JP2004537176A5 - - Google Patents
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- Publication number
- JP2004537176A5 JP2004537176A5 JP2003516804A JP2003516804A JP2004537176A5 JP 2004537176 A5 JP2004537176 A5 JP 2004537176A5 JP 2003516804 A JP2003516804 A JP 2003516804A JP 2003516804 A JP2003516804 A JP 2003516804A JP 2004537176 A5 JP2004537176 A5 JP 2004537176A5
- Authority
- JP
- Japan
- Prior art keywords
- spectrum
- pulse
- wavelength
- pulses
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001228 spectrum Methods 0.000 claims 13
- 238000000034 method Methods 0.000 claims 9
- 238000005286 illumination Methods 0.000 claims 6
- 238000001459 lithography Methods 0.000 claims 2
- 229920002120 photoresistant polymer Polymers 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/918,773 US6671294B2 (en) | 1997-07-22 | 2001-07-27 | Laser spectral engineering for lithographic process |
| US10/036,925 US6853653B2 (en) | 1997-07-22 | 2001-12-21 | Laser spectral engineering for lithographic process |
| PCT/US2002/022190 WO2003011595A2 (en) | 2001-07-27 | 2002-07-11 | Laser spectral engineering for lithographic process |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004537176A JP2004537176A (ja) | 2004-12-09 |
| JP2004537176A5 true JP2004537176A5 (enExample) | 2006-01-05 |
| JP4252896B2 JP4252896B2 (ja) | 2009-04-08 |
Family
ID=26713631
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003516804A Expired - Lifetime JP4252896B2 (ja) | 2001-07-27 | 2002-07-11 | リソグラフィ処理のためのレーザスペクトルエンジニアリング |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US6853653B2 (enExample) |
| EP (1) | EP1412182A4 (enExample) |
| JP (1) | JP4252896B2 (enExample) |
| AU (1) | AU2002355718A1 (enExample) |
| WO (1) | WO2003011595A2 (enExample) |
Families Citing this family (64)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6853653B2 (en) * | 1997-07-22 | 2005-02-08 | Cymer, Inc. | Laser spectral engineering for lithographic process |
| US6882674B2 (en) | 1999-12-27 | 2005-04-19 | Cymer, Inc. | Four KHz gas discharge laser system |
| US6914919B2 (en) * | 2000-06-19 | 2005-07-05 | Cymer, Inc. | Six to ten KHz, or greater gas discharge laser system |
| US7039086B2 (en) * | 2001-04-09 | 2006-05-02 | Cymer, Inc. | Control system for a two chamber gas discharge laser |
| US7079564B2 (en) * | 2001-04-09 | 2006-07-18 | Cymer, Inc. | Control system for a two chamber gas discharge laser |
| US7061959B2 (en) * | 2001-04-18 | 2006-06-13 | Tcz Gmbh | Laser thin film poly-silicon annealing system |
| US7009140B2 (en) * | 2001-04-18 | 2006-03-07 | Cymer, Inc. | Laser thin film poly-silicon annealing optical system |
| US20050259709A1 (en) * | 2002-05-07 | 2005-11-24 | Cymer, Inc. | Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate |
| US7154928B2 (en) * | 2004-06-23 | 2006-12-26 | Cymer Inc. | Laser output beam wavefront splitter for bandwidth spectrum control |
| US7088758B2 (en) * | 2001-07-27 | 2006-08-08 | Cymer, Inc. | Relax gas discharge laser lithography light source |
| US7830934B2 (en) * | 2001-08-29 | 2010-11-09 | Cymer, Inc. | Multi-chamber gas discharge laser bandwidth control through discharge timing |
| US20050100072A1 (en) * | 2001-11-14 | 2005-05-12 | Rao Rajasekhar M. | High power laser output beam energy density reduction |
| US7741639B2 (en) * | 2003-01-31 | 2010-06-22 | Cymer, Inc. | Multi-chambered excimer or molecular fluorine gas discharge laser fluorine injection control |
| US7277188B2 (en) * | 2003-04-29 | 2007-10-02 | Cymer, Inc. | Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate |
| US6829040B1 (en) | 2003-11-07 | 2004-12-07 | Advanced Micro Devices, Inc. | Lithography contrast enhancement technique by varying focus with wavelength modulation |
