JP2014516467A - 酸化アルミニウムベースの金属配線バリア - Google Patents
酸化アルミニウムベースの金属配線バリア Download PDFInfo
- Publication number
- JP2014516467A JP2014516467A JP2013556984A JP2013556984A JP2014516467A JP 2014516467 A JP2014516467 A JP 2014516467A JP 2013556984 A JP2013556984 A JP 2013556984A JP 2013556984 A JP2013556984 A JP 2013556984A JP 2014516467 A JP2014516467 A JP 2014516467A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- aluminum oxide
- aluminum
- silicon
- paste
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 title claims abstract description 49
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 37
- 239000002184 metal Substances 0.000 title claims abstract description 37
- 230000004888 barrier function Effects 0.000 title claims abstract description 29
- 238000000034 method Methods 0.000 claims abstract description 50
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 44
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 44
- 238000009792 diffusion process Methods 0.000 claims abstract description 21
- 238000002161 passivation Methods 0.000 claims abstract description 17
- 150000002739 metals Chemical class 0.000 claims abstract description 7
- 229940112824 paste Drugs 0.000 claims description 51
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 43
- 229910052710 silicon Inorganic materials 0.000 claims description 43
- 239000010703 silicon Substances 0.000 claims description 43
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 33
- 238000001035 drying Methods 0.000 claims description 27
- 238000004519 manufacturing process Methods 0.000 claims description 22
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 19
- 239000000758 substrate Substances 0.000 claims description 19
- 229910052796 boron Inorganic materials 0.000 claims description 17
- 230000015572 biosynthetic process Effects 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 14
- 238000003980 solgel method Methods 0.000 claims description 9
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 8
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 8
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 7
- 229910052698 phosphorus Inorganic materials 0.000 claims description 7
- 239000011574 phosphorus Substances 0.000 claims description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 6
- 239000002243 precursor Substances 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 5
- 229910052684 Cerium Inorganic materials 0.000 claims description 4
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 4
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 4
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 4
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 4
- 229910052785 arsenic Inorganic materials 0.000 claims description 4
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 4
- 229910017052 cobalt Inorganic materials 0.000 claims description 4
- 239000010941 cobalt Substances 0.000 claims description 4
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 4
- 229910052733 gallium Inorganic materials 0.000 claims description 4
- 239000007789 gas Substances 0.000 claims description 4
- 229910052732 germanium Inorganic materials 0.000 claims description 4
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 4
- 229910052742 iron Inorganic materials 0.000 claims description 4
- 229910052759 nickel Inorganic materials 0.000 claims description 4
