JP2012058068A5 - - Google Patents

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Publication number
JP2012058068A5
JP2012058068A5 JP2010201221A JP2010201221A JP2012058068A5 JP 2012058068 A5 JP2012058068 A5 JP 2012058068A5 JP 2010201221 A JP2010201221 A JP 2010201221A JP 2010201221 A JP2010201221 A JP 2010201221A JP 2012058068 A5 JP2012058068 A5 JP 2012058068A5
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JP
Japan
Prior art keywords
light
optical path
reflecting surface
cylindrical lens
incident
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JP2010201221A
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English (en)
Japanese (ja)
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JP2012058068A (ja
JP5317298B2 (ja
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Priority to JP2010201221A priority Critical patent/JP5317298B2/ja
Priority claimed from JP2010201221A external-priority patent/JP5317298B2/ja
Priority to EP11823571.2A priority patent/EP2615436A4/en
Priority to US13/820,592 priority patent/US8988689B2/en
Priority to PCT/JP2011/070273 priority patent/WO2012033096A1/ja
Publication of JP2012058068A publication Critical patent/JP2012058068A/ja
Publication of JP2012058068A5 publication Critical patent/JP2012058068A5/ja
Application granted granted Critical
Publication of JP5317298B2 publication Critical patent/JP5317298B2/ja
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JP2010201221A 2010-09-08 2010-09-08 分光計測装置及び分光計測方法 Active JP5317298B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2010201221A JP5317298B2 (ja) 2010-09-08 2010-09-08 分光計測装置及び分光計測方法
EP11823571.2A EP2615436A4 (en) 2010-09-08 2011-09-06 SPECTROMETER AND SPECTRAL PHOTOMETRY METHOD
US13/820,592 US8988689B2 (en) 2010-09-08 2011-09-06 Spectroscopic measurement device and spectroscopic measurement method
PCT/JP2011/070273 WO2012033096A1 (ja) 2010-09-08 2011-09-06 分光計測装置及び分光計測方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010201221A JP5317298B2 (ja) 2010-09-08 2010-09-08 分光計測装置及び分光計測方法

Publications (3)

Publication Number Publication Date
JP2012058068A JP2012058068A (ja) 2012-03-22
JP2012058068A5 true JP2012058068A5 (enExample) 2013-04-25
JP5317298B2 JP5317298B2 (ja) 2013-10-16

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ID=45810694

Family Applications (1)

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JP2010201221A Active JP5317298B2 (ja) 2010-09-08 2010-09-08 分光計測装置及び分光計測方法

Country Status (4)

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US (1) US8988689B2 (enExample)
EP (1) EP2615436A4 (enExample)
JP (1) JP5317298B2 (enExample)
WO (1) WO2012033096A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9482576B2 (en) 2012-10-05 2016-11-01 National University Corporation Kagawa University Spectroscopic measurement device having transmissive optical member with a sloped face
CA2886368C (en) * 2012-10-05 2017-08-29 National University Corporation Kagawa University Spectroscopic measurement device
CN104006883B (zh) * 2014-03-10 2016-12-07 中国科学院长春光学精密机械与物理研究所 基于多级微反射镜的成像光谱仪及制作方法
JP6513697B2 (ja) * 2014-03-13 2019-05-15 ナショナル ユニバーシティ オブ シンガポール 光干渉デバイス
WO2016121540A1 (ja) * 2015-01-29 2016-08-04 国立大学法人香川大学 分光測定装置および分光測定方法
DE102016103295A1 (de) * 2016-02-24 2017-08-24 Martin Berz Dreidimensionales Interferometer und Verfahren zur Bestimmung einer Phase eines elektrischen Feldes
KR101855816B1 (ko) * 2016-05-13 2018-05-10 주식회사 고영테크놀러지 생체 조직 검사 장치 및 그 방법
JP2018054450A (ja) * 2016-09-28 2018-04-05 花王株式会社 反射スペクトルの測定方法
TWI642969B (zh) * 2017-12-05 2018-12-01 逢甲大學 Light path rendering method
CN110530783B (zh) * 2018-05-24 2023-12-15 深圳市帝迈生物技术有限公司 用于流式细胞仪的侧向光束收集方法、装置及流式细胞仪
US11402270B2 (en) 2018-06-13 2022-08-02 National University Corporation Kagawa University Spectral measurement device and spectral measurement method
JP7182243B2 (ja) * 2018-06-13 2022-12-02 国立大学法人 香川大学 分光測定装置及び分光測定方法
US12235157B2 (en) 2019-09-03 2025-02-25 National University Corporation Kagawa University Spectrometry device
EP4403891A4 (en) 2021-09-14 2025-03-26 National University Corporation Kagawa University SPECTROMETRY DEVICE
CN114441145B (zh) * 2022-01-10 2022-08-16 上海精积微半导体技术有限公司 一种宽光谱物镜波像差的测算方法及系统
JP2023158360A (ja) * 2022-04-18 2023-10-30 株式会社日立ハイテク 分光測定装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0167601A1 (en) * 1984-01-16 1986-01-15 Ohio University Interferometric diode array spectrometer
JP2676028B2 (ja) * 1988-01-23 1997-11-12 日本分光株式会社 実時間フーリエ分光光度計
JPH02145927A (ja) * 1988-11-28 1990-06-05 Yokogawa Electric Corp フーリエ変換型干渉分光器
JPH02147842A (ja) * 1988-11-29 1990-06-06 Res Dev Corp Of Japan 多波長発光分析方法および装置
US5495334A (en) * 1990-07-26 1996-02-27 Research Development Corporation Of Japan Fourier transform spectroscope with quadrangular common path interferometer
US5414623A (en) * 1992-05-08 1995-05-09 Iowa State University Research Foundation Optoelectronic system for implementation of iterative computer tomography algorithms
JP2001227906A (ja) * 2000-02-18 2001-08-24 Ando Electric Co Ltd 光干渉計
US7079252B1 (en) * 2000-06-01 2006-07-18 Lifescan, Inc. Dual beam FTIR methods and devices for use in analyte detection in samples of low transmissivity
US6646264B1 (en) * 2000-10-30 2003-11-11 Monsanto Technology Llc Methods and devices for analyzing agricultural products
US6985232B2 (en) * 2003-03-13 2006-01-10 Tokyo Electron Limited Scatterometry by phase sensitive reflectometer
JP5120873B2 (ja) 2007-06-15 2013-01-16 国立大学法人 香川大学 分光計測装置及び分光計測方法
JP5078004B2 (ja) * 2007-06-15 2012-11-21 国立大学法人 香川大学 分光計測装置及び分光計測方法
WO2009070121A1 (en) * 2007-11-30 2009-06-04 Hamed Hamid Muhammed Miniaturized all-reflective holographic fourier transform imaging spectrometer based on a new all-reflective interferometer

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