|
US10503084B2
(en)
|
2002-11-12 |
2019-12-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US9482966B2
(en)
|
2002-11-12 |
2016-11-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
CN100568101C
(zh)
*
|
2002-11-12 |
2009-12-09 |
Asml荷兰有限公司 |
光刻装置和器件制造方法
|
|
US7372541B2
(en)
*
|
2002-11-12 |
2008-05-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
SG121818A1
(en)
|
2002-11-12 |
2006-05-26 |
Asml Netherlands Bv |
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|
|
DE10261775A1
(de)
*
|
2002-12-20 |
2004-07-01 |
Carl Zeiss Smt Ag |
Vorrichtung zur optischen Vermessung eines Abbildungssystems
|
|
KR101442361B1
(ko)
|
2003-02-26 |
2014-09-23 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
JP4353179B2
(ja)
|
2003-03-25 |
2009-10-28 |
株式会社ニコン |
露光装置、露光方法、及びデバイス製造方法
|
|
KR101176817B1
(ko)
*
|
2003-04-07 |
2012-08-24 |
가부시키가이샤 니콘 |
노광장치 및 디바이스 제조방법
|
|
JP4488004B2
(ja)
|
2003-04-09 |
2010-06-23 |
株式会社ニコン |
液浸リソグラフィ流体制御システム
|
|
EP3232271A1
(en)
*
|
2003-04-10 |
2017-10-18 |
Nikon Corporation |
Environmental system including vacuum scavenge for an immersion lithography apparatus
|
|
EP3352010A1
(en)
*
|
2003-04-10 |
2018-07-25 |
Nikon Corporation |
Run-off path to collect liquid for an immersion lithography apparatus
|
|
JP4656057B2
(ja)
*
|
2003-04-10 |
2011-03-23 |
株式会社ニコン |
液浸リソグラフィ装置用電気浸透素子
|
|
KR101745223B1
(ko)
*
|
2003-04-10 |
2017-06-08 |
가부시키가이샤 니콘 |
액침 리소그래피 장치용 운반 영역을 포함하는 환경 시스템
|
|
JP4582089B2
(ja)
|
2003-04-11 |
2010-11-17 |
株式会社ニコン |
液浸リソグラフィ用の液体噴射回収システム
|
|
SG185136A1
(en)
*
|
2003-04-11 |
2012-11-29 |
Nikon Corp |
Cleanup method for optics in immersion lithography
|
|
SG10201504396VA
(en)
*
|
2003-04-11 |
2015-07-30 |
Nikon Corp |
Apparatus having an immersion fluid system configured to maintain immersion fluid in a gap adjacent an optical assembly
|
|
CN1774667A
(zh)
|
2003-04-17 |
2006-05-17 |
株式会社尼康 |
用在浸没式平版印刷方法中自动聚焦部件的光学配置
|
|
TWI295414B
(en)
|
2003-05-13 |
2008-04-01 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
WO2004102646A1
(ja)
*
|
2003-05-15 |
2004-11-25 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
TW201806001A
(zh)
|
2003-05-23 |
2018-02-16 |
尼康股份有限公司 |
曝光裝置及元件製造方法
|
|
TWI421911B
(zh)
|
2003-05-23 |
2014-01-01 |
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An exposure method, an exposure apparatus, and an element manufacturing method
|
|
KR20110110320A
(ko)
*
|
2003-05-28 |
2011-10-06 |
가부시키가이샤 니콘 |
노광 방법, 노광 장치, 및 디바이스 제조 방법
|
|
US7213963B2
(en)
|
2003-06-09 |
2007-05-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7684008B2
(en)
*
|
2003-06-11 |
2010-03-23 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101520591B1
(ko)
|
2003-06-13 |
2015-05-14 |
가부시키가이샤 니콘 |
노광 방법, 기판 스테이지, 노광 장치, 및 디바이스 제조 방법
|
|
CN101436003B
