JP2013541844A5 - - Google Patents

Download PDF

Info

Publication number
JP2013541844A5
JP2013541844A5 JP2013531609A JP2013531609A JP2013541844A5 JP 2013541844 A5 JP2013541844 A5 JP 2013541844A5 JP 2013531609 A JP2013531609 A JP 2013531609A JP 2013531609 A JP2013531609 A JP 2013531609A JP 2013541844 A5 JP2013541844 A5 JP 2013541844A5
Authority
JP
Japan
Prior art keywords
during
droplet
period
generating
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013531609A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013541844A (ja
Filing date
Publication date
Priority claimed from US13/157,233 external-priority patent/US8653437B2/en
Application filed filed Critical
Publication of JP2013541844A publication Critical patent/JP2013541844A/ja
Publication of JP2013541844A5 publication Critical patent/JP2013541844A5/ja
Pending legal-status Critical Current

Links

JP2013531609A 2010-10-04 2011-09-06 Euv非出力期間中のlpp駆動レーザー出力のための方法 Pending JP2013541844A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US40456410P 2010-10-04 2010-10-04
US61/404,564 2010-10-04
US13/157,233 2011-06-09
US13/157,233 US8653437B2 (en) 2010-10-04 2011-06-09 EUV light source with subsystem(s) for maintaining LPP drive laser output during EUV non-output periods
PCT/US2011/050565 WO2012050685A1 (en) 2010-10-04 2011-09-06 Method for lpp drive laser output during euv non-output periods

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016125237A Division JP6182645B2 (ja) 2010-10-04 2016-06-24 Euv非出力期間中のlpp駆動レーザー出力のためのデバイス

Publications (2)

Publication Number Publication Date
JP2013541844A JP2013541844A (ja) 2013-11-14
JP2013541844A5 true JP2013541844A5 (enExample) 2014-10-16

Family

ID=45888994

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2013531609A Pending JP2013541844A (ja) 2010-10-04 2011-09-06 Euv非出力期間中のlpp駆動レーザー出力のための方法
JP2016125237A Active JP6182645B2 (ja) 2010-10-04 2016-06-24 Euv非出力期間中のlpp駆動レーザー出力のためのデバイス

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2016125237A Active JP6182645B2 (ja) 2010-10-04 2016-06-24 Euv非出力期間中のlpp駆動レーザー出力のためのデバイス

Country Status (6)

