JP2008039725A5 - - Google Patents

Download PDF

Info

Publication number
JP2008039725A5
JP2008039725A5 JP2006218062A JP2006218062A JP2008039725A5 JP 2008039725 A5 JP2008039725 A5 JP 2008039725A5 JP 2006218062 A JP2006218062 A JP 2006218062A JP 2006218062 A JP2006218062 A JP 2006218062A JP 2008039725 A5 JP2008039725 A5 JP 2008039725A5
Authority
JP
Japan
Prior art keywords
wiring board
printed wiring
inspection
probe
probes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006218062A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008039725A (ja
JP4835317B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2006218062A priority Critical patent/JP4835317B2/ja
Priority claimed from JP2006218062A external-priority patent/JP4835317B2/ja
Publication of JP2008039725A publication Critical patent/JP2008039725A/ja
Publication of JP2008039725A5 publication Critical patent/JP2008039725A5/ja
Application granted granted Critical
Publication of JP4835317B2 publication Critical patent/JP4835317B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2006218062A 2006-08-10 2006-08-10 プリント配線板の電気検査方法 Expired - Fee Related JP4835317B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006218062A JP4835317B2 (ja) 2006-08-10 2006-08-10 プリント配線板の電気検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006218062A JP4835317B2 (ja) 2006-08-10 2006-08-10 プリント配線板の電気検査方法

Publications (3)

Publication Number Publication Date
JP2008039725A JP2008039725A (ja) 2008-02-21
JP2008039725A5 true JP2008039725A5 (de) 2009-09-17
JP4835317B2 JP4835317B2 (ja) 2011-12-14

Family

ID=39174886

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006218062A Expired - Fee Related JP4835317B2 (ja) 2006-08-10 2006-08-10 プリント配線板の電気検査方法

Country Status (1)

Country Link
JP (1) JP4835317B2 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5314328B2 (ja) * 2008-06-06 2013-10-16 日置電機株式会社 アームオフセット取得方法
JP5236506B2 (ja) * 2009-01-06 2013-07-17 日置電機株式会社 基板検査装置
JP5310195B2 (ja) * 2009-03-31 2013-10-09 Ｔｄｋ株式会社 基板保持具、電子部品検査装置及び電子部品検査方法
JP5797240B2 (ja) * 2013-08-12 2015-10-21 太洋工業株式会社 プリント基板検査装置
JP6782001B2 (ja) * 2016-05-23 2020-11-11 ヤマハファインテック株式会社 電気検査装置
KR101819033B1 (ko) 2016-08-05 2018-01-17 (주)티이에스 배터리 보호 장치 제조 방법
JP6793755B2 (ja) 2016-12-22 2020-12-02 三井金属鉱業株式会社 多層配線板の製造方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06102301A (ja) * 1992-02-28 1994-04-15 I D Syst:Kk プリント基板の検査装置
JP2899492B2 (ja) * 1992-12-18 1999-06-02 株式会社テスコン プリント基板検査方法と検査装置
JPH0735808A (ja) * 1993-07-21 1995-02-07 Matsushita Electric Ind Co Ltd コンタクトプローブ移動式回路基板両面検査装置
JPH112653A (ja) * 1997-06-13 1999-01-06 Toppan Printing Co Ltd プリント配線板の検査方法
JP2004191166A (ja) * 2002-12-11 2004-07-08 Toppan Printing Co Ltd 毎葉もしくはテープ状基板の搬送機構及びそれを用いた検査装置

Similar Documents

Publication Publication Date Title
JP2008039725A5 (de)
MY154575A (en) Loaded printed circuit board test fixture and method for manufacturing the same
MY146719A (en) Probe assembly, method of producing it and electrical connecting apparatus
WO2008019134A3 (en) A probe head assembly for use in testing multiple wafer die
JP2015036625A5 (de)
TW200745578A (en) Inspection apparatus of testing a flat panel display and method of fabricating the same
TW200730829A (en) Finger tester for the testing of non-componented printed circuit boards and method of testing non-componented printed circuit boards with a finger tester
TW200809226A (en) Substrate inspecting apparatus and substrate inspecting method
JP2010045282A (ja) 回路基板固定装置および回路基板検査装置
JP5544226B2 (ja) 基板検査装置
JP2008102070A (ja) 電子部品検査プローブ
WO2008120518A1 (ja) Ｔｃｐハンドリング装置
KR19990076663A (ko) 탐침의 위치 조정에 의한 인쇄 회로의 전기분석 장치
KR101003394B1 (ko) 슬라이딩 피씨비 방식의 프로브회로기판의 착탈부를 구비한프로브 유닛
KR101416882B1 (ko) 프로브 검사장치의 프로브 핀 컨텍 체크 시스템
JP2008232851A (ja) プローブユニット及び検査装置
JP2012503189A (ja) 所定の温度条件下で繰り返しパターンの複数の電子部品を検査する方法
KR100737384B1 (ko) 모바일용 디스플레이 패널의 검사장치 및 방법
JP2007212194A (ja) 基板検査装置及び方法
JP2007232558A (ja) 電子部品検査プローブ
JP2012068043A (ja) 平面回路基板の電気検査装置及び電気検査方法
JP6576176B2 (ja) プローブユニットおよび基板検査装置
JPH03210481A (ja) プリント回路基板検査用可動プローブ式多点コンタクト装置
TWM555476U (zh) Pcba板信號對比設備
KR200417528Y1 (ko) Ｐｃｂ 전극판