JP2539956Y2 - テスターのタイミング発生回路 - Google Patents
テスターのタイミング発生回路Info
- Publication number
- JP2539956Y2 JP2539956Y2 JP1987128595U JP12859587U JP2539956Y2 JP 2539956 Y2 JP2539956 Y2 JP 2539956Y2 JP 1987128595 U JP1987128595 U JP 1987128595U JP 12859587 U JP12859587 U JP 12859587U JP 2539956 Y2 JP2539956 Y2 JP 2539956Y2
- Authority
- JP
- Japan
- Prior art keywords
- phase clock
- generator
- signal
- test
- test cycle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims description 87
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 description 4
- 230000001360 synchronised effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000011990 functional testing Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987128595U JP2539956Y2 (ja) | 1987-08-26 | 1987-08-26 | テスターのタイミング発生回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987128595U JP2539956Y2 (ja) | 1987-08-26 | 1987-08-26 | テスターのタイミング発生回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6434577U JPS6434577U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1989-03-02 |
JP2539956Y2 true JP2539956Y2 (ja) | 1997-07-02 |
Family
ID=31382082
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987128595U Expired - Lifetime JP2539956Y2 (ja) | 1987-08-26 | 1987-08-26 | テスターのタイミング発生回路 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2539956Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57114867A (en) * | 1981-01-08 | 1982-07-16 | Nec Corp | Tester for logic circuit |
-
1987
- 1987-08-26 JP JP1987128595U patent/JP2539956Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS6434577U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1989-03-02 |
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