JP2018031705A - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP2018031705A
JP2018031705A JP2016164999A JP2016164999A JP2018031705A JP 2018031705 A JP2018031705 A JP 2018031705A JP 2016164999 A JP2016164999 A JP 2016164999A JP 2016164999 A JP2016164999 A JP 2016164999A JP 2018031705 A JP2018031705 A JP 2018031705A
Authority
JP
Japan
Prior art keywords
terminal
operational amplifier
sense
inverting input
potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2016164999A
Other languages
English (en)
Japanese (ja)
Other versions
JP2018031705A5 (enExample
Inventor
貞洋 赤間
Sadahiro Akama
貞洋 赤間
秀和 小野
Hidekazu Ono
秀和 小野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
Denso Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Corp filed Critical Denso Corp
Priority to JP2016164999A priority Critical patent/JP2018031705A/ja
Priority to PCT/JP2017/025872 priority patent/WO2018037769A1/ja
Publication of JP2018031705A publication Critical patent/JP2018031705A/ja
Publication of JP2018031705A5 publication Critical patent/JP2018031705A5/ja
Priority to US16/228,889 priority patent/US20190113563A1/en
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G01R31/42—AC power supplies
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Amplifiers (AREA)
JP2016164999A 2016-08-25 2016-08-25 半導体装置 Pending JP2018031705A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2016164999A JP2018031705A (ja) 2016-08-25 2016-08-25 半導体装置
PCT/JP2017/025872 WO2018037769A1 (ja) 2016-08-25 2017-07-18 半導体装置
US16/228,889 US20190113563A1 (en) 2016-08-25 2018-12-21 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016164999A JP2018031705A (ja) 2016-08-25 2016-08-25 半導体装置

Publications (2)

Publication Number Publication Date
JP2018031705A true JP2018031705A (ja) 2018-03-01
JP2018031705A5 JP2018031705A5 (enExample) 2018-09-20

Family

ID=61246304

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016164999A Pending JP2018031705A (ja) 2016-08-25 2016-08-25 半導体装置

Country Status (3)

Country Link
US (1) US20190113563A1 (enExample)
JP (1) JP2018031705A (enExample)
WO (1) WO2018037769A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110726938A (zh) * 2018-07-17 2020-01-24 半导体组件工业公司 电流感测系统及其实现方法和集成电路
JP2021047057A (ja) * 2019-09-17 2021-03-25 ルネサスエレクトロニクス株式会社 半導体装置、および、パワーデバイス

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58124308A (ja) * 1982-01-20 1983-07-23 Nippon Gakki Seizo Kk 電力増幅器
JPS5957017U (ja) * 1982-10-06 1984-04-13 株式会社東芝 電力増幅回路
JPH07229928A (ja) * 1994-02-17 1995-08-29 Nissan Motor Co Ltd 電流検出装置
JPH0886818A (ja) * 1994-09-14 1996-04-02 Nissan Motor Co Ltd 電流検出回路
JPH08334534A (ja) * 1995-06-07 1996-12-17 Siemens Ag 電力用半導体構成要素の負荷電流検出用回路装置
US5977751A (en) * 1997-02-21 1999-11-02 Daimler-Benz Aktiengesellschaft Battery monitoring unit having a sense FET circuit arrangement
JP2002209340A (ja) * 2000-12-29 2002-07-26 Nokia Mobile Phones Ltd 蓄電池の充電電流及び放電電流を測定する方法及び装置
JP2005164381A (ja) * 2003-12-02 2005-06-23 Fuji Electric Holdings Co Ltd 双方向スイッチの電流検出回路
JP2010181351A (ja) * 2009-02-09 2010-08-19 Fuji Electric Systems Co Ltd 双方向スイッチの電流検出回路

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58124308A (ja) * 1982-01-20 1983-07-23 Nippon Gakki Seizo Kk 電力増幅器
JPS5957017U (ja) * 1982-10-06 1984-04-13 株式会社東芝 電力増幅回路
JPH07229928A (ja) * 1994-02-17 1995-08-29 Nissan Motor Co Ltd 電流検出装置
JPH0886818A (ja) * 1994-09-14 1996-04-02 Nissan Motor Co Ltd 電流検出回路
JPH08334534A (ja) * 1995-06-07 1996-12-17 Siemens Ag 電力用半導体構成要素の負荷電流検出用回路装置
US5977751A (en) * 1997-02-21 1999-11-02 Daimler-Benz Aktiengesellschaft Battery monitoring unit having a sense FET circuit arrangement
JP2002209340A (ja) * 2000-12-29 2002-07-26 Nokia Mobile Phones Ltd 蓄電池の充電電流及び放電電流を測定する方法及び装置
JP2005164381A (ja) * 2003-12-02 2005-06-23 Fuji Electric Holdings Co Ltd 双方向スイッチの電流検出回路
JP2010181351A (ja) * 2009-02-09 2010-08-19 Fuji Electric Systems Co Ltd 双方向スイッチの電流検出回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110726938A (zh) * 2018-07-17 2020-01-24 半导体组件工业公司 电流感测系统及其实现方法和集成电路
JP2021047057A (ja) * 2019-09-17 2021-03-25 ルネサスエレクトロニクス株式会社 半導体装置、および、パワーデバイス

Also Published As

Publication number Publication date
US20190113563A1 (en) 2019-04-18
WO2018037769A1 (ja) 2018-03-01

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