JP2022512914A5 - - Google Patents
Info
- Publication number
- JP2022512914A5 JP2022512914A5 JP2021524024A JP2021524024A JP2022512914A5 JP 2022512914 A5 JP2022512914 A5 JP 2022512914A5 JP 2021524024 A JP2021524024 A JP 2021524024A JP 2021524024 A JP2021524024 A JP 2021524024A JP 2022512914 A5 JP2022512914 A5 JP 2022512914A5
- Authority
- JP
- Japan
- Prior art keywords
- filter
- inductor
- capacitance
- frequency
- filter stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201862758362P | 2018-11-09 | 2018-11-09 | |
| US62/758,362 | 2018-11-09 | ||
| PCT/US2019/055314 WO2020096723A1 (en) | 2018-11-09 | 2019-10-09 | Radio frequency filter system for a processing chamber |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2022512914A JP2022512914A (ja) | 2022-02-07 |
| JP2022512914A5 true JP2022512914A5 (https=) | 2022-10-20 |
| JP7455825B2 JP7455825B2 (ja) | 2024-03-26 |
Family
ID=70551835
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021524024A Active JP7455825B2 (ja) | 2018-11-09 | 2019-10-09 | 処理チャンバ用の高周波フィルタシステム |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10840062B2 (https=) |
| JP (1) | JP7455825B2 (https=) |
| KR (1) | KR102765819B1 (https=) |
| CN (1) | CN112913140B (https=) |
| TW (1) | TWI848999B (https=) |
| WO (1) | WO2020096723A1 (https=) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| KR20240015167A (ko) | 2014-10-17 | 2024-02-02 | 어플라이드 머티어리얼스, 인코포레이티드 | 애디티브 제조 프로세스들을 이용한 복합 재료 특성들을 갖는 cmp 패드 구성 |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2020050932A1 (en) | 2018-09-04 | 2020-03-12 | Applied Materials, Inc. | Formulations for advanced polishing pads |
| US11361941B2 (en) * | 2020-06-19 | 2022-06-14 | Applied Materials, Inc. | Methods and apparatus for processing a substrate |
| CN113921360B (zh) * | 2020-07-10 | 2023-10-31 | 中微半导体设备(上海)股份有限公司 | 等离子体处理装置中的加热装置及抗射频干扰方法 |
| KR102603678B1 (ko) * | 2020-10-13 | 2023-11-21 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| US12198908B2 (en) * | 2021-05-11 | 2025-01-14 | Applied Materials, Inc. | Magnetically coupled RF filter for substrate processing chambers |
| KR102770730B1 (ko) * | 2021-12-30 | 2025-02-24 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| CN115979533A (zh) * | 2022-11-17 | 2023-04-18 | 北京北方华创微电子装备有限公司 | 漏率检测方法及半导体工艺设备 |
| KR20250074015A (ko) * | 2023-11-20 | 2025-05-27 | 피에스케이 주식회사 | 기판 처리 장치, 기판 처리 장치의 제어 방법 및 기판 처리 방법 |
Family Cites Families (44)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4160212A (en) * | 1977-05-26 | 1979-07-03 | Raytheon Company | Radio frequency receiver having serially coupled heterodyning stages, each stage having filters with difference center frequencies |
| US4423394A (en) * | 1977-06-06 | 1983-12-27 | Motorola, Inc. | Multiple pole bandpass filter having monolithic crystal elements |
| JPS616914A (ja) * | 1984-06-20 | 1986-01-13 | Yukio Kanbe | 無線局の電波による音声混入障害対策用フイルタ− |
| JPH08130100A (ja) * | 1994-10-27 | 1996-05-21 | Kokusai Electric Co Ltd | プラズマ処理装置の電極構造 |
| US5835990A (en) * | 1995-06-16 | 1998-11-10 | Northern Telecom Limited | Longitudinally coupled double mode surface wave resonators |
| JP4256483B2 (ja) * | 1996-07-19 | 2009-04-22 | アプライド マテリアルズ インコーポレイテッド | 静電チャック、集積回路デバイスを製造するための装置、及び静電チャックの製造方法 |
| US6136388A (en) | 1997-12-01 | 2000-10-24 | Applied Materials, Inc. | Substrate processing chamber with tunable impedance |
| US6587019B2 (en) * | 2001-04-11 | 2003-07-01 | Eni Technology, Inc. | Dual directional harmonics dissipation system |
| US7086347B2 (en) | 2002-05-06 | 2006-08-08 | Lam Research Corporation | Apparatus and methods for minimizing arcing in a plasma processing chamber |
| JP4370789B2 (ja) | 2002-07-12 | 2009-11-25 | 東京エレクトロン株式会社 | プラズマ処理装置及び可変インピーダンス手段の校正方法 |
| US7280009B2 (en) * | 2005-04-13 | 2007-10-09 | The Boeing Company | Radio frequency filter systems and methods |
| US7777152B2 (en) * | 2006-06-13 | 2010-08-17 | Applied Materials, Inc. | High AC current high RF power AC-RF decoupling filter for plasma reactor heated electrostatic chuck |
