JP2006064488A5 - - Google Patents

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Publication number
JP2006064488A5
JP2006064488A5 JP2004246175A JP2004246175A JP2006064488A5 JP 2006064488 A5 JP2006064488 A5 JP 2006064488A5 JP 2004246175 A JP2004246175 A JP 2004246175A JP 2004246175 A JP2004246175 A JP 2004246175A JP 2006064488 A5 JP2006064488 A5 JP 2006064488A5
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JP
Japan
Prior art keywords
semiconductor
semiconductor relay
pin
relay
connection point
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Application number
JP2004246175A
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English (en)
Japanese (ja)
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JP2006064488A (ja
JP4285370B2 (ja
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Priority to JP2004246175A priority Critical patent/JP4285370B2/ja
Priority claimed from JP2004246175A external-priority patent/JP4285370B2/ja
Publication of JP2006064488A publication Critical patent/JP2006064488A/ja
Publication of JP2006064488A5 publication Critical patent/JP2006064488A5/ja
Application granted granted Critical
Publication of JP4285370B2 publication Critical patent/JP4285370B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004246175A 2004-08-26 2004-08-26 半導体試験装置 Expired - Fee Related JP4285370B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004246175A JP4285370B2 (ja) 2004-08-26 2004-08-26 半導体試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004246175A JP4285370B2 (ja) 2004-08-26 2004-08-26 半導体試験装置

Publications (3)

Publication Number Publication Date
JP2006064488A JP2006064488A (ja) 2006-03-09
JP2006064488A5 true JP2006064488A5 (https=) 2006-12-21
JP4285370B2 JP4285370B2 (ja) 2009-06-24

Family

ID=36111105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004246175A Expired - Fee Related JP4285370B2 (ja) 2004-08-26 2004-08-26 半導体試験装置

Country Status (1)

Country Link
JP (1) JP4285370B2 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007322372A (ja) * 2006-06-05 2007-12-13 Yokogawa Electric Corp Ｉｃテスタ
JP2008102060A (ja) * 2006-10-20 2008-05-01 Yokogawa Electric Corp 半導体試験装置のタイミング校正回路及びタイミング校正方法
JPWO2008062579A1 (ja) * 2006-11-22 2010-03-04 パナソニック株式会社 半導体検査装置
CN100575972C (zh) * 2006-12-30 2009-12-30 中国科学院上海硅酸盐研究所 电脉冲诱导的电阻可逆变化的测试系统及其应用

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