JP2012517711A - マイグレーション及びプラズマ増強化学蒸着 - Google Patents
マイグレーション及びプラズマ増強化学蒸着 Download PDFInfo
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- JP2012517711A JP2012517711A JP2011549695A JP2011549695A JP2012517711A JP 2012517711 A JP2012517711 A JP 2012517711A JP 2011549695 A JP2011549695 A JP 2011549695A JP 2011549695 A JP2011549695 A JP 2011549695A JP 2012517711 A JP2012517711 A JP 2012517711A
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- Prior art keywords
- species
- plasma
- nitrogen
- substrate
- group iii
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/301—AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C23C16/303—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/10—Heating of the reaction chamber or the substrate
- C30B25/105—Heating of the reaction chamber or the substrate by irradiation or electric discharge
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/16—Controlling or regulating
- C30B25/165—Controlling or regulating the flow of the reactive gases
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32357—Generation remote from the workpiece, e.g. down-stream
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/332—Coating
- H01J2237/3321—CVD [Chemical Vapor Deposition]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA2653581 | 2009-02-11 | ||
| CA2653581A CA2653581A1 (en) | 2009-02-11 | 2009-02-11 | Migration and plasma enhanced chemical vapour deposition |
| US18595309P | 2009-06-10 | 2009-06-10 | |
| US61/185,953 | 2009-06-10 | ||
| PCT/IB2010/000390 WO2010092482A2 (en) | 2009-02-11 | 2010-02-10 | Migration and plasma enhanced chemical vapor deposition |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012517711A true JP2012517711A (ja) | 2012-08-02 |
| JP2012517711A5 JP2012517711A5 (https=) | 2013-03-21 |
Family
ID=42558510
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011549695A Pending JP2012517711A (ja) | 2009-02-11 | 2010-02-10 | マイグレーション及びプラズマ増強化学蒸着 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8580670B2 (https=) |
| EP (1) | EP2396808B1 (https=) |
| JP (1) | JP2012517711A (https=) |
| AU (1) | AU2010212553B2 (https=) |
| CA (2) | CA2653581A1 (https=) |
| WO (1) | WO2010092482A2 (https=) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2015099866A (ja) * | 2013-11-20 | 2015-05-28 | 国立大学法人名古屋大学 | Iii族窒化物半導体装置の製造装置および製造方法ならびに半導体ウエハの製造方法 |
| JP2017045856A (ja) * | 2015-08-26 | 2017-03-02 | 国立大学法人名古屋大学 | Iii族窒化物半導体装置の製造装置および製造方法ならびに半導体ウエハの製造方法 |
| JP2017168524A (ja) * | 2016-03-14 | 2017-09-21 | 株式会社東芝 | 半導体製造装置 |
| JP2017168589A (ja) * | 2016-03-15 | 2017-09-21 | 株式会社東芝 | 半導体製造装置および半導体装置の製造方法 |
| JP2019145803A (ja) * | 2019-03-13 | 2019-08-29 | 東芝デバイス&ストレージ株式会社 | 半導体装置の製造方法 |
| JP2019153691A (ja) * | 2018-03-02 | 2019-09-12 | 東芝デバイス&ストレージ株式会社 | 半導体装置の製造方法及び半導体装置の製造装置 |
| JP2019153690A (ja) * | 2018-03-02 | 2019-09-12 | 東芝デバイス&ストレージ株式会社 | 成膜装置 |
| WO2019225184A1 (ja) * | 2018-05-21 | 2019-11-28 | 東京エレクトロン株式会社 | 成膜装置および成膜方法 |
| JP2020068273A (ja) * | 2018-10-23 | 2020-04-30 | 国立大学法人名古屋大学 | Iii族窒化物半導体素子とその製造方法および半導体ウエハの製造方法およびテンプレート基板の製造方法 |