- 229910052758 niobium Inorganic materials 0.000 claims description 4
- 239000010955 niobium Substances 0.000 claims description 4
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 4
- 229910052718 tin Inorganic materials 0.000 claims description 4
- 239000011135 tin Substances 0.000 claims description 4
- 229910052719 titanium Inorganic materials 0.000 claims description 4
- 239000010936 titanium Substances 0.000 claims description 4
- 229910052727 yttrium Inorganic materials 0.000 claims description 4
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 4
- 229910052725 zinc Inorganic materials 0.000 claims description 4
- 239000011701 zinc Substances 0.000 claims description 4
- 229910052726 zirconium Inorganic materials 0.000 claims description 4
- 229940022504 aluminum oxide paste Drugs 0.000 claims description 3
- 238000000137 annealing Methods 0.000 claims description 3
- 239000012298 atmosphere Substances 0.000 claims description 3
- 229910052757 nitrogen Inorganic materials 0.000 claims description 3
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 claims 1
- 239000000203 mixture Substances 0.000 abstract description 25
- 235000012431 wafers Nutrition 0.000 description 40
- 239000000976 ink Substances 0.000 description 35
- 238000000576 coating method Methods 0.000 description 24
- 229910004298 SiO 2 Inorganic materials 0.000 description 21
- 239000011248 coating agent Substances 0.000 description 20
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 18
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 12
- 238000005530 etching Methods 0.000 description 11
- 238000007639 printing Methods 0.000 description 11
- 229910052581 Si3N4 Inorganic materials 0.000 description 10
- 230000009471 action Effects 0.000 description 10
- 238000010304 firing Methods 0.000 description 10
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 10
- 239000002800 charge carrier Substances 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 229910052814 silicon oxide Inorganic materials 0.000 description 8
- 239000002253 acid Substances 0.000 description 7
- 239000000654 additive Substances 0.000 description 7
- 238000009472 formulation Methods 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 description 6
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 description 6
- 102100028961 Peroxisome proliferator-activated receptor gamma coactivator 1-beta Human genes 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 150000004703 alkoxides Chemical class 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- YRKCREAYFQTBPV-UHFFFAOYSA-N acetylacetone Chemical compound CC(=O)CC(C)=O YRKCREAYFQTBPV-UHFFFAOYSA-N 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 238000013459 approach Methods 0.000 description 4
- 239000008139 complexing agent Substances 0.000 description 4
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000005240 physical vapour deposition Methods 0.000 description 4
- 238000005215 recombination Methods 0.000 description 4
- 230000006798 recombination Effects 0.000 description 4
- YGSDEFSMJLZEOE-UHFFFAOYSA-N salicylic acid Chemical compound OC(=O)C1=CC=CC=C1O YGSDEFSMJLZEOE-UHFFFAOYSA-N 0.000 description 4
- 238000007650 screen-printing Methods 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- 239000011877 solvent mixture Substances 0.000 description 4
