JP2014228474A5 - - Google Patents

Download PDF

Info

Publication number
JP2014228474A5
JP2014228474A5 JP2013110011A JP2013110011A JP2014228474A5 JP 2014228474 A5 JP2014228474 A5 JP 2014228474A5 JP 2013110011 A JP2013110011 A JP 2013110011A JP 2013110011 A JP2013110011 A JP 2013110011A JP 2014228474 A5 JP2014228474 A5 JP 2014228474A5
Authority
JP
Japan
Prior art keywords
detection
curvature
detection elements
diameter
radius
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013110011A
Other languages
English (en)
Japanese (ja)
Other versions
JP6127717B2 (ja
JP2014228474A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2013110011A priority Critical patent/JP6127717B2/ja
Priority claimed from JP2013110011A external-priority patent/JP6127717B2/ja
Priority to CN201410063011.4A priority patent/CN104181181B/zh
Publication of JP2014228474A publication Critical patent/JP2014228474A/ja
Publication of JP2014228474A5 publication Critical patent/JP2014228474A5/ja
Application granted granted Critical
Publication of JP6127717B2 publication Critical patent/JP6127717B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2013110011A 2013-05-24 2013-05-24 Ｘ線分析装置 Active JP6127717B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013110011A JP6127717B2 (ja) 2013-05-24 2013-05-24 Ｘ線分析装置
CN201410063011.4A CN104181181B (zh) 2013-05-24 2014-02-24 X射线分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013110011A JP6127717B2 (ja) 2013-05-24 2013-05-24 Ｘ線分析装置

Publications (3)

Publication Number Publication Date
JP2014228474A JP2014228474A (ja) 2014-12-08
JP2014228474A5 true JP2014228474A5 (enExample) 2015-12-17
JP6127717B2 JP6127717B2 (ja) 2017-05-17

Family

ID=51962404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013110011A Active JP6127717B2 (ja) 2013-05-24 2013-05-24 Ｘ線分析装置

Country Status (2)

Country Link
JP (1) JP6127717B2 (enExample)
CN (1) CN104181181B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106680865B (zh) * 2017-03-08 2018-11-06 沈阳东软医疗系统有限公司 一种射线源组件的漏射线测试方法及设备
JP2018169276A (ja) 2017-03-29 2018-11-01 株式会社島津製作所 Ｘ線分析装置
PL3425377T3 (pl) * 2017-07-05 2022-09-19 Rigaku Corporation Detektor promieniowania rentgenowskiego i technika sterowania detektorem promieniowania rentgenowskiego
CN110618148B (zh) * 2019-09-19 2021-07-06 西安交通大学 基于单色x射线单晶应力测量的调节装置及其方法
JP7687689B2 (ja) * 2022-02-14 2025-06-03 株式会社リガク Ｘ線回折装置及び計測方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8300419A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
JPH01285845A (ja) * 1988-05-12 1989-11-16 Fuji Electric Co Ltd 回折ｘ線測定装置
JPH01291148A (ja) * 1988-05-17 1989-11-22 Fuji Electric Co Ltd 回折ｘ線測定装置
JP2973566B2 (ja) * 1991-04-25 1999-11-08 株式会社島津製作所 Ｘ線回折装置
JPH05188019A (ja) * 1991-07-23 1993-07-27 Hitachi Ltd Ｘ線複合分析装置
JPH05281161A (ja) * 1992-04-03 1993-10-29 Mc Sci:Kk Ｘ線回折装置
JP3364042B2 (ja) * 1995-04-13 2003-01-08 三菱重工業株式会社 高速ｘ線ｃｔシステムの検出器位置決め装置
JPH0968507A (ja) * 1995-08-31 1997-03-11 Shimadzu Corp Ｘ線回折装置
US5724401A (en) * 1996-01-24 1998-03-03 The Penn State Research Foundation Large angle solid state position sensitive x-ray detector system
JPH1114566A (ja) * 1997-06-23 1999-01-22 Rigaku Corp Ｘ線回折測定及び蛍光ｘ線測定のためのｘ線装置
JPH11258186A (ja) * 1998-03-16 1999-09-24 Kansai Shingijutsu Kenkyusho:Kk Ｘ線による応力測定方法及び装置
JP3703125B2 (ja) * 1998-07-17 2005-10-05 株式会社リガク Ｘ線装置及びｘ線測定方法
JP2000258366A (ja) * 1999-03-05 2000-09-22 Rigaku Corp 微小部ｘ線回折装置
JP3548556B2 (ja) * 2001-12-28 2004-07-28 株式会社リガク Ｘ線回折装置
KR20050019620A (ko) * 2003-08-20 2005-03-03 삼성전자주식회사 마이크로 회절 시스템 및 이를 이용한 시료 분석방법
JP2005121528A (ja) * 2003-10-17 2005-05-12 Rigaku Corp ２次元イメージ素子及びそれを利用した２次元イメージ検出装置並びにｘ線分析装置
CN100485373C (zh) * 2004-07-14 2009-05-06 西南技术工程研究所 短波长x射线衍射测量装置和方法
JP2008539930A (ja) * 2005-05-12 2008-11-20 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 超短スキャン及び最新データのより強い重み付けを実行する連続コンピュータ断層撮影
CN101113961A (zh) * 2006-07-27 2008-01-30 上海英迈吉东影图像设备有限公司 一种具有x射线背散射和断层扫描的成像系统

Similar Documents

Publication Publication Date Title
JP2015536519A5 (enExample)
JP2018068093A5 (enExample)
JP2014143409A5 (ja) 金属酸化物膜
JP2016538150A5 (enExample)
EP2951859A4 (en) CONTOUR-BASED ARRAY INSPECTION OF STRUCTURED DEFECTS
JP2014228474A5 (enExample)
JP2015038868A5 (enExample)
JP2017507747A5 (enExample)
JP2017527382A5 (enExample)
JP2016526929A5 (enExample)
JP2015515738A5 (enExample)
JP2015515597A5 (enExample)
JP2012053691A5 (enExample)
JP2011226839A5 (enExample)
JP2015206001A5 (enExample)
JP2018121576A5 (enExample)
JP2019112877A5 (enExample)
BR112019008126A2 (pt) Sub portado operado repetidamente por pressão com coletor de múltiplas esferas
JP2016082579A5 (enExample)
JP2014179509A5 (enExample)
RU2013154970A (ru) Устройство управления с 6 степенями свободы
JP2014229752A5 (enExample)
JP2016531601A5 (enExample)
JP2015102676A5 (enExample)
ES2548354B1 (es) Dispositivo electródico para la detección de ión cloruro, procedimiento de fabricación y uso de dicho dispositivo