JP2012237060A5 - - Google Patents

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Publication number
JP2012237060A5
JP2012237060A5 JP2012092885A JP2012092885A JP2012237060A5 JP 2012237060 A5 JP2012237060 A5 JP 2012237060A5 JP 2012092885 A JP2012092885 A JP 2012092885A JP 2012092885 A JP2012092885 A JP 2012092885A JP 2012237060 A5 JP2012237060 A5 JP 2012237060A5
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JP
Japan
Prior art keywords
copper
layer
monovalent
metal
lower layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2012092885A
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English (en)
Japanese (ja)
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JP2012237060A (ja
JP5996244B2 (ja
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Application filed filed Critical
Publication of JP2012237060A publication Critical patent/JP2012237060A/ja
Publication of JP2012237060A5 publication Critical patent/JP2012237060A5/ja
Application granted granted Critical
Publication of JP5996244B2 publication Critical patent/JP5996244B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2012092885A 2011-04-19 2012-04-16 半導体上の銅のめっき Expired - Fee Related JP5996244B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161477155P 2011-04-19 2011-04-19
US61/477,155 2011-04-19

Publications (3)

Publication Number Publication Date
JP2012237060A JP2012237060A (ja) 2012-12-06
JP2012237060A5 true JP2012237060A5 (enExample) 2016-06-09
JP5996244B2 JP5996244B2 (ja) 2016-09-21

Family

ID=45976788

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012092885A Expired - Fee Related JP5996244B2 (ja) 2011-04-19 2012-04-16 半導体上の銅のめっき

Country Status (7)

Country Link
US (1) US20140174936A1 (enExample)
EP (1) EP2514856A3 (enExample)
JP (1) JP5996244B2 (enExample)
KR (1) KR20150127804A (enExample)
CN (1) CN102787338B (enExample)
SG (1) SG185227A1 (enExample)
TW (1) TWI445847B (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140008234A1 (en) * 2012-07-09 2014-01-09 Rohm And Haas Electronic Materials Llc Method of metal plating semiconductors
FR3002545B1 (fr) * 2013-02-22 2016-01-08 Alchimer Procede de formation d'un siliciure metallique a l'aide d'une solution contenant des ions or et des ions fluor
JP6367322B2 (ja) * 2013-06-17 2018-08-01 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated 湿式ウエハバックコンタクトを使用したシリコンビアを通した銅メッキのための方法
CN104711648B (zh) * 2013-12-17 2019-08-16 Ykk株式会社 闪镀铜镀敷液
TWI638424B (zh) * 2014-11-10 2018-10-11 應用材料股份有限公司 利用濕式晶圓背側接觸進行銅電鍍矽穿孔的方法
CN105154936A (zh) * 2015-08-21 2015-12-16 无锡桥阳机械制造有限公司 一种稀土镧-铜-锌合金电镀液及其电镀方法
WO2017127197A1 (en) 2016-01-21 2017-07-27 Applied Materials, Inc. Process and chemistry of plating of through silicon vias
EP3617350A1 (en) * 2018-08-31 2020-03-04 Tubacex Upstream Technologies, S.A. Method for coating a metal part destined to be subjected to high contact pressures and metal part obtained therefrom
CN114351224B (zh) * 2021-03-18 2023-08-25 青岛惠芯微电子有限公司 电镀挂具和电镀装置
CN114351227B (zh) * 2021-03-18 2023-08-25 青岛惠芯微电子有限公司 电镀挂具和电镀装置
CN114351202B (zh) * 2021-03-18 2023-08-25 青岛惠芯微电子有限公司 晶圆的电镀方法
CN114351225B (zh) * 2021-03-18 2023-08-25 青岛惠芯微电子有限公司 电镀挂具和电镀装置
CN114381789B (zh) * 2021-03-18 2023-08-25 青岛惠芯微电子有限公司 电镀挂具和电镀装置
CN114351226B (zh) * 2021-03-18 2023-08-25 青岛惠芯微电子有限公司 电镀挂具和电镀装置

Family Cites Families (19)

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US3041255A (en) 1960-03-22 1962-06-26 Metal & Thermit Corp Electrodeposition of bright nickel
US4251327A (en) * 1980-01-14 1981-02-17 Motorola, Inc. Electroplating method
US5011567A (en) * 1989-12-06 1991-04-30 Mobil Solar Energy Corporation Method of fabricating solar cells
JPH0544075A (ja) * 1991-08-15 1993-02-23 Nippon Riironaale Kk 無電解銅めつき代替銅ストライクめつき方法
GB2264717A (en) * 1992-03-06 1993-09-08 Zinex Corp Cyanide-free copper plating bath
US5750018A (en) * 1997-03-18 1998-05-12 Learonal, Inc. Cyanide-free monovalent copper electroplating solutions
US6054173A (en) * 1997-08-22 2000-04-25 Micron Technology, Inc. Copper electroless deposition on a titanium-containing surface
US6261954B1 (en) * 2000-02-10 2001-07-17 Chartered Semiconductor Manufacturing, Ltd. Method to deposit a copper layer
CN1253606C (zh) * 2001-02-23 2006-04-26 株式会社荏原制作所 镀铜溶液、镀敷方法和镀敷装置
WO2002086196A1 (en) * 2001-04-19 2002-10-31 Rd Chemical Company Copper acid baths, system and method for electroplating high aspect ratio substrates
EP1308541A1 (en) * 2001-10-04 2003-05-07 Shipley Company LLC Plating bath and method for depositing a metal layer on a substrate
US20040108217A1 (en) * 2002-12-05 2004-06-10 Dubin Valery M. Methods for forming copper interconnect structures by co-plating of noble metals and structures formed thereby
CN100576578C (zh) * 2006-04-20 2009-12-30 无锡尚德太阳能电力有限公司 制备太阳电池电极的方法及其电化学沉积装置
CN100533785C (zh) * 2006-06-05 2009-08-26 罗门哈斯电子材料有限公司 镀敷方法
US20080035489A1 (en) * 2006-06-05 2008-02-14 Rohm And Haas Electronic Materials Llc Plating process
US8058164B2 (en) * 2007-06-04 2011-11-15 Lam Research Corporation Methods of fabricating electronic devices using direct copper plating
CN101257059B (zh) * 2007-11-30 2011-04-13 无锡尚德太阳能电力有限公司 一种电化学沉积太阳能电池金属电极的方法
EP2141750B1 (en) * 2008-07-02 2013-10-16 Rohm and Haas Electronic Materials LLC Method of light induced plating on semiconductors
EP2157209B1 (en) * 2008-07-31 2014-10-22 Rohm and Haas Electronic Materials LLC Inhibiting Background Plating

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