TWI229733B - A method for measuring a permeation rate, a test and an apparatus for measuring and testing - Google Patents
A method for measuring a permeation rate, a test and an apparatus for measuring and testing Download PDFInfo
- Publication number
- TWI229733B TWI229733B TW091105083A TW91105083A TWI229733B TW I229733 B TWI229733 B TW I229733B TW 091105083 A TW091105083 A TW 091105083A TW 91105083 A TW91105083 A TW 91105083A TW I229733 B TWI229733 B TW I229733B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- patent application
- reactive material
- item
- light
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
- G01N15/082—Investigating permeability by forcing a fluid through a sample
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
- G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
- G01N15/131—Details
- G01N15/132—Circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/08—Investigating permeability, pore-volume, or surface area of porous materials
- G01N2015/086—Investigating permeability, pore-volume, or surface area of porous materials of films, membranes or pellicules
Landscapes
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Dispersion Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP01201229 | 2001-03-29 | ||
| EP02075202 | 2002-01-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWI229733B true TWI229733B (en) | 2005-03-21 |
Family
ID=26076870
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW091105083A TWI229733B (en) | 2001-03-29 | 2002-03-18 | A method for measuring a permeation rate, a test and an apparatus for measuring and testing |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US6993956B2 (enExample) |
| EP (1) | EP1373861A2 (enExample) |
| JP (1) | JP4209194B2 (enExample) |
| KR (1) | KR100859818B1 (enExample) |
| CN (1) | CN1242250C (enExample) |
| AU (1) | AU2002237478A1 (enExample) |
| TW (1) | TWI229733B (enExample) |
| WO (1) | WO2002079757A2 (enExample) |
Families Citing this family (41)
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| JP2601665B2 (ja) * | 1987-10-19 | 1997-04-16 | 富士写真フイルム株式会社 | ハロゲン化銀カラー写真感光材料の処理方法 |
| US5110713A (en) * | 1987-10-30 | 1992-05-05 | Fuji Photo Film Co., Ltd. | Method for processing silver halide color photographic material |
| WO2002079757A2 (en) * | 2001-03-29 | 2002-10-10 | Koninklijke Philips Electronics N.V. | Method and device for measuring a permeation rate |
| US7344901B2 (en) * | 2003-04-16 | 2008-03-18 | Corning Incorporated | Hermetically sealed package and method of fabricating of a hermetically sealed package |
| US6998776B2 (en) * | 2003-04-16 | 2006-02-14 | Corning Incorporated | Glass package that is hermetically sealed with a frit and method of fabrication |
| GB0316106D0 (en) * | 2003-07-09 | 2003-08-13 | Cambridge Display Tech Ltd | Test structures and methods |
| US7178384B2 (en) * | 2004-02-04 | 2007-02-20 | General Atomics | Method and apparatus for measuring ultralow permeation |
| US7256542B2 (en) * | 2004-02-20 | 2007-08-14 | Au Optronics Corporation | Method and device for detecting moisture in electroluminescence display devices |
| WO2005095924A1 (en) | 2004-03-31 | 2005-10-13 | Agency For Science, Technology And Research | A sensor for measuring gas permeability of a test material |
| CN100507510C (zh) * | 2004-09-30 | 2009-07-01 | 清华大学 | 一种水氧渗透率的测试方法及其测试设备 |
| GB0505517D0 (en) | 2005-03-17 | 2005-04-27 | Dupont Teijin Films Us Ltd | Coated polymeric substrates |
| US7257990B2 (en) * | 2005-04-25 | 2007-08-21 | General Atomics | Accelerated ultralow moisture permeation measurement |
| DE102005057031B4 (de) * | 2005-11-25 | 2011-04-21 | Innovent E.V. Technologieentwicklung | Vorrichtung für Permeations-oder Stoffdurchgangsuntersuchungen |
