JP2009117394A5 - - Google Patents

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Publication number
JP2009117394A5
JP2009117394A5 JP2009048243A JP2009048243A JP2009117394A5 JP 2009117394 A5 JP2009117394 A5 JP 2009117394A5 JP 2009048243 A JP2009048243 A JP 2009048243A JP 2009048243 A JP2009048243 A JP 2009048243A JP 2009117394 A5 JP2009117394 A5 JP 2009117394A5
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JP
Japan
Prior art keywords
particle beam
charged particle
irradiation
current
cleaning process
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Application number
JP2009048243A
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English (en)
Japanese (ja)
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JP5331516B2 (ja
JP2009117394A (ja
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Publication date
Priority claimed from EP05019259.0A external-priority patent/EP1760761B1/en
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Publication of JP2009117394A publication Critical patent/JP2009117394A/ja
Publication of JP2009117394A5 publication Critical patent/JP2009117394A5/ja
Application granted granted Critical
Publication of JP5331516B2 publication Critical patent/JP5331516B2/ja
Active legal-status Critical Current
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JP2009048243A 2005-09-05 2009-03-02 荷電粒子ビーム照射デバイス及び荷電粒子ビーム照射デバイスを動作させるための方法 Active JP5331516B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05019259.0A EP1760761B1 (en) 2005-09-05 2005-09-05 Charged particle beam emitting device and method for operating a charged particle beam emitting device
EP05019259.0 2005-09-05

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2006240568A Division JP4688760B2 (ja) 2005-09-05 2006-09-05 荷電粒子ビーム照射デバイス及び荷電粒子ビーム照射デバイスを動作させるための方法

Publications (3)

Publication Number Publication Date
JP2009117394A JP2009117394A (ja) 2009-05-28
JP2009117394A5 true JP2009117394A5 (enExample) 2009-10-22
JP5331516B2 JP5331516B2 (ja) 2013-10-30

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Family Applications (2)

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JP2006240568A Expired - Fee Related JP4688760B2 (ja) 2005-09-05 2006-09-05 荷電粒子ビーム照射デバイス及び荷電粒子ビーム照射デバイスを動作させるための方法
JP2009048243A Active JP5331516B2 (ja) 2005-09-05 2009-03-02 荷電粒子ビーム照射デバイス及び荷電粒子ビーム照射デバイスを動作させるための方法

Family Applications Before (1)

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JP2006240568A Expired - Fee Related JP4688760B2 (ja) 2005-09-05 2006-09-05 荷電粒子ビーム照射デバイス及び荷電粒子ビーム照射デバイスを動作させるための方法

Country Status (3)

Country Link
US (1) US7595490B2 (enExample)
EP (2) EP1993119B1 (enExample)
JP (2) JP4688760B2 (enExample)

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US9018861B2 (en) 2011-12-29 2015-04-28 Elwha Llc Performance optimization of a field emission device
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US9659735B2 (en) 2012-09-12 2017-05-23 Elwha Llc Applications of graphene grids in vacuum electronics
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WO2016103432A1 (ja) 2014-12-26 2016-06-30 株式会社 日立ハイテクノロジーズ 複合荷電粒子線装置およびその制御方法
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JP6943701B2 (ja) 2017-09-15 2021-10-06 日本電子株式会社 冷陰極電界放出型電子銃の調整方法
JP7068069B2 (ja) * 2018-06-27 2022-05-16 株式会社日立製作所 電子顕微鏡
JP2020027779A (ja) * 2018-08-16 2020-02-20 日本電子株式会社 電子顕微鏡およびその制御方法
JP7054660B2 (ja) * 2018-08-22 2022-04-14 日本電子株式会社 フィラメント回路及び電子顕微鏡
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