JP2017058911A5 - - Google Patents

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Publication number
JP2017058911A5
JP2017058911A5 JP2015182677A JP2015182677A JP2017058911A5 JP 2017058911 A5 JP2017058911 A5 JP 2017058911A5 JP 2015182677 A JP2015182677 A JP 2015182677A JP 2015182677 A JP2015182677 A JP 2015182677A JP 2017058911 A5 JP2017058911 A5 JP 2017058911A5
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JP
Japan
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voltage
clock
value
circuit
frequency
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JP2015182677A
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English (en)
Japanese (ja)
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JP2017058911A (ja
JP6533135B2 (ja
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Priority to JP2015182677A priority Critical patent/JP6533135B2/ja
Priority claimed from JP2015182677A external-priority patent/JP6533135B2/ja
Priority to US15/224,380 priority patent/US10222847B2/en
Priority to CN201610708757.5A priority patent/CN106547637B/zh
Publication of JP2017058911A publication Critical patent/JP2017058911A/ja
Publication of JP2017058911A5 publication Critical patent/JP2017058911A5/ja
Priority to US16/219,758 priority patent/US10782763B2/en
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Publication of JP6533135B2 publication Critical patent/JP6533135B2/ja
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JP2015182677A 2015-09-16 2015-09-16 半導体装置 Active JP6533135B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015182677A JP6533135B2 (ja) 2015-09-16 2015-09-16 半導体装置
US15/224,380 US10222847B2 (en) 2015-09-16 2016-07-29 Semiconductor device
CN201610708757.5A CN106547637B (zh) 2015-09-16 2016-08-23 半导体器件
US16/219,758 US10782763B2 (en) 2015-09-16 2018-12-13 Semiconductor device

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Application Number Priority Date Filing Date Title
JP2015182677A JP6533135B2 (ja) 2015-09-16 2015-09-16 半導体装置

Publications (3)

Publication Number Publication Date
JP2017058911A JP2017058911A (ja) 2017-03-23
JP2017058911A5 true JP2017058911A5 (https=) 2018-07-05
JP6533135B2 JP6533135B2 (ja) 2019-06-19

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JP2015182677A Active JP6533135B2 (ja) 2015-09-16 2015-09-16 半導体装置

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US (2) US10222847B2 (https=)
JP (1) JP6533135B2 (https=)
CN (1) CN106547637B (https=)

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US10831250B2 (en) 2017-02-13 2020-11-10 Chaoyang Semiconductor Jiangyin Technology Co., Ltd. In-circuit supply transient scope
JP6880900B2 (ja) * 2017-03-27 2021-06-02 日本電気株式会社 演算装置、演算装置制御方法、プログラム
US10171081B1 (en) * 2017-07-28 2019-01-01 International Business Machines Corporation On-chip supply noise voltage reduction or mitigation using local detection loops in a processor core
JP7193718B2 (ja) 2018-12-19 2022-12-21 富士通株式会社 制御プログラム、情報処理装置及び制御方法
EP3850523B1 (en) * 2019-11-19 2022-03-16 Google LLC Voltage-variation detection under clock fluctuations
US11442082B2 (en) 2019-12-23 2022-09-13 Graphcore Limited Droop detection
GB2590660B (en) * 2019-12-23 2022-01-05 Graphcore Ltd Reactive droop limiter
CN111077760B (zh) * 2020-01-07 2021-02-26 东南大学 一种时间数字转换器及转换方法
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DE102022100096A1 (de) 2021-07-27 2023-02-02 Taiwan Semiconductor Manufacturing Co., Ltd. Halbleitervorrichtung und verfahren zum betreiben davon
US11942953B2 (en) 2021-12-21 2024-03-26 Advanced Micro Devices, Inc. Droop detection and control of digital frequency-locked loop
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KR20240143518A (ko) * 2023-03-24 2024-10-02 삼성전자주식회사 클럭 게이팅을 수행하는 반도체 장치 및 반도체 장치의 동작 방법

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