JP2007531997A5 - - Google Patents

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Publication number
JP2007531997A5
JP2007531997A5 JP2007506170A JP2007506170A JP2007531997A5 JP 2007531997 A5 JP2007531997 A5 JP 2007531997A5 JP 2007506170 A JP2007506170 A JP 2007506170A JP 2007506170 A JP2007506170 A JP 2007506170A JP 2007531997 A5 JP2007531997 A5 JP 2007531997A5
Authority
JP
Japan
Prior art keywords
metal
ceramic substrate
substrate heater
containing gas
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007506170A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007531997A (ja
JP5475229B2 (ja
Filing date
Publication date
Priority claimed from US10/814,768 external-priority patent/US7419702B2/en
Application filed filed Critical
Publication of JP2007531997A publication Critical patent/JP2007531997A/ja
Publication of JP2007531997A5 publication Critical patent/JP2007531997A5/ja
Application granted granted Critical
Publication of JP5475229B2 publication Critical patent/JP5475229B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2007506170A 2004-03-31 2005-02-15 基板処理方法 Expired - Fee Related JP5475229B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/814,768 US7419702B2 (en) 2004-03-31 2004-03-31 Method for processing a substrate
US10/814,768 2004-03-31
PCT/US2005/004905 WO2005103325A1 (en) 2004-03-31 2005-02-15 A method for processing a substrate

Publications (3)

Publication Number Publication Date
JP2007531997A JP2007531997A (ja) 2007-11-08
JP2007531997A5 true JP2007531997A5 (enExample) 2011-06-30
JP5475229B2 JP5475229B2 (ja) 2014-04-16

Family

ID=34960969

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007506170A Expired - Fee Related JP5475229B2 (ja) 2004-03-31 2005-02-15 基板処理方法

Country Status (6)

Country Link
US (1) US7419702B2 (enExample)
JP (1) JP5475229B2 (enExample)
KR (1) KR101234492B1 (enExample)
CN (1) CN100557075C (enExample)
TW (1) TWI293649B (enExample)
WO (1) WO2005103325A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7323400B2 (en) * 2004-08-30 2008-01-29 Micron Technology, Inc. Plasma processing, deposition and ALD methods
US8124528B2 (en) 2008-04-10 2012-02-28 Micron Technology, Inc. Method for forming a ruthenium film
JP5434614B2 (ja) * 2010-01-14 2014-03-05 東京エレクトロン株式会社 基板処理装置
KR20130122503A (ko) * 2012-04-30 2013-11-07 세메스 주식회사 기판 세정 장치 및 기판 세정 방법
US8877617B2 (en) 2012-09-27 2014-11-04 Sunpower Corporation Methods and structures for forming and protecting thin films on substrates
US9528184B2 (en) * 2015-02-13 2016-12-27 Eastman Kodak Company Atomic-layer deposition method using compound gas jet
CN106158569B (zh) * 2015-03-26 2018-08-07 理想晶延半导体设备（上海）有限公司 半导体处理设备
US10121655B2 (en) 2015-11-20 2018-11-06 Applied Materials, Inc. Lateral plasma/radical source
US10006123B2 (en) * 2016-05-10 2018-06-26 The Boeing Company Species controlled chemical vapor deposition
CN112853316B (zh) * 2020-12-31 2023-03-14 拓荆科技股份有限公司 镀膜装置及其承载座
KR102872170B1 (ko) 2021-07-19 2025-10-15 삼성전자주식회사 반도체 장치의 제조용 장비 및 반도체 장치의 제조 방법

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4248943A (en) * 1980-04-21 1981-02-03 Ford Motor Company Sodium sulfur container with chromium/chromium oxide coating
US4894257A (en) * 1988-07-05 1990-01-16 The United States Of America As Represented By The Secretary Of America Method of overcoating a high current density cathode with rhodium
GB9001833D0 (en) * 1990-01-26 1990-03-28 De Beers Ind Diamond Method of bonding a diamond film to a substrate
JPH0559556A (ja) * 1991-09-02 1993-03-09 Osaka Gas Co Ltd Ｃｖｄ薄膜形成装置の基板保持台
JPH0741386A (ja) * 1993-07-29 1995-02-10 Sanyo Electric Co Ltd ダイヤモンド状被膜基板およびその形成方法
US5626963A (en) * 1993-07-07 1997-05-06 Sanyo Electric Co., Ltd. Hard-carbon-film-coated substrate and apparatus for forming the same
US5705080A (en) * 1994-07-06 1998-01-06 Applied Materials, Inc. Plasma-inert cover and plasma cleaning process
US5952060A (en) * 1996-06-14 1999-09-14 Applied Materials, Inc. Use of carbon-based films in extending the lifetime of substrate processing system components
US6197628B1 (en) * 1998-08-27 2001-03-06 Micron Technology, Inc. Ruthenium silicide diffusion barrier layers and methods of forming same
JP4547744B2 (ja) * 1999-11-17 2010-09-22 東京エレクトロン株式会社 プリコート膜の形成方法、成膜装置のアイドリング方法、載置台構造及び成膜装置
TW484189B (en) 1999-11-17 2002-04-21 Tokyo Electron Ltd Precoat film forming method, idling method of film forming device, loading table structure, film forming device and film forming method
JP4703810B2 (ja) * 2000-03-07 2011-06-15 東京エレクトロン株式会社 Ｃｖｄ成膜方法
JP3549188B2 (ja) * 2000-03-27 2004-08-04 日本エー・エス・エム株式会社 半導体基板への薄膜成膜方法
JP5165817B2 (ja) * 2000-03-31 2013-03-21 ラム リサーチ コーポレーション 静電チャック及びその製造方法
US6440495B1 (en) * 2000-08-03 2002-08-27 Applied Materials, Inc. Chemical vapor deposition of ruthenium films for metal electrode applications
US6461909B1 (en) * 2000-08-30 2002-10-08 Micron Technology, Inc. Process for fabricating RuSixOy-containing adhesion layers
JP2002115063A (ja) * 2000-10-06 2002-04-19 Ebara Corp 処理装置の付着物除去方法、付着物固定化方法及び処理装置
US6413321B1 (en) * 2000-12-07 2002-07-02 Applied Materials, Inc. Method and apparatus for reducing particle contamination on wafer backside during CVD process
JP4060526B2 (ja) * 2000-12-13 2008-03-12 株式会社日立国際電気 半導体装置の製造方法
JP2002338388A (ja) * 2001-02-15 2002-11-27 Ngk Insulators Ltd ダイヤモンドコート部材
US6869876B2 (en) * 2002-11-05 2005-03-22 Air Products And Chemicals, Inc. Process for atomic layer deposition of metal films

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