JP2006505975A5 - - Google Patents

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Publication number
JP2006505975A5
JP2006505975A5 JP2004548946A JP2004548946A JP2006505975A5 JP 2006505975 A5 JP2006505975 A5 JP 2006505975A5 JP 2004548946 A JP2004548946 A JP 2004548946A JP 2004548946 A JP2004548946 A JP 2004548946A JP 2006505975 A5 JP2006505975 A5 JP 2006505975A5
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JP
Japan
Prior art keywords
input
switch
output
operational amplifier
capacitors
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Application number
JP2004548946A
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English (en)
Japanese (ja)
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JP4526949B2 (ja
JP2006505975A (ja
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Priority claimed from PCT/BE2003/000187 external-priority patent/WO2004043062A1/en
Publication of JP2006505975A publication Critical patent/JP2006505975A/ja
Publication of JP2006505975A5 publication Critical patent/JP2006505975A5/ja
Application granted granted Critical
Publication of JP4526949B2 publication Critical patent/JP4526949B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2004548946A 2002-11-07 2003-11-06 赤外検出器用読出し回路 Expired - Lifetime JP4526949B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US42503602P 2002-11-07 2002-11-07
PCT/BE2003/000187 WO2004043062A1 (en) 2002-11-07 2003-11-06 Read-out circuit for infrared detectors.

Publications (3)

Publication Number Publication Date
JP2006505975A JP2006505975A (ja) 2006-02-16
JP2006505975A5 true JP2006505975A5 (enExample) 2010-05-27
JP4526949B2 JP4526949B2 (ja) 2010-08-18

Family

ID=32312919

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004548946A Expired - Lifetime JP4526949B2 (ja) 2002-11-07 2003-11-06 赤外検出器用読出し回路

Country Status (7)

Country Link
US (1) US7148727B2 (enExample)
EP (1) EP1561339B1 (enExample)
JP (1) JP4526949B2 (enExample)
CN (1) CN100525400C (enExample)
AU (1) AU2003283134A1 (enExample)
CA (1) CA2502467C (enExample)
WO (1) WO2004043062A1 (enExample)

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JP2006279377A (ja) 2005-03-29 2006-10-12 Handotai Rikougaku Kenkyu Center:Kk チョッパ増幅回路
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US8294495B2 (en) 2005-07-01 2012-10-23 Maxim Integrated Products, Inc. Constant slope ramp circuits for sampled-data circuits
US7522086B2 (en) 2005-12-29 2009-04-21 Cambridge Analog Technologies, Inc. Reference circuits for sampled-data circuits
US7504866B2 (en) 2005-12-29 2009-03-17 Cambridge Analog Technologies, Inc. Output hold circuits for sample-data circuits
KR100782304B1 (ko) * 2006-02-03 2007-12-06 삼성전자주식회사 Ｃｄｓ오프셋 보정 기능을 갖는 이미지 센서와이미지센서의 ｃｄｓ 방법
US7411460B2 (en) * 2006-03-10 2008-08-12 Exar Corporation Elimination of dummy detector on optical detectors using input common mode feedback
JP5292689B2 (ja) * 2006-10-31 2013-09-18 日本電気株式会社 熱型赤外線撮像装置及びその動作方法
US7525472B2 (en) * 2006-12-27 2009-04-28 Semiconductor Energy Laboratory Co., Ltd. Integration type and converter and device including same
CN100510661C (zh) * 2007-02-14 2009-07-08 中国科学院安徽光学精密机械研究所 反射式铟镓砷陷阱辐射探测器
CN101425098B (zh) * 2007-10-31 2010-08-25 中国科学院沈阳自动化研究所 红外探测器输出的模拟方法及装置
WO2009157964A1 (en) * 2008-06-26 2009-12-30 Marshall Delph Earle Techniques for monitoring storm conditions
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JP2011004327A (ja) * 2009-06-22 2011-01-06 Hamamatsu Photonics Kk 積分回路および光検出装置
JP5296612B2 (ja) * 2009-06-22 2013-09-25 浜松ホトニクス株式会社 積分回路および光検出装置
US8816268B1 (en) * 2011-04-29 2014-08-26 Bae Systems Information And Electronic Systems Integration Inc. Input unit cell circuitry for transducer readout
TWI439046B (zh) * 2011-08-12 2014-05-21 Richtek Technology Corp 自動調零放大器及相關的偵測模組
US8258864B1 (en) * 2011-09-21 2012-09-04 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Ultra low voltage multi-stage high-speed CMOS comparator with autozeroing
CN103036511B (zh) * 2012-12-14 2015-06-03 电子科技大学 红外焦平面阵列探测器读出电路的adc余量放大电路
TWI492538B (zh) * 2013-01-14 2015-07-11 Univ Nat Chi Nan Switchable reading device
JP6380882B2 (ja) * 2013-06-17 2018-08-29 セイコーＮｐｃ株式会社 信号検出回路
GB2524521A (en) * 2014-03-25 2015-09-30 Voltech Instr Ltd Apparatus and methods for measuring electrical current
JP6832649B2 (ja) 2016-08-17 2021-02-24 ブリルニクス インク 固体撮像装置、固体撮像装置の駆動方法、および電子機器
US10924701B2 (en) * 2019-07-18 2021-02-16 Omnivision Technologies, Inc. Column amplifier reset circuit with comparator
JP7383500B2 (ja) 2020-01-16 2023-11-20 浜松ホトニクス株式会社 固体撮像装置およびアンプアレイ
CN112738359A (zh) * 2020-12-30 2021-04-30 长春长光辰芯光电技术有限公司 Ctia像素单元
FR3123121B1 (fr) 2021-05-19 2025-12-05 St Microelectronics Grenoble 2 Capteur de lumiere ambiante
US11894670B2 (en) * 2021-09-21 2024-02-06 Raytheon Company High-energy suppression for infrared imagers or other imaging devices
JP2023104261A (ja) 2022-01-17 2023-07-28 ブリルニクス シンガポール プライベート リミテッド 固体撮像装置、固体撮像装置の駆動方法、および電子機器
US11843355B2 (en) 2022-02-04 2023-12-12 Raytheon Company High-energy suppression for capacitor transimpedance amplifier (CTIA)-based imagers or other imaging devices
JP2024010357A (ja) 2022-07-12 2024-01-24 ブリルニクス シンガポール プライベート リミテッド 固体撮像装置、固体撮像装置の駆動方法、および電子機器
JP2024040751A (ja) 2022-09-13 2024-03-26 ブリルニクス シンガポール プライベート リミテッド 固体撮像装置、固体撮像装置の駆動方法、および電子機器
US12206369B2 (en) 2023-02-07 2025-01-21 Raytheon Company High flux detection and imaging using capacitor transimpedance amplifier (CTIA)-based unit cells in imaging devices
US12289554B2 (en) 2023-02-07 2025-04-29 Raytheon Company Artifact mitigation in capacitor transimpedance amplifier (CTIA)-based imagers or other imaging devices
US12432475B2 (en) 2023-04-18 2025-09-30 Raytheon Company Digital pixel architecture supporting low power and high dynamic range operation having a counter that stops counting pulses in response to detecting a voltage on a capacitor exceeding a threshold
US20240361180A1 (en) * 2023-04-25 2024-10-31 Avago Technologies International Sales Pte. Limited Method and apparatus for interference reduction in optical sensing receivers
CN117939319B (zh) 2024-03-22 2024-06-04 中国科学院云南天文台 一种短波红外探测器的优化采样方法及系统

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TW580568B (en) * 2001-11-27 2004-03-21 Matsushita Electric Works Ltd An infrared detecting circuit and an infrared detector

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