DE60100109T2 - Umschaltbare Testschaltung für asymmetrischen und differentiellen Abschluss - Google Patents

Umschaltbare Testschaltung für asymmetrischen und differentiellen Abschluss

Info

Publication number
DE60100109T2
DE60100109T2 DE60100109T DE60100109T DE60100109T2 DE 60100109 T2 DE60100109 T2 DE 60100109T2 DE 60100109 T DE60100109 T DE 60100109T DE 60100109 T DE60100109 T DE 60100109T DE 60100109 T2 DE60100109 T2 DE 60100109T2
Authority
DE
Germany
Prior art keywords
circuit
nodes
termination
diode bridge
resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60100109T
Other languages
German (de)
English (en)
Other versions
DE60100109D1 (de
Inventor
Henriette Ossoinig
Bernhard Roth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE60100109D1 publication Critical patent/DE60100109D1/de
Publication of DE60100109T2 publication Critical patent/DE60100109T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc Digital Transmission (AREA)
  • Logic Circuits (AREA)
DE60100109T 2001-03-10 2001-03-10 Umschaltbare Testschaltung für asymmetrischen und differentiellen Abschluss Expired - Lifetime DE60100109T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01105970A EP1172661B1 (en) 2001-03-10 2001-03-10 Switchable testing circuit for single-ended and differential termination

Publications (2)

Publication Number Publication Date
DE60100109D1 DE60100109D1 (de) 2003-03-27
DE60100109T2 true DE60100109T2 (de) 2003-10-16

Family

ID=8176740

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60100109T Expired - Lifetime DE60100109T2 (de) 2001-03-10 2001-03-10 Umschaltbare Testschaltung für asymmetrischen und differentiellen Abschluss

Country Status (4)

Country Link
US (1) US6639397B2 (https=)
EP (1) EP1172661B1 (https=)
JP (1) JP4171229B2 (https=)
DE (1) DE60100109T2 (https=)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6798237B1 (en) 2001-08-29 2004-09-28 Altera Corporation On-chip impedance matching circuit
US6812732B1 (en) 2001-12-04 2004-11-02 Altera Corporation Programmable parallel on-chip parallel termination impedance and impedance matching
US6836144B1 (en) 2001-12-10 2004-12-28 Altera Corporation Programmable series on-chip termination impedance and impedance matching
US7109744B1 (en) 2001-12-11 2006-09-19 Altera Corporation Programmable termination with DC voltage level control
US6812734B1 (en) 2001-12-11 2004-11-02 Altera Corporation Programmable termination with DC voltage level control
DE10207676A1 (de) * 2002-02-22 2003-09-04 Philips Intellectual Property Schaltungsanordnung für einen stromgesteuerten Widerstand mit erweitertem Linearitätsbereich
US6888369B1 (en) 2003-07-17 2005-05-03 Altera Corporation Programmable on-chip differential termination impedance
DE10338030B3 (de) * 2003-08-19 2005-04-28 Infineon Technologies Ag Integrierte Schaltung zum Testen von Schaltungskomponenten eines Halbleiterchips
US6859064B1 (en) 2003-08-20 2005-02-22 Altera Corporation Techniques for reducing leakage current in on-chip impedance termination circuits
US6888370B1 (en) 2003-08-20 2005-05-03 Altera Corporation Dynamically adjustable termination impedance control techniques
US20050146320A1 (en) * 2003-12-31 2005-07-07 Gohel Tushar K. Differential active load
US7221193B1 (en) 2005-01-20 2007-05-22 Altera Corporation On-chip termination with calibrated driver strength
US7218155B1 (en) 2005-01-20 2007-05-15 Altera Corporation Techniques for controlling on-chip termination resistance using voltage range detection
US7679397B1 (en) 2005-08-05 2010-03-16 Altera Corporation Techniques for precision biasing output driver for a calibrated on-chip termination circuit
EP1832888B1 (en) * 2006-03-09 2009-06-17 Teradyne, Inc. V/I source and test system incorporating the same
US7408406B2 (en) * 2006-05-24 2008-08-05 Tektronix, Inc. Mode selection amplifier circuit usable in a signal acquisition probe
DE102007045756B4 (de) * 2007-09-25 2014-05-15 Texas Instruments Deutschland Gmbh Elektronische Leiterplatte und Verfahren für das automatische Prüfen
US8278936B2 (en) * 2007-11-23 2012-10-02 Evan Grund Test circuits and current pulse generator for simulating an electrostatic discharge
US8836383B2 (en) * 2012-09-07 2014-09-16 Richtek Technology Corporation Multipurpose half bridge signal output circuit
US9813050B1 (en) * 2016-04-13 2017-11-07 Analog Devices, Inc. Comparator circuit with input attenuator
US10145893B2 (en) 2016-12-25 2018-12-04 Nuvoton Technology Corporation Resolving automated test equipment (ATE) timing constraint violations

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
FR2648943B1 (fr) * 1989-06-23 1991-10-11 Radiotechnique Compelec Circuit echantillonneur-bloqueur
US5010297A (en) * 1989-12-01 1991-04-23 Analog Devices, Incorporated Automatic test equipment with active load having high-speed inhibit mode switching
US5200696A (en) * 1990-09-10 1993-04-06 Ltx Corporation Test system apparatus with Schottky diodes with programmable voltages
US5101153A (en) * 1991-01-09 1992-03-31 National Semiconductor Corporation Pin electronics test circuit for IC device testing
US5521493A (en) * 1994-11-21 1996-05-28 Megatest Corporation Semiconductor test system including a novel driver/load circuit
JP3331109B2 (ja) * 1996-01-23 2002-10-07 株式会社アドバンテスト 半導体試験装置の比較器
JP3672136B2 (ja) * 1996-10-04 2005-07-13 株式会社アドバンテスト Ｉｃ試験装置
US5942922A (en) * 1998-04-07 1999-08-24 Credence Systems Corporation Inhibitable, continuously-terminated differential drive circuit for an integrated circuit tester
JP3872594B2 (ja) * 1998-05-21 2007-01-24 株式会社アドバンテスト 半導体試験装置
US6313657B1 (en) * 1998-12-24 2001-11-06 Advantest Corporation IC testing apparatus and testing method using same
US6211723B1 (en) * 1999-01-20 2001-04-03 Ltx Corporation Programmable load circuit for use in automatic test equipment
US6275023B1 (en) * 1999-02-03 2001-08-14 Hitachi Electronics Engineering Co., Ltd. Semiconductor device tester and method for testing semiconductor device

Also Published As

Publication number Publication date
JP2002311108A (ja) 2002-10-23
EP1172661A1 (en) 2002-01-16
JP4171229B2 (ja) 2008-10-22
DE60100109D1 (de) 2003-03-27
US20020125896A1 (en) 2002-09-12
US6639397B2 (en) 2003-10-28
EP1172661B1 (en) 2003-02-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG

R082 Change of representative

Ref document number: 1172661

Country of ref document: EP

Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER, ZINKLER & PARTNER