JP2022529066A5 - - Google Patents

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Publication number
JP2022529066A5
JP2022529066A5 JP2021561950A JP2021561950A JP2022529066A5 JP 2022529066 A5 JP2022529066 A5 JP 2022529066A5 JP 2021561950 A JP2021561950 A JP 2021561950A JP 2021561950 A JP2021561950 A JP 2021561950A JP 2022529066 A5 JP2022529066 A5 JP 2022529066A5
Authority
JP
Japan
Prior art keywords
material layer
organic solvent
patterned
use according
additive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021561950A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022529066A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/EP2020/059580 external-priority patent/WO2020212173A1/en
Publication of JP2022529066A publication Critical patent/JP2022529066A/ja
Publication of JP2022529066A5 publication Critical patent/JP2022529066A5/ja
Pending legal-status Critical Current

Links

JP2021561950A 2019-04-16 2020-04-03 ホウ素タイプの添加剤を含む、50nm以下のライン間寸法を有するパターン化材料を処理する際のパターンの崩壊を回避するための組成物 Pending JP2022529066A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP19169513.9 2019-04-16
EP19169513 2019-04-16
PCT/EP2020/059580 WO2020212173A1 (en) 2019-04-16 2020-04-03 Composition for avoiding pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below comprising a boron-type additive

Publications (2)

Publication Number Publication Date
JP2022529066A JP2022529066A (ja) 2022-06-16
JP2022529066A5 true JP2022529066A5 (https=) 2023-04-14

Family

ID=66217771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021561950A Pending JP2022529066A (ja) 2019-04-16 2020-04-03 ホウ素タイプの添加剤を含む、50nm以下のライン間寸法を有するパターン化材料を処理する際のパターンの崩壊を回避するための組成物

Country Status (8)

Country Link
US (1) US20220187712A1 (https=)
EP (1) EP3956729A1 (https=)
JP (1) JP2022529066A (https=)
KR (1) KR20210154971A (https=)
CN (1) CN113574460A (https=)
IL (1) IL287201A (https=)
TW (1) TW202104572A (https=)
WO (1) WO2020212173A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021525388A (ja) * 2018-05-25 2021-09-24 ビーエイエスエフ・ソシエタス・エウロパエアBasf Se 50nm以下のライン間寸法を有するパターン化材料を処理したときのパターン倒壊を回避するための溶媒混合物を含む組成物を使用する方法
US12518960B2 (en) * 2020-07-09 2026-01-06 Basf Se Composition comprising a siloxane and an alkane for avoiding pattern collapse when treating patterned materials with line-space dimensions of 50 NM or below
KR20250109768A (ko) * 2023-01-10 2025-07-17 후지필름 가부시키가이샤 약액, 약액 수용체

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2434118A1 (fr) * 1978-06-19 1980-03-21 Charbonnages Ste Chimique Solutions d'anhydride borique et leur utilisation comme durcisseurs de resols
KR20080110984A (ko) * 2005-12-30 2008-12-22 아나코르 파마슈티칼스 인코포레이티드 보론함유 소분자
US20080299487A1 (en) 2007-05-31 2008-12-04 Taiwan Semiconductor Manufacturing Company, Ltd. Lithography material and lithography process
WO2012027667A2 (en) 2010-08-27 2012-03-01 Advanced Technology Materials, Inc. Method for preventing the collapse of high aspect ratio structures during drying
US8828144B2 (en) * 2010-12-28 2014-09-09 Central Grass Company, Limited Process for cleaning wafers
MY161218A (en) * 2011-01-25 2017-04-14 Basf Se Use of surfactants having at least three short-chain perfluorinated groups rf for manufacturing integrated circuits having patterns with line-space dimensions below 50nm
JP5681560B2 (ja) * 2011-05-17 2015-03-11 東京エレクトロン株式会社 基板乾燥方法及び基板処理装置
JP5806645B2 (ja) * 2012-06-12 2015-11-10 株式会社東芝 基板の乾燥方法、電子装置の製造方法及び基板の乾燥装置
EP3341352A4 (en) * 2015-09-24 2019-08-28 Board of Trustees of Michigan State University BOR-BASED CYCLOADDITION CATALYSTS AND PROCESS FOR PREPARING BIOBASED TEREPHTHALIC ACID, ISOPHTHALIC ACID AND POLY (ETHYLENE TEREPHTHALATE)
WO2019086374A1 (en) 2017-11-03 2019-05-09 Basf Se Use of compositions comprising a siloxane-type additive for avoiding pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below
CN108565124B (zh) * 2018-03-27 2019-12-31 天津理工大学 一种基于掺硼石墨烯/掺硼金刚石复合电极的钠离子超级电容器的制备方法
JP7077184B2 (ja) * 2018-08-30 2022-05-30 キオクシア株式会社 基板処理方法及び半導体装置の製造方法

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