JP2016536576A5 - - Google Patents

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Publication number
JP2016536576A5
JP2016536576A5 JP2016519750A JP2016519750A JP2016536576A5 JP 2016536576 A5 JP2016536576 A5 JP 2016536576A5 JP 2016519750 A JP2016519750 A JP 2016519750A JP 2016519750 A JP2016519750 A JP 2016519750A JP 2016536576 A5 JP2016536576 A5 JP 2016536576A5
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JP
Japan
Prior art keywords
scale
encoder
photodetector
incremental
encoder device
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Application number
JP2016519750A
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English (en)
Japanese (ja)
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JP2016536576A (ja
JP7153997B2 (ja
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Priority claimed from PCT/EP2014/070614 external-priority patent/WO2015049173A1/en
Publication of JP2016536576A publication Critical patent/JP2016536576A/ja
Publication of JP2016536576A5 publication Critical patent/JP2016536576A5/ja
Application granted granted Critical
Publication of JP7153997B2 publication Critical patent/JP7153997B2/ja
Active legal-status Critical Current
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JP2016519750A 2013-10-01 2014-09-26 基準マーク検出器配列 Active JP7153997B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP13275237 2013-10-01
EP13275237.9 2013-10-01
PCT/EP2014/070614 WO2015049173A1 (en) 2013-10-01 2014-09-26 Reference mark detector arrangement

Publications (3)

Publication Number Publication Date
JP2016536576A JP2016536576A (ja) 2016-11-24
JP2016536576A5 true JP2016536576A5 (enExample) 2017-11-02
JP7153997B2 JP7153997B2 (ja) 2022-10-17

Family

ID=49301402

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016519750A Active JP7153997B2 (ja) 2013-10-01 2014-09-26 基準マーク検出器配列

Country Status (6)

Country Link
US (1) US10281301B2 (enExample)
EP (1) EP3052898B1 (enExample)
JP (1) JP7153997B2 (enExample)
CN (1) CN106104216B (enExample)
ES (1) ES2882114T3 (enExample)
WO (1) WO2015049173A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017203210A1 (en) * 2016-05-25 2017-11-30 Renishaw Plc Adaptive reference mark detection process
US10295378B2 (en) * 2017-06-29 2019-05-21 Mitutoyo Corporation Contamination and defect resistant optical encoder configuration outputting structured illumination to a scale plane for providing displacement signals
DE102018202556A1 (de) * 2018-02-20 2019-08-22 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
EP3623769A1 (en) * 2018-09-12 2020-03-18 Renishaw PLC Measurement device
EP3663723A1 (en) 2018-12-04 2020-06-10 Renishaw PLC Encoder apparatus
CN209570108U (zh) * 2018-12-05 2019-11-01 惠科股份有限公司 一种用于显示面板的刻度尺和测量装置
JP7039642B2 (ja) * 2020-04-01 2022-03-22 株式会社東京精密 リニア・スケールを有するエンコーダ
JP7475973B2 (ja) * 2020-06-08 2024-04-30 キヤノン株式会社 光学式エンコーダ及び制御装置
CN112344859A (zh) * 2020-09-14 2021-02-09 桂林电子科技大学 一种基于光栅读头组合的位移测量方法
DE102020134604B4 (de) 2020-12-22 2022-07-14 Smaract Gmbh Vorrichtung und Verfahren zur Positionsbestimmung
EP4390327A1 (en) 2022-12-20 2024-06-26 Renishaw PLC Encoder apparatus
WO2024134155A1 (en) 2022-12-20 2024-06-27 Renishaw Plc Encoder apparatus

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62172219A (ja) * 1986-03-14 1987-07-29 Ishikawajima Harima Heavy Ind Co Ltd 回転検出器
JP2586121B2 (ja) 1988-09-30 1997-02-26 キヤノン株式会社 ロータリーエンコーダの原点検出系
JP2670457B2 (ja) 1989-09-29 1997-10-29 キヤノン株式会社 零点位置検出装置
JP3530573B2 (ja) 1994-04-27 2004-05-24 キヤノン株式会社 光学式変位センサ
DE4428590C2 (de) 1994-08-12 1996-06-20 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
GB9424969D0 (en) 1994-12-10 1995-02-08 Renishaw Plc Opto-electronic scale reading apparatus
DE69622297T2 (de) 1995-02-21 2002-11-21 Canon K.K., Tokio/Tokyo Vorrichtung zur Bestimmung einer Verschiebung und deren Verwendung in einer Einrichtung zur Antriebsregelung
JPH08226804A (ja) * 1995-02-21 1996-09-03 Canon Inc 変位情報検出装置及びこれを用いたドライブ制御装置
JP3471971B2 (ja) 1995-05-10 2003-12-02 キヤノン株式会社 複合型のロータリーエンコーダ
JP3591942B2 (ja) * 1995-10-27 2004-11-24 キヤノン株式会社 変位情報検出装置
JP3722949B2 (ja) * 1997-05-27 2005-11-30 株式会社ミツトヨ 光電式エンコーダ
DE19754595B4 (de) * 1997-12-10 2011-06-01 Dr. Johannes Heidenhain Gmbh Lichtelektrische Positionsmeßeinrichtung
DE19854733A1 (de) 1998-11-27 2000-05-31 Heidenhain Gmbh Dr Johannes Abtasteinheit einer Positionsmeßeinrichtung
DE60033075T3 (de) 1999-04-16 2012-08-30 Canon K.K. Kodierer
DE19941318A1 (de) * 1999-08-31 2001-03-15 Heidenhain Gmbh Dr Johannes Optische Positionsmeßeinrichtung
JP2001356028A (ja) 2000-06-14 2001-12-26 Olympus Optical Co Ltd 光学式エンコーダ
GB0103582D0 (en) 2001-02-14 2001-03-28 Renishaw Plc Position determination system
WO2003021194A2 (en) 2001-08-30 2003-03-13 Microe Systems Corporation Reference point talbot encoder
JP4266105B2 (ja) * 2002-08-28 2009-05-20 サムタク株式会社 原点設定型リニヤスケール
GB0316921D0 (en) 2003-07-19 2003-08-27 Renishaw Plc Reader for a scale marking
DE112004002244B4 (de) 2003-11-20 2013-11-28 Mitsubishi Denki K.K. Optischer Codierer
JP2005326266A (ja) 2004-05-14 2005-11-24 Sharp Corp 反射型位置エンコーダ
GB0413710D0 (en) 2004-06-21 2004-07-21 Renishaw Plc Scale reading apparatus
JP2006071535A (ja) * 2004-09-03 2006-03-16 Mitsutoyo Corp 変位検出装置
JP4869628B2 (ja) * 2005-05-26 2012-02-08 オリンパス株式会社 光学式エンコーダ
GB0522651D0 (en) 2005-11-07 2005-12-14 Renishaw Plc Scale and readhead system
JP5308059B2 (ja) 2008-04-25 2013-10-09 株式会社ミツトヨ 光電式エンコーダ用スケール
JP2010223636A (ja) * 2009-03-19 2010-10-07 Olympus Corp 光学式エンコーダ
GB0909724D0 (en) 2009-06-05 2009-07-22 Renishaw Plc Position measurement encoder and method of operation
US9632315B2 (en) 2010-10-21 2017-04-25 Lockheed Martin Corporation Head-mounted display apparatus employing one or more fresnel lenses
DE102011076055A1 (de) * 2011-05-18 2012-11-22 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung

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