JP2010500607A5 - - Google Patents

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Publication number
JP2010500607A5
JP2010500607A5 JP2009523369A JP2009523369A JP2010500607A5 JP 2010500607 A5 JP2010500607 A5 JP 2010500607A5 JP 2009523369 A JP2009523369 A JP 2009523369A JP 2009523369 A JP2009523369 A JP 2009523369A JP 2010500607 A5 JP2010500607 A5 JP 2010500607A5
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JP
Japan
Prior art keywords
seconds
baked
wafer
film
coated
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JP2009523369A
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English (en)
Japanese (ja)
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JP5453615B2 (ja
JP2010500607A (ja
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Priority claimed from US11/502,706 external-priority patent/US7638262B2/en
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Publication of JP2010500607A publication Critical patent/JP2010500607A/ja
Publication of JP2010500607A5 publication Critical patent/JP2010500607A5/ja
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Publication of JP5453615B2 publication Critical patent/JP5453615B2/ja
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JP2009523369A 2006-08-10 2007-08-07 フォトレジスト用反射防止膜組成物 Active JP5453615B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/502,706 US7638262B2 (en) 2006-08-10 2006-08-10 Antireflective composition for photoresists
US11/502,706 2006-08-10
PCT/IB2007/002340 WO2008017954A2 (en) 2006-08-10 2007-08-07 Antireflective composition for photoresists

Publications (3)

Publication Number Publication Date
JP2010500607A JP2010500607A (ja) 2010-01-07
JP2010500607A5 true JP2010500607A5 (enExample) 2011-09-29
JP5453615B2 JP5453615B2 (ja) 2014-03-26

Family

ID=38740457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009523369A Active JP5453615B2 (ja) 2006-08-10 2007-08-07 フォトレジスト用反射防止膜組成物

Country Status (8)

Country Link
US (1) US7638262B2 (enExample)
EP (1) EP2052293B1 (enExample)
JP (1) JP5453615B2 (enExample)
KR (1) KR101441705B1 (enExample)
CN (1) CN101501572A (enExample)
MY (1) MY145421A (enExample)
TW (1) TWI417668B (enExample)
WO (1) WO2008017954A2 (enExample)

Families Citing this family (22)

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US7824844B2 (en) * 2007-01-19 2010-11-02 Az Electronic Materials Usa Corp. Solvent mixtures for antireflective coating compositions for photoresists
US20080286689A1 (en) * 2007-05-14 2008-11-20 Hong Zhuang Antireflective Coating Compositions
US20090035704A1 (en) * 2007-08-03 2009-02-05 Hong Zhuang Underlayer Coating Composition Based on a Crosslinkable Polymer
US8039201B2 (en) * 2007-11-21 2011-10-18 Az Electronic Materials Usa Corp. Antireflective coating composition and process thereof
US8435721B2 (en) * 2008-02-21 2013-05-07 Nissan Chemical Industries, Ltd. Resist underlayer film forming composition and forming method of resist pattern using the same
US8329387B2 (en) 2008-07-08 2012-12-11 Az Electronic Materials Usa Corp. Antireflective coating compositions
US8221965B2 (en) * 2008-07-08 2012-07-17 Az Electronic Materials Usa Corp. Antireflective coating compositions
KR100997502B1 (ko) * 2008-08-26 2010-11-30 금호석유화학 주식회사 개환된 프탈릭 언하이드라이드를 포함하는 유기 반사 방지막 조성물과 이의 제조방법
US20100092894A1 (en) * 2008-10-14 2010-04-15 Weihong Liu Bottom Antireflective Coating Compositions
US8551686B2 (en) * 2009-10-30 2013-10-08 Az Electronic Materials Usa Corp. Antireflective composition for photoresists
US8507192B2 (en) 2010-02-18 2013-08-13 Az Electronic Materials Usa Corp. Antireflective compositions and methods of using same
US8465902B2 (en) 2011-02-08 2013-06-18 Az Electronic Materials Usa Corp. Underlayer coating composition and processes thereof
KR102115442B1 (ko) 2012-04-23 2020-05-28 브레우어 사이언스 인코포레이션 감광성의 현상제-가용성 하부 반사-방지 코팅 재료
US9170494B2 (en) 2012-06-19 2015-10-27 Az Electronic Materials (Luxembourg) S.A.R.L. Antireflective compositions and methods of using same
KR102011446B1 (ko) 2013-02-26 2019-10-14 삼성전자주식회사 반도체 소자의 박막 패턴 형성 방법
KR101982103B1 (ko) 2015-08-31 2019-05-27 롬 앤드 하스 일렉트로닉 머트어리얼즈 엘엘씨 오버코팅된 포토레지스트와 함께 사용하기 위한 코팅 조성물
WO2017130896A1 (ja) 2016-01-26 2017-08-03 株式会社Adeka 熱酸発生剤およびこれを用いたレジスト組成物
KR102487404B1 (ko) * 2017-07-26 2023-01-12 에스케이이노베이션 주식회사 바닥반사 방지막 형성용 중합체 및 이를 포함하는 바닥반사 방지막 형성용 조성물
KR102288386B1 (ko) 2018-09-06 2021-08-10 삼성에스디아이 주식회사 레지스트 하층막용 조성물 및 이를 이용한 패턴 형성 방법
DE102020131427B4 (de) * 2020-05-21 2024-03-28 Taiwan Semiconductor Manufacturing Co., Ltd. Photoresistzusammensetzung und Herstellungsverfahren von Photoresiststruktur
KR102675074B1 (ko) * 2020-11-20 2024-06-12 삼성에스디아이 주식회사 레지스트 하층막용 조성물 및 이를 이용한 패턴형성방법
CN116814119A (zh) * 2023-07-03 2023-09-29 长鑫存储技术有限公司 底部抗反射涂层组合物、图案形成方法

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