JP2014527254A5 - - Google Patents
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- JP2014527254A5 JP2014527254A5 JP2014527335A JP2014527335A JP2014527254A5 JP 2014527254 A5 JP2014527254 A5 JP 2014527254A5 JP 2014527335 A JP2014527335 A JP 2014527335A JP 2014527335 A JP2014527335 A JP 2014527335A JP 2014527254 A5 JP2014527254 A5 JP 2014527254A5
- Authority
- JP
- Japan
- Prior art keywords
- memory
- threshold voltage
- cell
- programmed
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims 19
- 239000007787 solid Substances 0.000 claims 6
- 230000000694 effects Effects 0.000 claims 4
- 238000001514 detection method Methods 0.000 claims 1
- 230000003631 expected effect Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/219,439 US9030870B2 (en) | 2011-08-26 | 2011-08-26 | Threshold voltage compensation in a multilevel memory |
| US13/219,439 | 2011-08-26 | ||
| PCT/US2012/052333 WO2013032928A1 (en) | 2011-08-26 | 2012-08-24 | Threshold voltage compensation in a memory |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2014527254A JP2014527254A (ja) | 2014-10-09 |
| JP2014527254A5 true JP2014527254A5 (enExample) | 2015-10-08 |
Family
ID=47743566
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014527335A Pending JP2014527254A (ja) | 2011-08-26 | 2012-08-24 | メモリ内の閾値電圧補償 |
Country Status (7)
| Country | Link |
|---|---|
| US (4) | US9030870B2 (enExample) |
| EP (2) | EP2748821B1 (enExample) |
| JP (1) | JP2014527254A (enExample) |
| KR (2) | KR102318742B1 (enExample) |
| CN (1) | CN103843068B (enExample) |
| TW (1) | TWI512736B (enExample) |
| WO (1) | WO2013032928A1 (enExample) |
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| US10755781B2 (en) | 2018-06-06 | 2020-08-25 | Micron Technology, Inc. | Techniques for programming multi-level self-selecting memory cell |
| US10559353B2 (en) * | 2018-06-06 | 2020-02-11 | Micron Technology, Inc. | Weight storage using memory device |
| CN109408402B (zh) * | 2018-10-09 | 2021-06-01 | 长江存储科技有限责任公司 | 一种闪存器的数据写入方法及闪存器 |
| US10636501B1 (en) * | 2019-03-18 | 2020-04-28 | Sandisk Technologies Llc | Memory device with reduced neighbor word line interference using adjustable voltage on source-side unselected word line |
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| JP2023078545A (ja) | 2021-11-26 | 2023-06-07 | キオクシア株式会社 | メモリシステム及び不揮発性メモリ |
| US11942179B2 (en) * | 2022-04-11 | 2024-03-26 | Macronix International Co., Ltd. | Threshold voltage variation compensation in integrated circuits |
| US12087391B2 (en) * | 2022-08-30 | 2024-09-10 | Micron Technology, Inc. | Drift compensation for codewords in memory |
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| US9076547B2 (en) | 2012-04-05 | 2015-07-07 | Micron Technology, Inc. | Level compensation in multilevel memory |
| US9030870B2 (en) | 2011-08-26 | 2015-05-12 | Micron Technology, Inc. | Threshold voltage compensation in a multilevel memory |
-
2011
- 2011-08-26 US US13/219,439 patent/US9030870B2/en active Active
-
2012
- 2012-07-31 US US13/563,314 patent/US9087594B2/en active Active
- 2012-08-24 JP JP2014527335A patent/JP2014527254A/ja active Pending
- 2012-08-24 EP EP12828784.4A patent/EP2748821B1/en active Active
- 2012-08-24 KR KR1020187031249A patent/KR102318742B1/ko active Active
- 2012-08-24 TW TW101130887A patent/TWI512736B/zh active
- 2012-08-24 KR KR1020147007737A patent/KR101914519B1/ko active Active
- 2012-08-24 CN CN201280048762.8A patent/CN103843068B/zh active Active
- 2012-08-24 WO PCT/US2012/052333 patent/WO2013032928A1/en not_active Ceased
- 2012-08-24 EP EP19150644.3A patent/EP3493211B1/en active Active
-
2015
- 2015-05-08 US US14/707,684 patent/US9520183B2/en active Active
- 2015-07-20 US US14/803,918 patent/US9646683B2/en active Active
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