JP2019158926A5 - - Google Patents

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Publication number
JP2019158926A5
JP2019158926A5 JP2018041198A JP2018041198A JP2019158926A5 JP 2019158926 A5 JP2019158926 A5 JP 2019158926A5 JP 2018041198 A JP2018041198 A JP 2018041198A JP 2018041198 A JP2018041198 A JP 2018041198A JP 2019158926 A5 JP2019158926 A5 JP 2019158926A5
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JP
Japan
Prior art keywords
pattern forming
light
alignment mark
forming apparatus
substrate
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JP2018041198A
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English (en)
Japanese (ja)
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JP7114277B2 (ja
JP2019158926A (ja
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Priority claimed from JP2018041198A external-priority patent/JP7114277B2/ja
Priority to JP2018041198A priority Critical patent/JP7114277B2/ja
Priority to EP19160584.9A priority patent/EP3537219B1/en
Priority to TW108106986A priority patent/TWI722394B/zh
Priority to US16/292,953 priority patent/US10747116B2/en
Priority to CN201910167636.8A priority patent/CN110244519B/zh
Publication of JP2019158926A publication Critical patent/JP2019158926A/ja
Publication of JP2019158926A5 publication Critical patent/JP2019158926A5/ja
Publication of JP7114277B2 publication Critical patent/JP7114277B2/ja
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JP2018041198A 2018-03-07 2018-03-07 パターン形成装置及び物品の製造方法 Active JP7114277B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018041198A JP7114277B2 (ja) 2018-03-07 2018-03-07 パターン形成装置及び物品の製造方法
EP19160584.9A EP3537219B1 (en) 2018-03-07 2019-03-04 Pattern forming apparatus and article manufacturing method
TW108106986A TWI722394B (zh) 2018-03-07 2019-03-04 圖案形成裝置及物品製造方法
US16/292,953 US10747116B2 (en) 2018-03-07 2019-03-05 Pattern forming apparatus and article manufacturing method
CN201910167636.8A CN110244519B (zh) 2018-03-07 2019-03-06 图案形成装置、基板保持装置和物品制造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018041198A JP7114277B2 (ja) 2018-03-07 2018-03-07 パターン形成装置及び物品の製造方法

Publications (3)

Publication Number Publication Date
JP2019158926A JP2019158926A (ja) 2019-09-19
JP2019158926A5 true JP2019158926A5 (enExample) 2021-04-15
JP7114277B2 JP7114277B2 (ja) 2022-08-08

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ID=65686727

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018041198A Active JP7114277B2 (ja) 2018-03-07 2018-03-07 パターン形成装置及び物品の製造方法

Country Status (5)

Country Link
US (1) US10747116B2 (enExample)
EP (1) EP3537219B1 (enExample)
JP (1) JP7114277B2 (enExample)
CN (1) CN110244519B (enExample)
TW (1) TWI722394B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6980562B2 (ja) * 2018-02-28 2021-12-15 キヤノン株式会社 パターン形成装置、アライメントマークの検出方法及びパターン形成方法
JP7659388B2 (ja) 2020-12-08 2025-04-09 キヤノン株式会社 検出装置、検出方法、露光装置、露光システム、物品製造方法、およびプログラム
CN114047137B (zh) * 2021-09-28 2023-09-12 深圳市麓邦技术有限公司 偏振信息转化或复制拼接方法
CN118448324B (zh) * 2024-03-27 2025-06-06 深圳稳顶聚芯技术有限公司 对准装置及对准方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62262426A (ja) * 1986-05-09 1987-11-14 Canon Inc 露光装置
US5148214A (en) * 1986-05-09 1992-09-15 Canon Kabushiki Kaisha Alignment and exposure apparatus
JP2535889B2 (ja) * 1987-03-26 1996-09-18 株式会社ニコン 投影光学装置
JP2803667B2 (ja) * 1997-11-17 1998-09-24 株式会社ニコン 露光方法
JP2001356488A (ja) * 2000-06-14 2001-12-26 Asahi Optical Co Ltd レーザ描画装置
US7113258B2 (en) * 2001-01-15 2006-09-26 Asml Netherlands B.V. Lithographic apparatus
US6768539B2 (en) * 2001-01-15 2004-07-27 Asml Netherlands B.V. Lithographic apparatus
JP2003233198A (ja) * 2002-02-12 2003-08-22 Konica Corp 画像露光装置
US20090128792A1 (en) * 2007-10-19 2009-05-21 Asml Netherlands B.V. Lithographic apparatus and method
NL1036308A1 (nl) * 2007-12-19 2009-06-22 Asml Netherlands Bv Lithographic method.
CN102483580B (zh) * 2009-08-20 2015-04-01 株式会社尼康 物体处理装置、曝光装置及曝光方法、以及元件制造方法
US20110042874A1 (en) * 2009-08-20 2011-02-24 Nikon Corporation Object processing apparatus, exposure apparatus and exposure method, and device manufacturing method
JP6116456B2 (ja) * 2013-09-25 2017-04-19 株式会社Screenホールディングス 描画方法および描画装置
CN105807578A (zh) * 2014-12-29 2016-07-27 上海微电子装备有限公司 一种背面对准测量装置及方法
JP6207671B1 (ja) * 2016-06-01 2017-10-04 キヤノン株式会社 パターン形成装置、基板配置方法及び物品の製造方法

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