JP2009544169A - 新規な導体と誘電体組成物とを含む薄膜トランジスタ - Google Patents

新規な導体と誘電体組成物とを含む薄膜トランジスタ Download PDF

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Publication number
JP2009544169A
JP2009544169A JP2009520789A JP2009520789A JP2009544169A JP 2009544169 A JP2009544169 A JP 2009544169A JP 2009520789 A JP2009520789 A JP 2009520789A JP 2009520789 A JP2009520789 A JP 2009520789A JP 2009544169 A JP2009544169 A JP 2009544169A
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Prior art keywords
group
layer
film transistor
thin film
styrene
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Ceased
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JP2009520789A
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Japanese (ja)
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JP2009544169A5 (enExample
Inventor
リチャード・ケヴィン・ベイリー
グラシエラ・ベアトリス・ブランチェット
ジョン・ダブリュー・カトロン
リード・ジョン・チェスターフィールド
フェン・ガオ
ハワード・デイヴィッド・グリックスマン
マーク・ビー・ゴールドフィンガー
ゲアリー・デルマー・ジェイコックス
リンダ・ケイ・ジョンソン
ルーパン・レオン・クゥセイヤン
アイリーナ・マラジョヴィック
ホン・メン
ジェフリー・スコット・メス
ジェフリー・ヌーニシュ
ジェラード・オニール
ケネス・ジョージ・シャープ
ナンシー・ジー・タシ
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EIDP Inc
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EI Du Pont de Nemours and Co
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Application filed by EI Du Pont de Nemours and Co filed Critical EI Du Pont de Nemours and Co
Publication of JP2009544169A publication Critical patent/JP2009544169A/ja
Publication of JP2009544169A5 publication Critical patent/JP2009544169A5/ja
Ceased legal-status Critical Current

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/18Deposition of organic active material using non-liquid printing techniques, e.g. thermal transfer printing from a donor sheet
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • H10K10/471Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising only organic materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/464Lateral top-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/466Lateral bottom-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/481Insulated gate field-effect transistors [IGFETs] characterised by the gate conductors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/80Constructional details
    • H10K10/82Electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/10Organic polymers or oligomers
    • H10K85/111Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/60Organic compounds having low molecular weight
    • H10K85/615Polycyclic condensed aromatic hydrocarbons, e.g. anthracene
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/60Organic compounds having low molecular weight
    • H10K85/649Aromatic compounds comprising a hetero atom
    • H10K85/655Aromatic compounds comprising a hetero atom comprising only sulfur as heteroatom

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Thin Film Transistor (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Formation Of Insulating Films (AREA)
JP2009520789A 2006-07-17 2007-07-16 新規な導体と誘電体組成物とを含む薄膜トランジスタ Ceased JP2009544169A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/488,200 US7528448B2 (en) 2006-07-17 2006-07-17 Thin film transistor comprising novel conductor and dielectric compositions
PCT/US2007/016119 WO2008010983A2 (en) 2006-07-17 2007-07-16 Thin film transistor comprising novel conductor and dielectric compositions

Publications (2)

Publication Number Publication Date
JP2009544169A true JP2009544169A (ja) 2009-12-10
JP2009544169A5 JP2009544169A5 (enExample) 2010-03-25

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JP2009520789A Ceased JP2009544169A (ja) 2006-07-17 2007-07-16 新規な導体と誘電体組成物とを含む薄膜トランジスタ

Country Status (5)

Country Link
US (2) US7528448B2 (enExample)
EP (3) EP2482354A1 (enExample)
JP (1) JP2009544169A (enExample)
CN (1) CN101490863A (enExample)
WO (1) WO2008010983A2 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
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JP2008244022A (ja) * 2007-03-26 2008-10-09 Kyushu Univ 有機半導体素子およびその製造方法
JP2011100972A (ja) * 2009-11-03 2011-05-19 Internatl Business Mach Corp <Ibm> 高性能のカーボン・ナノ電子デバイスを製造するための有機バッファ層の利用
JP2013505898A (ja) * 2009-09-25 2013-02-21 北京大学 芳香族ボロン酸エステル化合物の調製方法
JP2016508893A (ja) * 2013-08-01 2016-03-24 エルジー・ケム・リミテッド 3次元構造の金属パターンの製造方法

