JP5475229B2 - 基板処理方法 - Google Patents
基板処理方法 Download PDFInfo
- Publication number
- JP5475229B2 JP5475229B2 JP2007506170A JP2007506170A JP5475229B2 JP 5475229 B2 JP5475229 B2 JP 5475229B2 JP 2007506170 A JP2007506170 A JP 2007506170A JP 2007506170 A JP2007506170 A JP 2007506170A JP 5475229 B2 JP5475229 B2 JP 5475229B2
- Authority
- JP
- Japan
- Prior art keywords
- metal
- substrate
- ceramic substrate
- substrate heater
- heater
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4581—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber characterised by material of construction or surface finish of the means for supporting the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/16—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal carbonyl compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
- Drying Of Semiconductors (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Resistance Heating (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/814,768 US7419702B2 (en) | 2004-03-31 | 2004-03-31 | Method for processing a substrate |
| US10/814,768 | 2004-03-31 | ||
| PCT/US2005/004905 WO2005103325A1 (en) | 2004-03-31 | 2005-02-15 | A method for processing a substrate |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007531997A JP2007531997A (ja) | 2007-11-08 |
| JP2007531997A5 JP2007531997A5 (enExample) | 2011-06-30 |
| JP5475229B2 true JP5475229B2 (ja) | 2014-04-16 |
Family
ID=34960969
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007506170A Expired - Fee Related JP5475229B2 (ja) | 2004-03-31 | 2005-02-15 | 基板処理方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7419702B2 (enExample) |
| JP (1) | JP5475229B2 (enExample) |
| KR (1) | KR101234492B1 (enExample) |
| CN (1) | CN100557075C (enExample) |
| TW (1) | TWI293649B (enExample) |
| WO (1) | WO2005103325A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7323400B2 (en) * | 2004-08-30 | 2008-01-29 | Micron Technology, Inc. | Plasma processing, deposition and ALD methods |
| US8124528B2 (en) | 2008-04-10 | 2012-02-28 | Micron Technology, Inc. | Method for forming a ruthenium film |
| JP5434614B2 (ja) * | 2010-01-14 | 2014-03-05 | 東京エレクトロン株式会社 | 基板処理装置 |
| KR20130122503A (ko) * | 2012-04-30 | 2013-11-07 | 세메스 주식회사 | 기판 세정 장치 및 기판 세정 방법 |
| US8877617B2 (en) | 2012-09-27 | 2014-11-04 | Sunpower Corporation | Methods and structures for forming and protecting thin films on substrates |
| US9528184B2 (en) * | 2015-02-13 | 2016-12-27 | Eastman Kodak Company | Atomic-layer deposition method using compound gas jet |
| CN106158569B (zh) * | 2015-03-26 | 2018-08-07 | 理想晶延半导体设备(上海)有限公司 | 半导体处理设备 |
| US10121655B2 (en) | 2015-11-20 | 2018-11-06 | Applied Materials, Inc. | Lateral plasma/radical source |
| US10006123B2 (en) * | 2016-05-10 | 2018-06-26 | The Boeing Company | Species controlled chemical vapor deposition |
| CN112853316B (zh) * | 2020-12-31 | 2023-03-14 | 拓荆科技股份有限公司 | 镀膜装置及其承载座 |
| KR102872170B1 (ko) | 2021-07-19 | 2025-10-15 | 삼성전자주식회사 | 반도체 장치의 제조용 장비 및 반도체 장치의 제조 방법 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4248943A (en) * | 1980-04-21 | 1981-02-03 | Ford Motor Company | Sodium sulfur container with chromium/chromium oxide coating |
| US4894257A (en) * | 1988-07-05 | 1990-01-16 | The United States Of America As Represented By The Secretary Of America | Method of overcoating a high current density cathode with rhodium |