| US7468642B2 (en) * | 2006-12-12 | 2008-12-23 | International Business Machines Corporation | Multi band pass filters |
| JP5042661B2 (ja) * | 2007-02-15 | 2012-10-03 | 東京エレクトロン株式会社 | プラズマ処理装置及びフィルタユニット |
| US20170213734A9 (en) | 2007-03-30 | 2017-07-27 | Alexei Marakhtanov | Multifrequency capacitively coupled plasma etch chamber |
| US9536711B2 (en) | 2007-03-30 | 2017-01-03 | Lam Research Corporation | Method and apparatus for DC voltage control on RF-powered electrode |
| US7758764B2 (en) | 2007-06-28 | 2010-07-20 | Lam Research Corporation | Methods and apparatus for substrate processing |
| JP5315942B2 (ja) * | 2008-05-21 | 2013-10-16 | 東京エレクトロン株式会社 | 載置台機構、これを用いたプラズマ処理装置及び静電チャックへの電圧印加方法 |
| CN102055426A (zh) * | 2009-10-30 | 2011-05-11 | 鸿富锦精密工业(深圳)有限公司 | 滤波器 |
| KR101321772B1 (ko) * | 2010-03-31 | 2013-10-28 | 한국전자통신연구원 | 통신 시스템에서 공진기 및 그를 이용한 필터 |
| US8742666B2 (en) * | 2010-08-06 | 2014-06-03 | Lam Research Corporation | Radio frequency (RF) power filters and plasma processing systems including RF power filters |
| US9866178B2 (en) * | 2011-02-24 | 2018-01-09 | Dsp Group Ltd. | Radio frequency circuitr having an integrated harmonic filter and a radio frequency circuit having transistors of different threshold voltages |
| KR101328800B1 (ko) * | 2011-09-08 | 2013-11-13 | 성균관대학교산학협력단 | 다중 주파수의 rf 펄스 파워를 이용한 펄스 플라즈마의 특성 제어 방법 |
| JP6027374B2 (ja) * | 2012-09-12 | 2016-11-16 | 東京エレクトロン株式会社 | プラズマ処理装置及びフィルタユニット |
| JP6050722B2 (ja) * | 2013-05-24 | 2016-12-21 | 東京エレクトロン株式会社 | プラズマ処理装置及びフィルタユニット |
| CN105684305B (zh) * | 2013-10-30 | 2018-04-24 | 株式会社村田制作所 | 电子元器件 |
| CN104375546A (zh) * | 2014-03-18 | 2015-02-25 | 苏州芯动科技有限公司 | 一种带开关电容滤波器的斩波带隙基准设备 |
| CN107112615B (zh) * | 2014-12-31 | 2019-11-26 | 深圳市大富科技股份有限公司 | 腔体滤波器、双工器、信号收发装置、射频拉远设备和塔顶放大器 |
| US10298196B2 (en) * | 2015-07-28 | 2019-05-21 | Qorvo Us, Inc. | RF filtering circuitry |
| US9923584B2 (en) * | 2015-09-03 | 2018-03-20 | Qualcomm Incorporated | Rectifiers for wireless power transfer with impedance inverting filters for reduced electromagnetic interference |
| US9741539B2 (en) * | 2015-10-05 | 2017-08-22 | Applied Materials, Inc. | RF power delivery regulation for processing substrates |
| US9966231B2 (en) * | 2016-02-29 | 2018-05-08 | Lam Research Corporation | Direct current pulsing plasma systems |
| CN105978533A (zh) * | 2016-06-18 | 2016-09-28 | 南通尚青医疗科技有限公司 | 一种复合滤波器 |
| JP2018078515A (ja) | 2016-11-11 | 2018-05-17 | 東京エレクトロン株式会社 | フィルタ装置及びプラズマ処理装置 |
| US10435789B2 (en) * | 2016-12-06 | 2019-10-08 | Asm Ip Holding B.V. | Substrate treatment apparatus |
| KR20190133276A (ko) * | 2017-04-21 | 2019-12-02 | 어플라이드 머티어리얼스, 인코포레이티드 | 개선된 전극 조립체 |
| JP7029340B2 (ja) | 2017-04-25 | 2022-03-03 | 東京エレクトロン株式会社 | フィルタ装置及びプラズマ処理装置 |
| US11447868B2 (en) * | 2017-05-26 | 2022-09-20 | Applied Materials, Inc. | Method for controlling a plasma process |
| JP6832800B2 (ja) | 2017-06-21 | 2021-02-24 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP6865128B2 (ja) | 2017-07-19 | 2021-04-28 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| US10715095B2 (en) * | 2017-10-06 | 2020-07-14 | Lam Research Corporation | Radiofrequency (RF) filter for multi-frequency RF bias |
| CN111226393B (zh) * | 2017-10-24 | 2023-10-24 | Rf360新加坡私人有限公司 | Rf滤波器和设计rf滤波器的方法 |
| US11456160B2 (en) | 2018-03-26 | 2022-09-27 | Tokyo Electron Limited | Plasma processing apparatus |
| JP7061511B2 (ja) | 2018-05-10 | 2022-04-28 | 東京エレクトロン株式会社 | フィルタ装置及びプラズマ処理装置 |
-
2019
- 2019-10-09 KR KR1020217017422A patent/KR102765819B1/ko active Active
- 2019-10-09 JP JP2021524024A patent/JP7455825B2/ja active Active
- 2019-10-09 CN CN201980069837.2A patent/CN112913140B/zh active Active
- 2019-10-09 WO PCT/US2019/055314 patent/WO2020096723A1/en not_active Ceased
- 2019-10-14 US US16/601,241 patent/US10840062B2/en active Active
- 2019-11-05 TW TW108140075A patent/TWI848999B/zh active
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