JP2008546199A - 対称配置された電界効果トランジスタを有する画素 - Google Patents
対称配置された電界効果トランジスタを有する画素 Download PDFInfo
- Publication number
- JP2008546199A JP2008546199A JP2008514726A JP2008514726A JP2008546199A JP 2008546199 A JP2008546199 A JP 2008546199A JP 2008514726 A JP2008514726 A JP 2008514726A JP 2008514726 A JP2008514726 A JP 2008514726A JP 2008546199 A JP2008546199 A JP 2008546199A
- Authority
- JP
- Japan
- Prior art keywords
- image sensor
- photodetectors
- transistors
- transistor
- photodiodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005669 field effect Effects 0.000 title description 5
- 238000009792 diffusion process Methods 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000005421 electrostatic potential Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14641—Electronic components shared by two or more pixel-elements, e.g. one amplifier shared by two pixel elements
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
20、25、30、35 フォトダイオード
40、45、50、55 転送ゲート
60 リセットトランジスタ
70、75、80、85 浮遊拡散層
90 ソースフォロワ・トランジスタ(増幅器)
100 行選択信号線
110 列バス
120 デジタルカメラ
Claims (10)
- (a)アレイ状に配置された複数の光検出器;及び
(b)前記光検出器によって機能的に共有される複数のトランジスタであり、各光検出器の、隣接するトランジスタへの距離が実質的に同一である、複数のトランジスタ;
を有する画像センサ。 - 各光検出器の、機能的に共有される複数のトランジスタへの距離が実質的に同一である、請求項1に記載の画像センサ。
- 各トランジスタに印加される電位が実質的に同一である、請求項1に記載の画像センサ。
- 各トランジスタに印加される電位が実質的に同一である、請求項2に記載の画像センサ。
- 各光検出器はそれらの間で実質的に均一なピッチを有し、前記トランジスタは前記複数の光検出器を囲む領域内で実質的に均一なピッチで配置されている、請求項1に記載の画像センサ。
- (a)アレイ状に配置された複数の光検出器;及び
(b)前記光検出器によって機能的に共有される複数のトランジスタであり、各光検出器の、隣接するトランジスタへの距離が実質的に同一である、複数のトランジスタ;
を有する画像センサ
を有するデジタルカメラ。 - 各光検出器の、機能的に共有される複数のトランジスタへの距離が実質的に同一である、請求項6に記載のデジタルカメラ。
- 各トランジスタに印加される電位が実質的に同一である、請求項6に記載のデジタルカメラ。
- 各トランジスタに印加される電位が実質的に同一である、請求項7に記載のデジタルカメラ。
- 各光検出器はそれらの間で実質的に均一なピッチを有し、前記トランジスタは前記複数の光検出器を囲む領域内で実質的に均一なピッチで配置されている、請求項6に記載のデジタルカメラ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US68610305P | 2005-06-01 | 2005-06-01 | |
US11/432,573 US7342213B2 (en) | 2005-06-01 | 2006-05-11 | CMOS APS shared amplifier pixel with symmetrical field effect transistor placement |
PCT/US2006/020584 WO2006130516A1 (en) | 2005-06-01 | 2006-05-26 | Pixel with symmetrical field effect transistor placement |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008546199A true JP2008546199A (ja) | 2008-12-18 |
JP2008546199A5 JP2008546199A5 (ja) | 2009-06-04 |
Family
ID=36992552
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008514726A Pending JP2008546199A (ja) | 2005-06-01 | 2006-05-26 | 対称配置された電界効果トランジスタを有する画素 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7342213B2 (ja) |
EP (1) | EP1894245A1 (ja) |
JP (1) | JP2008546199A (ja) |
KR (1) | KR101320784B1 (ja) |
CN (1) | CN101185166B (ja) |
TW (1) | TWI385793B (ja) |
WO (1) | WO2006130516A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012186540A (ja) * | 2011-03-03 | 2012-09-27 | Toshiba Corp | 固体撮像装置 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7960768B2 (en) * | 2008-01-17 | 2011-06-14 | Aptina Imaging Corporation | 3D backside illuminated image sensor with multiplexed pixel structure |
TWI433307B (zh) * | 2008-10-22 | 2014-04-01 | Sony Corp | 固態影像感測器、其驅動方法、成像裝置及電子器件 |
JP5029624B2 (ja) * | 2009-01-15 | 2012-09-19 | ソニー株式会社 | 固体撮像装置及び電子機器 |
FR2955701A1 (fr) * | 2010-01-28 | 2011-07-29 | St Microelectronics Sa | Structure compacte de capteur d'image |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000232216A (ja) * | 1998-12-31 | 2000-08-22 | Eastman Kodak Co | 配線されたフローティングディフュージョンと共通増幅器のあるアクティブピクセルセンサ |
JP2002077731A (ja) * | 2000-08-25 | 2002-03-15 | Canon Inc | 固体撮像装置および撮像システム |
JP2004186407A (ja) * | 2002-12-03 | 2004-07-02 | Canon Inc | 光電変換装置 |
JP2005268537A (ja) * | 2004-03-18 | 2005-09-29 | Renesas Technology Corp | 撮像素子およびそれを備えた撮像装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5933188A (en) | 1994-10-19 | 1999-08-03 | Canon Kabushiki Kaisha | Photoelectric conversion apparatus and method with reset |