(zh)
|
2003-06-19 |
2011-08-17 |
株式会社尼康 |
曝光装置及器件制造方法
|
|
EP1639391A4
(en)
*
|
2003-07-01 |
2009-04-29 |
Nikon Corp |
USE OF ISOTOPICALLY SPECIFIED FLUIDS AS OPTICAL ELEMENTS
|
|
WO2005010611A2
(en)
*
|
2003-07-08 |
2005-02-03 |
Nikon Corporation |
Wafer table for immersion lithography
|
|
WO2005006415A1
(ja)
*
|
2003-07-09 |
2005-01-20 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
WO2005006418A1
(ja)
*
|
2003-07-09 |
2005-01-20 |
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露光装置及びデバイス製造方法
|
|
WO2005006416A1
(ja)
*
|
2003-07-09 |
2005-01-20 |
Nikon Corporation |
結合装置、露光装置、及びデバイス製造方法
|
|
JP4524669B2
(ja)
*
|
2003-07-25 |
2010-08-18 |
株式会社ニコン |
投影光学系の検査方法および検査装置
|
|
KR101641011B1
(ko)
|
2003-07-28 |
2016-07-19 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법, 그리고 노광 장치의 제어 방법
|
|
EP1503244A1
(en)
*
|
2003-07-28 |
2005-02-02 |
ASML Netherlands B.V. |
Lithographic projection apparatus and device manufacturing method
|
|
US7779781B2
(en)
|
2003-07-31 |
2010-08-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
WO2005022616A1
(ja)
*
|
2003-08-29 |
2005-03-10 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
TWI263859B
(en)
|
2003-08-29 |
2006-10-11 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
EP1660925B1
(en)
|
2003-09-03 |
2015-04-29 |
Nikon Corporation |
Apparatus and method for providing fluid for immersion lithography
|
|
JP4444920B2
(ja)
*
|
2003-09-19 |
2010-03-31 |
株式会社ニコン |
露光装置及びデバイス製造方法
|
|
KR101743378B1
(ko)
*
|
2003-09-29 |
2017-06-15 |
가부시키가이샤 니콘 |
노광장치, 노광방법 및 디바이스 제조방법
|
|
KR101111364B1
(ko)
|
2003-10-08 |
2012-02-27 |
가부시키가이샤 자오 니콘 |
기판 반송 장치 및 기판 반송 방법, 노광 장치 및 노광방법, 디바이스 제조 방법
|
|
JP2005136364A
(ja)
*
|
2003-10-08 |
2005-05-26 |
Zao Nikon Co Ltd |
基板搬送装置、露光装置、並びにデバイス製造方法
|
|
EP1672682A4
(en)
|
2003-10-08 |
2008-10-15 |
Zao Nikon Co Ltd |
SUBSTRATE TRANSPORT DEVICE AND METHOD, EXPOSURE DEVICE AND METHOD AND COMPONENT MANUFACTURING METHOD
|
|
TW201738932A
(zh)
|
2003-10-09 |
2017-11-01 |
尼康股份有限公司 |
曝光裝置及曝光方法、元件製造方法
|
|
US7411653B2
(en)
|
2003-10-28 |
2008-08-12 |
Asml Netherlands B.V. |
Lithographic apparatus
|
|
EP1531362A3
(en)
*
|
2003-11-13 |
2007-07-25 |
Matsushita Electric Industrial Co., Ltd. |
Semiconductor manufacturing apparatus and pattern formation method
|
|
US7528929B2
(en)
|
2003-11-14 |
2009-05-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
TWI470371B
(zh)
*
|
2003-12-03 |
2015-01-21 |
尼康股份有限公司 |
An exposure apparatus, an exposure method, an element manufacturing method, and an optical component
|
|
KR101111363B1
(ko)
*
|
2003-12-15 |
2012-04-12 |
가부시키가이샤 니콘 |
투영노광장치 및 스테이지 장치, 그리고 노광방법
|
|
DE602004030481D1
(de)
|
2003-12-15 |
2011-01-20 |
Nippon Kogaku Kk |
Bühnensystem, belichtungsvorrichtung und belichtungsverfahren
|
