JP2010123978A5 - - Google Patents
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- Publication number
- JP2010123978A5 JP2010123978A5 JP2009291333A JP2009291333A JP2010123978A5 JP 2010123978 A5 JP2010123978 A5 JP 2010123978A5 JP 2009291333 A JP2009291333 A JP 2009291333A JP 2009291333 A JP2009291333 A JP 2009291333A JP 2010123978 A5 JP2010123978 A5 JP 2010123978A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- ferromagnetic layer
- ferromagnetic
- magnetoresistive element
- nonmagnetic intermediate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 230000005294 ferromagnetic effect Effects 0.000 claims 11
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical group [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims 4
- 230000005290 antiferromagnetic effect Effects 0.000 claims 3
- 230000005415 magnetization Effects 0.000 claims 3
- 229910052751 metal Inorganic materials 0.000 claims 3
- 239000002184 metal Substances 0.000 claims 3
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical group [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims 2
- 239000000956 alloy Substances 0.000 claims 2
- 229910045601 alloy Inorganic materials 0.000 claims 2
- 229910052796 boron Inorganic materials 0.000 claims 2
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 claims 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims 1
- 230000004888 barrier function Effects 0.000 claims 1
- 229910052741 iridium Inorganic materials 0.000 claims 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 claims 1
- 229910052748 manganese Inorganic materials 0.000 claims 1
- 239000011572 manganese Substances 0.000 claims 1
- 229910052762 osmium Inorganic materials 0.000 claims 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 claims 1
- 229910052763 palladium Inorganic materials 0.000 claims 1
- 229910052697 platinum Inorganic materials 0.000 claims 1
- 229910052703 rhodium Inorganic materials 0.000 claims 1
- 239000010948 rhodium Substances 0.000 claims 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 claims 1
- 229910052707 ruthenium Inorganic materials 0.000 claims 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009291333A JP2010123978A (ja) | 2007-05-07 | 2009-12-22 | 磁気抵抗素子の製造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007122367 | 2007-05-07 | ||
JP2009291333A JP2010123978A (ja) | 2007-05-07 | 2009-12-22 | 磁気抵抗素子の製造方法 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008110434A Division JP2008306169A (ja) | 2007-05-07 | 2008-04-21 | 磁気抵抗素子、磁気抵抗素子の製造方法及び磁性多層膜作成装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010123978A JP2010123978A (ja) | 2010-06-03 |
JP2010123978A5 true JP2010123978A5 (enrdf_load_stackoverflow) | 2011-08-25 |
Family
ID=40113862
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008110434A Pending JP2008306169A (ja) | 2007-05-07 | 2008-04-21 | 磁気抵抗素子、磁気抵抗素子の製造方法及び磁性多層膜作成装置 |
JP2009291333A Pending JP2010123978A (ja) | 2007-05-07 | 2009-12-22 | 磁気抵抗素子の製造方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008110434A Pending JP2008306169A (ja) | 2007-05-07 | 2008-04-21 | 磁気抵抗素子、磁気抵抗素子の製造方法及び磁性多層膜作成装置 |
Country Status (2)
Country | Link |
---|---|
JP (2) | JP2008306169A (enrdf_load_stackoverflow) |
CN (1) | CN101304070B (enrdf_load_stackoverflow) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102082018B (zh) * | 2009-11-26 | 2013-10-16 | 中国科学院物理研究所 | 一种磁性多层膜单元及其制备和磁矩翻转方法 |
US8508221B2 (en) * | 2010-08-30 | 2013-08-13 | Everspin Technologies, Inc. | Two-axis magnetic field sensor having reduced compensation angle for zero offset |
