JP2012518902A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2012518902A5 JP2012518902A5 JP2011550596A JP2011550596A JP2012518902A5 JP 2012518902 A5 JP2012518902 A5 JP 2012518902A5 JP 2011550596 A JP2011550596 A JP 2011550596A JP 2011550596 A JP2011550596 A JP 2011550596A JP 2012518902 A5 JP2012518902 A5 JP 2012518902A5
- Authority
- JP
- Japan
- Prior art keywords
- lithographic apparatus
- common
- rows
- charged particle
- robot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 claims 6
- 238000001459 lithography Methods 0.000 claims 2
Applications Claiming Priority (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15441109P | 2009-02-22 | 2009-02-22 | |
| US15441509P | 2009-02-22 | 2009-02-22 | |
| US61/154,415 | 2009-02-22 | ||
| US61/154,411 | 2009-02-22 | ||
| US28940709P | 2009-12-23 | 2009-12-23 | |
| US61/289,407 | 2009-12-23 | ||
| US30633310P | 2010-02-19 | 2010-02-19 | |
| US61/306,333 | 2010-02-19 | ||
| PCT/EP2010/052221 WO2010094804A1 (en) | 2009-02-22 | 2010-02-22 | Lithography machine and substrate handling arrangement |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012518902A JP2012518902A (ja) | 2012-08-16 |
| JP2012518902A5 true JP2012518902A5 (enExample) | 2013-04-11 |
| JP5539406B2 JP5539406B2 (ja) | 2014-07-02 |
Family
ID=42035939
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011550596A Expired - Fee Related JP5539406B2 (ja) | 2009-02-22 | 2010-02-22 | リソグラフィマシン及び基板処理構成体 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20110049393A1 (enExample) |
| EP (1) | EP2399271B1 (enExample) |
| JP (1) | JP5539406B2 (enExample) |
| KR (1) | KR20110139699A (enExample) |
| CN (1) | CN102414776A (enExample) |
| WO (1) | WO2010094804A1 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5315100B2 (ja) * | 2009-03-18 | 2013-10-16 | 株式会社ニューフレアテクノロジー | 描画装置 |
| US8895943B2 (en) * | 2010-12-14 | 2014-11-25 | Mapper Lithography Ip B.V. | Lithography system and method of processing substrates in such a lithography system |
| CN104321701B (zh) * | 2012-03-20 | 2017-04-12 | 迈普尔平版印刷Ip有限公司 | 用于运输自由基的装置和方法 |
| US10586625B2 (en) | 2012-05-14 | 2020-03-10 | Asml Netherlands B.V. | Vacuum chamber arrangement for charged particle beam generator |
| US11348756B2 (en) | 2012-05-14 | 2022-05-31 | Asml Netherlands B.V. | Aberration correction in charged particle system |
| NL2010797C2 (en) | 2012-05-14 | 2014-08-21 | Mapper Lithography Ip Bv | Charged particle lithography system and beam generator. |
| NL2010624C2 (en) | 2013-04-08 | 2014-10-09 | Mapper Lithography Ip Bv | Cabinet for electronic equipment. |
| JP2016528556A (ja) * | 2013-08-16 | 2016-09-15 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置、プログラマブルパターニングデバイスおよびリソグラフィ方法 |
| KR102919104B1 (ko) | 2020-02-03 | 2026-01-29 | 아이엠에스 나노패브릭케이션 게엠베하 | 멀티―빔 라이터의 블러 변화 보정 |
