JP2008532293A5 - - Google Patents

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Publication number
JP2008532293A5
JP2008532293A5 JP2007557224A JP2007557224A JP2008532293A5 JP 2008532293 A5 JP2008532293 A5 JP 2008532293A5 JP 2007557224 A JP2007557224 A JP 2007557224A JP 2007557224 A JP2007557224 A JP 2007557224A JP 2008532293 A5 JP2008532293 A5 JP 2008532293A5
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JP
Japan
Prior art keywords
raw material
irradiated
euv light
droplet
droplets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2007557224A
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English (en)
Japanese (ja)
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JP2008532293A (ja
JP5431675B2 (ja
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Priority claimed from US11/067,124 external-priority patent/US7405416B2/en
Priority claimed from US11/174,443 external-priority patent/US7372056B2/en
Priority claimed from US11/358,988 external-priority patent/US20060255298A1/en
Application filed filed Critical
Publication of JP2008532293A publication Critical patent/JP2008532293A/ja
Publication of JP2008532293A5 publication Critical patent/JP2008532293A5/ja
Application granted granted Critical
Publication of JP5431675B2 publication Critical patent/JP5431675B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007557224A 2005-02-25 2006-02-24 プレパルスによるレーザ生成プラズマeuv光源 Expired - Fee Related JP5431675B2 (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US11/067,124 US7405416B2 (en) 2005-02-25 2005-02-25 Method and apparatus for EUV plasma source target delivery
US11/067,124 2005-02-25
US11/174,443 US7372056B2 (en) 2005-06-29 2005-06-29 LPP EUV plasma source material target delivery system
US11/174,443 2005-06-29
US11/358,988 US20060255298A1 (en) 2005-02-25 2006-02-21 Laser produced plasma EUV light source with pre-pulse
US11/358,988 2006-02-21
PCT/US2006/006947 WO2006091948A2 (en) 2005-02-25 2006-02-24 Laser produced plasma euv light source with pre-pulse

Publications (3)

Publication Number Publication Date
JP2008532293A JP2008532293A (ja) 2008-08-14
JP2008532293A5 true JP2008532293A5 (enExample) 2009-04-09
JP5431675B2 JP5431675B2 (ja) 2014-03-05

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Family Applications (1)

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JP2007557224A Expired - Fee Related JP5431675B2 (ja) 2005-02-25 2006-02-24 プレパルスによるレーザ生成プラズマeuv光源

Country Status (3)

Country Link
US (1) US20060255298A1 (enExample)
JP (1) JP5431675B2 (enExample)
WO (1) WO2006091948A2 (enExample)

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US7641349B1 (en) 2008-09-22 2010-01-05 Cymer, Inc. Systems and methods for collector mirror temperature control using direct contact heat transfer
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US8283643B2 (en) * 2008-11-24 2012-10-09 Cymer, Inc. Systems and methods for drive laser beam delivery in an EUV light source
US8969838B2 (en) * 2009-04-09 2015-03-03 Asml Netherlands B.V. Systems and methods for protecting an EUV light source chamber from high pressure source material leaks
JP5687488B2 (ja) 2010-02-22 2015-03-18 ギガフォトン株式会社 極端紫外光生成装置
WO2011113591A2 (en) 2010-03-18 2011-09-22 Eth Zurich Optical collector for collecting extreme ultraviolet radiation, method for operating such an optical collector, and euv source with such a collector
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US8263953B2 (en) 2010-04-09 2012-09-11 Cymer, Inc. Systems and methods for target material delivery protection in a laser produced plasma EUV light source
US9066412B2 (en) 2010-04-15 2015-06-23 Asml Netherlands B.V. Systems and methods for cooling an optic
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US8462425B2 (en) 2010-10-18 2013-06-11 Cymer, Inc. Oscillator-amplifier drive laser with seed protection for an EUV light source
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US8633459B2 (en) 2011-03-02 2014-01-21 Cymer, Llc Systems and methods for optics cleaning in an EUV light source
US8604452B2 (en) 2011-03-17 2013-12-10 Cymer, Llc Drive laser delivery systems for EUV light source
US9029813B2 (en) * 2011-05-20 2015-05-12 Asml Netherlands B.V. Filter for material supply apparatus of an extreme ultraviolet light source
US9516730B2 (en) 2011-06-08 2016-12-06 Asml Netherlands B.V. Systems and methods for buffer gas flow stabilization in a laser produced plasma light source
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WO2016063409A1 (ja) * 2014-10-24 2016-04-28 ギガフォトン株式会社 極端紫外光生成システム及び極端紫外光を生成する方法
US9538628B1 (en) 2015-06-11 2017-01-03 Taiwan Semiconductor Manufacturing Co., Ltd. Method for EUV power improvement with fuel droplet trajectory stabilization
US9451683B1 (en) * 2015-07-14 2016-09-20 Taiwan Semiconductor Manufacturing Co., Ltd. Solution for EUV power increment at wafer level
US20170311429A1 (en) 2016-04-25 2017-10-26 Asml Netherlands B.V. Reducing the effect of plasma on an object in an extreme ultraviolet light source
JP6864096B2 (ja) 2016-12-19 2021-04-21 エーエスエムエル ネザーランズ ビー.ブイ. 計測センサ、リソグラフィ装置および内でのデバイス製造方法
US10499485B2 (en) 2017-06-20 2019-12-03 Asml Netherlands B.V. Supply system for an extreme ultraviolet light source
US10585215B2 (en) 2017-06-29 2020-03-10 Cymer, Llc Reducing optical damage on an optical element
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US11587781B2 (en) 2021-05-24 2023-02-21 Hamamatsu Photonics K.K. Laser-driven light source with electrodeless ignition
US11906902B2 (en) * 2021-08-06 2024-02-20 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor processing tool and methods of operation
US12165856B2 (en) 2022-02-21 2024-12-10 Hamamatsu Photonics K.K. Inductively coupled plasma light source
US12144072B2 (en) 2022-03-29 2024-11-12 Hamamatsu Photonics K.K. All-optical laser-driven light source with electrodeless ignition
US12156322B2 (en) 2022-12-08 2024-11-26 Hamamatsu Photonics K.K. Inductively coupled plasma light source with switched power supply

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