JP6127717B2 - Ｘ線分析装置 - Google Patents

Ｘ線分析装置 Download PDF

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Publication number
JP6127717B2
JP6127717B2 JP2013110011A JP2013110011A JP6127717B2 JP 6127717 B2 JP6127717 B2 JP 6127717B2 JP 2013110011 A JP2013110011 A JP 2013110011A JP 2013110011 A JP2013110011 A JP 2013110011A JP 6127717 B2 JP6127717 B2 JP 6127717B2
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detection
detector
detection elements
sample
ray
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JP2013110011A
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Japanese (ja)
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JP2014228474A5 (enExample
JP2014228474A (ja
Inventor
哲弥 米田
哲弥 米田
隆雄 丸井
隆雄 丸井
正之 松尾
正之 松尾
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2013110011A priority Critical patent/JP6127717B2/ja
Priority to CN201410063011.4A priority patent/CN104181181B/zh
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Publication of JP2014228474A5 publication Critical patent/JP2014228474A5/ja
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JP2013110011A 2013-05-24 2013-05-24 Ｘ線分析装置 Active JP6127717B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013110011A JP6127717B2 (ja) 2013-05-24 2013-05-24 Ｘ線分析装置
CN201410063011.4A CN104181181B (zh) 2013-05-24 2014-02-24 X射线分析装置

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JP2013110011A JP6127717B2 (ja) 2013-05-24 2013-05-24 Ｘ線分析装置

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JP2014228474A JP2014228474A (ja) 2014-12-08
JP2014228474A5 JP2014228474A5 (enExample) 2015-12-17
JP6127717B2 true JP6127717B2 (ja) 2017-05-17

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JP2013110011A Active JP6127717B2 (ja) 2013-05-24 2013-05-24 Ｘ線分析装置

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CN (1) CN104181181B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106680865B (zh) * 2017-03-08 2018-11-06 沈阳东软医疗系统有限公司 一种射线源组件的漏射线测试方法及设备
JP2018169276A (ja) 2017-03-29 2018-11-01 株式会社島津製作所 Ｘ線分析装置
PL3425377T3 (pl) * 2017-07-05 2022-09-19 Rigaku Corporation Detektor promieniowania rentgenowskiego i technika sterowania detektorem promieniowania rentgenowskiego
CN110618148B (zh) * 2019-09-19 2021-07-06 西安交通大学 基于单色x射线单晶应力测量的调节装置及其方法
JP7687689B2 (ja) * 2022-02-14 2025-06-03 株式会社リガク Ｘ線回折装置及び計測方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8300419A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
JPH01285845A (ja) * 1988-05-12 1989-11-16 Fuji Electric Co Ltd 回折ｘ線測定装置
JPH01291148A (ja) * 1988-05-17 1989-11-22 Fuji Electric Co Ltd 回折ｘ線測定装置
JP2973566B2 (ja) * 1991-04-25 1999-11-08 株式会社島津製作所 Ｘ線回折装置
JPH05188019A (ja) * 1991-07-23 1993-07-27 Hitachi Ltd Ｘ線複合分析装置
JPH05281161A (ja) * 1992-04-03 1993-10-29 Mc Sci:Kk Ｘ線回折装置
JP3364042B2 (ja) * 1995-04-13 2003-01-08 三菱重工業株式会社 高速ｘ線ｃｔシステムの検出器位置決め装置
JPH0968507A (ja) * 1995-08-31 1997-03-11 Shimadzu Corp Ｘ線回折装置
US5724401A (en) * 1996-01-24 1998-03-03 The Penn State Research Foundation Large angle solid state position sensitive x-ray detector system
JPH1114566A (ja) * 1997-06-23 1999-01-22 Rigaku Corp Ｘ線回折測定及び蛍光ｘ線測定のためのｘ線装置
JPH11258186A (ja) * 1998-03-16 1999-09-24 Kansai Shingijutsu Kenkyusho:Kk Ｘ線による応力測定方法及び装置
JP3703125B2 (ja) * 1998-07-17 2005-10-05 株式会社リガク Ｘ線装置及びｘ線測定方法
JP2000258366A (ja) * 1999-03-05 2000-09-22 Rigaku Corp 微小部ｘ線回折装置
JP3548556B2 (ja) * 2001-12-28 2004-07-28 株式会社リガク Ｘ線回折装置
KR20050019620A (ko) * 2003-08-20 2005-03-03 삼성전자주식회사 마이크로 회절 시스템 및 이를 이용한 시료 분석방법
JP2005121528A (ja) * 2003-10-17 2005-05-12 Rigaku Corp ２次元イメージ素子及びそれを利用した２次元イメージ検出装置並びにｘ線分析装置
CN100485373C (zh) * 2004-07-14 2009-05-06 西南技术工程研究所 短波长x射线衍射测量装置和方法
JP2008539930A (ja) * 2005-05-12 2008-11-20 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 超短スキャン及び最新データのより強い重み付けを実行する連続コンピュータ断層撮影
CN101113961A (zh) * 2006-07-27 2008-01-30 上海英迈吉东影图像设备有限公司 一种具有x射线背散射和断层扫描的成像系统

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JP2014228474A (ja) 2014-12-08
CN104181181A (zh) 2014-12-03
CN104181181B (zh) 2017-07-14

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