JP6533135B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP6533135B2
JP6533135B2 JP2015182677A JP2015182677A JP6533135B2 JP 6533135 B2 JP6533135 B2 JP 6533135B2 JP 2015182677 A JP2015182677 A JP 2015182677A JP 2015182677 A JP2015182677 A JP 2015182677A JP 6533135 B2 JP6533135 B2 JP 6533135B2
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Japan
Prior art keywords
voltage
clock
value
circuit
power supply
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JP2015182677A
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Japanese (ja)
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JP2017058911A (ja
JP2017058911A5 (https=
Inventor
祐子 北地
祐子 北地
一樹 福岡
一樹 福岡
涼 森
涼 森
俊文 植村
俊文 植村
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Renesas Electronics Corp
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Renesas Electronics Corp
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Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Priority to JP2015182677A priority Critical patent/JP6533135B2/ja
Priority to US15/224,380 priority patent/US10222847B2/en
Priority to CN201610708757.5A priority patent/CN106547637B/zh
Publication of JP2017058911A publication Critical patent/JP2017058911A/ja
Publication of JP2017058911A5 publication Critical patent/JP2017058911A5/ja
Priority to US16/219,758 priority patent/US10782763B2/en
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0721—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU]
    • G06F11/0724—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU] in a multiprocessor or a multi-core unit
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/30—Means for acting in the event of power-supply failure or interruption, e.g. power-supply fluctuations
    • G06F1/305—Means for acting in the event of power-supply failure or interruption, e.g. power-supply fluctuations in the event of power-supply fluctuations
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0793—Remedial or corrective actions
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G06F1/08—Clock generators with changeable or programmable clock frequency
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G06F1/10—Distribution of clock signals, e.g. skew
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
    • G06F1/3234—Power saving characterised by the action undertaken
    • G06F1/3237—Power saving characterised by the action undertaken by disabling clock generation or distribution

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Power Sources (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Measuring Fluid Pressure (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2015182677A 2015-09-16 2015-09-16 半導体装置 Active JP6533135B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015182677A JP6533135B2 (ja) 2015-09-16 2015-09-16 半導体装置
US15/224,380 US10222847B2 (en) 2015-09-16 2016-07-29 Semiconductor device
CN201610708757.5A CN106547637B (zh) 2015-09-16 2016-08-23 半导体器件
US16/219,758 US10782763B2 (en) 2015-09-16 2018-12-13 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015182677A JP6533135B2 (ja) 2015-09-16 2015-09-16 半導体装置

Publications (3)

Publication Number Publication Date
JP2017058911A JP2017058911A (ja) 2017-03-23
JP2017058911A5 JP2017058911A5 (https=) 2018-07-05
JP6533135B2 true JP6533135B2 (ja) 2019-06-19

Family

ID=58258331

Family Applications (1)

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JP2015182677A Active JP6533135B2 (ja) 2015-09-16 2015-09-16 半導体装置

Country Status (3)

Country Link
US (2) US10222847B2 (https=)
JP (1) JP6533135B2 (https=)
CN (1) CN106547637B (https=)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10148258B2 (en) * 2016-09-28 2018-12-04 Mellanox Technologies, Ltd. Power supply voltage monitoring and high-resolution adaptive clock stretching circuit
EP3568734A4 (en) * 2017-02-13 2020-01-15 Chaoyang Semiconductor Jiangyin Technology Co., Ltd. REAL-TIME DETECTION AND PREVENTION OF POSSIBLE CRITICAL SYNCHRONIZATION PATH ERROR EVENTS FOR EMBEDDED CORES
US10831250B2 (en) 2017-02-13 2020-11-10 Chaoyang Semiconductor Jiangyin Technology Co., Ltd. In-circuit supply transient scope
JP6880900B2 (ja) * 2017-03-27 2021-06-02 日本電気株式会社 演算装置、演算装置制御方法、プログラム
US10171081B1 (en) * 2017-07-28 2019-01-01 International Business Machines Corporation On-chip supply noise voltage reduction or mitigation using local detection loops in a processor core
JP7193718B2 (ja) 2018-12-19 2022-12-21 富士通株式会社 制御プログラム、情報処理装置及び制御方法
EP3850523B1 (en) * 2019-11-19 2022-03-16 Google LLC Voltage-variation detection under clock fluctuations
US11442082B2 (en) 2019-12-23 2022-09-13 Graphcore Limited Droop detection
GB2590660B (en) * 2019-12-23 2022-01-05 Graphcore Ltd Reactive droop limiter
CN111077760B (zh) * 2020-01-07 2021-02-26 东南大学 一种时间数字转换器及转换方法
JP7452259B2 (ja) 2020-06-02 2024-03-19 富士通株式会社 半導体装置
CN113022480B (zh) * 2021-02-04 2022-10-25 珠海格力电器股份有限公司 一种空调的控制方法、装置、空调、存储介质及处理器
JP7596911B2 (ja) * 2021-04-26 2024-12-10 富士通株式会社 半導体装置及びクロック制御方法
CN115472195A (zh) * 2021-07-27 2022-12-13 台湾积体电路制造股份有限公司 半导体器件及其操作方法
DE102022100096A1 (de) 2021-07-27 2023-02-02 Taiwan Semiconductor Manufacturing Co., Ltd. Halbleitervorrichtung und verfahren zum betreiben davon
US11942953B2 (en) 2021-12-21 2024-03-26 Advanced Micro Devices, Inc. Droop detection and control of digital frequency-locked loop
KR20240030473A (ko) 2022-08-31 2024-03-07 삼성전자주식회사 디지털 드룹 검출기, 반도체 장치, 그리고 그것의 켈리브레이션 방법
KR20240143518A (ko) * 2023-03-24 2024-10-02 삼성전자주식회사 클럭 게이팅을 수행하는 반도체 장치 및 반도체 장치의 동작 방법

