JP2009123298A5 - - Google Patents
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- Publication number
- JP2009123298A5 JP2009123298A5 JP2007297479A JP2007297479A JP2009123298A5 JP 2009123298 A5 JP2009123298 A5 JP 2009123298A5 JP 2007297479 A JP2007297479 A JP 2007297479A JP 2007297479 A JP2007297479 A JP 2007297479A JP 2009123298 A5 JP2009123298 A5 JP 2009123298A5
- Authority
- JP
- Japan
- Prior art keywords
- cpu
- signal
- address
- address signal
- decoder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 239000004065 semiconductor Substances 0.000 claims 37
- 230000008878 coupling Effects 0.000 claims 3
- 238000010168 coupling process Methods 0.000 claims 3
- 238000005859 coupling reaction Methods 0.000 claims 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 2
- 230000005540 biological transmission Effects 0.000 claims 2
- 229910052814 silicon oxide Inorganic materials 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- 229910052581 Si3N4 Inorganic materials 0.000 claims 1
- 230000003321 amplification Effects 0.000 claims 1
- 238000003199 nucleic acid amplification method Methods 0.000 claims 1
- 230000000630 rising effect Effects 0.000 claims 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007297479A JP2009123298A (ja) | 2007-11-16 | 2007-11-16 | 半導体集積回路装置 |
| US12/269,098 US7848177B2 (en) | 2007-11-16 | 2008-11-12 | Semiconductor integrated circuit device |
| CN2008101814389A CN101436430B (zh) | 2007-11-16 | 2008-11-13 | 半导体集成电路装置 |
| EP08253714A EP2065893B1 (en) | 2007-11-16 | 2008-11-13 | Semiconductor integrated circuit device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007297479A JP2009123298A (ja) | 2007-11-16 | 2007-11-16 | 半導体集積回路装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2009123298A JP2009123298A (ja) | 2009-06-04 |
| JP2009123298A5 true JP2009123298A5 (enExample) | 2010-08-19 |
Family
ID=40303728
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007297479A Pending JP2009123298A (ja) | 2007-11-16 | 2007-11-16 | 半導体集積回路装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7848177B2 (enExample) |
| EP (1) | EP2065893B1 (enExample) |
| JP (1) | JP2009123298A (enExample) |
| CN (1) | CN101436430B (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101644169B1 (ko) | 2010-04-29 | 2016-08-01 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 이를 포함하는 비휘발성 메모리 시스템 |
| TW201225529A (en) * | 2010-12-03 | 2012-06-16 | Fortune Semiconductor Corp | Test mode controller and electronic apparatus with self-testing thereof |
| US8593878B2 (en) | 2011-11-17 | 2013-11-26 | Macronix International Co., Ltd. | Program method and flash memory using the same |
| CN103514956B (zh) * | 2012-06-15 | 2016-04-13 | 晶豪科技股份有限公司 | 半导体存储器元件及其测试方法 |
| US9190172B2 (en) * | 2013-01-24 | 2015-11-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP6359491B2 (ja) * | 2015-06-12 | 2018-07-18 | 東芝メモリ株式会社 | 半導体記憶装置 |
| US11048583B1 (en) * | 2015-09-11 | 2021-06-29 | Green Mountain Semiconductor Inc. | Flexible, low-latency error correction architecture for semiconductor memory products |
| DE102015221064A1 (de) * | 2015-10-28 | 2017-05-04 | Robert Bosch Gmbh | Anordnung aus wenigstens zwei Mikrocontrollern und Verfahren zur Herstellung einer solchen Anordnung |
| KR102557324B1 (ko) * | 2016-02-15 | 2023-07-20 | 에스케이하이닉스 주식회사 | 메모리 장치 |
| KR102682253B1 (ko) * | 2016-11-29 | 2024-07-08 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 메모리 시스템의 동작방법 |
| US9997212B1 (en) * | 2017-04-24 | 2018-06-12 | Micron Technology, Inc. | Accessing data in memory |
| US10347307B2 (en) * | 2017-06-29 | 2019-07-09 | SK Hynix Inc. | Skew control circuit and interface circuit including the same |
| JP2019040646A (ja) * | 2017-08-22 | 2019-03-14 | 東芝メモリ株式会社 | 半導体記憶装置 |
| US11360704B2 (en) | 2018-12-21 | 2022-06-14 | Micron Technology, Inc. | Multiplexed signal development in a memory device |
| CN111489773B (zh) * | 2019-01-29 | 2023-04-07 | 合肥格易集成电路有限公司 | 一种读取数据的电路、非易失存储器以及读取数据的方法 |
| US11676657B2 (en) * | 2020-04-16 | 2023-06-13 | Mediatek Inc. | Time-interleaving sensing scheme for pseudo dual-port memory |
| US11443823B2 (en) * | 2020-10-29 | 2022-09-13 | SambaNova Systems, Inc. | Method and circuit for scan dump of latch array |
| US12321262B2 (en) * | 2020-12-28 | 2025-06-03 | Kioxia Corporation | Memory system which orders data fetching from a latch circuit during execution of a read operation |
| JP7614966B2 (ja) * | 2021-07-14 | 2025-01-16 | キオクシア株式会社 | 半導体記憶装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2855633B2 (ja) | 1989-02-03 | 1999-02-10 | ミノルタ株式会社 | マルチプロセッサシステムにおけるデュアルポートメモリの故障診断装置 |
| JP2830594B2 (ja) | 1992-03-26 | 1998-12-02 | 日本電気株式会社 | 半導体メモリ装置 |
| US5375089A (en) | 1993-10-05 | 1994-12-20 | Advanced Micro Devices, Inc. | Plural port memory system utilizing a memory having a read port and a write port |
| JP2001306307A (ja) | 2000-04-25 | 2001-11-02 | Hitachi Ltd | ファームウェアの処理方法。 |
| JP4704541B2 (ja) * | 2000-04-27 | 2011-06-15 | エルピーダメモリ株式会社 | 半導体集積回路装置 |
| US6246634B1 (en) | 2000-05-01 | 2001-06-12 | Silicon Storage Technology, Inc. | Integrated memory circuit having a flash memory array and at least one SRAM memory array with internal address and data bus for transfer of signals therebetween |
| JP4331966B2 (ja) | 2003-04-14 | 2009-09-16 | 株式会社ルネサステクノロジ | 半導体集積回路 |
| US7349285B2 (en) | 2005-02-02 | 2008-03-25 | Texas Instruments Incorporated | Dual port memory unit using a single port memory core |
| JP2007297479A (ja) | 2006-04-28 | 2007-11-15 | Hitachi Chem Co Ltd | 樹脂組成物及び電気機器絶縁物の製造方法 |
-
2007
- 2007-11-16 JP JP2007297479A patent/JP2009123298A/ja active Pending
-
2008
- 2008-11-12 US US12/269,098 patent/US7848177B2/en not_active Expired - Fee Related
- 2008-11-13 EP EP08253714A patent/EP2065893B1/en not_active Expired - Fee Related
- 2008-11-13 CN CN2008101814389A patent/CN101436430B/zh not_active Expired - Fee Related
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