TW200745578A - Inspection apparatus of testing a flat panel display and method of fabricating the same - Google Patents
Inspection apparatus of testing a flat panel display and method of fabricating the sameInfo
- Publication number
- TW200745578A TW200745578A TW096111633A TW96111633A TW200745578A TW 200745578 A TW200745578 A TW 200745578A TW 096111633 A TW096111633 A TW 096111633A TW 96111633 A TW96111633 A TW 96111633A TW 200745578 A TW200745578 A TW 200745578A
- Authority
- TW
- Taiwan
- Prior art keywords
- flat panel
- panel display
- inspection device
- probes
- fabricating
- Prior art date
Links
Classifications
-
- A—HUMAN NECESSITIES
- A41—WEARING APPAREL
- A41D—OUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
- A41D13/00—Professional, industrial or sporting protective garments, e.g. surgeons' gowns or garments protecting against blows or punches
- A41D13/04—Aprons; Fastening devices for aprons
-
- A—HUMAN NECESSITIES
- A41—WEARING APPAREL
- A41D—OUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
- A41D2300/00—Details of garments
- A41D2300/30—Closures
- A41D2300/33—Closures using straps or ties
-
- A—HUMAN NECESSITIES
- A41—WEARING APPAREL
- A41D—OUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
- A41D2400/00—Functions or special features of garments
- A41D2400/52—Disposable
-
- A—HUMAN NECESSITIES
- A41—WEARING APPAREL
- A41D—OUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
- A41D2500/00—Materials for garments
- A41D2500/50—Synthetic resins or rubbers
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Physical Education & Sports Medicine (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Liquid Crystal (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
To provide an inspection device for a flat panel display element test, allowing various probe arrangements in response to a tendency of forming micro-finely a pad electrode of a flat panel display element, and capable of preventing a malfunction caused by short circuiting between the adjacent probes, and a method of manufacturing the inspection device without requiring manual work. The inspection device includes a substrate 100, a body 118 arranged on the substrate, the plurality of probes 115 projected extendedly from both sides of the body, and a probe chips 122 arranged in lower ends of the probes projected extendedly from one side face of the body. The each probe is coated with an insulating film.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060030631A KR100787160B1 (en) | 2006-04-04 | 2006-04-04 | Inspection apparatus of testing a flat panel display and method of fabricating the same |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200745578A true TW200745578A (en) | 2007-12-16 |
Family
ID=38680609
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096111633A TW200745578A (en) | 2006-04-04 | 2007-04-02 | Inspection apparatus of testing a flat panel display and method of fabricating the same |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2007279034A (en) |
KR (1) | KR100787160B1 (en) |
CN (1) | CN101051066A (en) |
TW (1) | TW200745578A (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100988524B1 (en) | 2008-06-09 | 2010-10-20 | (주)에이원메카 | Probe needle equipped with probe block and manufacturing method of the probe needle |
KR100952138B1 (en) * | 2009-06-01 | 2010-04-09 | 주식회사 코디에스 | Menufacturing method of probe assembly |
KR100952139B1 (en) * | 2009-06-01 | 2010-04-09 | 주식회사 코디에스 | Menufacturing method of probe assembly and probe assembly |
KR100929649B1 (en) * | 2009-06-01 | 2009-12-03 | 주식회사 코디에스 | Menufacturing method of probe assembly |
KR100949295B1 (en) * | 2009-06-01 | 2010-03-23 | 주식회사 코디에스 | Menufacturing method of probe assembly having plural row |
KR100955597B1 (en) * | 2009-08-11 | 2010-05-03 | (주)메리테크 | Probe manufacturing methods using semiconductor or display panel device test |
KR100968602B1 (en) * | 2010-01-26 | 2010-07-08 | 주식회사 코디에스 | Mprobe assembly |
KR100977289B1 (en) * | 2010-02-02 | 2010-08-23 | (주)메리테크 | Probe using semiconductor or display panel device test |
CN101975921A (en) * | 2010-09-29 | 2011-02-16 | 上海天臣威讯信息技术有限公司 | Chip test board and test method, and DFN packaging device test board and test method |
CN104297530A (en) * | 2014-09-24 | 2015-01-21 | 昆山迈致治具科技有限公司 | Screen calibration detection box |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3974389B2 (en) | 2001-12-04 | 2007-09-12 | 日本メクトロン株式会社 | Manufacturing method of contact type probe |
KR100554180B1 (en) * | 2003-09-23 | 2006-02-22 | 주식회사 파이컴 | Manufacturing method of probe for testing flat panel display and probe thereby |
KR100474420B1 (en) * | 2002-11-22 | 2005-03-10 | 주식회사 파이컴 | Probe sheet for testing flat pannel display, method thereby, probe assembly having it |
KR100578695B1 (en) * | 2003-12-29 | 2006-05-12 | 주식회사 파이컴 | Method for manufacturing probe of flat panel display device |
KR100543684B1 (en) * | 2004-01-20 | 2006-01-20 | 주식회사 파이컴 | Method for manufacturing probe for testing flat panel display and probe thereby |
JP2006038457A (en) | 2004-07-22 | 2006-02-09 | Toray Eng Co Ltd | Film probe manufacturing method |
-
2006
- 2006-04-04 KR KR1020060030631A patent/KR100787160B1/en not_active IP Right Cessation
-
2007
- 2007-03-30 JP JP2007090910A patent/JP2007279034A/en active Pending
- 2007-04-02 TW TW096111633A patent/TW200745578A/en unknown
- 2007-04-02 CN CNA2007100907752A patent/CN101051066A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
KR100787160B1 (en) | 2007-12-21 |
JP2007279034A (en) | 2007-10-25 |
KR20070099322A (en) | 2007-10-09 |
CN101051066A (en) | 2007-10-10 |
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