|
US20070081133A1
(en)
*
|
2004-12-14 |
2007-04-12 |
Niikon Corporation |
Projection exposure apparatus and stage unit, and exposure method
|
|
JP4371822B2
(ja)
*
|
2004-01-06 |
2009-11-25 |
キヤノン株式会社 |
露光装置
|
|
CN1938646B
(zh)
*
|
2004-01-20 |
2010-12-15 |
卡尔蔡司Smt股份公司 |
曝光装置和用于投影透镜的测量装置
|
|
US7589822B2
(en)
*
|
2004-02-02 |
2009-09-15 |
Nikon Corporation |
Stage drive method and stage unit, exposure apparatus, and device manufacturing method
|
|
JP4506674B2
(ja)
*
|
2004-02-03 |
2010-07-21 |
株式会社ニコン |
露光装置及びデバイス製造方法
|
|
JP5167572B2
(ja)
*
|
2004-02-04 |
2013-03-21 |
株式会社ニコン |
露光装置、露光方法及びデバイス製造方法
|
|
KR101741343B1
(ko)
*
|
2004-02-04 |
2017-05-29 |
가부시키가이샤 니콘 |
노광 장치, 노광 방법 및 디바이스 제조 방법
|
|
KR20180042456A
(ko)
|
2004-03-25 |
2018-04-25 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US8054448B2
(en)
*
|
2004-05-04 |
2011-11-08 |
Nikon Corporation |
Apparatus and method for providing fluid for immersion lithography
|
|
US7616383B2
(en)
*
|
2004-05-18 |
2009-11-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
WO2005119368A2
(en)
|
2004-06-04 |
2005-12-15 |
Carl Zeiss Smt Ag |
System for measuring the image quality of an optical imaging system
|
|
EP2966670B1
(en)
|
2004-06-09 |
2017-02-22 |
Nikon Corporation |
Exposure apparatus and device manufacturing method
|
|
US7463330B2
(en)
|
2004-07-07 |
2008-12-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
WO2006006565A1
(ja)
|
2004-07-12 |
2006-01-19 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
JP4983257B2
(ja)
*
|
2004-08-18 |
2012-07-25 |
株式会社ニコン |
露光装置、デバイス製造方法、計測部材、及び計測方法
|
|
US7701550B2
(en)
|
2004-08-19 |
2010-04-20 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7397533B2
(en)
|
2004-12-07 |
2008-07-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7880860B2
(en)
|
2004-12-20 |
2011-02-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP1843387A4
(en)
*
|
2005-01-25 |
2010-01-13 |
Jsr Corp |
IMMERSION EXPOSURE SYSTEM, RECYCLING METHOD, AND LIQUID DELIVERY METHOD FOR IMMERSION EXPOSURE
|
|
KR101942138B1
(ko)
|
2005-01-31 |
2019-01-24 |
가부시키가이샤 니콘 |
노광 장치 및 디바이스 제조 방법
|
|
US8692973B2
(en)
*
|
2005-01-31 |
2014-04-08 |
Nikon Corporation |
Exposure apparatus and method for producing device
|
|
US7282701B2
(en)
*
|
2005-02-28 |
2007-10-16 |
Asml Netherlands B.V. |
Sensor for use in a lithographic apparatus
|
|
JP4072543B2
(ja)
*
|
2005-03-18 |
2008-04-09 |
キヤノン株式会社 |
液浸露光装置及びデバイス製造方法
|
|
USRE43576E1
(en)
|
2005-04-08 |
2012-08-14 |
Asml Netherlands B.V. |
Dual stage lithographic apparatus and device manufacturing method
|
|
EP1873816A4
(en)
|
2005-04-18 |
2010-11-24 |
Nikon Corp |
EXPOSURE DEVICE, EXPOSURE METHOD AND COMPONENTS MANUFACTURING METHOD
|
|
US7357768B2
(en)
*
|
2005-09-22 |
2008-04-15 |
William Marshall |
