JP2016513898A - タイムインターリーブ型アナログ／デジタル変換器の欠陥の推定 - Google Patents

タイムインターリーブ型アナログ／デジタル変換器の欠陥の推定 Download PDF

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Publication number
JP2016513898A
JP2016513898A JP2015560709A JP2015560709A JP2016513898A JP 2016513898 A JP2016513898 A JP 2016513898A JP 2015560709 A JP2015560709 A JP 2015560709A JP 2015560709 A JP2015560709 A JP 2015560709A JP 2016513898 A JP2016513898 A JP 2016513898A
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Japan
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analog
digital
digital converters
configuration
signal
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JP2015560709A
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Japanese (ja)
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JP2016513898A5 (enExample
Inventor
ロルフ スンドブラッド
ロルフ スンドブラッド
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アナカトゥム デザイン アーベー
アナカトゥム デザイン アーベー
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Publication of JP2016513898A5 publication Critical patent/JP2016513898A5/ja
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Analogue/Digital Conversion (AREA)
JP2015560709A 2013-03-08 2014-03-07 タイムインターリーブ型アナログ／デジタル変換器の欠陥の推定 Pending JP2016513898A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361774967P 2013-03-08 2013-03-08
US61/774,967 2013-03-08
PCT/EP2014/054467 WO2014135685A1 (en) 2013-03-08 2014-03-07 Estimation of imperfections of a time-interleaved analog-to-digital converter

Publications (2)

Publication Number Publication Date
JP2016513898A true JP2016513898A (ja) 2016-05-16
JP2016513898A5 JP2016513898A5 (enExample) 2017-04-13

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JP2015560709A Pending JP2016513898A (ja) 2013-03-08 2014-03-07 タイムインターリーブ型アナログ／デジタル変換器の欠陥の推定

Country Status (7)

Country Link
US (1) US9331708B2 (enExample)
EP (1) EP2965432B1 (enExample)
JP (1) JP2016513898A (enExample)
KR (1) KR101735581B1 (enExample)
CN (1) CN105075126B (enExample)
TW (1) TWI605687B (enExample)
WO (1) WO2014135685A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8485442B2 (en) 2009-07-02 2013-07-16 Biometric Payment Solutions Electronic transaction verification system with biometric authentication
TWI548212B (zh) * 2014-12-16 2016-09-01 原相科技股份有限公司 電路校正方法以及電路校正系統
WO2017113305A1 (zh) * 2015-12-31 2017-07-06 华为技术有限公司 一种校正装置和方法
US10187078B2 (en) * 2017-02-03 2019-01-22 Qualcomm Incorporated Data converters for mitigating time-interleaved artifacts
US11476860B2 (en) 2018-10-22 2022-10-18 Telefonaktiebolaget Lm Ericsson (Publ) Sub-ADC assignment in TI-ADC
CN113271100B (zh) * 2020-02-17 2023-10-24 创意电子股份有限公司 模拟数字转换器装置以及时脉偏斜校正方法
TWI704773B (zh) * 2020-02-17 2020-09-11 創意電子股份有限公司 類比數位轉換器裝置以及時脈偏斜校正方法
US11569834B2 (en) * 2020-07-28 2023-01-31 AyDeeKay LLC Time-interleaved dynamic-element matching analog-to-digital converter
EP3962069B1 (en) * 2020-08-31 2024-10-16 IniVation AG Event sensor and method for generating a signal stream comprising event data
CN114024549B (zh) * 2022-01-04 2022-04-15 普源精电科技股份有限公司 一种时域交织模数转换器同步装置及方法
US20240097693A1 (en) * 2022-09-20 2024-03-21 Intel Corporation Analog-to-digital converter, receiver, base station, mobile device and method for a time-interleaved analog-to-digital converter

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005252703A (ja) * 2004-03-04 2005-09-15 Thine Electronics Inc アナログ／ディジタル変換回路及びそれを内蔵した半導体集積回路
WO2006126672A1 (ja) * 2005-05-26 2006-11-30 Advantest Corporation アナログデジタル変換装置、プログラム、及び記録媒体
JP2011049746A (ja) * 2009-08-26 2011-03-10 Nec Corp Ａ／ｄ変換装置
US20130106632A1 (en) * 2011-11-02 2013-05-02 Stmicroelectronics (Grenoble 2) Sas Calibration of interleaved adc

