JP2009530853A5 - - Google Patents

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Publication number
JP2009530853A5
JP2009530853A5 JP2009501475A JP2009501475A JP2009530853A5 JP 2009530853 A5 JP2009530853 A5 JP 2009530853A5 JP 2009501475 A JP2009501475 A JP 2009501475A JP 2009501475 A JP2009501475 A JP 2009501475A JP 2009530853 A5 JP2009530853 A5 JP 2009530853A5
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JP
Japan
Prior art keywords
bromide
chloride
chemical mechanical
mechanical polishing
substrate
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JP2009501475A
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English (en)
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JP5313866B2 (ja
JP2009530853A (ja
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Priority claimed from US11/388,085 external-priority patent/US7820067B2/en
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Publication of JP2009530853A publication Critical patent/JP2009530853A/ja
Publication of JP2009530853A5 publication Critical patent/JP2009530853A5/ja
Application granted granted Critical
Publication of JP5313866B2 publication Critical patent/JP5313866B2/ja
Expired - Fee Related legal-status Critical Current
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Claims (11)

  1. (a)研磨パッド、研磨剤及びそれらの組み合わせからなる群より選択される研磨構成材と、
    (b)液体キャリヤーと、
    (c)基材の少なくとも一部を酸化する酸化剤であって、前記液体キャリヤー及びそれに溶解又は懸濁した任意の成分の質量に基づいて0.5wt%以下の量で存在する酸化剤と、
    (d)塩化物、臭化物及びそれらの組み合わせからなる群より選択されるハロゲンアニオンと
    を含み、任意の成分が溶解又は懸濁した前記液体キャリヤーが3以下のpHを有する、基材を研磨するための化学機械研磨系。
  2. 前記基材が少なくとも1つのタンタル層と少なくとも1つの銅層を含む、請求項1に記載の化学機械研磨系。
  3. 前記液体キャリヤー中に懸濁された研磨剤を含む、請求項1に記載の化学機械研磨系。
  4. 前記研磨剤が、アルミナ、セリア、シリカ、ジルコニア、及びそれらの組み合わせからなる群より選択される、請求項に記載の化学機械研磨系。
  5. 研磨パッド及び該研磨パッドに固定された研磨剤を含む、請求項1に記載の化学機械研磨系。
  6. 前記ハロゲンアニオンが、酸の塩化物又は臭化物、アルカリ金属の塩化物又は臭化物、第IIIA族の塩化物又は臭化物、アンモニウム又はアンモニウム誘導体の塩化物又は臭化物塩、遷移金属の塩化物又は臭化物、及びそれらの組み合わせからなる群より選択される供給源によって生成される、請求項1に記載の化学機械研磨系。
  7. 前記ハロゲンアニオンが、塩化水素、塩化マグネシウム、塩化カルシウム、塩化ストロンチウム、塩化バリウム、塩化カリウム、塩化セシウム、塩化リチウム、塩化ナトリウム、塩化ルビジウム、塩化テトラブチルアンモニウム、塩化テトラメチルアンモニウム、塩化テトラエチルアンモニウム、塩化テトラプロピルアンモニウム、アルキルがC1〜C20アルキルである塩化アルキルベンジルジメチルアンモニウム、塩化アルミニウム、塩化ガリウム、塩化インジウム、塩化タリウム、塩化亜鉛、塩化銅、塩化第二鉄、塩化第一鉄、臭化テトラブチルアンモニウム、臭化テトラメチルアンモニウム、臭化テトラエチルアンモニウム、臭化テトラプロピルアンモニウム、アルキルがC1〜C20アルキルである臭化アルキルベンジルジメチルアンモニウム、臭化水素、臭化リチウム、臭化カリウム、臭化セシウム、臭化ルビジウム、臭化ナトリウム、臭化マグネシウム、臭化カルシウム、臭化ストロンチウム、臭化バリウム、臭化アルミニウム、臭化ガリウム、臭化インジウム、臭化タリウム、臭化亜鉛、臭化銅、臭化第二鉄、臭化第一鉄、及びそれらの組み合わせからなる群より選択される供給源によって生成される、請求項に記載の化学機械研磨系。
  8. 前記ハロゲンアニオンの濃度が0.5mM〜50mMである、請求項に記載の化学機械研磨系。
  9. (i)基材を請求項1〜8のいずれか1項に記載の化学機械研磨系と接触させる工程、
    (ii)前記基材に対して前記研磨構成材を動かす工程、及び
    (iii)該基材の少なくとも一部を削って該基材を研磨する工程
    を含む、基材を化学機械研磨する方法。
  10. 前記基材が少なくとも1つのタンタル層と少なくとも1つの銅層を含む、請求項に記載の方法。
  11. 前記銅層が1000Å/分以下の速度で前記基材から除去される、請求項10に記載の方法。
JP2009501475A 2006-03-23 2007-03-16 金属の除去速度を制御するためのハロゲン化物アニオン Expired - Fee Related JP5313866B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/388,085 US7820067B2 (en) 2006-03-23 2006-03-23 Halide anions for metal removal rate control
US11/388,085 2006-03-23
PCT/US2007/006709 WO2007111855A2 (en) 2006-03-23 2007-03-16 Halide anions for metal removal rate control

Publications (3)

Publication Number Publication Date
JP2009530853A JP2009530853A (ja) 2009-08-27
JP2009530853A5 true JP2009530853A5 (ja) 2010-05-06
JP5313866B2 JP5313866B2 (ja) 2013-10-09

Family

ID=38450247

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009501475A Expired - Fee Related JP5313866B2 (ja) 2006-03-23 2007-03-16 金属の除去速度を制御するためのハロゲン化物アニオン

Country Status (9)

Country Link
US (1) US7820067B2 (ja)
EP (1) EP1996664B1 (ja)
JP (1) JP5313866B2 (ja)
KR (1) KR101364318B1 (ja)
CN (1) CN101389724B (ja)
IL (1) IL192550A0 (ja)
MY (1) MY145564A (ja)
TW (1) TWI343406B (ja)
WO (1) WO2007111855A2 (ja)

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