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- 150000007513 acids Chemical class 0.000 description 3
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical class [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 3
- -1 aluminum alkoxides Chemical class 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical compound [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 3
- 239000002738 chelating agent Substances 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 239000003989 dielectric material Substances 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 238000001000 micrograph Methods 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 150000007524 organic acids Chemical class 0.000 description 3
- 230000035515 penetration Effects 0.000 description 3
- 239000013074 reference sample Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000006641 stabilisation Effects 0.000 description 3
- 238000011105 stabilization Methods 0.000 description 3
- 238000009736 wetting Methods 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 2
- 229940120146 EDTMP Drugs 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- QPCDCPDFJACHGM-UHFFFAOYSA-N N,N-bis{2-[bis(carboxymethyl)amino]ethyl}glycine Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(=O)O)CCN(CC(O)=O)CC(O)=O QPCDCPDFJACHGM-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical class [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 229910052810 boron oxide Inorganic materials 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 239000006059 cover glass Substances 0.000 description 2
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 2
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 description 2
- 229940090960 diethylenetriamine pentamethylene phosphonic acid Drugs 0.000 description 2
- DUYCTCQXNHFCSJ-UHFFFAOYSA-N dtpmp Chemical compound OP(=O)(O)CN(CP(O)(O)=O)CCN(CP(O)(=O)O)CCN(CP(O)(O)=O)CP(O)(O)=O DUYCTCQXNHFCSJ-UHFFFAOYSA-N 0.000 description 2
- NFDRPXJGHKJRLJ-UHFFFAOYSA-N edtmp Chemical compound OP(O)(=O)CN(CP(O)(O)=O)CCN(CP(O)(O)=O)CP(O)(O)=O NFDRPXJGHKJRLJ-UHFFFAOYSA-N 0.000 description 2
- 230000002209 hydrophobic effect Effects 0.000 description 2
- 150000004679 hydroxides Chemical class 0.000 description 2
- 229910052500 inorganic mineral Inorganic materials 0.000 description 2
- 239000008204 material by function Substances 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- 235000005985 organic acids Nutrition 0.000 description 2
- FJKROLUGYXJWQN-UHFFFAOYSA-N papa-hydroxy-benzoic acid Natural products OC(=O)C1=CC=C(O)C=C1 FJKROLUGYXJWQN-UHFFFAOYSA-N 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 229960003330 pentetic acid Drugs 0.000 description 2
- 229910001392 phosphorus oxide Inorganic materials 0.000 description 2
- LFGREXWGYUGZLY-UHFFFAOYSA-N phosphoryl Chemical class [P]=O LFGREXWGYUGZLY-UHFFFAOYSA-N 0.000 description 2
- 239000003880 polar aprotic solvent Substances 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 235000019260 propionic acid Nutrition 0.000 description 2
- 239000003586 protic polar solvent Substances 0.000 description 2
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 229960004889 salicylic acid Drugs 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- WOZZOSDBXABUFO-UHFFFAOYSA-N tri(butan-2-yloxy)alumane Chemical compound [Al+3].CCC(C)[O-].CCC(C)[O-].CCC(C)[O-] WOZZOSDBXABUFO-UHFFFAOYSA-N 0.000 description 2
