学(华东) | 一种测试氢渗透路径的拉曼池系统 |
| CN114414154A (zh) * | 2022-01-21 | 2022-04-29 | 浙江省二建建设集团有限公司 | 一种垃圾焚烧发电厂构筑物池体工程防渗透监测装置 |
| TW202432360A (zh) | 2022-12-14 | 2024-08-16 | 德商巴斯夫塗料有限責任公司 | 經多層障壁膜塗覆之聚合物基板、其製造及其在電子裝置中之用途 |
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-
2002
- 2002-03-13 KR KR1020027016047A patent/KR100859818B1/ko not_active Expired - Fee Related
- 2002-03-13 WO PCT/IB2002/000754 patent/WO2002079757A2/en not_active Ceased
- 2002-03-13 EP EP02703801A patent/EP1373861A2/en not_active Withdrawn
- 2002-03-13 AU AU2002237478A patent/AU2002237478A1/en not_active Abandoned
- 2002-03-13 CN CNB028008804A patent/CN1242250C/zh not_active Expired - Fee Related
- 2002-03-13 JP JP2002577538A patent/JP4209194B2/ja not_active Expired - Fee Related
- 2002-03-18 TW TW091105083A patent/TWI229733B/zh not_active IP Right Cessation
- 2002-03-26 US US10/106,951 patent/US6993956B2/en not_active Ceased
-
2005
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| US20060147346A1 (en) | 2006-07-06 |
| US20020152800A1 (en) | 2002-10-24 |
| CN1242250C (zh) | 2006-02-15 |
| KR20030004438A (ko) | 2003-01-14 |
| WO2002079757A3 (en) | 2003-01-16 |
| US7117720B2 (en) | 2006-10-10 |
| AU2002237478A1 (en) | 2002-10-15 |
| CN1460179A (zh) | 2003-12-03 |
| TWI229733B (en) | 2005-03-21 |
| EP1373861A2 (en) | 2004-01-02 |
| JP2004531711A (ja) | 2004-10-14 |
| US6993956B2 (en) | 2006-02-07 |
| WO2002079757A2 (en) | 2002-10-10 |
| KR100859818B1 (ko) | 2008-09-24 |
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