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE500357C2 (sv) 1992-01-31 1994-06-06 Silicon Construction Sweden Ab Arrangemang för analog/digital-omvandling
JPH0645936A (ja) 1992-03-18 1994-02-18 Nec Corp アナログ・デジタル変換方式
SE513434C2 (sv) 1999-01-20 2000-09-11 Ericsson Telefon Ab L M Lågenergi PARALLELL ADC
US7292170B2 (en) 2005-06-13 2007-11-06 Texas Instruments Incorporated System and method for improved time-interleaved analog-to-digital converter arrays
ATE417409T1 (de) 2006-02-17 2008-12-15 Sicon Semiconductor Ab Zeitverschachtelter analog-digital-wandler
JP5009919B2 (ja) 2006-08-18 2012-08-29 パナソニック株式会社 Ａ／ｄ変換器
US7538708B2 (en) 2006-12-30 2009-05-26 Teradyne, Inc. Efficient, selective error reduction for parallel, time-interleaved analog-to-digital converter
SE533293C2 (sv) 2008-10-10 2010-08-17 Zoran Corp Analog/digital-omvandlare
ATE543259T1 (de) 2009-01-26 2012-02-15 Fujitsu Semiconductor Ltd Abtastung
US7956788B2 (en) 2009-04-30 2011-06-07 Alcatel-Lucent Usa Inc. Technique for photonic analog-to-digital signal conversion
US7961123B2 (en) 2009-07-09 2011-06-14 Texas Instruments Incorporated Time-interleaved analog-to-digital converter
WO2011038189A1 (en) * 2009-09-25 2011-03-31 Telcordia Technologies, Inc. System and method for selective wavelength interleaved filtered technique (swift) adc
US8310387B2 (en) 2009-11-30 2012-11-13 Intersil Americas Inc. Sampling method for time-interleaved data converters in frequency-multiplexed communications systems
US8212697B2 (en) * 2010-06-15 2012-07-03 Csr Technology Inc. Methods of and arrangements for offset compensation of an analog-to-digital converter
TWI545903B (zh) 2011-03-17 2016-08-11 安娜卡敦設計公司 類比轉數位轉換器（ａｄｃ）之校正
US8519875B2 (en) * 2011-04-12 2013-08-27 Maxim Integrated Products, Inc. System and method for background calibration of time interleaved analog to digital converters
US8611483B2 (en) 2011-06-03 2013-12-17 Maxlinear, Inc. Multi-layer time-interleaved analog-to-digital convertor (ADC)
US8487795B1 (en) 2012-04-18 2013-07-16 Lsi Corporation Time-interleaved track-and-hold circuit using distributed global sine-wave clock
CN102769468B (zh) * 2012-08-13 2016-08-03 复旦大学 一种时间交织流水线型模数转换器结构
US8890729B2 (en) * 2012-12-05 2014-11-18 Crest Semiconductors, Inc. Randomized time-interleaved sample-and-hold system
US8890739B2 (en) * 2012-12-05 2014-11-18 Crest Semiconductors, Inc. Time interleaving analog-to-digital converter
TWI611662B (zh) * 2013-03-08 2018-01-11 安娜卡敦設計公司 可組態的時間交錯類比至數位轉換器
TWI605688B (zh) * 2013-03-08 2017-11-11 安娜卡敦設計公司 有效率的時間交錯類比至數位轉換器
US9000962B1 (en) * 2014-01-28 2015-04-07 Cadence Design Systems, Inc. System and method for interleaved analog-to-digital conversion having scalable self-calibration of timing

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005252703A (ja) * 2004-03-04 2005-09-15 Thine Electronics Inc アナログ／ディジタル変換回路及びそれを内蔵した半導体集積回路
WO2006126672A1 (ja) * 2005-05-26 2006-11-30 Advantest Corporation アナログデジタル変換装置、プログラム、及び記録媒体
JP2011049746A (ja) * 2009-08-26 2011-03-10 Nec Corp Ａ／ｄ変換装置
US20130106632A1 (en) * 2011-11-02 2013-05-02 Stmicroelectronics (Grenoble 2) Sas Calibration of interleaved adc

Also Published As

Publication number Publication date
US9331708B2 (en) 2016-05-03
EP2965432A1 (en) 2016-01-13
WO2014135685A1 (en) 2014-09-12
CN105075126B (zh) 2018-01-02
TWI605687B (zh) 2017-11-11
KR101735581B1 (ko) 2017-05-15
TW201448481A (zh) 2014-12-16
US20160006447A1 (en) 2016-01-07
KR20150127592A (ko) 2015-11-17
CN105075126A (zh) 2015-11-18
EP2965432B1 (en) 2018-01-31

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