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61138356A (ja) * 1984-12-10 1986-06-25 Nippon Denso Co Ltd １チツプマイクロコントロ−ラ
US5847555A (en) * 1995-08-01 1998-12-08 Lewis; Dennis E. Source voltage sensitive load controller
JPH09128092A (ja) * 1995-10-31 1997-05-16 Toshiba Corp 情報処理装置
JPH10336883A (ja) * 1997-04-02 1998-12-18 Toshiba Corp 電力系統の脱調検出方法および脱調検出装置
KR100280435B1 (ko) 1998-01-23 2001-02-01 김영환 엠씨유의파워노이즈방지회로
US6804793B2 (en) * 2001-03-16 2004-10-12 Hewlett-Packard Development Company, L.P. Manipulating an integrated circuit clock in response to early detection of an operation known to trigger an internal disturbance
US6804557B1 (en) * 2001-10-11 2004-10-12 Pacesetter, Inc. Battery monitoring system for an implantable medical device
JP2004013820A (ja) * 2002-06-11 2004-01-15 Matsushita Electric Ind Co Ltd クロック制御回路
JP4259928B2 (ja) 2003-06-11 2009-04-30 株式会社リコー 移送物体検出装置，原稿読取装置および画像形成装置
JP4463115B2 (ja) * 2005-01-04 2010-05-12 株式会社ルネサステクノロジ 半導体装置
JP2007034839A (ja) * 2005-07-28 2007-02-08 Matsushita Electric Ind Co Ltd 集積回路の動作周波数制御方法
JP4510039B2 (ja) 2007-02-15 2010-07-21 Ｏｋｉセミコンダクタ株式会社 位相同期回路
CN101105713A (zh) * 2007-08-24 2008-01-16 威盛电子股份有限公司 数据传输速率调整方法以及计算机系统
JP4821749B2 (ja) * 2007-09-25 2011-11-24 株式会社デンソー クロック供給制御回路
US8648645B2 (en) * 2010-05-25 2014-02-11 Oracle International Corporation Microprocessor performance and power optimization through self calibrated inductive voltage droop monitoring and correction
US8669794B2 (en) * 2012-02-21 2014-03-11 Qualcomm Incorporated Circuit for detecting a voltage change using a time-to-digital converter
JP5890207B2 (ja) * 2012-03-13 2016-03-22 ルネサスエレクトロニクス株式会社 半導体装置
JP2014052969A (ja) 2012-09-10 2014-03-20 Renesas Electronics Corp クロック周波数制御装置、半導体装置
US9223365B2 (en) * 2013-03-16 2015-12-29 Intel Corporation Method and apparatus for controlled reset sequences without parallel fuses and PLL'S
CN103607112B (zh) * 2013-12-01 2016-03-02 西安电子科技大学 自适应开关频率调整电路
US9141177B1 (en) * 2014-03-21 2015-09-22 Western Digital Technologies, Inc. Data storage device employing glitch compensation for power loss detection
US9634676B2 (en) * 2015-07-01 2017-04-25 Qualcomm Incorporated Circuits and methods providing clock frequency adjustment in response to supply voltage changes

Also Published As

Publication number Publication date
US20170075404A1 (en) 2017-03-16
US20190129488A1 (en) 2019-05-02
CN106547637A (zh) 2017-03-29
US10782763B2 (en) 2020-09-22
JP2017058911A (ja) 2017-03-23
CN106547637B (zh) 2021-07-02
US10222847B2 (en) 2019-03-05

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