JP2008306180A - 膜の基板斜面及び縁部の研磨プロファイルを制御する方法及び装置 - Google Patents
膜の基板斜面及び縁部の研磨プロファイルを制御する方法及び装置 Download PDFInfo
- Publication number
- JP2008306180A JP2008306180A JP2008132105A JP2008132105A JP2008306180A JP 2008306180 A JP2008306180 A JP 2008306180A JP 2008132105 A JP2008132105 A JP 2008132105A JP 2008132105 A JP2008132105 A JP 2008132105A JP 2008306180 A JP2008306180 A JP 2008306180A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- polishing
- edge
- backing plate
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
- B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
- B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
- B24B9/065—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US93934307P | 2007-05-21 | 2007-05-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008306180A true JP2008306180A (ja) | 2008-12-18 |
| JP2008306180A5 JP2008306180A5 (enExample) | 2011-06-23 |
Family
ID=40072855
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008132105A Pending JP2008306180A (ja) | 2007-05-21 | 2008-05-20 | 膜の基板斜面及び縁部の研磨プロファイルを制御する方法及び装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20080293336A1 (enExample) |
| JP (1) | JP2008306180A (enExample) |
| TW (1) | TW200908123A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011161625A (ja) * | 2010-01-15 | 2011-08-25 | Ebara Corp | 研磨装置、研磨方法、研磨具を押圧する押圧部材 |
| WO2021044735A1 (ja) * | 2019-09-03 | 2021-03-11 | 株式会社荏原製作所 | 研磨装置 |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200908124A (en) * | 2007-05-21 | 2009-02-16 | Applied Materials Inc | Methods and apparatus for using a bevel polishing head with an efficient tape routing arrangement |
| JP2008284684A (ja) * | 2007-05-21 | 2008-11-27 | Applied Materials Inc | 研磨アームを使用して基板の縁部を研磨する方法及び装置 |
| US20080293329A1 (en) * | 2007-05-21 | 2008-11-27 | Applied Materials, Inc. | Methods and apparatus for identifying a substrate edge profile and adjusting the processing of the substrate according to the identified edge profile |
| US20080293333A1 (en) * | 2007-05-21 | 2008-11-27 | Applied Materials, Inc. | Methods and apparatus for controlling the size of an edge exclusion zone of a substrate |
| US20080293337A1 (en) * | 2007-05-21 | 2008-11-27 | Applied Materials, Inc. | Methods and apparatus for polishing a notch of a substrate by substrate vibration |
| JP2008306179A (ja) * | 2007-05-21 | 2008-12-18 | Applied Materials Inc | バッキングパッドを使用して基板の両面の縁部から膜及び薄片を除去する方法及び装置 |
| US20080291448A1 (en) * | 2007-05-21 | 2008-11-27 | Applied Materials, Inc. | Methods and apparatus for finding a substrate notch center |
| JP2009004765A (ja) * | 2007-05-21 | 2009-01-08 | Applied Materials Inc | 基板研磨のためにローリングバッキングパッドを使用する方法及び装置 |
| JP2009119537A (ja) * | 2007-11-12 | 2009-06-04 | Toshiba Corp | 基板処理方法及び基板処理装置 |
| JP5393039B2 (ja) * | 2008-03-06 | 2014-01-22 | 株式会社荏原製作所 | 研磨装置 |
| TW201002472A (en) * | 2008-04-21 | 2010-01-16 | Applied Materials Inc | Apparatus and methods for using a polishing tape cassette |
| US20100105290A1 (en) * | 2008-10-24 | 2010-04-29 | Applied Materials, Inc. | Methods and apparatus for indicating a polishing tape end |
| JP2011224680A (ja) * | 2010-04-16 | 2011-11-10 | Ebara Corp | 研磨方法及び研磨装置 |
| US8968537B2 (en) | 2011-02-09 | 2015-03-03 | Applied Materials, Inc. | PVD sputtering target with a protected backing plate |
| JP5886602B2 (ja) | 2011-03-25 | 2016-03-16 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
| US9457447B2 (en) | 2011-03-28 | 2016-10-04 | Ebara Corporation | Polishing apparatus and polishing method |
| JP6223873B2 (ja) * | 2014-03-14 | 2017-11-01 | 株式会社荏原製作所 | 研磨装置及び研磨方法 |
| EP3567139B1 (en) | 2018-05-11 | 2021-04-07 | SiCrystal GmbH | Chamfered silicon carbide substrate and method of chamfering |
| EP3567138B1 (en) | 2018-05-11 | 2020-03-25 | SiCrystal GmbH | Chamfered silicon carbide substrate and method of chamfering |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004241434A (ja) * | 2003-02-03 | 2004-08-26 | Ebara Corp | 基板処理装置 |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4533399A (en) * | 1983-04-12 | 1985-08-06 | Minnesota Mining And Manufacturing Company | Contact lens cleaning method |
| US5117590A (en) * | 1988-08-12 | 1992-06-02 | Shin-Etsu Handotai Co., Ltd. | Method of automatically chamfering a wafer and apparatus therefor |
| JP2719855B2 (ja) * | 1991-05-24 | 1998-02-25 | 信越半導体株式会社 | ウエーハ外周の鏡面面取り装置 |