US8325448B2 (en) * | 2011-02-11 | 2012-12-04 | Headway Technologies, Inc. | Pinning field in MR devices despite higher annealing temperature |
US20130065075A1 (en) * | 2011-09-12 | 2013-03-14 | Klemens Pruegl | Magnetoresistive spin valve layer systems |
JP2020068214A (ja) * | 2017-02-28 | 2020-04-30 | Tdk株式会社 | 強磁性多層膜、磁気抵抗効果素子、及び強磁性多層膜を製造する方法 |
US10700267B2 (en) * | 2017-11-13 | 2020-06-30 | Tdk Corporation | Magnetoresistive element, manufacturing method thereof and magnetic sensor |
CN110491990B (zh) * | 2019-08-13 | 2024-09-13 | 上海新微技术研发中心有限公司 | 磁存储器件 |
CN112750944A (zh) * | 2019-10-30 | 2021-05-04 | 上海磁宇信息科技有限公司 | 磁性隧道结结构及磁性随机存储器 |
CN114284428A (zh) * | 2021-11-17 | 2022-04-05 | 天津理工大学 | 一种基于pmn-pt的铁电/铁磁复合薄膜的磁电存储元件及其制备方法 |
CN115101284B (zh) * | 2022-08-25 | 2022-12-20 | 季华实验室 | 一种磁性多层膜及其制备方法和应用 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5528440A (en) * | 1994-07-26 | 1996-06-18 | International Business Machines Corporation | Spin valve magnetoresistive element with longitudinal exchange biasing of end regions abutting the free layer, and magnetic recording system using the element |
JPH08111315A (ja) * | 1994-10-07 | 1996-04-30 | Mitsui Mining & Smelting Co Ltd | 磁気抵抗効果多層膜 |
US6226159B1 (en) * | 1999-06-25 | 2001-05-01 | International Business Machines Corporation | Multilayered pinned layer of cobalt based films separated by a nickel base film for improved coupling field and GMR for spin valve sensors |
JP3473016B2 (ja) * | 1999-08-25 | 2003-12-02 | 日本電気株式会社 | 強磁性トンネル接合素子と磁気ヘッドと磁気メモリ |
JP4693292B2 (ja) * | 2000-09-11 | 2011-06-01 | 株式会社東芝 | 強磁性トンネル接合素子およびその製造方法 |
JP2002167661A (ja) * | 2000-11-30 | 2002-06-11 | Anelva Corp | 磁性多層膜作製装置 |
JP4167428B2 (ja) * | 2001-02-01 | 2008-10-15 | 株式会社東芝 | 磁気抵抗効果素子、磁気抵抗効果ヘッド、および磁気記録再生装置 |
JP4387955B2 (ja) * | 2001-04-24 | 2009-12-24 | パナソニック株式会社 | 磁気抵抗効果素子 |
JP3551196B2 (ja) * | 2001-06-26 | 2004-08-04 | 松下電器産業株式会社 | 磁気抵抗素子の製造方法 |
JP3607265B2 (ja) * | 2001-06-26 | 2005-01-05 | 松下電器産業株式会社 | 磁気抵抗素子 |
JP3737986B2 (ja) * | 2001-07-25 | 2006-01-25 | アルプス電気株式会社 | 交換結合膜と前記交換結合膜を用いた磁気検出素子 |
JP2003258335A (ja) * | 2002-03-04 | 2003-09-12 | Matsushita Electric Ind Co Ltd | トンネル磁気抵抗効果素子の製造方法 |
JP2003304012A (ja) * | 2002-04-10 | 2003-10-24 | Matsushita Electric Ind Co Ltd | トンネル磁気抵抗効果素子 |
JP2003324225A (ja) * | 2002-04-26 | 2003-11-14 | Nec Corp | 積層フェリ型磁性薄膜並びにそれを使用した磁気抵抗効果素子及び強磁性トンネル素子 |
JP2004047583A (ja) * | 2002-07-09 | 2004-02-12 | Matsushita Electric Ind Co Ltd | 磁気抵抗効果素子とこれを用いた磁気ヘッドおよび磁気メモリならびに磁気記録装置 |
JP2005223193A (ja) * | 2004-02-06 | 2005-08-18 | Tdk Corp | 磁気抵抗効果素子、薄膜磁気ヘッド、薄膜磁気ヘッドのウエハ、ヘッドジンバルアセンブリ、ヘッドアームアセンブリ、ヘッドスタックアセンブリ、およびハードディスク装置 |
JP4292128B2 (ja) * | 2004-09-07 | 2009-07-08 | キヤノンアネルバ株式会社 | 磁気抵抗効果素子の製造方法 |
JP2006156893A (ja) * | 2004-12-01 | 2006-06-15 | Tdk Corp | 磁気メモリ |
JP2006165265A (ja) * | 2004-12-07 | 2006-06-22 | Sony Corp | 記憶素子及びメモリ |
JP4661230B2 (ja) * | 2005-01-21 | 2011-03-30 | ソニー株式会社 | 記憶素子及びメモリ |
JP4008478B2 (ja) * | 2005-07-13 | 2007-11-14 | Tdk株式会社 | 磁界検出素子、基体、ウエハ、ヘッドジンバルアセンブリ、ハードディスク装置、および磁界検出素子の製造方法 |
JP2007027493A (ja) * | 2005-07-19 | 2007-02-01 | Nec Corp | 磁気抵抗効果素子およびその製造方法 |
JP2007073638A (ja) * | 2005-09-05 | 2007-03-22 | Sony Corp | 記憶素子及びメモリ |
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2008
- 2008-04-21 JP JP2008110434A patent/JP2008306169A/ja active Pending
- 2008-05-07 CN CN200810095658XA patent/CN101304070B/zh active Active
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2009
- 2009-12-22 JP JP2009291333A patent/JP2010123978A/ja active Pending