| US20080124558A1 (en) * | 2006-08-18 | 2008-05-29 | Heather Debra Boek | Boro-silicate glass frits for hermetic sealing of light emitting device displays |
| EP1983079A1 (en) | 2007-04-17 | 2008-10-22 | Nederlandse Organisatie voor Toegepast-Natuuurwetenschappelijk Onderzoek TNO | Barrier layer and method for making the same |
| CN101246095B (zh) * | 2008-01-07 | 2011-03-30 | 电子科技大学 | 阻隔材料气体渗透率的测量装置 |
| US20100095705A1 (en) | 2008-10-20 | 2010-04-22 | Burkhalter Robert S | Method for forming a dry glass-based frit |
| WO2010093237A1 (en) | 2009-02-11 | 2010-08-19 | Nederlandse Organisatie Voor Toegepast- Natuurwetenschappelijk Onderzoek Tno | Optoelectronic device and method for fabricating such device |
| US8388742B2 (en) * | 2010-01-13 | 2013-03-05 | E I Du Pont De Nemours And Company | Apparatus to measure permeation of a gas through a membrane |
| EP2476784A1 (en) | 2011-01-18 | 2012-07-18 | Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO | Method for manufacturing an electronic device by electrodeposition from an ionic liquid |
| CN102183444B (zh) * | 2011-01-27 | 2013-09-25 | 中国商用飞机有限责任公司 | 在铺层面内方向上测试气体渗透率的测试装置及其方法 |
| CN102141504B (zh) * | 2011-01-27 | 2013-06-12 | 中国商用飞机有限责任公司 | 在铺层厚度方向上测试气体渗透率的测试装置及其方法 |
| JP5810556B2 (ja) * | 2011-03-09 | 2015-11-11 | 凸版印刷株式会社 | ガス透過性試験片及びガス透過性評価方法 |
| US9356070B2 (en) | 2012-08-15 | 2016-05-31 | Epistar Corporation | Light-emitting device |
| US20140048824A1 (en) | 2012-08-15 | 2014-02-20 | Epistar Corporation | Light-emitting device |
| US9086351B1 (en) * | 2013-03-14 | 2015-07-21 | The United States Of America As Represented By The Secretary Of The Army | Fixture for system-level glove testing of contact permeation |
| CN103217459A (zh) * | 2013-05-06 | 2013-07-24 | 深圳市华星光电技术有限公司 | Oled面板封装效果的检测方法 |
| KR101469533B1 (ko) * | 2013-05-30 | 2014-12-05 | 전자부품연구원 | 외기 침투율 측정을 위한 반응 물질 카트리지 및 이를 포함하는 기판의 외기 침투율 측정 장치 |
| DE102013022032A1 (de) | 2013-12-19 | 2015-06-25 | Technische Universität Ilmenau | Verfahren zum Nachweis von Fremdstoffen oder Degradationsprodukten in verkapselten Systemen sowie dessen Verwendung |
| WO2015194558A1 (ja) * | 2014-06-17 | 2015-12-23 | コニカミノルタ株式会社 | 水蒸気透過度評価方法及び水蒸気透過度評価装置 |
| CN104048901B (zh) * | 2014-06-26 | 2016-03-30 | 河南省嵩阳高速公路有限公司 | 透层乳化沥青渗透效果测试方法 |
| CN104465622B (zh) * | 2014-12-08 | 2017-09-15 | 京东方科技集团股份有限公司 | 检测背板水氧透过率的方法和封装结构 |
| US9529188B2 (en) | 2015-03-25 | 2016-12-27 | Amazon Technologies, Inc. | Electrowetting device with multi layer support plate |
| CN105043935A (zh) * | 2015-05-18 | 2015-11-11 | 华南理工大学 | 基于数字图像处理多孔金属材料浸润性能测量装置及方法 |
| CN106442260B (zh) * | 2016-09-27 | 2019-11-01 | 江西理工大学 | 一种测量稀土浸矿过程中渗透系数的方法 |
| US11181460B1 (en) * | 2019-06-20 | 2021-11-23 | The United States Of America As Represented By The Secretary Of The Army | Apparatus and method for measuring permeation of contaminants through a complex protective material swatch |
| CN110993521B (zh) * | 2019-12-11 | 2025-09-09 | 浙江清华柔性电子技术研究院 | 封装测试方法和设备 |
| US11624672B2 (en) * | 2020-06-23 | 2023-04-11 | Ateq | Apparatus and method for automatic leak detection |
| CN114295602B (zh) * | 2021-12-30 | 2024-03-01 | 中国石油大学(华东) | 一种测试氢渗透路径的拉曼池系统 |
| CN114414154A (zh) * | 2022-01-21 | 2022-04-29 | 浙江省二建建设集团有限公司 | 一种垃圾焚烧发电厂构筑物池体工程防渗透监测装置 |
| CN120615105A (zh) | 2022-12-14 | 2025-09-09 | 巴斯夫涂料有限公司 | 多层阻挡膜涂覆的聚合物基底、其制造和在电子装置中的用途 |
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| US4326514A (en) * | 1980-06-20 | 1982-04-27 | Minnesota Mining And Manufacturing Company | Cartridge respirator with service life indicator |
| JPS6020135A (ja) * | 1983-07-15 | 1985-02-01 | Daicel Chem Ind Ltd | 膜性能測定用および漏洩検査用物質 |
| JPS6131937A (ja) * | 1984-07-25 | 1986-02-14 | Mitsubishi Heavy Ind Ltd | 漏洩欠陥部検知法 |
| US4822743A (en) * | 1984-12-13 | 1989-04-18 | Lockheed Corporation | Method and cloth for detecting leaks in closed bodies |