Country Link
US (2) US8653437B2 (enExample)
EP (1) EP2624913B1 (enExample)
JP (2) JP2013541844A (enExample)
KR (1) KR101884706B1 (enExample)
TW (1) TWI530231B (enExample)
WO (1) WO2012050685A1 (enExample)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8653437B2 (en) * 2010-10-04 2014-02-18 Cymer, Llc EUV light source with subsystem(s) for maintaining LPP drive laser output during EUV non-output periods
US10966308B2 (en) * 2010-10-04 2021-03-30 Asml Netherlands B.V. EUV light source with subsystem(s) for maintaining LPP drive laser output during EUV non-output periods
WO2013174620A1 (en) * 2012-05-21 2013-11-28 Asml Netherlands B.V. Radiation source
JP6152109B2 (ja) 2012-09-11 2017-06-21 ギガフォトン株式会社 極端紫外光生成方法及び極端紫外光生成装置
DE102012217120A1 (de) 2012-09-24 2014-03-27 Trumpf Laser- Und Systemtechnik Gmbh EUV-Strahlungserzeugungsvorrichtung und Betriebsverfahren dafür
DE102012217520A1 (de) 2012-09-27 2014-03-27 Trumpf Laser- Und Systemtechnik Gmbh Strahlführungseinrichtung und Verfahren zum Einstellen des Öffnungswinkels eines Laserstrahls
NL2011533A (en) * 2012-10-31 2014-05-06 Asml Netherlands Bv Method and apparatus for generating radiation.
JP6010438B2 (ja) * 2012-11-27 2016-10-19 浜松ホトニクス株式会社 量子ビーム生成装置、量子ビーム生成方法、及び、レーザ核融合装置
TWI618453B (zh) * 2013-01-10 2018-03-11 Asml荷蘭公司 用以調整雷射光束脈衝時序以調節極端紫外光劑量之方法及系統
WO2014161698A1 (en) * 2013-04-05 2014-10-09 Asml Netherlands B.V. Source collector apparatus, lithographic apparatus and method
JP6195474B2 (ja) 2013-05-31 2017-09-13 ギガフォトン株式会社 極端紫外光生成装置及び極端紫外光生成システムにおけるレーザシステムの制御方法
JP6434404B2 (ja) * 2013-06-20 2018-12-05 ギガフォトン株式会社 極端紫外光生成システム
WO2015045102A1 (ja) 2013-09-27 2015-04-02 ギガフォトン株式会社 レーザ装置及び極端紫外光生成システム
US9374882B2 (en) * 2013-12-12 2016-06-21 Asml Netherlands B.V. Final focus assembly for extreme ultraviolet light source
WO2015139900A1 (en) * 2014-03-18 2015-09-24 Asml Netherlands B.V. Fuel stream generator
US9506871B1 (en) 2014-05-25 2016-11-29 Kla-Tencor Corporation Pulsed laser induced plasma light source
WO2016013114A1 (ja) 2014-07-25 2016-01-28 ギガフォトン株式会社 極端紫外光生成装置
WO2016013102A1 (ja) 2014-07-25 2016-01-28 ギガフォトン株式会社 極端紫外光生成装置
KR102336300B1 (ko) 2014-11-17 2021-12-07 삼성전자주식회사 극자외선 광원 장치 및 극자외선 광 발생 방법
WO2016079810A1 (ja) 2014-11-18 2016-05-26 ギガフォトン株式会社 極端紫外光生成装置及び極端紫外光の生成方法
WO2017059314A1 (en) * 2015-02-27 2017-04-06 Asml Netherlands B.V. Optical isolation module
US9832855B2 (en) 2015-10-01 2017-11-28 Asml Netherlands B.V. Optical isolation module
US9625824B2 (en) * 2015-04-30 2017-04-18 Taiwan Semiconductor Manufacturing Company, Ltd Extreme ultraviolet lithography collector contamination reduction
US9538628B1 (en) * 2015-06-11 2017-01-03 Taiwan Semiconductor Manufacturing Co., Ltd. Method for EUV power improvement with fuel droplet trajectory stabilization
TWI739755B (zh) * 2015-08-12 2021-09-21 荷蘭商Asml荷蘭公司 極紫外線光源中之目標擴張率控制
US9426872B1 (en) * 2015-08-12 2016-08-23 Asml Netherlands B.V. System and method for controlling source laser firing in an LPP EUV light source
JP6649958B2 (ja) * 2015-10-02 2020-02-19 ギガフォトン株式会社 極端紫外光生成システム
US10048199B1 (en) * 2017-03-20 2018-08-14 Asml Netherlands B.V. Metrology system for an extreme ultraviolet light source
KR102675689B1 (ko) * 2018-05-14 2024-06-14 트럼프 레이저시스템즈 포 세미컨덕터 매뉴팩처링 게엠베하 초점 조정 장치 및 이를 구비한 euv 방사선 발생 장치
US10925142B2 (en) * 2018-07-31 2021-02-16 Taiwan Semiconductor Manufacturing Co., Ltd. EUV radiation source for lithography exposure process
CN112771736B (zh) * 2018-09-26 2024-07-09 Asml荷兰有限公司 在光刻系统中提供高精度延迟的装置和方法
US11166361B2 (en) * 2018-11-30 2021-11-02 Taiwan Semiconductor Manufacturing Co., Ltd. Method and device for measuring contamination in EUV source
NL2024949A (en) 2019-03-21 2020-09-22 Asml Netherlands Bv Method for controlling a lithographic system
JP7435195B2 (ja) * 2020-04-15 2024-02-21 ウシオ電機株式会社 極端紫外光光源装置およびプラズマ位置調整方法
CN115842282A (zh) * 2022-11-16 2023-03-24 中国科学院上海光学精密机械研究所 一种高功率euv光刻光源的双脉冲驱动光源
WO2025131510A1 (en) * 2023-12-22 2025-06-26 Asml Netherlands B.V. Method and apparatus for power supply synchronization