US6160281A (en) * | 1997-02-28 | 2000-12-12 | Eastman Kodak Company | Active pixel sensor with inter-pixel function sharing |
US6466266B1 (en) * | 1998-07-28 | 2002-10-15 | Eastman Kodak Company | Active pixel sensor with shared row timing signals |
JP3697073B2 (ja) | 1998-08-05 | 2005-09-21 | キヤノン株式会社 | 撮像装置及びそれを用いた撮像システム |
US6956605B1 (en) * | 1998-08-05 | 2005-10-18 | Canon Kabushiki Kaisha | Image pickup apparatus |
JP3559714B2 (ja) * | 1998-09-02 | 2004-09-02 | キヤノン株式会社 | 撮像装置およびそれを用いた撮像システム |
US6734906B1 (en) * | 1998-09-02 | 2004-05-11 | Canon Kabushiki Kaisha | Image pickup apparatus with photoelectric conversion portions arranged two dimensionally |
JP3792628B2 (ja) * | 2002-09-02 | 2006-07-05 | 富士通株式会社 | 固体撮像装置及び画像読み出し方法 |
JP3746769B2 (ja) * | 2003-02-24 | 2006-02-15 | 新光電子株式会社 | 物品の寸法測定装置 |
JP4230406B2 (ja) * | 2004-04-27 | 2009-02-25 | 富士通マイクロエレクトロニクス株式会社 | 固体撮像装置 |
US7830437B2 (en) * | 2005-05-11 | 2010-11-09 | Aptina Imaging Corp. | High fill factor multi-way shared pixel |
-
2006
- 2006-05-11 US US11/432,573 patent/US7342213B2/en active Active
- 2006-05-26 WO PCT/US2006/020584 patent/WO2006130516A1/en active Application Filing
- 2006-05-26 EP EP20060760458 patent/EP1894245A1/en not_active Withdrawn
- 2006-05-26 KR KR1020077027908A patent/KR101320784B1/ko active IP Right Grant
- 2006-05-26 JP JP2008514726A patent/JP2008546199A/ja active Pending
- 2006-05-26 CN CN2006800191229A patent/CN101185166B/zh not_active Ceased
- 2006-05-30 TW TW095119247A patent/TWI385793B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000232216A (ja) * | 1998-12-31 | 2000-08-22 | Eastman Kodak Co | 配線されたフローティングディフュージョンと共通増幅器のあるアクティブピクセルセンサ |
JP2002077731A (ja) * | 2000-08-25 | 2002-03-15 | Canon Inc | 固体撮像装置および撮像システム |
JP2004186407A (ja) * | 2002-12-03 | 2004-07-02 | Canon Inc | 光電変換装置 |
JP2005268537A (ja) * | 2004-03-18 | 2005-09-29 | Renesas Technology Corp | 撮像素子およびそれを備えた撮像装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012186540A (ja) * | 2011-03-03 | 2012-09-27 | Toshiba Corp | 固体撮像装置 |
Also Published As
Publication number | Publication date |
---|---|
TWI385793B (zh) | 2013-02-11 |
US20060273241A1 (en) | 2006-12-07 |
CN101185166A (zh) | 2008-05-21 |
US7342213B2 (en) | 2008-03-11 |
KR101320784B1 (ko) | 2013-10-22 |
TW200703633A (en) | 2007-01-16 |
WO2006130516A1 (en) | 2006-12-07 |
CN101185166B (zh) | 2011-04-27 |
EP1894245A1 (en) | 2008-03-05 |
KR20080009737A (ko) | 2008-01-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US11322535B2 (en) | Solid-state imaging device and camera | |
JP4752447B2 (ja) | 固体撮像装置およびカメラ | |
KR100657863B1 (ko) | 핑거드 타입 소스 폴로워 트랜지스터를 이용한 상보성금속 산화막 반도체 액티브 픽셀 센서 | |
KR100598015B1 (ko) | 공유 구조 상보성 금속 산화막 반도체 액티브 픽셀 센서어레이의 레이 아웃 | |
KR101129128B1 (ko) | 후면 조사 이미지 센서를 위한 회로 및 광센서 오버랩 | |
JP6018376B2 (ja) | 固体撮像装置およびカメラ | |
TWI418021B (zh) | 減低畫素區域影像感測器 | |
TWI412271B (zh) | 固態成像裝置、相機、及電子裝置 | |
KR100820520B1 (ko) | 고체촬상장치 | |
JP6183718B2 (ja) | 固体撮像装置 | |
JP5036709B2 (ja) | Cmos能動画素センサの増幅器を共有した画素 | |
JP2014049727A (ja) | 固体撮像装置 | |
US8542304B2 (en) | Solid-state imaging device | |
US20050274874A1 (en) | Active pixel cell using asymmetric transfer transistor | |
WO2011117949A1 (ja) | 固体撮像装置 | |
JP2008546199A (ja) | 対称配置された電界効果トランジスタを有する画素 | |
US9924120B2 (en) | Pixel unit and image sensor | |
JP5440056B2 (ja) | 固体撮像素子 | |
JP5313550B2 (ja) | 固体撮像装置 | |
JP4770246B2 (ja) | 固体撮像素子 | |
JP4720402B2 (ja) | 固体撮像装置 | |
JP7115067B2 (ja) | 固体撮像素子及び撮像システム | |
JP2009141838A (ja) | 撮像素子 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090414 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20090414 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20110530 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20111201 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20111206 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20120508 |