| EP4131326A4 (en) * | 2020-03-26 | 2024-11-27 | National Institute for Materials Science | Electron gun chamber for scanning electron microscope, electron gun containing same, and scanning electron microscope |
| KR102922552B1 (ko) | 2020-04-24 | 2026-02-04 | 아이엠에스 나노패브릭케이션 게엠베하 | 대전 입자 소스 |
| EP4095882A1 (en) * | 2021-05-25 | 2022-11-30 | IMS Nanofabrication GmbH | Pattern data processing for programmable direct-write apparatus |
| US12500060B2 (en) | 2021-07-14 | 2025-12-16 | Ims Nanofabrication Gmbh | Electromagnetic lens |
| US12154756B2 (en) | 2021-08-12 | 2024-11-26 | Ims Nanofabrication Gmbh | Beam pattern device having beam absorber structure |
| JP2023138912A (ja) | 2022-03-21 | 2023-10-03 | アイエムエス ナノファブリケーション ゲーエムベーハー | リソグラフィ描画法における熱膨張の補正 |
| JP2023166336A (ja) | 2022-05-09 | 2023-11-21 | アイエムエス ナノファブリケーション ゲーエムベーハー | シャント装置を有する調節可能永久磁石レンズ |
| JP2024012118A (ja) | 2022-07-15 | 2024-01-25 | アイエムエス ナノファブリケーション ゲーエムベーハー | 温度制御要素を有する調節可能永久磁石レンズ |
| CN119404299A (zh) * | 2022-08-05 | 2025-02-07 | Asml荷兰有限公司 | 高生产量装载锁定腔室 |
| US12695055B2 (en) | 2023-03-08 | 2026-07-28 | Ims Nanofabrication Gmbh | Optimizing image distortion in a multi beam charged particle processing apparatus |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3157308A (en) | 1961-09-05 | 1964-11-17 | Clark Mfg Co J L | Canister type container and method of making the same |
| US3159408A (en) | 1961-10-05 | 1964-12-01 | Grace W R & Co | Chuck |
| US3365091A (en) * | 1964-10-30 | 1968-01-23 | Welding Research Inc | Vacuum chamber |
| US4524308A (en) | 1984-06-01 | 1985-06-18 | Sony Corporation | Circuits for accomplishing electron beam convergence in color cathode ray tubes |
| JPH04352410A (ja) * | 1991-05-30 | 1992-12-07 | Canon Inc | 半導体製造装置 |
| WO1994025880A1 (en) | 1993-04-30 | 1994-11-10 | Board Of Regents, The University Of Texas System | Megavoltage scanning imager and method for its use |
| JPH0936198A (ja) * | 1995-07-19 | 1997-02-07 | Hitachi Ltd | 真空処理装置およびそれを用いた半導体製造ライン |
| EP0766405A1 (en) | 1995-09-29 | 1997-04-02 | STMicroelectronics S.r.l. | Successive approximation register without redundancy |
| JPH09209150A (ja) * | 1996-02-06 | 1997-08-12 | Tokyo Electron Ltd | 真空チャンバ及びその製造方法 |
| JPH1054369A (ja) * | 1996-05-21 | 1998-02-24 | Ebara Corp | 真空ポンプの制御装置 |
| US6235634B1 (en) * | 1997-10-08 | 2001-05-22 | Applied Komatsu Technology, Inc. | Modular substrate processing system |
| JP3463855B2 (ja) * | 1997-12-18 | 2003-11-05 | 富士重工業株式会社 | 無段変速機の変速制御装置 |
| AU3888400A (en) * | 1999-03-19 | 2000-10-09 | Electron Vision Corporation | Cluster tool for wafer processing having an electron beam exposure module |
| JP3019260B1 (ja) * | 1999-03-26 | 2000-03-13 | 株式会社日立製作所 | 電子ビ―ム描画装置 |
| US6855929B2 (en) * | 2000-12-01 | 2005-02-15 | Ebara Corporation | Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