| WO2023008297A1 (ja) * | 2021-07-30 | 2023-02-02 | 国立大学法人東海国立大学機構 | Iii族窒化物半導体素子の製造方法 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140008210A1 (en) * | 2012-07-06 | 2014-01-09 | Aviva Biosciences Corporation | Methods and compositions for separating or enriching cells |
| US20070240631A1 (en) * | 2006-04-14 | 2007-10-18 | Applied Materials, Inc. | Epitaxial growth of compound nitride semiconductor structures |
| US20080092819A1 (en) * | 2006-10-24 | 2008-04-24 | Applied Materials, Inc. | Substrate support structure with rapid temperature change |
| US20080314311A1 (en) * | 2007-06-24 | 2008-12-25 | Burrows Brian H | Hvpe showerhead design |
| US20090149008A1 (en) * | 2007-10-05 | 2009-06-11 | Applied Materials, Inc. | Method for depositing group iii/v compounds |
| US20090194026A1 (en) * | 2008-01-31 | 2009-08-06 | Burrows Brian H | Processing system for fabricating compound nitride semiconductor devices |
| US20100139554A1 (en) * | 2008-12-08 | 2010-06-10 | Applied Materials, Inc. | Methods and apparatus for making gallium nitride and gallium aluminum nitride thin films |
| US20110079251A1 (en) * | 2009-04-28 | 2011-04-07 | Olga Kryliouk | Method for in-situ cleaning of deposition systems |
| US20100273291A1 (en) * | 2009-04-28 | 2010-10-28 | Applied Materials, Inc. | Decontamination of mocvd chamber using nh3 purge after in-situ cleaning |
| JP2012525718A (ja) * | 2009-04-29 | 2012-10-22 | アプライド マテリアルズ インコーポレイテッド | HVPEにおいてその場プレ−GaN堆積層を形成する方法 |
| US20110027973A1 (en) * | 2009-07-31 | 2011-02-03 | Applied Materials, Inc. | Method of forming led structures |
| US20110104843A1 (en) * | 2009-07-31 | 2011-05-05 | Applied Materials, Inc. | Method of reducing degradation of multi quantum well (mqw) light emitting diodes |
| CN102414801A (zh) | 2009-08-27 | 2012-04-11 | 应用材料公司 | 在原位腔室清洁后的处理腔室去污方法 |
| US20110064545A1 (en) * | 2009-09-16 | 2011-03-17 | Applied Materials, Inc. | Substrate transfer mechanism with preheating features |
| US20110076400A1 (en) * | 2009-09-30 | 2011-03-31 | Applied Materials, Inc. | Nanocrystalline diamond-structured carbon coating of silicon carbide |
| US20110081771A1 (en) * | 2009-10-07 | 2011-04-07 | Applied Materials, Inc. | Multichamber split processes for led manufacturing |
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| US20110207256A1 (en) * | 2010-02-24 | 2011-08-25 | Applied Materials, Inc. | In-situ acceptor activation with nitrogen and/or oxygen plasma treatment |
| JP5759690B2 (ja) * | 2010-08-30 | 2015-08-05 | 株式会社日立国際電気 | 膜の形成方法、半導体装置の製造方法及び基板処理装置 |
| US9076827B2 (en) | 2010-09-14 | 2015-07-07 | Applied Materials, Inc. | Transfer chamber metrology for improved device yield |
| US20120204957A1 (en) * | 2011-02-10 | 2012-08-16 | David Nicholls | METHOD FOR GROWING AlInGaN LAYER |
| US8143147B1 (en) | 2011-02-10 | 2012-03-27 | Intermolecular, Inc. | Methods and systems for forming thin films |
| US20120258555A1 (en) * | 2011-04-11 | 2012-10-11 | Lam Research Corporation | Multi-Frequency Hollow Cathode and Systems Implementing the Same |
| US8524581B2 (en) * | 2011-12-29 | 2013-09-03 | Intermolecular, Inc. | GaN epitaxy with migration enhancement and surface energy modification |