| US7352791B2 (en) * | 2004-07-27 | 2008-04-01 | Corning Incorporated | Optical systems including wavefront correcting optical surfaces |
| US7643522B2 (en) * | 2004-11-30 | 2010-01-05 | Cymer, Inc. | Method and apparatus for gas discharge laser bandwidth and center wavelength control |
| US7366219B2 (en) * | 2004-11-30 | 2008-04-29 | Cymer, Inc. | Line narrowing module |
| US20060114956A1 (en) * | 2004-11-30 | 2006-06-01 | Sandstrom Richard L | High power high pulse repetition rate gas discharge laser system bandwidth management |
| JP4580338B2 (ja) * | 2004-12-23 | 2010-11-10 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置、エキシマ・レーザ、およびデバイス製造方法 |
| US7256870B2 (en) * | 2005-02-01 | 2007-08-14 | Asml Netherlands B.V. | Method and apparatus for controlling iso-dense bias in lithography |
| US20060222034A1 (en) * | 2005-03-31 | 2006-10-05 | Cymer, Inc. | 6 Khz and above gas discharge laser system |
| US8379687B2 (en) | 2005-06-30 | 2013-02-19 | Cymer, Inc. | Gas discharge laser line narrowing module |
| US7653095B2 (en) * | 2005-06-30 | 2010-01-26 | Cymer, Inc. | Active bandwidth control for a laser |
| WO2007004567A1 (ja) * | 2005-07-01 | 2007-01-11 | Nikon Corporation | 露光装置、露光方法及びデバイス製造方法、並びにシステム |
| US20070013889A1 (en) * | 2005-07-12 | 2007-01-18 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and device manufactured thereby having an increase in depth of focus |
| US20070071047A1 (en) * | 2005-09-29 | 2007-03-29 | Cymer, Inc. | 6K pulse repetition rate and above gas discharge laser system solid state pulse power system improvements |
| US7706424B2 (en) * | 2005-09-29 | 2010-04-27 | Cymer, Inc. | Gas discharge laser system electrodes and power supply for delivering electrical energy to same |
| US7317179B2 (en) * | 2005-10-28 | 2008-01-08 | Cymer, Inc. | Systems and methods to shape laser light as a homogeneous line beam for interaction with a film deposited on a substrate |
| US7679029B2 (en) * | 2005-10-28 | 2010-03-16 | Cymer, Inc. | Systems and methods to shape laser light as a line beam for interaction with a substrate having surface variations |
| US7321607B2 (en) * | 2005-11-01 | 2008-01-22 | Cymer, Inc. | External optics and chamber support system |
| JP2007250947A (ja) * | 2006-03-17 | 2007-09-27 | Canon Inc | 露光装置および像面検出方法 |
| EP1850427A1 (de) * | 2006-04-29 | 2007-10-31 | Technomedica AG | Injektionssynchronisierung eines Gaslasers mit inkohärentem Licht zur Frequenzstabilisierung |
| JP2007329432A (ja) * | 2006-06-09 | 2007-12-20 | Canon Inc | 露光装置 |
| JP5157004B2 (ja) * | 2006-07-04 | 2013-03-06 | 株式会社小松製作所 | 狭帯域化レーザのスペクトル幅調整方法 |
| JP2008140956A (ja) * | 2006-12-01 | 2008-06-19 | Canon Inc | 露光装置 |
| JP2009010231A (ja) | 2007-06-28 | 2009-01-15 | Canon Inc | 露光装置およびデバイス製造方法 |
| JP5606929B2 (ja) * | 2008-02-21 | 2014-10-15 | インテュイティブ サージカル オペレーションズ, インコーポレイテッド | 波長可変レーザ制御システムおよび波長可変レーザの出力を制御する方法 |
| US7756171B2 (en) * | 2008-10-21 | 2010-07-13 | Cymer, Inc. | Method and apparatus for laser control in a two chamber gas discharge laser |
| US7751453B2 (en) * | 2008-10-21 | 2010-07-06 | Cymer, Inc. | Method and apparatus for laser control in a two chamber gas discharge laser |
| US7720120B2 (en) * | 2008-10-21 | 2010-05-18 | Cymer, Inc. | Method and apparatus for laser control in a two chamber gas discharge laser |
| US8520186B2 (en) * | 2009-08-25 | 2013-08-27 | Cymer, Llc | Active spectral control of optical source |
| JP5410396B2 (ja) | 2010-03-23 | 2014-02-05 | ギガフォトン株式会社 | レーザ装置 |
| US8837536B2 (en) | 2010-04-07 | 2014-09-16 | Cymer, Llc | Method and apparatus for controlling light bandwidth |
| US9207119B2 (en) | 2012-04-27 | 2015-12-08 | