JP4171229B2 - 自動試験装置の電子回路 - Google Patents

自動試験装置の電子回路 Download PDF

Info

Publication number
JP4171229B2
JP4171229B2 JP2002051316A JP2002051316A JP4171229B2 JP 4171229 B2 JP4171229 B2 JP 4171229B2 JP 2002051316 A JP2002051316 A JP 2002051316A JP 2002051316 A JP2002051316 A JP 2002051316A JP 4171229 B2 JP4171229 B2 JP 4171229B2
Authority
JP
Japan
Prior art keywords
circuit
nodes
circuit according
diode bridge
termination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2002051316A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002311108A (ja
JP2002311108A5 (https=
Inventor
ベルンハルト・ロート
ヘンリエッテ・オソイニッヒ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Verigy Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Verigy Singapore Pte Ltd filed Critical Verigy Singapore Pte Ltd
Publication of JP2002311108A publication Critical patent/JP2002311108A/ja
Publication of JP2002311108A5 publication Critical patent/JP2002311108A5/ja
Application granted granted Critical
Publication of JP4171229B2 publication Critical patent/JP4171229B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc Digital Transmission (AREA)
  • Logic Circuits (AREA)
JP2002051316A 2001-03-10 2002-02-27 自動試験装置の電子回路 Expired - Fee Related JP4171229B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01105970.6 2001-03-10
EP01105970A EP1172661B1 (en) 2001-03-10 2001-03-10 Switchable testing circuit for single-ended and differential termination

Publications (3)

Publication Number Publication Date
JP2002311108A JP2002311108A (ja) 2002-10-23
JP2002311108A5 JP2002311108A5 (https=) 2005-08-25
JP4171229B2 true JP4171229B2 (ja) 2008-10-22

Family

ID=8176740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002051316A Expired - Fee Related JP4171229B2 (ja) 2001-03-10 2002-02-27 自動試験装置の電子回路

Country Status (4)

Country Link
US (1) US6639397B2 (https=)
EP (1) EP1172661B1 (https=)
JP (1) JP4171229B2 (https=)
DE (1) DE60100109T2 (https=)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6798237B1 (en) 2001-08-29 2004-09-28 Altera Corporation On-chip impedance matching circuit
US6812732B1 (en) 2001-12-04 2004-11-02 Altera Corporation Programmable parallel on-chip parallel termination impedance and impedance matching
US6836144B1 (en) 2001-12-10 2004-12-28 Altera Corporation Programmable series on-chip termination impedance and impedance matching
US7109744B1 (en) 2001-12-11 2006-09-19 Altera Corporation Programmable termination with DC voltage level control
US6812734B1 (en) 2001-12-11 2004-11-02 Altera Corporation Programmable termination with DC voltage level control
DE10207676A1 (de) * 2002-02-22 2003-09-04 Philips Intellectual Property Schaltungsanordnung für einen stromgesteuerten Widerstand mit erweitertem Linearitätsbereich
US6888369B1 (en) 2003-07-17 2005-05-03 Altera Corporation Programmable on-chip differential termination impedance
DE10338030B3 (de) * 2003-08-19 2005-04-28 Infineon Technologies Ag Integrierte Schaltung zum Testen von Schaltungskomponenten eines Halbleiterchips
US6859064B1 (en) 2003-08-20 2005-02-22 Altera Corporation Techniques for reducing leakage current in on-chip impedance termination circuits
US6888370B1 (en) 2003-08-20 2005-05-03 Altera Corporation Dynamically adjustable termination impedance control techniques
US20050146320A1 (en) * 2003-12-31 2005-07-07 Gohel Tushar K. Differential active load
US7221193B1 (en) 2005-01-20 2007-05-22 Altera Corporation On-chip termination with calibrated driver strength
US7218155B1 (en) 2005-01-20 2007-05-15 Altera Corporation Techniques for controlling on-chip termination resistance using voltage range detection
US7679397B1 (en) 2005-08-05 2010-03-16 Altera Corporation Techniques for precision biasing output driver for a calibrated on-chip termination circuit
EP1832888B1 (en) * 2006-03-09 2009-06-17 Teradyne, Inc. V/I source and test system incorporating the same
US7408406B2 (en) * 2006-05-24 2008-08-05 Tektronix, Inc. Mode selection amplifier circuit usable in a signal acquisition probe
DE102007045756B4 (de) * 2007-09-25 2014-05-15 Texas Instruments Deutschland Gmbh Elektronische Leiterplatte und Verfahren für das automatische Prüfen
US8278936B2 (en) * 2007-11-23 2012-10-02 Evan Grund Test circuits and current pulse generator for simulating an electrostatic discharge
US8836383B2 (en) * 2012-09-07 2014-09-16 Richtek Technology Corporation Multipurpose half bridge signal output circuit
US9813050B1 (en) * 2016-04-13 2017-11-07 Analog Devices, Inc. Comparator circuit with input attenuator
US10145893B2 (en) 2016-12-25 2018-12-04 Nuvoton Technology Corporation Resolving automated test equipment (ATE) timing constraint violations

