JP2017156337A - 光学フィルムの欠陥情報統合管理装置およびその方法 - Google Patents

光学フィルムの欠陥情報統合管理装置およびその方法 Download PDF

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Publication number
JP2017156337A
JP2017156337A JP2016162690A JP2016162690A JP2017156337A JP 2017156337 A JP2017156337 A JP 2017156337A JP 2016162690 A JP2016162690 A JP 2016162690A JP 2016162690 A JP2016162690 A JP 2016162690A JP 2017156337 A JP2017156337 A JP 2017156337A
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Prior art keywords
defect
defect information
information
optical film
management machine
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Japanese (ja)
Inventor
チョン−ウ キム，
Jong Woo Kim
チョン−ウ キム，
ジン−ヨン パク，
Jin Yong Park
ジン−ヨン パク，
テ−ギュ イ，
Tae Kyu Lee
テ−ギュ イ，
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Dongwoo Fine Chem Co Ltd
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Dongwoo Fine Chem Co Ltd
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Publication of JP2017156337A publication Critical patent/JP2017156337A/ja
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • G06Q10/063—Operations research, analysis or management
    • G06Q10/0633—Workflow analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K17/00—Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Engineering & Computer Science (AREA)
  • Business, Economics & Management (AREA)
  • Human Resources & Organizations (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Strategic Management (AREA)
  • Economics (AREA)
  • Entrepreneurship & Innovation (AREA)
  • General Business, Economics & Management (AREA)
  • Marketing (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Tourism & Hospitality (AREA)
  • Educational Administration (AREA)
  • Game Theory and Decision Science (AREA)
  • Development Economics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Operations Research (AREA)
  • Quality & Reliability (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Signal Processing (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Artificial Intelligence (AREA)
  • Manufacturing & Machinery (AREA)
  • Primary Health Care (AREA)
JP2016162690A 2016-03-04 2016-08-23 光学フィルムの欠陥情報統合管理装置およびその方法 Pending JP2017156337A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020160026298A KR20170103416A (ko) 2016-03-04 2016-03-04 광학필름의 결함 정보 통합 관리 장치 및 그 방법
KR10-2016-0026298 2016-03-04

Publications (1)

Publication Number Publication Date
JP2017156337A true JP2017156337A (ja) 2017-09-07

Family

ID=59792430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016162690A Pending JP2017156337A (ja) 2016-03-04 2016-08-23 光学フィルムの欠陥情報統合管理装置およびその方法

Country Status (3)

Country Link
JP (1) JP2017156337A (ko)
KR (1) KR20170103416A (ko)
CN (1) CN107153902A (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019059012A1 (ja) 2017-09-19 2019-03-28 コニカミノルタ株式会社 非破壊検査方法
CN107703152A (zh) * 2017-10-27 2018-02-16 深圳精创视觉科技有限公司 光学膜缺点自动标示装置
CN111452514B (zh) * 2020-04-26 2021-01-12 杭州利珀科技有限公司 偏光膜整线打标系统及方法
CN114953764B (zh) * 2021-02-18 2023-08-22 恒美光电股份有限公司 一种偏光膜缺点汇整标记系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000014790A1 (fr) * 1998-09-03 2000-03-16 Hitachi, Ltd. Systeme d'inspection et procede de production d'un dispositif electronique l'utilisant
JP2008200788A (ja) * 2007-02-19 2008-09-04 Sumitomo Chemical Co Ltd 光学フィルムの裁断装置および光学フィルムの製造方法
JP5733879B2 (ja) * 2008-12-24 2015-06-10 株式会社神戸製鋼所 工程不良検出装置及び工程不良検出方法
KR101315102B1 (ko) * 2011-07-25 2013-10-07 동우 화인켐 주식회사 필름의 수율 예측 시스템 및 방법

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KR20170103416A (ko) 2017-09-13
CN107153902A (zh) 2017-09-12

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