- BRRSNXCXLSVPFC-UHFFFAOYSA-N 2,3,4-Trihydroxybenzoic acid Chemical compound OC(=O)C1=CC=C(O)C(O)=C1O BRRSNXCXLSVPFC-UHFFFAOYSA-N 0.000 description 1
- WXTMDXOMEHJXQO-UHFFFAOYSA-N 2,5-dihydroxybenzoic acid Chemical compound OC(=O)C1=CC(O)=CC=C1O WXTMDXOMEHJXQO-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- FIPWRIJSWJWJAI-UHFFFAOYSA-N Butyl carbitol 6-propylpiperonyl ether Chemical compound C1=C(CCC)C(COCCOCCOCCCC)=CC2=C1OCO2 FIPWRIJSWJWJAI-UHFFFAOYSA-N 0.000 description 1
- 208000032953 Device battery issue Diseases 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 239000000443 aerosol Substances 0.000 description 1
- 230000001476 alcoholic effect Effects 0.000 description 1
- SMZOGRDCAXLAAR-UHFFFAOYSA-N aluminium isopropoxide Chemical compound [Al+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] SMZOGRDCAXLAAR-UHFFFAOYSA-N 0.000 description 1
- JPUHCPXFQIXLMW-UHFFFAOYSA-N aluminium triethoxide Chemical compound CCO[Al](OCC)OCC JPUHCPXFQIXLMW-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000007766 curtain coating Methods 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 1
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 1
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 238000007373 indentation Methods 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 229910000464 lead oxide Inorganic materials 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000000813 microcontact printing Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- MGFYIUFZLHCRTH-UHFFFAOYSA-N nitrilotriacetic acid Chemical compound OC(=O)CN(CC(O)=O)CC(O)=O MGFYIUFZLHCRTH-UHFFFAOYSA-N 0.000 description 1
- 239000012454 non-polar solvent Substances 0.000 description 1
- 238000007645 offset printing Methods 0.000 description 1
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 description 1
- 238000007649 pad printing Methods 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 229960005235 piperonyl butoxide Drugs 0.000 description 1
- 239000002798 polar solvent Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 238000004094 preconcentration Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000012925 reference material Substances 0.000 description 1
- 238000007761 roller coating Methods 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 238000007764 slot die coating Methods 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 238000012421 spiking Methods 0.000 description 1
- 238000011272 standard treatment Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 description 1
- ZFXYFBGIUFBOJW-UHFFFAOYSA-N theophylline Chemical compound O=C1N(C)C(=O)N(C)C2=C1NC=N2 ZFXYFBGIUFBOJW-UHFFFAOYSA-N 0.000 description 1
- 238000009997 thermal pre-treatment Methods 0.000 description 1
- 239000002562 thickening agent Substances 0.000 description 1
- 238000010023 transfer printing Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
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Abstract
Description
これらの技術は、2つの条件を満たさなければならない:
a)それらは、ケイ素中で局所抵抗接点を生成させることができなければならない
および
b)これらの抵抗接点は、電動ミラー(electronic mirror)のタイプとして機能する背面表面場の形成により、基材からの大部分の電荷担体の輸送を確保しなければならないが、これらの接点への少数の電荷担体の輸送を抑制しなければならない。
[2]F.S. Grasso, L. Gautero, J. Rentsch, R. Preu, R. Lanzafame, Presented at the 25th European PV Solar Energy Conference and Exhibition, 2010, Valencia, Spain
