JP2022509506A5 - - Google Patents

Info

Publication number
JP2022509506A5
JP2022509506A5 JP2021548528A JP2021548528A JP2022509506A5 JP 2022509506 A5 JP2022509506 A5 JP 2022509506A5 JP 2021548528 A JP2021548528 A JP 2021548528A JP 2021548528 A JP2021548528 A JP 2021548528A JP 2022509506 A5 JP2022509506 A5 JP 2022509506A5
Authority
JP
Japan
Prior art keywords
stage
substrate
wiring
thickness direction
along
Prior art date
Application number
JP2021548528A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022509506A (ja
JPWO2020092361A5 (https=
JP7426547B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2019/058554 external-priority patent/WO2020092361A1/en
Publication of JP2022509506A publication Critical patent/JP2022509506A/ja
Publication of JPWO2020092361A5 publication Critical patent/JPWO2020092361A5/ja
Publication of JP2022509506A5 publication Critical patent/JP2022509506A5/ja
Application granted granted Critical
Publication of JP7426547B2 publication Critical patent/JP7426547B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2021548528A 2018-10-29 2019-10-29 半導体素子のモノリシック3d集積を行うためのアーキテクチャ Active JP7426547B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862752112P 2018-10-29 2018-10-29
US62/752,112 2018-10-29
PCT/US2019/058554 WO2020092361A1 (en) 2018-10-29 2019-10-29 Architecture for monolithic 3d integration of semiconductor devices

Publications (4)

Publication Number Publication Date
JP2022509506A JP2022509506A (ja) 2022-01-20
JPWO2020092361A5 JPWO2020092361A5 (https=) 2022-07-29
JP2022509506A5 true JP2022509506A5 (https=) 2022-07-29
JP7426547B2 JP7426547B2 (ja) 2024-02-02

Family

ID=70327689

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021548528A Active JP7426547B2 (ja) 2018-10-29 2019-10-29 半導体素子のモノリシック3d集積を行うためのアーキテクチャ

Country Status (6)

Country Link
US (2) US11201148B2 (https=)
JP (1) JP7426547B2 (https=)
KR (1) KR102672379B1 (https=)
CN (1) CN112956024B (https=)
TW (1) TWI856983B (https=)
WO (1) WO2020092361A1 (https=)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7376805B2 (ja) * 2018-11-09 2023-11-09 株式会社ソシオネクスト 半導体集積回路装置
JP7364922B2 (ja) * 2018-12-26 2023-10-19 株式会社ソシオネクスト 半導体集積回路装置
US11437376B2 (en) * 2019-05-31 2022-09-06 Tokyo Electron Limited Compact 3D stacked-CFET architecture for complex logic cells
US12451430B2 (en) 2020-05-28 2025-10-21 Taiwan Semiconductor Manufacturing Company, Ltd. Method of fabricating semiconductor devices having different architectures and semiconductor devices fabricated thereby
DE102021107950A1 (de) * 2020-05-28 2021-12-02 Taiwan Semiconductor Manufacturing Co., Ltd. Verfahren zum fertigen von halbleiterbauelementen mit unterschiedlichen architekturen und damit gefertigte halbleiterbauelemente
US11646318B2 (en) * 2020-09-30 2023-05-09 Tokyo Electron Limited Connections from buried interconnects to device terminals in multiple stacked devices structures
US11322197B1 (en) * 2020-10-21 2022-05-03 Arm Limited Power-gating techniques with buried metal
US11948886B2 (en) 2020-10-23 2024-04-02 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor device and methods of manufacturing same
US12176293B2 (en) * 2020-12-04 2024-12-24 Tokyo Electron Limited Inter-tier power delivery network (PDN) for dense gate-on-gate 3D logic integration
US12374623B2 (en) 2021-01-18 2025-07-29 Samsung Electronics Co., Ltd. Stacked semiconductor device architecture
US12183738B2 (en) * 2021-01-29 2024-12-31 Samsung Electronics Co., Ltd. Cross-coupled gate design for stacked device with separated top-down gate
US12446291B2 (en) * 2021-02-19 2025-10-14 Tokyo Electron Limited Inverted top-tier FET for multi-tier gate-on-gate 3-dimension integration (3Di)
US11968818B2 (en) 2021-03-19 2024-04-23 Samsung Electronics Co., Ltd. SRAM memory cell for stacked transistors with different channel width
US11670363B2 (en) * 2021-04-23 2023-06-06 Arm Limited Multi-tier memory architecture
US12557377B2 (en) * 2021-05-13 2026-02-17 Tokyo Electron Limited Inverted cross-couple for top-tier FET for multi-tier gate-on-gate 3DI
US11764154B2 (en) 2021-07-30 2023-09-19 Taiwan Semiconductor Manufacturing Company, Ltd. Power rail and signal line arrangement in integrated circuits having stacked transistors
EP4434092A4 (en) * 2021-11-16 2025-10-08 Hsu Fu Chang ADVANCED STRUCTURES WITH MOSFET TRANSISTORS AND METAL LAYERS
US12588489B2 (en) 2022-02-25 2026-03-24 Samsung Electronics Co., Ltd. Integrated circuit devices including stacked elements and methods of forming the same
US12131996B2 (en) 2022-03-28 2024-10-29 Samsung Electronics Co., Ltd. Stacked device with backside power distribution network and method of manufacturing the same
US20230317717A1 (en) * 2022-03-30 2023-10-05 Arm Limited Multi-Device Stack Structure
EP4293721A1 (en) * 2022-06-15 2023-12-20 Imec VZW Bit cell for sram
US20240290719A1 (en) * 2023-02-24 2024-08-29 Taiwan Semiconductor Manufacturing Company, Ltd. Integrated circuit device, system and method
US20250309093A1 (en) * 2024-03-28 2025-10-02 International Business Machines Corporation Power rail in stacked fet devices
EP4665106A1 (en) * 2024-06-13 2025-12-17 Imec VZW A static random access memory device
US20260096411A1 (en) * 2024-09-27 2026-04-02 Intel Corporation Complementary field-effect transistor static random-access memory