| WO2013158210A2 (en) | 2012-02-17 | 2013-10-24 | Yale University | Heterogeneous material integration through guided lateral growth |
| US20140124788A1 (en) * | 2012-11-06 | 2014-05-08 | Intermolecular, Inc. | Chemical Vapor Deposition System |
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| WO2014144698A2 (en) | 2013-03-15 | 2014-09-18 | Yale University | Large-area, laterally-grown epitaxial semiconductor layers |
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| CN104956476B (zh) * | 2013-11-06 | 2017-11-14 | 马特森技术有限公司 | 用于垂直nand器件的新型掩模去除方法策略 |
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| WO2015160909A1 (en) | 2014-04-16 | 2015-10-22 | Yale University | Method of obtaining planar semipolar gallium nitride surfaces |
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| WO2018031876A1 (en) | 2016-08-12 | 2018-02-15 | Yale University | Stacking fault-free semipolar and nonpolar gan grown on foreign substrates by eliminating the nitrogen polar facets during the growth |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007162131A (ja) * | 2005-11-18 | 2007-06-28 | Tokyo Electron Ltd | 熱およびプラズマ増強蒸着のための装置および操作方法 |
| JP2008545277A (ja) * | 2005-06-28 | 2008-12-11 | マイクロン テクノロジー, インク. | アルカリ土類金属β‐ジケチミナート前駆体を用いた原子層堆積 |
Family Cites Families (73)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59150417A (ja) | 1983-02-08 | 1984-08-28 | Toshiba Corp | 気相成長方法およびその装置 |
| US4614961A (en) | 1984-10-09 | 1986-09-30 | Honeywell Inc. | Tunable cut-off UV detector based on the aluminum gallium nitride material system |
| US4616248A (en) | 1985-05-20 | 1986-10-07 | Honeywell Inc. | UV photocathode using negative electron affinity effect in Alx Ga1 N |
| US4753818A (en) * | 1986-07-25 | 1988-06-28 | Hughes Aircraft Company | Process for photochemical vapor deposition of oxide layers at enhanced deposition rates |
| US4830702A (en) | 1987-07-02 | 1989-05-16 | General Electric Company | Hollow cathode plasma assisted apparatus and method of diamond synthesis |
| EP0322466A1 (en) | 1987-12-24 | 1989-07-05 | Ibm Deutschland Gmbh | PECVD (plasma enhanced chemical vapor deposition) method for deposition of tungsten or layers containing tungsten by in situ formation of tungsten fluorides |
| JPH01204411A (ja) | 1988-02-09 | 1989-08-17 | Nec Corp | 半導体装置の製造方法 |
| US5102694A (en) * | 1990-09-27 | 1992-04-07 | Cvd Incorporated | Pulsed chemical vapor deposition of gradient index optical material |
| US5133986A (en) | 1990-10-05 | 1992-07-28 | International Business Machines Corporation | Plasma enhanced chemical vapor processing system using hollow cathode effect |
| EP0525297A3 (en) | 1991-05-08 | 1993-10-06 | Fujitsu Limited | Method of growing doped crystal |
| US5614055A (en) | 1993-08-27 | 1997-03-25 | Applied Materials, Inc. | High density plasma CVD and etching reactor |
| FI100409B (fi) | 1994-11-28 | 1997-11-28 | Asm Int | Menetelmä ja laitteisto ohutkalvojen valmistamiseksi |
| US5863831A (en) * | 1995-08-14 | 1999-01-26 | Advanced Materials Engineering Research, Inc. | Process for fabricating semiconductor device with shallow p-type regions using dopant compounds containing elements of high solid solubility |