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US7528448B2 (en) * 2006-07-17 2009-05-05 E.I. Du Pont De Nemours And Company Thin film transistor comprising novel conductor and dielectric compositions
US7582403B2 (en) * 2006-07-17 2009-09-01 E. I. Du Pont De Nemours And Company Metal compositions, thermal imaging donors and patterned multilayer compositions derived therefrom
JP2010514667A (ja) * 2007-01-05 2010-05-06 トップ・ナノシス・インコーポレーテッド 炭素ナノチューブ分散剤、炭素ナノチューブ組成物、炭素ナノチューブフィルム及び炭素ナノチューブフィルムの製造方法
JP2008235880A (ja) * 2007-02-21 2008-10-02 Brother Ind Ltd 薄膜トランジスタ及び薄膜トランジスタの製造方法
KR101257851B1 (ko) * 2007-03-13 2013-04-24 삼성전자주식회사 디스플레용 박막 트랜지스터 및 그 제조 방법
TWI345671B (en) * 2007-08-10 2011-07-21 Au Optronics Corp Thin film transistor, pixel structure and liquid crystal display panel
US8445840B2 (en) 2007-09-07 2013-05-21 Bruker Biospin Corporation Imaging target for testing quality of multiple-magnification focus and image co-registration
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US7879678B2 (en) * 2008-02-28 2011-02-01 Versatilis Llc Methods of enhancing performance of field-effect transistors and field-effect transistors made thereby
CN101582381B (zh) * 2008-05-14 2011-01-26 鸿富锦精密工业(深圳)有限公司 薄膜晶体管及其阵列的制备方法
KR101468596B1 (ko) 2008-07-09 2014-12-05 삼성전자주식회사 자기 조립 유기겔에 기초한 유기 나노섬유 구조와 이를이용한 유기 나노섬유 트랜지스터 및 이들의 제조방법
GB2462591B (en) * 2008-08-05 2013-04-03 Cambridge Display Tech Ltd Organic thin film transistors and methods of making the same
US8154080B2 (en) * 2008-12-05 2012-04-10 Xerox Corporation Dielectric structure having lower-k and higher-k materials
JP2010168347A (ja) * 2008-12-22 2010-08-05 Semiconductor Energy Lab Co Ltd カルバゾール誘導体を製造する方法
US8330156B2 (en) * 2008-12-26 2012-12-11 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor with a plurality of oxide clusters over the gate insulating layer
US8436350B2 (en) * 2009-01-30 2013-05-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device using an oxide semiconductor with a plurality of metal clusters
JP2013504186A (ja) * 2009-09-05 2013-02-04 メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング 有機電子装置用の溶液加工性パッシベーション層
US8304512B2 (en) * 2010-01-19 2012-11-06 Xerox Corporation Benzodithiophene based materials compositions
WO2011145814A2 (ko) * 2010-05-19 2011-11-24 경희대학교 산학협력단 박막 트랜지스터 및 그 제조 방법
JP5652005B2 (ja) * 2010-06-03 2015-01-14 ソニー株式会社 薄膜トランジスタおよびその製造方法、ならびに電子機器
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US8742403B2 (en) 2011-03-08 2014-06-03 Samsung Electronics Co., Ltd. Xanthene based semiconductor compositions
TWI538235B (zh) 2011-04-19 2016-06-11 弗里松股份有限公司 薄膜光伏打裝置及製造方法
CN102629077A (zh) * 2011-06-29 2012-08-08 北京京东方光电科技有限公司 树脂介电层及其材料的制备方法、液晶面板及显示器件
CN102654805B (zh) * 2011-08-03 2014-11-19 京东方科技集团股份有限公司 电子手写屏
US8692238B2 (en) 2012-04-25 2014-04-08 Eastman Kodak Company Semiconductor devices and methods of preparation
JP6482082B2 (ja) 2012-12-21 2019-03-13 フリソム アクツィエンゲゼルシャフトFlisom Ag カリウムを添加した薄膜光電子デバイスの製作
CN105705610B (zh) 2013-08-23 2018-01-30 巴斯夫欧洲公司 具有端杂芳基氰基亚乙烯基的化合物及其在有机太阳能电池中的应用
KR101555753B1 (ko) * 2013-11-18 2015-09-30 서울대학교산학협력단 단일 공정의 부식 방지된 구리 페이스트 제조와 다이폴 태그 안테나로의 응용
TWI677105B (zh) 2014-05-23 2019-11-11 瑞士商弗里松股份有限公司 製造薄膜光電子裝置之方法及可藉由該方法獲得的薄膜光電子裝置
WO2015191293A1 (en) 2014-06-11 2015-12-17 Eastman Kodak Company Devices having dielectric layers with thiosulfate-containing polymers
CN104076550A (zh) * 2014-06-17 2014-10-01 京东方科技集团股份有限公司 彩膜阵列基板、显示装置及彩膜阵列基板的制作方法
TWI661991B (zh) 2014-09-18 2019-06-11 瑞士商弗里松股份有限公司 用於製造薄膜裝置之自組裝圖案化
US10651324B2 (en) 2016-02-11 2020-05-12 Flisom Ag Self-assembly patterning for fabricating thin-film devices
US10658532B2 (en) 2016-02-11 2020-05-19 Flisom Ag Fabricating thin-film optoelectronic devices with added rubidium and/or cesium
WO2025113770A1 (en) * 2023-11-27 2025-06-05 Yellow Dot D.O.O. A coating composition for forming a flexible dielectric coat with high dielectric permittivity

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Publication number Priority date Publication date Assignee Title
JP2008244022A (ja) * 2007-03-26 2008-10-09 Kyushu Univ 有機半導体素子およびその製造方法
JP2013505898A (ja) * 2009-09-25 2013-02-21 北京大学 芳香族ボロン酸エステル化合物の調製方法
JP2011100972A (ja) * 2009-11-03 2011-05-19 Internatl Business Mach Corp <Ibm> 高性能のカーボン・ナノ電子デバイスを製造するための有機バッファ層の利用
JP2016508893A (ja) * 2013-08-01 2016-03-24 エルジー・ケム・リミテッド 3次元構造の金属パターンの製造方法
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Also Published As

Publication number Publication date
US8053840B2 (en) 2011-11-08
US7528448B2 (en) 2009-05-05
EP2482355A1 (en) 2012-08-01
US20080012006A1 (en) 2008-01-17
WO2008010983A3 (en) 2008-09-12
EP2041816A2 (en) 2009-04-01
WO2008010983A2 (en) 2008-01-24
EP2482354A1 (en) 2012-08-01
US20090179198A1 (en) 2009-07-16
CN101490863A (zh) 2009-07-22

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