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3119177B2 (ja) * 1996-10-24 2000-12-18 日本電気株式会社 半導体装置
US6800883B2 (en) * 2000-09-21 2004-10-05 Matsushita Electric Industrial Co., Ltd. CMOS basic cell and method for fabricating semiconductor integrated circuit using the same
KR100505658B1 (ko) * 2002-12-11 2005-08-03 삼성전자주식회사 MIM(Metal-Insulator-Metal)커패시터를 갖는 반도체 소자
KR101036158B1 (ko) * 2003-07-29 2011-05-23 매그나칩 반도체 유한회사 Sram 및 로직 복합 소자의 제조 방법
KR100629364B1 (ko) * 2004-12-28 2006-09-29 삼성전자주식회사 에스램 셀들 및 플래쉬 메모리 셀들을 구비하는 반도체직접회로 소자들 및 그 제조방법들
JP2008117864A (ja) * 2006-11-01 2008-05-22 Nec Electronics Corp 半導体装置
US8624328B2 (en) * 2008-11-19 2014-01-07 Renesas Electronics Corporation Semiconductor device
JP2011114049A (ja) * 2009-11-25 2011-06-09 Renesas Electronics Corp 半導体装置
JP2011165966A (ja) * 2010-02-10 2011-08-25 Renesas Electronics Corp 半導体装置および半導体装置の製造方法
JP2012059830A (ja) * 2010-09-07 2012-03-22 Toshiba Corp 半導体記憶装置
JP5959162B2 (ja) * 2011-06-09 2016-08-02 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
JP5947580B2 (ja) * 2012-03-23 2016-07-06 ローム株式会社 デカップルキャパシタセル、セルベースic、セルベースicのレイアウトシステムおよびレイアウト方法
JP6113500B2 (ja) * 2012-12-27 2017-04-12 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
US9536840B2 (en) * 2013-02-12 2017-01-03 Qualcomm Incorporated Three-dimensional (3-D) integrated circuits (3DICS) with graphene shield, and related components and methods
US9177890B2 (en) * 2013-03-07 2015-11-03 Qualcomm Incorporated Monolithic three dimensional integration of semiconductor integrated circuits
US9171608B2 (en) 2013-03-15 2015-10-27 Qualcomm Incorporated Three-dimensional (3D) memory cell separation among 3D integrated circuit (IC) tiers, and related 3D integrated circuits (3DICS), 3DIC processor cores, and methods
DE112013007061T5 (de) * 2013-06-25 2016-01-28 Intel Corp. Monolithische dreidimensionale (3D) ICS mit örtlichen ebenenübergreifenden Zwischenverbindungen
US10134729B2 (en) 2013-09-27 2018-11-20 Taiwan Semiconductor Manufacturing Co., Ltd. Vertical noise reduction in 3D stacked semiconductor devices
US9070552B1 (en) * 2014-05-01 2015-06-30 Qualcomm Incorporated Adaptive standard cell architecture and layout techniques for low area digital SoC
US20160211250A1 (en) * 2015-01-15 2016-07-21 Infineon Technologies Ag Semiconductor substrate arrangement, a semiconductor device, and a method for processing a semiconductor substrate
US9431300B1 (en) * 2015-08-27 2016-08-30 Globalfoundries Inc. MOL architecture enabling ultra-regular cross couple
US9691695B2 (en) 2015-08-31 2017-06-27 Taiwan Semiconductor Manufacturing Company, Ltd. Monolithic 3D integration inter-tier vias insertion scheme and associated layout structure
US9935100B2 (en) * 2015-11-09 2018-04-03 Qualcomm Incorporated Power rail inbound middle of line (MOL) routing
US9799741B2 (en) * 2015-12-16 2017-10-24 Taiwan Semiconductor Manufacturing Company Limited Semiconductor device and method for manufacturing the same
FR3045869B1 (fr) * 2015-12-18 2020-02-07 Stmicroelectronics (Crolles 2) Sas Routage ameliore pour structure integree tridimensionnelle
US9754923B1 (en) * 2016-05-09 2017-09-05 Qualcomm Incorporated Power gate placement techniques in three-dimensional (3D) integrated circuits (ICs) (3DICs)
US9929149B2 (en) 2016-06-21 2018-03-27 Arm Limited Using inter-tier vias in integrated circuits
US10510592B2 (en) * 2016-07-25 2019-12-17 Taiwan Semiconductor Manufacturing Co., Ltd. Integrated circuit (IC) structure for high performance and functional density
US10651178B2 (en) * 2018-02-14 2020-05-12 Taiwan Semiconductor Manufacturing Co., Ltd. Compact electrical connection that can be used to form an SRAM cell and method of making the same