| GB2313606A (en) | 1996-06-01 | 1997-12-03 | Sharp Kk | Forming a compound semiconductor film |
| US6342277B1 (en) | 1996-08-16 | 2002-01-29 | Licensee For Microelectronics: Asm America, Inc. | Sequential chemical vapor deposition |
| US5916365A (en) | 1996-08-16 | 1999-06-29 | Sherman; Arthur | Sequential chemical vapor deposition |
| US6197683B1 (en) | 1997-09-29 | 2001-03-06 | Samsung Electronics Co., Ltd. | Method of forming metal nitride film by chemical vapor deposition and method of forming metal contact of semiconductor device using the same |
| JP3844274B2 (ja) | 1998-06-25 | 2006-11-08 | 独立行政法人産業技術総合研究所 | プラズマcvd装置及びプラズマcvd方法 |
| ATE228797T1 (de) | 1999-01-12 | 2002-12-15 | Island Oasis Frozen Cocktail C | Küchengerät mit magnetischem antrieb |
| US6305314B1 (en) | 1999-03-11 | 2001-10-23 | Genvs, Inc. | Apparatus and concept for minimizing parasitic chemical vapor deposition during atomic layer deposition |
| US6200893B1 (en) | 1999-03-11 | 2001-03-13 | Genus, Inc | Radical-assisted sequential CVD |
| SE516722C2 (sv) * | 1999-04-28 | 2002-02-19 | Hana Barankova | Förfarande och apparat för plasmabehandling av gas |
| US6563144B2 (en) * | 1999-09-01 | 2003-05-13 | The Regents Of The University Of California | Process for growing epitaxial gallium nitride and composite wafers |
| US6444039B1 (en) | 2000-03-07 | 2002-09-03 | Simplus Systems Corporation | Three-dimensional showerhead apparatus |
| US6745717B2 (en) * | 2000-06-22 | 2004-06-08 | Arizona Board Of Regents | Method and apparatus for preparing nitride semiconductor surfaces |
| TW527436B (en) | 2000-06-23 | 2003-04-11 | Anelva Corp | Chemical vapor deposition system |
| US6600169B2 (en) * | 2000-09-22 | 2003-07-29 | Andreas Stintz | Quantum dash device |
| US6764888B2 (en) | 2000-09-27 | 2004-07-20 | Sensor Electronic Technology, Inc. | Method of producing nitride-based heterostructure devices |
| US6690042B2 (en) | 2000-09-27 | 2004-02-10 | Sensor Electronic Technology, Inc. | Metal oxide semiconductor heterostructure field effect transistor |
| US6689220B1 (en) * | 2000-11-22 | 2004-02-10 | Simplus Systems Corporation | Plasma enhanced pulsed layer deposition |
| US6610169B2 (en) | 2001-04-21 | 2003-08-26 | Simplus Systems Corporation | Semiconductor processing system and method |
| US7442615B2 (en) * | 2001-04-21 | 2008-10-28 | Tegal Corporation | Semiconductor processing system and method |
| US7867905B2 (en) * | 2001-04-21 | 2011-01-11 | Tegal Corporation | System and method for semiconductor processing |
| US20030049916A1 (en) | 2001-08-20 | 2003-03-13 | The Hong Kong Polytechnic University | Development of an intermediate-temperature buffer layer for the growth of high-quality GaxInyAlzN epitaxial layers by molecular beam epitaxy |
| US6756318B2 (en) * | 2001-09-10 | 2004-06-29 | Tegal Corporation | Nanolayer thick film processing system and method |
| US6998014B2 (en) | 2002-01-26 | 2006-02-14 | Applied Materials, Inc. | Apparatus and method for plasma assisted deposition |
| US20030215570A1 (en) * | 2002-05-16 | 2003-11-20 | Applied Materials, Inc. | Deposition of silicon nitride |
