JP2016100592A5 - - Google Patents

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JP2016100592A5
JP2016100592A5 JP2014239389A JP2014239389A JP2016100592A5 JP 2016100592 A5 JP2016100592 A5 JP 2016100592A5 JP 2014239389 A JP2014239389 A JP 2014239389A JP 2014239389 A JP2014239389 A JP 2014239389A JP 2016100592 A5 JP2016100592 A5 JP 2016100592A5
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Japan
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crystalline
layer
structure according
convex portion
epitaxial
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JP2014239389A
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Japanese (ja)
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JP2016100592A (ja
JP6945119B2 (ja
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JP2014239389A 2014-11-26 2014-11-26 結晶性積層構造体およびその製造方法 Active JP6945119B2 (ja)

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JP2014239389A JP6945119B2 (ja) 2014-11-26 2014-11-26 結晶性積層構造体およびその製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014239389A JP6945119B2 (ja) 2014-11-26 2014-11-26 結晶性積層構造体およびその製造方法

Publications (3)

Publication Number Publication Date
JP2016100592A JP2016100592A (ja) 2016-05-30
JP2016100592A5 true JP2016100592A5 (OSRAM) 2018-02-15
JP6945119B2 JP6945119B2 (ja) 2021-10-06

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JP (1) JP6945119B2 (OSRAM)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018057797A1 (en) * 2016-09-22 2018-03-29 IQE, plc Integrated epitaxial metal electrodes
CN114836833B (zh) * 2017-08-21 2024-12-06 株式会社Flosfia 用于制造结晶膜的方法
CN109423694B (zh) 2017-08-21 2022-09-09 株式会社Flosfia 结晶膜、包括结晶膜的半导体装置以及制造结晶膜的方法
CN109423690B (zh) * 2017-08-21 2022-09-16 株式会社Flosfia 用于制造结晶膜的方法
US11488821B2 (en) 2018-06-26 2022-11-01 Flosfia Inc. Film forming method and crystalline multilayer structure
WO2020004250A1 (ja) 2018-06-26 2020-01-02 株式会社Flosfia 結晶性酸化物膜
JP6909191B2 (ja) 2018-09-27 2021-07-28 信越化学工業株式会社 積層体、半導体装置及び積層体の製造方法
JP7315136B2 (ja) 2018-12-26 2023-07-26 株式会社Flosfia 結晶性酸化物半導体
JP7315137B2 (ja) 2018-12-26 2023-07-26 株式会社Flosfia 結晶性酸化物膜
JP2020186153A (ja) 2019-05-15 2020-11-19 トヨタ自動車株式会社 半導体層の成長方法、半導体装置の製造方法、及び、バルク結晶の製造方法
WO2021044845A1 (ja) 2019-09-03 2021-03-11 株式会社Flosfia 結晶膜、結晶膜を含む半導体装置、及び結晶膜の製造方法
CN114423883B (zh) 2019-09-30 2024-03-12 日本碍子株式会社 α-Ga2O3系半导体膜
CN114556585A (zh) * 2019-09-30 2022-05-27 株式会社Flosfia 层叠结构体和半导体装置
JP7453609B2 (ja) * 2019-11-19 2024-03-21 株式会社Flosfia 剥離方法および結晶性酸化物膜の製造方法
JP7510123B2 (ja) * 2020-01-27 2024-07-03 株式会社Flosfia 半導体装置
KR102777027B1 (ko) 2020-01-27 2025-03-05 가부시키가이샤 플로스피아 반도체 장치 및 반도체 장치의 제조 방법
US11804519B2 (en) 2020-04-24 2023-10-31 Flosfia Inc. Crystalline multilayer structure, semiconductor device, and method of manufacturing crystalline structure
US11694894B2 (en) 2020-04-24 2023-07-04 Flosfia Inc. Crystalline film containing a crystalline metal oxide and method for manufacturing the same under partial pressure
JP7649944B2 (ja) * 2020-04-24 2025-03-24 株式会社Flosfia 結晶性積層構造体の製造方法
EP4407660A1 (en) 2021-09-22 2024-07-31 Shin-Etsu Chemical Co., Ltd. Film-forming method, film-forming device, and crystalline oxide film
EP4539108A1 (en) 2022-06-08 2025-04-16 Shin-Etsu Chemical Co., Ltd. Film formation method and film formation device
KR102675554B1 (ko) * 2022-06-29 2024-06-14 웨이브로드 주식회사 그룹3족 질화물 반도체 소자용 템플릿
US12402381B2 (en) 2022-07-12 2025-08-26 Flosfia, Inc. Semiconductor device

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Publication number Priority date Publication date Assignee Title
JP2000231122A (ja) * 1999-02-12 2000-08-22 Sony Corp 電気光学装置、電気光学装置用の駆動基板、及びこれらの製造方法
JP5180189B2 (ja) * 2006-04-25 2013-04-10 ナショナル ユニヴァーシティー オブ シンガポール エピタキシャル横方向異常成長窒化ガリウムテンプレート上での酸化亜鉛膜成長の方法
DE102010011895B4 (de) * 2010-03-18 2013-07-25 Freiberger Compound Materials Gmbh Verfahren zur Herstellung eines semipolaren Gruppe III-Nitrid-Kristalls, Substrat, freistehendes semipolares Substrat und Verwendung der Substrate
KR101932576B1 (ko) * 2010-09-13 2018-12-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
US8569754B2 (en) * 2010-11-05 2013-10-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US8809852B2 (en) * 2010-11-30 2014-08-19 Semiconductor Energy Laboratory Co., Ltd. Semiconductor film, semiconductor element, semiconductor device, and method for manufacturing the same
US20140217471A1 (en) * 2011-09-08 2014-08-07 National Institute of Information and Communicatio ns Technology Ga2O3 SEMICONDUCTOR ELEMENT
JP5343224B1 (ja) * 2012-09-28 2013-11-13 Roca株式会社 半導体装置および結晶

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