Similar Documents

Publication Publication Date Title
JP2022509506A5 (https=)
JP7426547B2 (ja) 半導体素子のモノリシック3d集積を行うためのアーキテクチャ
JPWO2020092361A5 (https=)
US12040271B2 (en) Power delivery network for CFET with buried power rails
CN112771655B (zh) 半导体集成电路装置以及半导体封装件构造
JP7415176B2 (ja) 半導体集積回路装置
US9324715B2 (en) Flip-flop layout architecture implementation for semiconductor device
EP3038156B1 (en) Semiconductor package assembly with through silicon via interconnects
JP2022534858A (ja) 複合ロジックセルのための小型3d積層cfetアーキテクチャ
KR102819717B1 (ko) 반도체 소자 및 반도체 소자의 설계 방법
US12464819B2 (en) Semiconductor integrated circuit device
JP7610127B2 (ja) 半導体集積回路装置
JPWO2018042986A1 (ja) 半導体集積回路装置
WO2022224847A1 (ja) 出力回路
TW201705407A (zh) 半導體裝置、系統晶片、行動裝置以及半導體系統
JP6215645B2 (ja) 半導体集積回路
US10777579B2 (en) Semiconductor integrated circuit device
TWI847046B (zh) 半導體結構
CN119855165B (zh) 一种存储芯片、逻辑芯片、芯片堆叠结构和存储器
WO2023209971A1 (ja) 半導体集積回路装置
KR20120045351A (ko) Mos 트랜지스터를 포함하는 반도체 소자의 레이아웃 구조 및 그 제조 방법
JPH09246393A (ja) 半導体集積回路のレイアウト方法