| AUPS240402A0 (en) | 2002-05-17 | 2002-06-13 | Macquarie Research Limited | Gallium nitride |
| US6838125B2 (en) * | 2002-07-10 | 2005-01-04 | Applied Materials, Inc. | Method of film deposition using activated precursor gases |
| US6902774B2 (en) * | 2002-07-25 | 2005-06-07 | Inficon Gmbh | Method of manufacturing a device |
| KR100497748B1 (ko) * | 2002-09-17 | 2005-06-29 | 주식회사 무한 | 반도체소자 제조용 원자층 증착 장치 및 원자층 증착 방법 |
| JP2004140339A (ja) | 2002-09-25 | 2004-05-13 | Univ Chiba | 窒化物系ヘテロ構造を有するデバイス及びその製造方法 |
| JP3574651B2 (ja) * | 2002-12-05 | 2004-10-06 | 東京エレクトロン株式会社 | 成膜方法および成膜装置 |
| US7713592B2 (en) * | 2003-02-04 | 2010-05-11 | Tegal Corporation | Nanolayer deposition process |
| US7070833B2 (en) | 2003-03-05 | 2006-07-04 | Restek Corporation | Method for chemical vapor deposition of silicon on to substrates for use in corrosive and vacuum environments |
| US7192849B2 (en) | 2003-05-07 | 2007-03-20 | Sensor Electronic Technology, Inc. | Methods of growing nitride-based film using varying pulses |
| US7268375B2 (en) | 2003-10-27 | 2007-09-11 | Sensor Electronic Technology, Inc. | Inverted nitride-based semiconductor structure |
| DE10350752A1 (de) | 2003-10-30 | 2005-06-09 | Infineon Technologies Ag | Verfahren zum Ausbilden eines Dielektrikums auf einer kupferhaltigen Metallisierung und Kondensatoranordnung |
| JP2005229013A (ja) | 2004-02-16 | 2005-08-25 | Ishikawajima Harima Heavy Ind Co Ltd | 窒化物半導体の成長方法 |
| US7291360B2 (en) | 2004-03-26 | 2007-11-06 | Applied Materials, Inc. | Chemical vapor deposition plasma process using plural ion shower grids |
| US20050223986A1 (en) | 2004-04-12 | 2005-10-13 | Choi Soo Y | Gas diffusion shower head design for large area plasma enhanced chemical vapor deposition |
| KR101084631B1 (ko) | 2004-05-13 | 2011-11-18 | 매그나칩 반도체 유한회사 | 퍼지 펄스트 mocvd 방법 및 이를 이용한 반도체소자의 유전막 제조방법 |
| JP5519105B2 (ja) | 2004-08-02 | 2014-06-11 | ビーコ・インストゥルメンツ・インコーポレイテッド | 化学気相成長の方法及び化学気相成長リアクタ用のガス供給システム |
| US7629270B2 (en) * | 2004-08-27 | 2009-12-08 | Asm America, Inc. | Remote plasma activated nitridation |
| BRPI0516136A (pt) | 2004-09-27 | 2008-08-26 | Gallium Entpr Pty Ltd | método e equipamento para desenvolvimento de uma pelìcula de nitreto de um metal do grupo (iii) e a pelìcula de nitreto do metal do grupo (iii) |
| US7326963B2 (en) | 2004-12-06 | 2008-02-05 | Sensor Electronic Technology, Inc. | Nitride-based light emitting heterostructure |
| US7491626B2 (en) | 2005-06-20 | 2009-02-17 | Sensor Electronic Technology, Inc. | Layer growth using metal film and/or islands |
| US7897217B2 (en) | 2005-11-18 | 2011-03-01 | Tokyo Electron Limited | Method and system for performing plasma enhanced atomic layer deposition |
| US8603248B2 (en) | 2006-02-10 | 2013-12-10 | Veeco Instruments Inc. | System and method for varying wafer surface temperature via wafer-carrier temperature offset |
| KR101019941B1 (ko) | 2006-03-10 | 2011-03-09 | 에스티씨. 유엔엠 | Gan 나노선의 펄스 성장 및 ⅲ 족 질화물 반도체 기판 물질과 디바이스에서의 어플리케이션 |
| US20070215036A1 (en) * | 2006-03-15 | 2007-09-20 | Hyung-Sang Park | Method and apparatus of time and space co-divided atomic layer deposition |