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
FR2648943B1 (fr) * 1989-06-23 1991-10-11 Radiotechnique Compelec Circuit echantillonneur-bloqueur
US5010297A (en) * 1989-12-01 1991-04-23 Analog Devices, Incorporated Automatic test equipment with active load having high-speed inhibit mode switching
US5200696A (en) * 1990-09-10 1993-04-06 Ltx Corporation Test system apparatus with Schottky diodes with programmable voltages
US5101153A (en) * 1991-01-09 1992-03-31 National Semiconductor Corporation Pin electronics test circuit for IC device testing
US5521493A (en) * 1994-11-21 1996-05-28 Megatest Corporation Semiconductor test system including a novel driver/load circuit
JP3331109B2 (ja) * 1996-01-23 2002-10-07 株式会社アドバンテスト 半導体試験装置の比較器
JP3672136B2 (ja) * 1996-10-04 2005-07-13 株式会社アドバンテスト Ｉｃ試験装置
US5942922A (en) * 1998-04-07 1999-08-24 Credence Systems Corporation Inhibitable, continuously-terminated differential drive circuit for an integrated circuit tester
JP3872594B2 (ja) * 1998-05-21 2007-01-24 株式会社アドバンテスト 半導体試験装置
US6313657B1 (en) * 1998-12-24 2001-11-06 Advantest Corporation IC testing apparatus and testing method using same
US6211723B1 (en) * 1999-01-20 2001-04-03 Ltx Corporation Programmable load circuit for use in automatic test equipment
US6275023B1 (en) * 1999-02-03 2001-08-14 Hitachi Electronics Engineering Co., Ltd. Semiconductor device tester and method for testing semiconductor device

Also Published As

Publication number Publication date
JP2002311108A (ja) 2002-10-23
EP1172661A1 (en) 2002-01-16
DE60100109T2 (de) 2003-10-16
DE60100109D1 (de) 2003-03-27
US20020125896A1 (en) 2002-09-12
US6639397B2 (en) 2003-10-28
EP1172661B1 (en) 2003-02-19

Similar Documents

Publication Publication Date Title
JP4171229B2 (ja) 自動試験装置の電子回路
US6605958B2 (en) Precision on-chip transmission line termination
TWI276820B (en) Interface circuit
US7313723B2 (en) Self-reparable semiconductor and method thereof
JP3935338B2 (ja) 差動信号の交差点に従って論理出力信号を送り出すための回路
US7541857B1 (en) Comparator offset cancellation assisted by PLD resources
KR20030080058A (ko) Ｐｉｎ다이오드 매트릭스를 구비한 ａｃ 교정 스위칭 장치
CN110675791B (zh) 源极驱动器
KR101803464B1 (ko) 다수 판정 회로
US6242966B1 (en) Leakage current correcting circuit
EP1386402B1 (en) Modified repetitive cell matching technique for integrated circuits
US20070241822A1 (en) Chain-chopping current mirror and method for stabilizing output currents
JP3336105B2 (ja) マルチプレクサ装置
JP2001077870A (ja) 多値信号伝送システム
CN116224043B (zh) 芯片均压测试系统
CN1763555B (zh) 半导体集成电路
US6437633B2 (en) Switching element, stage and system
JP2966464B2 (ja) 多値駆動回路
US7123092B2 (en) Differential amplifier with limitation of high common mode output voltages
US6911847B2 (en) Current switching type of high-speed logic circuit which generates output pair of differential signals each having accurately matched rise-time and fall-time waveform characteristics
CN1191642A (zh) 去复用器、保护转换单元、电信网络和去复用方法
KR101803465B1 (ko) 다수 판정 회로
US7250790B2 (en) Circuit for providing a logic gate function and a latch function
JPH08292227A (ja) 終端回路
JPH07118643B2 (ja) データを処理するための回路網

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050216

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050216

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20061017

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20061122

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20071225

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080401

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080617

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20080805

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20080808

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110815

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 4171229

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110815

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120815

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120815

Year of fee payment: 4

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120815

Year of fee payment: 4

R360 Written notification for declining of transfer of rights

Free format text: JAPANESE INTERMEDIATE CODE: R360

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120815

Year of fee payment: 4

R370 Written measure of declining of transfer procedure

Free format text: JAPANESE INTERMEDIATE CODE: R370

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120815

Year of fee payment: 4

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120815

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130815

Year of fee payment: 5

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees