JP2002311108A5 - - Google Patents
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- Publication number
- JP2002311108A5 JP2002311108A5 JP2002051316A JP2002051316A JP2002311108A5 JP 2002311108 A5 JP2002311108 A5 JP 2002311108A5 JP 2002051316 A JP2002051316 A JP 2002051316A JP 2002051316 A JP2002051316 A JP 2002051316A JP 2002311108 A5 JP2002311108 A5 JP 2002311108A5
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- lines
- termination
- resistor
- series
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP01105970.6 | 2001-03-10 | ||
| EP01105970A EP1172661B1 (en) | 2001-03-10 | 2001-03-10 | Switchable testing circuit for single-ended and differential termination |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002311108A JP2002311108A (ja) | 2002-10-23 |
| JP2002311108A5 true JP2002311108A5 (https=) | 2005-08-25 |
| JP4171229B2 JP4171229B2 (ja) | 2008-10-22 |
Family
ID=8176740
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002051316A Expired - Fee Related JP4171229B2 (ja) | 2001-03-10 | 2002-02-27 | 自動試験装置の電子回路 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6639397B2 (https=) |
| EP (1) | EP1172661B1 (https=) |
| JP (1) | JP4171229B2 (https=) |
| DE (1) | DE60100109T2 (https=) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6798237B1 (en) | 2001-08-29 | 2004-09-28 | Altera Corporation | On-chip impedance matching circuit |
| US6812732B1 (en) | 2001-12-04 | 2004-11-02 | Altera Corporation | Programmable parallel on-chip parallel termination impedance and impedance matching |
| US6836144B1 (en) | 2001-12-10 | 2004-12-28 | Altera Corporation | Programmable series on-chip termination impedance and impedance matching |
| US7109744B1 (en) | 2001-12-11 | 2006-09-19 | Altera Corporation | Programmable termination with DC voltage level control |
| US6812734B1 (en) | 2001-12-11 | 2004-11-02 | Altera Corporation | Programmable termination with DC voltage level control |
| DE10207676A1 (de) * | 2002-02-22 | 2003-09-04 | Philips Intellectual Property | Schaltungsanordnung für einen stromgesteuerten Widerstand mit erweitertem Linearitätsbereich |
| US6888369B1 (en) | 2003-07-17 | 2005-05-03 | Altera Corporation | Programmable on-chip differential termination impedance |
| DE10338030B3 (de) * | 2003-08-19 | 2005-04-28 | Infineon Technologies Ag | Integrierte Schaltung zum Testen von Schaltungskomponenten eines Halbleiterchips |
| US6859064B1 (en) | 2003-08-20 | 2005-02-22 | Altera Corporation | Techniques for reducing leakage current in on-chip impedance termination circuits |
| US6888370B1 (en) | 2003-08-20 | 2005-05-03 | Altera Corporation | Dynamically adjustable termination impedance control techniques |
| US20050146320A1 (en) * | 2003-12-31 | 2005-07-07 | Gohel Tushar K. | Differential active load |
| US7221193B1 (en) | 2005-01-20 | 2007-05-22 | Altera Corporation | On-chip termination with calibrated driver strength |
| US7218155B1 (en) | 2005-01-20 | 2007-05-15 | Altera Corporation | Techniques for controlling on-chip termination resistance using voltage range detection |
| US7679397B1 (en) | 2005-08-05 | 2010-03-16 | Altera Corporation | Techniques for precision biasing output driver for a calibrated on-chip termination circuit |
| EP1832888B1 (en) * | 2006-03-09 | 2009-06-17 | Teradyne, Inc. | V/I source and test system incorporating the same |
| US7408406B2 (en) * | 2006-05-24 | 2008-08-05 | Tektronix, Inc. | Mode selection amplifier circuit usable in a signal acquisition probe |
| DE102007045756B4 (de) * | 2007-09-25 | 2014-05-15 | Texas Instruments Deutschland Gmbh | Elektronische Leiterplatte und Verfahren für das automatische Prüfen |
| US8278936B2 (en) * | 2007-11-23 | 2012-10-02 | Evan Grund | Test circuits and current pulse generator for simulating an electrostatic discharge |
| US8836383B2 (en) * | 2012-09-07 | 2014-09-16 | Richtek Technology Corporation | Multipurpose half bridge signal output circuit |
| US9813050B1 (en) * | 2016-04-13 | 2017-11-07 | Analog Devices, Inc. | Comparator circuit with input attenuator |
| US10145893B2 (en) | 2016-12-25 | 2018-12-04 | Nuvoton Technology Corporation | Resolving automated test equipment (ATE) timing constraint violations |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4646299A (en) * | 1983-08-01 | 1987-02-24 | Fairchild Semiconductor Corporation | Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits |
| FR2648943B1 (fr) * | 1989-06-23 | 1991-10-11 | Radiotechnique Compelec | Circuit echantillonneur-bloqueur |
| US5010297A (en) * | 1989-12-01 | 1991-04-23 | Analog Devices, Incorporated | Automatic test equipment with active load having high-speed inhibit mode switching |
| US5200696A (en) * | 1990-09-10 | 1993-04-06 | Ltx Corporation | Test system apparatus with Schottky diodes with programmable voltages |
| US5101153A (en) * | 1991-01-09 | 1992-03-31 | National Semiconductor Corporation | Pin electronics test circuit for IC device testing |
| US5521493A (en) * | 1994-11-21 | 1996-05-28 | Megatest Corporation | Semiconductor test system including a novel driver/load circuit |
| JP3331109B2 (ja) * | 1996-01-23 | 2002-10-07 | 株式会社アドバンテスト | 半導体試験装置の比較器 |
| JP3672136B2 (ja) * | 1996-10-04 | 2005-07-13 | 株式会社アドバンテスト | Ｉｃ試験装置 |
| US5942922A (en) * | 1998-04-07 | 1999-08-24 | Credence Systems Corporation | Inhibitable, continuously-terminated differential drive circuit for an integrated circuit tester |
| JP3872594B2 (ja) * | 1998-05-21 | 2007-01-24 | 株式会社アドバンテスト | 半導体試験装置 |
| US6313657B1 (en) * | 1998-12-24 | 2001-11-06 | Advantest Corporation | IC testing apparatus and testing method using same |
| US6211723B1 (en) * | 1999-01-20 | 2001-04-03 | Ltx Corporation | Programmable load circuit for use in automatic test equipment |
| US6275023B1 (en) * | 1999-02-03 | 2001-08-14 | Hitachi Electronics Engineering Co., Ltd. | Semiconductor device tester and method for testing semiconductor device |
-
2001
- 2001-03-10 EP EP01105970A patent/EP1172661B1/en not_active Expired - Lifetime
- 2001-03-10 DE DE60100109T patent/DE60100109T2/de not_active Expired - Lifetime
- 2001-10-31 US US09/999,315 patent/US6639397B2/en not_active Expired - Fee Related
-
2002
- 2002-02-27 JP JP2002051316A patent/JP4171229B2/ja not_active Expired - Fee Related
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