Family Cites Families (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61153935A (ja) * 1984-12-26 1986-07-12 Toshiba Corp プラズマx線発生装置
DE3586244T2 (de) * 1984-12-26 2000-04-20 Kabushiki Kaisha Toshiba Vorrichtung zur Erzeugung von Weich-Röntgenstrahlen durch ein Hochenergiebündel.
JPS62151017A (ja) * 1985-12-25 1987-07-06 Nec Corp 遅延回路
US6567450B2 (en) 1999-12-10 2003-05-20 Cymer, Inc. Very narrow band, two chamber, high rep rate gas discharge laser system
US6549551B2 (en) 1999-09-27 2003-04-15 Cymer, Inc. Injection seeded laser with precise timing control
US6625191B2 (en) 1999-12-10 2003-09-23 Cymer, Inc. Very narrow band, two chamber, high rep rate gas discharge laser system
WO2001031678A1 (en) * 1999-10-27 2001-05-03 Jmar Research, Inc. Method and radiation generating system using microtargets
US6693939B2 (en) 2001-01-29 2004-02-17 Cymer, Inc. Laser lithography light source with beam delivery
US7518787B2 (en) 2006-06-14 2009-04-14 Cymer, Inc. Drive laser for EUV light source
US20050259709A1 (en) 2002-05-07 2005-11-24 Cymer, Inc. Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate
US7843632B2 (en) 2006-08-16 2010-11-30 Cymer, Inc. EUV optics
US7378673B2 (en) 2005-02-25 2008-05-27 Cymer, Inc. Source material dispenser for EUV light source
US7897947B2 (en) 2007-07-13 2011-03-01 Cymer, Inc. Laser produced plasma EUV light source having a droplet stream produced using a modulated disturbance wave
US7372056B2 (en) 2005-06-29 2008-05-13 Cymer, Inc. LPP EUV plasma source material target delivery system
US7405416B2 (en) 2005-02-25 2008-07-29 Cymer, Inc. Method and apparatus for EUV plasma source target delivery
US7439530B2 (en) 2005-06-29 2008-10-21 Cymer, Inc. LPP EUV light source drive laser system
US7491954B2 (en) 2006-10-13 2009-02-17 Cymer, Inc. Drive laser delivery systems for EUV light source
US7465946B2 (en) 2004-03-10 2008-12-16 Cymer, Inc. Alternative fuels for EUV light source
US7928416B2 (en) * 2006-12-22 2011-04-19 Cymer, Inc. Laser produced plasma EUV light source
US7916388B2 (en) 2007-12-20 2011-03-29 Cymer, Inc. Drive laser for EUV light source
US20060255298A1 (en) 2005-02-25 2006-11-16 Cymer, Inc. Laser produced plasma EUV light source with pre-pulse
US7415056B2 (en) 2006-03-31 2008-08-19 Cymer, Inc. Confocal pulse stretcher
US7476886B2 (en) 2006-08-25 2009-01-13 Cymer, Inc. Source material collection unit for a laser produced plasma EUV light source
US7598509B2 (en) 2004-11-01 2009-10-06 Cymer, Inc. Laser produced plasma EUV light source
US6928093B2 (en) 2002-05-07 2005-08-09 Cymer, Inc. Long delay and high TIS pulse stretcher
US8653437B2 (en) * 2010-10-04 2014-02-18 Cymer, Llc EUV light source with subsystem(s) for maintaining LPP drive laser output during EUV non-output periods
US7671349B2 (en) 2003-04-08 2010-03-02 Cymer, Inc. Laser produced plasma EUV light source
DE10215469B4 (de) * 2002-04-05 2005-03-17 Xtreme Technologies Gmbh Anordnung zur Unterdrückung von Teilchenemission bei einer Strahlungserzeugung auf Basis eines heißen Plasmas
US6792076B2 (en) * 2002-05-28 2004-09-14 Northrop Grumman Corporation Target steering system for EUV droplet generators
JP4088485B2 (ja) * 2002-07-04 2008-05-21 オムロンレーザーフロント株式会社 光波発生装置及び光波発生方法
US7087914B2 (en) 2004-03-17 2006-08-08 Cymer, Inc High repetition rate laser produced plasma EUV light source
US7164144B2 (en) 2004-03-10 2007-01-16 Cymer Inc. EUV light source
GB2420238B (en) * 2004-11-04 2007-03-21 Instro Prec Ltd Correlation apparatus and method
US7145631B2 (en) * 2004-12-27 2006-12-05 Asml Netherlands B.V. Lithographic apparatus, illumination system and method for mitigating debris particles
DE102005020521B4 (de) * 2005-04-29 2013-05-02 Xtreme Technologies Gmbh Verfahren und Anordnung zur Unterdrückung von Debris bei der Erzeugung kurzwelliger Strahlung auf Basis eines Plasmas
US7718985B1 (en) * 2005-11-01 2010-05-18 University Of Central Florida Research Foundation, Inc. Advanced droplet and plasma targeting system
JP5156192B2 (ja) * 2006-01-24 2013-03-06 ギガフォトン株式会社 極端紫外光源装置
US8158960B2 (en) 2007-07-13 2012-04-17 Cymer, Inc. Laser produced plasma EUV light source
JP4885587B2 (ja) * 2006-03-28 2012-02-29 株式会社小松製作所 ターゲット供給装置
JP5280066B2 (ja) * 2008-02-28 2013-09-04 ギガフォトン株式会社 極端紫外光源装置
US7872245B2 (en) 2008-03-17 2011-01-18 Cymer, Inc. Systems and methods for target material delivery in a laser produced plasma EUV light source
JP2010103499A (ja) * 2008-09-29 2010-05-06 Komatsu Ltd 極端紫外光源装置および極端紫外光生成方法
JP5314433B2 (ja) * 2009-01-06 2013-10-16 ギガフォトン株式会社 極端紫外光源装置
NL2004085A (en) * 2009-03-11 2010-09-14 Asml Netherlands Bv Radiation source, lithographic apparatus, and device manufacturing method.
WO2011013779A1 (ja) 2009-07-29 2011-02-03 株式会社小松製作所 極端紫外光源装置、極端紫外光源装置の制御方法、およびそのプログラムを記録した記録媒体
US8173985B2 (en) 2009-12-15 2012-05-08 Cymer, Inc. Beam transport system for extreme ultraviolet light source
US8444260B2 (en) * 2010-07-27 2013-05-21 Eastman Kodak Company Liquid film moving over solid catcher surface

