JP2010217124A5 - - Google Patents
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- Publication number
- JP2010217124A5 JP2010217124A5 JP2009067183A JP2009067183A JP2010217124A5 JP 2010217124 A5 JP2010217124 A5 JP 2010217124A5 JP 2009067183 A JP2009067183 A JP 2009067183A JP 2009067183 A JP2009067183 A JP 2009067183A JP 2010217124 A5 JP2010217124 A5 JP 2010217124A5
- Authority
- JP
- Japan
- Prior art keywords
- light
- measured
- conical lens
- shape
- conical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000003287 optical effect Effects 0.000 claims description 11
- NCGICGYLBXGBGN-UHFFFAOYSA-N 3-morpholin-4-yl-1-oxa-3-azonia-2-azanidacyclopent-3-en-5-imine;hydrochloride Chemical compound Cl.[N-]1OC(=N)C=[N+]1N1CCOCC1 NCGICGYLBXGBGN-UHFFFAOYSA-N 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims 5
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000000691 measurement method Methods 0.000 claims 1
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009067183A JP2010217124A (ja) | 2009-03-19 | 2009-03-19 | 形状測定装置及び方法 |
| US12/935,300 US20110043822A1 (en) | 2009-03-19 | 2010-03-09 | Shape measuring apparatus and method thereof |
| CN201080001241.8A CN101970983B (zh) | 2009-03-19 | 2010-03-09 | 形状测定装置以及方法 |
| PCT/JP2010/001643 WO2010106758A1 (ja) | 2009-03-19 | 2010-03-09 | 形状測定装置及び方法 |
| EP10753255A EP2410289A1 (en) | 2009-03-19 | 2010-03-09 | Shape measurement device and method |
| KR1020107020251A KR101233941B1 (ko) | 2009-03-19 | 2010-03-09 | 형상 측정 장치 및 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009067183A JP2010217124A (ja) | 2009-03-19 | 2009-03-19 | 形状測定装置及び方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010217124A JP2010217124A (ja) | 2010-09-30 |
| JP2010217124A5 true JP2010217124A5 (enExample) | 2012-02-16 |
Family
ID=42739426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009067183A Withdrawn JP2010217124A (ja) | 2009-03-19 | 2009-03-19 | 形状測定装置及び方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20110043822A1 (enExample) |
| EP (1) | EP2410289A1 (enExample) |
| JP (1) | JP2010217124A (enExample) |
| KR (1) | KR101233941B1 (enExample) |
| CN (1) | CN101970983B (enExample) |
| WO (1) | WO2010106758A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102581703A (zh) * | 2011-01-05 | 2012-07-18 | 财团法人精密机械研究发展中心 | 同轴向双进给轴量测装置 |
| US8810904B2 (en) * | 2011-02-09 | 2014-08-19 | Northwestern University | Optical contact micrometer |
| DE102011103003A1 (de) * | 2011-05-24 | 2012-11-29 | Lufthansa Technik Ag | Verfahren und Vorrichtung zur Rissprüfung eines Flugzeug- oder Gasturbinen-Bauteils |
| CN104949631B (zh) * | 2014-03-27 | 2017-12-15 | 纽富来科技股份有限公司 | 曲率测定装置以及曲率测定方法 |
| CN107796596A (zh) * | 2016-08-30 | 2018-03-13 | 尼德克株式会社 | 透镜测定装置及透镜测定装置用标识板 |
| CN106441152B (zh) * | 2016-10-18 | 2019-02-01 | 淮阴师范学院 | 非对称式光学干涉测量方法及装置 |
| CN116294983B (zh) * | 2023-02-28 | 2024-01-23 | 重庆米森科技有限公司 | 基于平面光路设计的非闭合光路波阵面分割干涉仪 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3351857B2 (ja) * | 1993-06-01 | 2002-12-03 | 株式会社ミツトヨ | マイケルソン形干渉測定装置 |
| JPH0763508A (ja) * | 1993-08-31 | 1995-03-10 | Ishikawajima Harima Heavy Ind Co Ltd | レーザ顕微鏡 |
| JPH08136248A (ja) * | 1994-11-08 | 1996-05-31 | Idec Izumi Corp | 共焦点位置測定装置 |
| JP3633713B2 (ja) * | 1996-04-23 | 2005-03-30 | 松下電器産業株式会社 | 距離計測方法及び距離センサ |
| US7072045B2 (en) * | 2002-01-16 | 2006-07-04 | The Regents Of The University Of California | High resolution optical coherence tomography with an improved depth range using an axicon lens |
| US7218403B2 (en) * | 2002-06-26 | 2007-05-15 | Zygo Corporation | Scanning interferometer for aspheric surfaces and wavefronts |
| JP4144389B2 (ja) * | 2003-03-14 | 2008-09-03 | オムロン株式会社 | 光学式膜計測装置 |
| CN2788123Y (zh) * | 2005-01-26 | 2006-06-14 | 闫宏 | 双光路自准直镀膜厚度光学监控装置 |
| US7586670B2 (en) * | 2006-05-13 | 2009-09-08 | Alcatel-Lucent Usa Inc. | Nonlinear optical devices based on metamaterials |
| CN101324422B (zh) * | 2007-06-12 | 2011-01-19 | 北京普瑞微纳科技有限公司 | 白光干涉测量样品表面形状精细分布的方法及其装置 |
| US20090195788A1 (en) * | 2007-12-17 | 2009-08-06 | Shinichi Dosaka | Apparatus for profile irregularity measurement and surface imperfection observation; method of profile irregularity measurement and surface imperfection observation; and inspection method of profile irregularity and surface imperfection |
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2009
- 2009-03-19 JP JP2009067183A patent/JP2010217124A/ja not_active Withdrawn
-
2010
- 2010-03-09 WO PCT/JP2010/001643 patent/WO2010106758A1/ja not_active Ceased
- 2010-03-09 KR KR1020107020251A patent/KR101233941B1/ko not_active Expired - Fee Related
- 2010-03-09 US US12/935,300 patent/US20110043822A1/en not_active Abandoned
- 2010-03-09 CN CN201080001241.8A patent/CN101970983B/zh not_active Expired - Fee Related
- 2010-03-09 EP EP10753255A patent/EP2410289A1/en not_active Withdrawn