JP2013254945A5 - - Google Patents

Download PDF

Info

Publication number
JP2013254945A5
JP2013254945A5 JP2013098202A JP2013098202A JP2013254945A5 JP 2013254945 A5 JP2013254945 A5 JP 2013254945A5 JP 2013098202 A JP2013098202 A JP 2013098202A JP 2013098202 A JP2013098202 A JP 2013098202A JP 2013254945 A5 JP2013254945 A5 JP 2013254945A5
Authority
JP
Japan
Prior art keywords
data holding
holding unit
electrically connected
data
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013098202A
Other languages
English (en)
Japanese (ja)
Other versions
JP6174899B2 (ja
JP2013254945A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2013098202A priority Critical patent/JP6174899B2/ja
Priority claimed from JP2013098202A external-priority patent/JP6174899B2/ja
Publication of JP2013254945A publication Critical patent/JP2013254945A/ja
Publication of JP2013254945A5 publication Critical patent/JP2013254945A5/ja
Application granted granted Critical
Publication of JP6174899B2 publication Critical patent/JP6174899B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2013098202A 2012-05-11 2013-05-08 半導体装置 Expired - Fee Related JP6174899B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013098202A JP6174899B2 (ja) 2012-05-11 2013-05-08 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012109286 2012-05-11
JP2012109286 2012-05-11
JP2013098202A JP6174899B2 (ja) 2012-05-11 2013-05-08 半導体装置

Publications (3)

Publication Number Publication Date
JP2013254945A JP2013254945A (ja) 2013-12-19
JP2013254945A5 true JP2013254945A5 (enExample) 2016-06-16
JP6174899B2 JP6174899B2 (ja) 2017-08-02

Family

ID=49548479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013098202A Expired - Fee Related JP6174899B2 (ja) 2012-05-11 2013-05-08 半導体装置

Country Status (2)

Country Link
US (1) US9001549B2 (enExample)
JP (1) JP6174899B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102087443B1 (ko) 2012-05-11 2020-03-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 구동 방법
JP2014195241A (ja) 2013-02-28 2014-10-09 Semiconductor Energy Lab Co Ltd 半導体装置
US9607991B2 (en) 2013-09-05 2017-03-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
TWI658597B (zh) 2014-02-07 2019-05-01 日商半導體能源研究所股份有限公司 半導體裝置
KR102581808B1 (ko) 2014-12-18 2023-09-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 센서 장치, 및 전자 기기
DE112017001059T5 (de) * 2016-02-29 2018-11-29 Sony Corporation Halbleiterschaltkreis, verfahren zur ansteuerung des halbleiterschaltkreises und elektronische vorrichtung
JPWO2017158465A1 (ja) 2016-03-18 2019-02-14 株式会社半導体エネルギー研究所 記憶装置
TWI724231B (zh) * 2016-09-09 2021-04-11 日商半導體能源硏究所股份有限公司 記憶體裝置及其工作方法、半導體裝置、電子構件以及電子裝置
CN110168642B (zh) * 2017-01-10 2023-08-01 株式会社半导体能源研究所 半导体装置及其工作方法、电子构件以及电子设备
WO2020139895A1 (en) 2018-12-24 2020-07-02 The Trustees Of Columbia University In The City Of New York Circuits and methods for in-memory computing

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62291168A (ja) * 1986-06-11 1987-12-17 Seiko Instr & Electronics Ltd 不揮発性ram
JPH01307094A (ja) * 1988-06-02 1989-12-12 Seiko Instr Inc 不揮発性ram
JPH0770227B2 (ja) * 1990-10-01 1995-07-31 日鉄セミコンダクター株式会社 半導体メモリの読出し動作制御方法
JPH04366495A (ja) * 1991-06-14 1992-12-18 Kawasaki Steel Corp 不揮発性メモリ
JP4198201B2 (ja) * 1995-06-02 2008-12-17 株式会社ルネサステクノロジ 半導体装置
JP2000293989A (ja) * 1999-04-07 2000-10-20 Nec Corp 強誘電体容量を用いたシャドーramセル及び不揮発性メモリ装置並びにその制御方法
JP5064747B2 (ja) 2005-09-29 2012-10-31 株式会社半導体エネルギー研究所 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法
EP1998373A3 (en) 2005-09-29 2012-10-31 Semiconductor Energy Laboratory Co, Ltd. Semiconductor device having oxide semiconductor layer and manufacturing method thereof
JP5078246B2 (ja) 2005-09-29 2012-11-21 株式会社半導体エネルギー研究所 半導体装置、及び半導体装置の作製方法
JP2007108402A (ja) 2005-10-13 2007-04-26 Kyocera Mita Corp 半導体集積回路
US20100006912A1 (en) * 2008-07-14 2010-01-14 Honeywell International Inc. Planar Metal-Insulator-Metal Circuit Element and Method for Planar Integration of Same
JP5781720B2 (ja) * 2008-12-15 2015-09-24 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
JP2010218671A (ja) * 2009-03-19 2010-09-30 Renesas Electronics Corp 半導体記憶装置
WO2011062075A1 (en) 2009-11-20 2011-05-26 Semiconductor Energy Laboratory Co., Ltd. Nonvolatile latch circuit and logic circuit, and semiconductor device using the same
IN2012DN04871A (enExample) * 2009-12-11 2015-09-25 Semiconductor Energy Laoboratory Co Ltd
KR101729933B1 (ko) 2009-12-18 2017-04-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 불휘발성 래치 회로와 논리 회로, 및 이를 사용한 반도체 장치
WO2011078373A1 (en) * 2009-12-25 2011-06-30 Semiconductor Energy Laboratory Co., Ltd. Memory device, semiconductor device, and electronic device
TWI570719B (zh) 2011-05-20 2017-02-11 半導體能源研究所股份有限公司 儲存裝置及信號處理電路
KR102087443B1 (ko) 2012-05-11 2020-03-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 구동 방법

Similar Documents

Publication Publication Date Title
JP2013254945A5 (enExample)
JP2014160526A5 (ja) 半導体装置
JP2011181905A5 (enExample)
JP2013008435A5 (enExample)
JP2013235644A5 (ja) 記憶回路
JP2012257197A5 (ja) 半導体装置
JP2013243657A5 (enExample)
JP2013009308A5 (ja) 半導体装置
JP2013149969A5 (enExample)
JP2012138160A5 (ja) 半導体装置
JP2016076285A5 (ja) 半導体装置
JP2012134961A5 (ja) 回路
JP2012257200A5 (ja) 半導体装置
JP2013016247A5 (enExample)
JP2013153169A5 (enExample)
JP2012252770A5 (ja) 半導体メモリ装置
JP2013008431A5 (ja) 記憶装置
JP2014038603A5 (enExample)
JP2016054282A5 (enExample)
JP2014007386A5 (ja) 半導体装置
JP2013009300A5 (ja) 記憶装置
JP2014063557A5 (enExample)
JP2015195331A5 (ja) 記憶装置
JP2016115386A5 (ja) 半導体装置
JP2016146227A5 (ja) 半導体装置