Similar Documents

Publication Publication Date Title
JP2013541844A5 (enExample)
TWI616119B (zh) 用以在極紫外線光源中控制靶材小滴之系統及方法
TWI705734B (zh) 產生極紫外(euv)光之方法及euv系統
JP2014528069A5 (enExample)
US9241395B2 (en) System and method for controlling droplet timing in an LPP EUV light source
PL2051042T3 (pl) Urządzenie do tomograficznego rozpoznawania obiektów
HRP20230759T1 (hr) Medicinski laserski sistem
US8809823B1 (en) System and method for controlling droplet timing and steering in an LPP EUV light source
JP2011229660A5 (ja) 被検体情報取得装置
WO2013180884A3 (en) System and method to optimize extreme ultraviolet light generation
JP2014195822A5 (enExample)
MX2016003664A (es) Dispositivo y procedimiento de marcado laser de una lentilla oftalmica con un pulso laser de longitud de onda y energia por pulsos seleccionados.
JP2007528607A5 (enExample)
KR102632454B1 (ko) Lpp euv 광 소스 내의 레이저 발화를 제어하는 시스템 및 방법
JP2016518674A5 (enExample)
JP2016504931A5 (enExample)
RU2012154309A (ru) Устройство формирования изображения, способ и программа автоматической фокусировки
TW201532074A (zh) 極紫外光源
WO2014145305A1 (en) Laser emission-based control of beam positioner
JP2016516585A5 (enExample)
JP2006167804A5 (enExample)
RU2015150165A (ru) Неинвазивное устройство для лечения кожи с использованием лазерного света
WO2009090643A3 (en) Laser surgical method
JP2015502665A5 (enExample)
CN105511231A (zh) Euv光源和曝光装置