| KR100782291B1 (ko) | 2006-05-11 | 2007-12-05 | 주식회사 아토 | 가스분리형 샤워헤드 및 이를 이용한 펄스 cvd 장치 |
| JP2009538989A (ja) * | 2006-05-30 | 2009-11-12 | フジフィルム マニュファクチャリング ユーロプ ビー.ブイ. | パルス化大気圧グロー放電を使用する堆積の方法及び装置 |
| US7691757B2 (en) * | 2006-06-22 | 2010-04-06 | Asm International N.V. | Deposition of complex nitride films |
| US8268409B2 (en) * | 2006-10-25 | 2012-09-18 | Asm America, Inc. | Plasma-enhanced deposition of metal carbide films |
| US8338273B2 (en) | 2006-12-15 | 2012-12-25 | University Of South Carolina | Pulsed selective area lateral epitaxy for growth of III-nitride materials over non-polar and semi-polar substrates |
| CN102174693B (zh) | 2007-01-12 | 2014-10-29 | 威科仪器有限公司 | 气体处理系统 |
| US8318562B2 (en) | 2007-04-02 | 2012-11-27 | University Of South Carolina | Method to increase breakdown voltage of semiconductor devices |
| EP2017884A3 (en) | 2007-07-20 | 2011-03-23 | Gallium Enterprises Pty Ltd | Buried contact devices for nitride-based films and manufacture thereof |
| US20110140072A1 (en) | 2008-08-21 | 2011-06-16 | Nanocrystal Corporation | Defect-free group iii - nitride nanostructures and devices using pulsed and non-pulsed growth techniques |
| US8501624B2 (en) * | 2008-12-04 | 2013-08-06 | Varian Semiconductor Equipment Associates, Inc. | Excited gas injection for ion implant control |
| KR101691558B1 (ko) | 2009-02-13 | 2016-12-30 | 갈리움 엔터프라이지즈 피티와이 엘티디 | 플라즈마 증착 |
| US8039394B2 (en) * | 2009-06-26 | 2011-10-18 | Seagate Technology Llc | Methods of forming layers of alpha-tantalum |
-
2009
- 2009-02-11 CA CA2653581A patent/CA2653581A1/en not_active Abandoned
-
2010
- 2010-02-10 US US12/703,713 patent/US8580670B2/en active Active
- 2010-02-10 JP JP2011549695A patent/JP2012517711A/ja active Pending
- 2010-02-10 AU AU2010212553A patent/AU2010212553B2/en active Active
- 2010-02-10 WO PCT/IB2010/000390 patent/WO2010092482A2/en not_active Ceased
- 2010-02-10 CA CA2756994A patent/CA2756994C/en active Active
- 2010-02-10 EP EP10740987.2A patent/EP2396808B1/en active Active
-
2013
- 2013-01-23 US US13/748,458 patent/US9045824B2/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008545277A (ja) * | 2005-06-28 | 2008-12-11 | マイクロン テクノロジー, インク. | アルカリ土類金属β‐ジケチミナート前駆体を用いた原子層堆積 |
| JP2007162131A (ja) * | 2005-11-18 | 2007-06-28 | Tokyo Electron Ltd | 熱およびプラズマ増強蒸着のための装置および操作方法 |
Cited By (17)
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| JP2017045856A (ja) * | 2015-08-26 | 2017-03-02 | 国立大学法人名古屋大学 | Iii族窒化物半導体装置の製造装置および製造方法ならびに半導体ウエハの製造方法 |
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Also Published As
| Publication number | Publication date |
|---|---|
| EP2396808B1 (en) | 2021-07-07 |
| WO2010092482A3 (en) | 2010-11-25 |
| EP2396808A4 (en) | 2013-10-16 |
| US20140037865A1 (en) | 2014-02-06 |
| AU2010212553B2 (en) | 2014-05-15 |
| US20100210067A1 (en) | 2010-08-19 |
| EP2396808A2 (en) | 2011-12-21 |
| US8580670B2 (en) | 2013-11-12 |
| AU2010212553A1 (en) | 2011-09-15 |
| CA2756994A1 (en) | 2010-08-19 |
| CA2756994C (en) | 2017-03-07 |
| WO2010092482A2 (en) | 2010-08-19 |
| CA2653581A1 (en) | 2010-08-11 |
| US9045824B2 (en) | 2015-06-02 |
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