| JP2007147648A (ja) * | 2000-12-01 | 2007-06-14 | Ebara Corp | 欠陥検査方法及び基板検査装置 |
| KR101368027B1 (ko) | 2002-10-25 | 2014-02-26 | 마퍼 리쏘그라피 아이피 비.브이. | 리소그라피 장치 |
| EP3671804A1 (en) | 2002-10-30 | 2020-06-24 | ASML Netherlands B.V. | Electron beam exposure system |
| WO2004081910A2 (en) | 2003-03-10 | 2004-09-23 | Mapper Lithography Ip B.V. | Apparatus for generating a plurality of beamlets |
| EP1830384B1 (en) | 2003-05-28 | 2011-09-14 | Mapper Lithography Ip B.V. | Charged particle beamlet exposure system |
| JP2005016255A (ja) * | 2003-06-27 | 2005-01-20 | Sumitomo Heavy Ind Ltd | 扉ロック装置、及び扉システム |
| JP2005032505A (ja) * | 2003-07-10 | 2005-02-03 | Nikon Corp | 磁気シールド構造及び露光装置 |
| WO2005010618A2 (en) | 2003-07-30 | 2005-02-03 | Mapper Lithography Ip B.V. | Modulator circuitry |
| US7819079B2 (en) * | 2004-12-22 | 2010-10-26 | Applied Materials, Inc. | Cartesian cluster tool configuration for lithography type processes |
| US7709815B2 (en) | 2005-09-16 | 2010-05-04 | Mapper Lithography Ip B.V. | Lithography system and projection method |
| CN105304529B (zh) * | 2005-09-18 | 2019-03-15 | 弗雷德里克·A·弗里奇 | 用于在洁净空间中垂直定位基片处理设备的方法和装置 |
| EP3279624B1 (en) | 2015-04-03 | 2019-08-28 | Hitachi High-Technologies Corporation | Light quantity detection device, and immunoanalysis device and charged particle beam device using same |
-
2010
- 2010-02-22 JP JP2011550596A patent/JP5539406B2/ja not_active Expired - Fee Related
- 2010-02-22 WO PCT/EP2010/052221 patent/WO2010094804A1/en not_active Ceased
- 2010-02-22 US US12/709,647 patent/US20110049393A1/en not_active Abandoned
- 2010-02-22 CN CN201080017870XA patent/CN102414776A/zh active Pending
- 2010-02-22 KR KR1020117022202A patent/KR20110139699A/ko not_active Abandoned
- 2010-02-22 EP EP10704835A patent/EP2399271B1/en not_active Not-in-force
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7643842B2 (ja) | 垂直バッチ炉組立体 | |
| JP2017108112A5 (enExample) | ||
| TWI379378B (enExample) | ||
| TWI585889B (zh) | 連結型真空處理工具及使用該工具之方法 | |
| JP2014501442A5 (enExample) | ||
| CN202786403U (zh) | 有机层沉积设备和有机发光显示装置 | |
| TWI702678B (zh) | 收納單元、搬送裝置及基板處理系統 | |
| TW201417209A (zh) | 有關半導體處理設備之方法與系統 | |
| WO2009079448A3 (en) | Disk drive testing | |
| WO2009079449A3 (en) | Disk drive testing | |
| JP2013045989A5 (enExample) | ||
| JP2013032587A5 (enExample) | ||
| JP6747136B2 (ja) | 基板処理装置 | |
| US20110318143A1 (en) | Vacuum processing apparatus | |
| JP2012238623A5 (ja) | 荷電粒子線描画装置およびそのクリーニング方法ならびにデバイスの製造方法 | |
| JP6266349B2 (ja) | 蒸着マスク | |
| JP2013077819A5 (enExample) | ||
| KR101934621B1 (ko) | 마스크 스토커를 구비한 대면적 기판용 인라인 시스템 | |
| JP2008189951A5 (enExample) | ||
| TW201727808A (zh) | 採用三維之模組系統配置 | |
| JP2017515301A5 (enExample) | ||
| JP3202183U (ja) | 各システムがマスクチャンバを有するマルチシステム | |
| CN106469669B (zh) | 基板移送系统 | |
| JP2024051304A (ja) | 基板搬送モジュール及び基板搬送方法 | |
| JP2014530496A5 (enExample) |