[4]M.N. van den Donker, P.A.M. Wijnen, S. Krantz, V. Siarheyeva, L. Janssen, M. Fleuster, I.G. Romijn, A.A. Mewe, M.W.P.E. Lamers, A.F. Stassen, E.E. Bende, A.W. Weeber, P. van Eijk, H. Kerp, K. Albertsen, Proceedings of the 23rd European Photovoltaic Solar Energy Conference, 2008, Valencia, Spain
[5]I.G. Romijn, A.A. Mewe, E. Kossen, I. Cesar, E.E. Bende, M. N. van den Donker, P. van Eijk, E. Granneman, P. Vermont, A.W. Weeber, 2010, Valencia, Spain
したがって、本発明の目的は、方法およびそれに用いることができる組成物を提供することであり、これにより、誘電体層が(これにより、不動態化層と、また焼成処理の間のアルミニウムの「スパイクスルー」に対するバリア層との両方を製造することができ)、安価に、および簡単な手法でゾルゲル法に基づいてシリコンウエハに適用することができる。好ましくは、この層を、単一の処理ステップで、この目的に要求される組成物の簡単な選択的印刷により適用することが可能でなければならない。
目的は、特に、不動態化層とアルミニウムおよび/または他の関連金属ならびに金属ペーストに対する拡散バリア層との役割を果たす誘電体層の製造方法により達成され、ここで、インクもしくはペーストの形態での酸化アルミニウムゾルまたは酸化アルミニウムハイブリッドゾルを、表面全体にわたって、あるいは体系的に適用し、高温で加温することにより圧縮して乾燥させ、アモルファスAl2O3および/または酸化アルミニウムハイブリッドの層を形成させる。このようにして、<100nmの厚みを有する、アモルファスAl2O3および/または酸化アルミニウムハイブリッドの層が形成される。
実験により、対応する誘電体を、シリコンウエハ上で、ゾルゲル法により製造することができることが示され、ここで、純酸化アルミニウムゾルまたは酸化アルミニウムハイブリッドゾルを、この目的のために使用することができる。この処理により十分な層厚で製造される誘電体は、通常結晶性ケイ素太陽電池上での接点の製造に使用される、従来のスクリーン印刷可能なアルミニウム含有金属ペーストと比較して、有利には、好適な熱前処置後に、アルミニウムによる「スパイクスルー」に対する拡散抵抗性を示す。
層形成成分を、好ましくは、好適なインク組成物中で、インクの固体含有量が0.5重量%と10重量%との間、好ましくは1重量%と5重量%との間となるような比で用いる。
ゾルゲルペースト処方物は、上記のインクと同じ目的で使用することができる。
より良い理解のために、および本発明を例示するために、以下に、本発明の保護の範囲内である例を示す。これらの例はまた、可能な変法の例示にも役立つ。しかしながら、記載した本発明の原理の一般的有効性により、本例は、本願の保護の範囲をこれらのみに減縮することに適するものではない。
例および説明において、ならびに請求の範囲において、示される温度は常に℃である。
出願番号11 001 920.5の欧州特許出願からの例4に従い:25mlのイソプロパノールと25mlのジエチレングリコールモノエチルエーテルとの中の3gのサリチル酸と1gのアセチルアセトンとを、最初に100mlの丸底フラスコに導入する。4.9gのアルミニウムトリ−sec−ブトキシドを、溶液に加え、混合物を、さらに10分間撹拌する。
SiO2のバリア作用の可能性を調査するため、4つのウエハ片(Cz、p型、片面研磨済、10Ω*cm)を、スピンコーティング(任意に多層コーティング、必要な場合には、ここで、各層を、例1に記載するように予め熱的に圧縮する)によるゾルゲル法においてSiO2で、種々の層厚で被覆し、適用したゾルを、熱的に圧縮する(450℃で30分間、例1に記載したとおり)。各ウエハの半分は、HFディップによりエッチングしない。
図3は、金属配線化前のウエハ片の写真を示す。
図4は、エッチング処置後の表面の顕微鏡写真を示す。写真は、アルミニウムペーストの焼成およびその後のエッチング除去後の、SiO2がコートされたウエハの表面を示す(a 258nmのSiO2;b 386nmのSiO2;c 508nmのSiO2;d 639nmのSiO2;e バリアなし;f 金属ペースト無しの基準物)。
3つのウエハ片(Cz、p型、片面研磨済、10Ω*cm)を、種々の層厚を与えるように、スピンコーティングによるゾルゲルベースのAl2O3層によりコートする(任意に多層コーティング、必要な場合には、ここで、各層を、例1に記載するように予め熱的に圧縮する)。ゾル層を、熱的に圧縮し(450℃で30分間、例1に記載したとおり)、Al2O3層の半分を、続いて希HF溶液でのエッチングにより除去する。
アルミニウム金属ペーストを、続いてウエハの表面全体に、20μmの層厚で、ハンドコーターにより適用し、ウエハを、4つのゾーンを有するベルト炉中で100s焼成する(T設定点:850/800/800/800℃)。焼成処理後、アルミニウムペーストを、リン酸(85%)/硝酸(69%)/酢酸(100%)混合物(v/vで:80/5/5、残部は水)でのエッチングにより除去する。次いでAl2O3層および寄生的に(parasitically)形成したあらゆるSiO2を、希HFでエッチング除去する。
図7は、種々の層厚でコートされたサンプル、コートされていない基準サンプルおよび同時に処理したが、アルミニウムで金属配線化していない基準物のECV測定を示す。170nmおよび220nmのAl2O3で不動態化した点で、基材ドープ(ホウ素 〜1*1016原子/cm3)のみを検出することができる。ケイ素中の正の電荷担体を測定した。
Claims (12)
- 不動態化層と、アルミニウムおよび/または他の関連金属ならびに金属ペーストに対する拡散バリアとの役割を果たす誘電体層の製造方法であって、インクもしくはペーストの形態での酸化アルミニウムゾルまたは酸化アルミニウムハイブリッドゾルを、表面全体にわたって、あるいは体系的に適用し、高温で加温することにより圧縮して乾燥させ、アモルファスAl2O3および/または酸化アルミニウムハイブリッドの層を形成させることを特徴とする、前記方法。
- <100nmの厚みを有するアモルファスAl2O3および/または酸化アルミニウムハイブリッドの層を形成させることを特徴とする、請求項1に記載の方法。
- 少なくとも150nmの厚みを有するアモルファスAl2O3および/または酸化アルミニウムハイブリッドの層を形成させるために、酸化アルミニウムゾルまたは酸化アルミニウムハイブリッドゾルを何回も適用し、乾燥させることを特徴とする、請求項1に記載の方法。
- 乾燥を、300℃と1000℃との間の温度で、好ましくは350℃と450℃との間の範囲で、行うことを特徴とする、請求項1、2および3のいずれか一項に記載の方法。
- 適用された層の乾燥を、2〜5分間の時間内で行うことを特徴とする、請求項1〜4のいずれか一項に記載の方法。
- 適用され、乾燥された層(単数および複数)を、続く窒素および/またはフォーミングガスの雰囲気中における400〜500℃でのアニーリングにより不動態化することを特徴とする、請求項1〜5のいずれか一項に記載の方法。