| GB9001833D0 (en) * | 1990-01-26 | 1990-03-28 | De Beers Ind Diamond | Method of bonding a diamond film to a substrate |
| JPH0559556A (ja) * | 1991-09-02 | 1993-03-09 | Osaka Gas Co Ltd | Cvd薄膜形成装置の基板保持台 |
| JPH0741386A (ja) * | 1993-07-29 | 1995-02-10 | Sanyo Electric Co Ltd | ダイヤモンド状被膜基板およびその形成方法 |
| US5626963A (en) * | 1993-07-07 | 1997-05-06 | Sanyo Electric Co., Ltd. | Hard-carbon-film-coated substrate and apparatus for forming the same |
| US5705080A (en) * | 1994-07-06 | 1998-01-06 | Applied Materials, Inc. | Plasma-inert cover and plasma cleaning process |
| US5952060A (en) * | 1996-06-14 | 1999-09-14 | Applied Materials, Inc. | Use of carbon-based films in extending the lifetime of substrate processing system components |
| US6197628B1 (en) * | 1998-08-27 | 2001-03-06 | Micron Technology, Inc. | Ruthenium silicide diffusion barrier layers and methods of forming same |
| JP4547744B2 (ja) * | 1999-11-17 | 2010-09-22 | 東京エレクトロン株式会社 | プリコート膜の形成方法、成膜装置のアイドリング方法、載置台構造及び成膜装置 |
| TW484189B (en) | 1999-11-17 | 2002-04-21 | Tokyo Electron Ltd | Precoat film forming method, idling method of film forming device, loading table structure, film forming device and film forming method |
| JP4703810B2 (ja) * | 2000-03-07 | 2011-06-15 | 東京エレクトロン株式会社 | Cvd成膜方法 |
| JP3549188B2 (ja) * | 2000-03-27 | 2004-08-04 | 日本エー・エス・エム株式会社 | 半導体基板への薄膜成膜方法 |
| JP5165817B2 (ja) * | 2000-03-31 | 2013-03-21 | ラム リサーチ コーポレーション | 静電チャック及びその製造方法 |
| US6440495B1 (en) * | 2000-08-03 | 2002-08-27 | Applied Materials, Inc. | Chemical vapor deposition of ruthenium films for metal electrode applications |
| US6461909B1 (en) * | 2000-08-30 | 2002-10-08 | Micron Technology, Inc. | Process for fabricating RuSixOy-containing adhesion layers |
| JP2002115063A (ja) * | 2000-10-06 | 2002-04-19 | Ebara Corp | 処理装置の付着物除去方法、付着物固定化方法及び処理装置 |
| US6413321B1 (en) * | 2000-12-07 | 2002-07-02 | Applied Materials, Inc. | Method and apparatus for reducing particle contamination on wafer backside during CVD process |
| JP4060526B2 (ja) * | 2000-12-13 | 2008-03-12 | 株式会社日立国際電気 | 半導体装置の製造方法 |
| JP2002338388A (ja) * | 2001-02-15 | 2002-11-27 | Ngk Insulators Ltd | ダイヤモンドコート部材 |
| US6869876B2 (en) * | 2002-11-05 | 2005-03-22 | Air Products And Chemicals, Inc. | Process for atomic layer deposition of metal films |
-
2004
- 2004-03-31 US US10/814,768 patent/US7419702B2/en active Active
-
2005
- 2005-02-15 WO PCT/US2005/004905 patent/WO2005103325A1/en not_active Ceased
- 2005-02-15 CN CNB2005800100297A patent/CN100557075C/zh not_active Expired - Lifetime
- 2005-02-15 JP JP2007506170A patent/JP5475229B2/ja not_active Expired - Fee Related
- 2005-02-15 KR KR1020067015601A patent/KR101234492B1/ko not_active Expired - Lifetime
- 2005-03-31 TW TW094110239A patent/TWI293649B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| CN100557075C (zh) | 2009-11-04 |
| TWI293649B (en) | 2008-02-21 |
| JP2007531997A (ja) | 2007-11-08 |
| CN1938450A (zh) | 2007-03-28 |
| KR101234492B1 (ko) | 2013-02-18 |
| US7419702B2 (en) | 2008-09-02 |
| KR20070026378A (ko) | 2007-03-08 |
| TW200538573A (en) | 2005-12-01 |
| WO2005103325A1 (en) | 2005-11-03 |
| US20050221002A1 (en) | 2005-10-06 |
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