Recliner exerciser
|
|
US20070124987A1
(en)
*
|
2005-12-05 |
2007-06-07 |
Brown Jeffrey K |
Electronic pest control apparatus
|
|
EP1965414A4
(en)
*
|
2005-12-06 |
2010-08-25 |
Nikon Corp |
EXPOSURE METHOD, EXPOSURE DEVICE AND METHOD FOR MANUFACTURING COMPONENTS
|
|
KR100768849B1
(ko)
*
|
2005-12-06 |
2007-10-22 |
엘지전자 주식회사 |
계통 연계형 연료전지 시스템의 전원공급장치 및 방법
|
|
US7649611B2
(en)
|
2005-12-30 |
2010-01-19 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
DE102006021797A1
(de)
|
2006-05-09 |
2007-11-15 |
Carl Zeiss Smt Ag |
Optische Abbildungseinrichtung mit thermischer Dämpfung
|
|
US7826030B2
(en)
*
|
2006-09-07 |
2010-11-02 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
WO2008053918A1
(en)
*
|
2006-10-31 |
2008-05-08 |
Nikon Corporation |
Liquid holding apparatus, liquid holding method, exposure apparatus, exposure method and device manufacturing method
|
|
US8817226B2
(en)
|
2007-02-15 |
2014-08-26 |
Asml Holding N.V. |
Systems and methods for insitu lens cleaning using ozone in immersion lithography
|
|
US8654305B2
(en)
*
|
2007-02-15 |
2014-02-18 |
Asml Holding N.V. |
Systems and methods for insitu lens cleaning in immersion lithography
|
|
US8237911B2
(en)
|
2007-03-15 |
2012-08-07 |
Nikon Corporation |
Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
|
|
US9025126B2
(en)
|
2007-07-31 |
2015-05-05 |
Nikon Corporation |
Exposure apparatus adjusting method, exposure apparatus, and device fabricating method
|
|
US8681308B2
(en)
*
|
2007-09-13 |
2014-03-25 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
NL1036432A1
(nl)
*
|
2008-01-23 |
2009-07-27 |
Asml Holding Nv |
An immersion lithographic apparatus with immersion fluid re-circulating system.
|
|
JP5369443B2
(ja)
|
2008-02-05 |
2013-12-18 |
株式会社ニコン |
ステージ装置、露光装置、露光方法、及びデバイス製造方法
|
|
KR101448152B1
(ko)
*
|
2008-03-26 |
2014-10-07 |
삼성전자주식회사 |
수직 포토게이트를 구비한 거리측정 센서 및 그를 구비한입체 컬러 이미지 센서
|
|
JP5097166B2
(ja)
|
2008-05-28 |
2012-12-12 |
エーエスエムエル ネザーランズ ビー.ブイ. |
リソグラフィ装置及び装置の動作方法
|
|
JP2010098172A
(ja)
*
|
2008-10-17 |
2010-04-30 |
Canon Inc |
液体回収装置、露光装置及びデバイス製造方法
|
|
MX2012007581A
(es)
*
|
2009-12-28 |
2012-07-30 |
Pioneer Hi Bred Int |
Genotipos restauradores de la fertilidad de sorgo y metodos de seleccion asistida por marcadores.
|
|
EP2381310B1
(en)
|
2010-04-22 |
2015-05-06 |
ASML Netherlands BV |
Fluid handling structure and lithographic apparatus
|
|
WO2017060259A1
(en)
|
2015-10-06 |
2017-04-13 |
Asml Holding N.V. |
Chucks and clamps for holding objects of a lithographic apparatus and methods for controlling a temperature of an object held by a clamp of a lithographic apparatus
|
|
NL2024711A
(en)
*
|
2019-02-11 |
2020-08-19 |
Asml Netherlands Bv |
Lithographic apparatus and method with a thermal control system
|