- ホウ素、ガリウム、ケイ素、ゲルマニウム、亜鉛、スズ、リン、チタン、ジルコニウム、イットリウム、ニッケル、コバルト、鉄、セリウム、ニオブ、ヒ素または鉛の酸化物を形成するための、ドープに供される少なくとも1種の前駆体を含む、ゾルゲル法に基づく酸化アルミニウムインクまたは酸化アルミニウムペーストを適用することを特徴とする、請求項1〜6のいずれか一項に記載の方法。
- ケイ素層のホウ素ドープを、ホウ素含有酸化アルミニウムのインクまたはペーストが適用された層を高温で乾燥させることにより行うことを特徴とする、請求項1〜7のいずれか一項に記載の方法。
- ホウ素ドープを、ケイ素中でのエミッタ形成と共に行うことを特徴とする、請求項8に記載の方法。
- ケイ素層のリンドープを、リン含有酸化アルミニウムのインクまたはペーストが適用された層を高温で乾燥させることにより行うことを特徴とする、請求項1〜7のいずれか一項に記載の方法。
- p−ドープ基材層に対して不動態化特性を有し、請求項1〜9のいずれか一項に記載の方法により得られる、誘電体酸化アルミニウム層。
- アルミニウムおよび他の関連金属に対する拡散バリアの役割を果たし、請求項1〜6のいずれか一項に記載の方法により得られる、誘電体層。
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JP2014072448A (ja) * | 2012-09-28 | 2014-04-21 | Hitachi Chemical Co Ltd | 半導体基板パッシベーション膜形成用組成物、パッシベーション膜付半導体基板及びその製造方法、並びに太陽電池素子及びその製造方法 |
JP2014072447A (ja) * | 2012-09-28 | 2014-04-21 | Hitachi Chemical Co Ltd | 半導体基板パッシベーション膜形成用組成物、パッシベーション膜付半導体基板及びその製造方法、並びに太陽電池素子及びその製造方法 |
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KR20140117400A (ko) * | 2012-01-06 | 2014-10-07 | 히타치가세이가부시끼가이샤 | 패시베이션막이 있는 반도체 기판과 그 제조 방법, 및 태양전지 소자와 그 제조 방법 |
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KR20160113093A (ko) * | 2013-09-16 | 2016-09-28 | 솔렉셀, 인크. | 태양 전지의 베이스 영역 및 이미터 영역용의 레이저 가공 |
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WO2016150549A2 (de) * | 2015-03-23 | 2016-09-29 | Merck Patent Gmbh | Druckbare tinte zur verwendung als diffusions- und legierungsbarriere zur herstellung von hocheffizienten kristallinen siliziumsolarzellen |
WO2016165811A1 (de) * | 2015-04-15 | 2016-10-20 | Merck Patent Gmbh | Verfahren zur herstellung von solarzellen unter verwendung von phosphor-diffusionshemmenden, druckbaren dotiermedien |
KR20170139580A (ko) | 2015-04-15 | 2017-12-19 | 메르크 파텐트 게엠베하 | 공확산 공정에서 인 확산을 동시 억제하는 스크린 인쇄 가능한 붕소 도핑 페이스트 |
CN107532300A (zh) | 2015-04-15 | 2018-01-02 | 默克专利股份有限公司 | 用于硅晶片的局部掺杂的抑制寄生扩散和基于溶胶‑凝胶的可印刷的掺杂介质 |
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JP2017195377A (ja) * | 2017-05-19 | 2017-10-26 | 日立化成株式会社 | 半導体基板パッシベーション膜形成用組成物、パッシベーション膜付半導体基板及びその製造方法、並びに太陽電池素子及びその製造方法 |
US10622502B1 (en) | 2019-05-23 | 2020-04-14 | Zhejiang Kaiying New Materials Co., Ltd. | Solar cell edge interconnects |
US10749045B1 (en) | 2019-05-23 | 2020-08-18 | Zhejiang Kaiying New Materials Co., Ltd. | Solar cell side surface interconnects |
CN111834492A (zh) * | 2020-07-22 | 2020-10-27 | 常州时创能源股份有限公司 | TOPCon电池的制备方法 |
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- 2012-02-09 CN CN2012800119575A patent/CN103403885A/zh active Pending
- 2012-02-09 US US14/004,074 patent/US20130341769A1/en not_active Abandoned
- 2012-02-09 JP JP2013556984A patent/JP6185845B2/ja not_active Expired - Fee Related
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JP2014072448A (ja) * | 2012-09-28 | 2014-04-21 | Hitachi Chemical Co Ltd | 半導体基板パッシベーション膜形成用組成物、パッシベーション膜付半導体基板及びその製造方法、並びに太陽電池素子及びその製造方法 |
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Also Published As
Publication number | Publication date |
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JP6185845B2 (ja) | 2017-08-23 |
CA2829269A1 (en) | 2012-09-13 |
TW201241924A (en) | 2012-10-16 |
WO2012119684A2 (de) | 2012-09-13 |
SG193304A1 (en) | 2013-10-30 |
AU2012224973B2 (en) | 2016-01-07 |
EP2683777A2 (de) | 2014-01-15 |
US20130341769A1 (en) | 2013-12-26 |
AU2012224973A1 (en) | 2013-10-24 |
KR20140022012A (ko) | 2014-02-21 |
CN103403885A (zh) | 2013-11-20 |
WO2012119684A3 (de) | 2013-01-31 |
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