| JP2559650B2 (ja) * | 1991-11-27 | 1996-12-04 | 信越半導体株式会社 | ウエーハ面取部研磨装置 |
| US5868857A (en) * | 1996-12-30 | 1999-02-09 | Intel Corporation | Rotating belt wafer edge cleaning apparatus |
| AT408856B (de) * | 1997-12-02 | 2002-03-25 | Lisec Peter | Vorrichtung zum automatischen säumen von plattenförmigen gegenständen |
| JP3197253B2 (ja) * | 1998-04-13 | 2001-08-13 | 株式会社日平トヤマ | ウエーハの面取り方法 |
| US6739947B1 (en) * | 1998-11-06 | 2004-05-25 | Beaver Creek Concepts Inc | In situ friction detector method and apparatus |
| JP2001205549A (ja) * | 2000-01-25 | 2001-07-31 | Speedfam Co Ltd | 基板エッジ部の片面研磨方法およびその装置 |
| US6629875B2 (en) * | 2000-01-28 | 2003-10-07 | Accretech Usa, Inc. | Machine for grinding-polishing of a water edge |
| JP2002043267A (ja) * | 2000-07-21 | 2002-02-08 | Ebara Corp | 基板洗浄装置、基板洗浄方法及び基板処理装置 |
| US6257953B1 (en) * | 2000-09-25 | 2001-07-10 | Center For Tribology, Inc. | Method and apparatus for controlled polishing |
| US6488567B1 (en) * | 2000-11-09 | 2002-12-03 | Axsun Technologies, Inc. | System and method for automated fiber polishing |
| JP2002219642A (ja) * | 2001-01-24 | 2002-08-06 | Fuji Electric Co Ltd | 磁気記録媒体用ガラス基板およびその製造方法、並びに該基板を用いた磁気記録媒体 |
| JP2002329687A (ja) * | 2001-05-02 | 2002-11-15 | Speedfam Co Ltd | デバイスウエハの外周研磨装置及び研磨方法 |
| JP3949941B2 (ja) * | 2001-11-26 | 2007-07-25 | 株式会社東芝 | 半導体装置の製造方法および研磨装置 |
| JP4090247B2 (ja) * | 2002-02-12 | 2008-05-28 | 株式会社荏原製作所 | 基板処理装置 |
| WO2005081301A1 (en) * | 2004-02-25 | 2005-09-01 | Ebara Corporation | Polishing apparatus and substrate processing apparatus |
| JP4284215B2 (ja) * | 2004-03-24 | 2009-06-24 | 株式会社東芝 | 基板処理方法 |
| KR101249430B1 (ko) * | 2004-10-15 | 2013-04-03 | 가부시키가이샤 에바라 세이사꾸쇼 | 폴리싱장치 및 폴리싱방법 |
| JP2006142388A (ja) * | 2004-11-16 | 2006-06-08 | Nihon Micro Coating Co Ltd | 研磨テープ及び方法 |
| TWI362064B (en) * | 2005-04-25 | 2012-04-11 | Applied Materials Inc | Methods and apparatus for cleaning an edge of a substrate |
| US20070131653A1 (en) * | 2005-12-09 | 2007-06-14 | Ettinger Gary C | Methods and apparatus for processing a substrate |
| JP2008036783A (ja) * | 2006-08-08 | 2008-02-21 | Sony Corp | 研磨方法および研磨装置 |
| JP2008306179A (ja) * | 2007-05-21 | 2008-12-18 | Applied Materials Inc | バッキングパッドを使用して基板の両面の縁部から膜及び薄片を除去する方法及び装置 |
| US20080293333A1 (en) * | 2007-05-21 | 2008-11-27 | Applied Materials, Inc. | Methods and apparatus for controlling the size of an edge exclusion zone of a substrate |
| TW200908124A (en) * | 2007-05-21 | 2009-02-16 | Applied Materials Inc | Methods and apparatus for using a bevel polishing head with an efficient tape routing arrangement |
| JP2008284684A (ja) * | 2007-05-21 | 2008-11-27 | Applied Materials Inc | 研磨アームを使用して基板の縁部を研磨する方法及び装置 |
| JP2008290233A (ja) * | 2007-05-21 | 2008-12-04 | Applied Materials Inc | 半導体製造における基板斜面及び縁部の研磨用の高性能及び低価格の研磨テープのための方法及び装置 |
| US20080293337A1 (en) * | 2007-05-21 | 2008-11-27 | Applied Materials, Inc. | Methods and apparatus for polishing a notch of a substrate by substrate vibration |
| US20080293329A1 (en) * | 2007-05-21 | 2008-11-27 | Applied Materials, Inc. | Methods and apparatus for identifying a substrate edge profile and adjusting the processing of the substrate according to the identified edge profile |
| US20080291448A1 (en) * | 2007-05-21 | 2008-11-27 | Applied Materials, Inc. | Methods and apparatus for finding a substrate notch center |
| JP2009004765A (ja) * | 2007-05-21 | 2009-01-08 | Applied Materials Inc | 基板研磨のためにローリングバッキングパッドを使用する方法及び装置 |
| TW200908125A (en) * | 2007-05-21 | 2009-02-16 | Applied Materials Inc | Methods and apparatus for polishing a notch of a substrate using a polishing pad |
-
2008
- 2008-05-20 JP JP2008132105A patent/JP2008306180A/ja active Pending
- 2008-05-20 TW TW097118571A patent/TW200908123A/zh unknown
- 2008-05-20 US US12/124,128 patent/US20080293336A1/en not_active Abandoned
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004241434A (ja) * | 2003-02-03 | 2004-08-26 | Ebara Corp | 基板処理装置 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011161625A (ja) * | 2010-01-15 | 2011-08-25 | Ebara Corp | 研磨装置、研磨方法、研磨具を押圧する押圧部材 |
| WO2021044735A1 (ja) * | 2019-09-03 | 2021-03-11 | 株式会社荏原製作所 | 研磨装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200908123A (en) | 2009-02-16 |
| US20080293336A1 (en) | 2008-11-27 |
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