| JPS6232336A (ja) * | 1985-08-05 | 1987-02-12 | Toshiba Corp | Itvカメラによる液体漏洩検出方法 |
| JPH0684707B2 (ja) * | 1985-11-29 | 1994-10-26 | ベヒリ・エミ−ル | 熱絶縁作用する建築要素および/または採光要素およびそれらの製造方法およびこの方法を行うための装置 |
| JPH01307635A (ja) * | 1988-06-03 | 1989-12-12 | Hamamatsu Photonics Kk | 被試験用薄膜の物質透過性能を評価する方法 |
| US4848138A (en) * | 1988-07-15 | 1989-07-18 | Marshall John M | Window gas monitor |
| DE3828531A1 (de) * | 1988-08-23 | 1990-03-15 | Rudolf Dr Ing Ernst | Sauerstoffabsorptionsmittel und verwendung desselben |
| JPH02306132A (ja) * | 1989-05-19 | 1990-12-19 | Hitachi Cable Ltd | 漏油検知法 |
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| US5001346A (en) * | 1990-02-26 | 1991-03-19 | Rockwell International Corporation | Leak detection system with background compensation |
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| US5047947A (en) * | 1990-07-25 | 1991-09-10 | Grumman Aerospace Corporation | Method of modeling the assembly of products to increase production yield |
| US5447688A (en) * | 1991-12-30 | 1995-09-05 | Moore; Robert E. | Detector, and method of using same |
| DE4214239C2 (de) * | 1992-04-30 | 1994-06-16 | Draegerwerk Ag | Atemschutzmaske mit einem indikator |
| GB9311427D0 (en) * | 1993-06-03 | 1993-07-21 | Trigon Ind Ltd | A multi-wall film |
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| US5963881A (en) * | 1995-09-22 | 1999-10-05 | Texas Instruments Incorporated | Method and system for enhancing the identification of causes of variations in the performance of manufactured articles |
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| JP2001051307A (ja) * | 1999-01-20 | 2001-02-23 | Sony Corp | 光学装置、その製造方法、その駆動方法及びカメラシステム |
| US6259370B1 (en) * | 1999-08-03 | 2001-07-10 | Technical & Try Co., Ltd. | Leak sensor |
| US7448258B2 (en) * | 1999-10-29 | 2008-11-11 | Avery Dennison Corporation | High throughput screening for moisture barrier characteristics of materials |
| KR20010102160A (ko) * | 1999-12-14 | 2001-11-15 | 사토 아키오 | 액정표시셀용 실링제, 액정표시셀실링제용 조성물 및액정표시소자 |
| US6622059B1 (en) * | 2000-04-13 | 2003-09-16 | Advanced Micro Devices, Inc. | Automated process monitoring and analysis system for semiconductor processing |
| WO2002079757A2 (en) * | 2001-03-29 | 2002-10-10 | Koninklijke Philips Electronics N.V. | Method and device for measuring a permeation rate |
| KR20040067875A (ko) * | 2001-05-24 | 2004-07-30 | 테스트 어드밴티지 인코포레이티드 | 반도체 테스팅 방법 및 장치 |
-
2002
- 2002-03-13 WO PCT/IB2002/000754 patent/WO2002079757A2/en not_active Ceased
- 2002-03-13 CN CNB028008804A patent/CN1242250C/zh not_active Expired - Fee Related
- 2002-03-13 KR KR1020027016047A patent/KR100859818B1/ko not_active Expired - Fee Related
- 2002-03-13 AU AU2002237478A patent/AU2002237478A1/en not_active Abandoned
- 2002-03-13 EP EP02703801A patent/EP1373861A2/en not_active Withdrawn
- 2002-03-13 JP JP2002577538A patent/JP4209194B2/ja not_active Expired - Fee Related
- 2002-03-18 TW TW091105083A patent/TWI229733B/zh not_active IP Right Cessation
- 2002-03-26 US US10/106,951 patent/US6993956B2/en not_active Ceased
-
2005
- 2005-12-12 US US11/298,651 patent/US7117720B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20060147346A1 (en) | 2006-07-06 |
| KR100859818B1 (ko) | 2008-09-24 |
| US7117720B2 (en) | 2006-10-10 |
| WO2002079757A3 (en) | 2003-01-16 |
| JP2004531711A (ja) | 2004-10-14 |
| JP4209194B2 (ja) | 2009-01-14 |
| KR20030004438A (ko) | 2003-01-14 |
| US6993956B2 (en) | 2006-02-07 |
| EP1373861A2 (en) | 2004-01-02 |
| AU2002237478A1 (en) | 2002-10-15 |
| CN1460179A (zh) | 2003-12-03 |
| US20020152800A1 (en) | 2002-10-24 |
| WO2002079757A2 (en) | 2002-10-10 |
| CN1242250C (zh) | 2006-02-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |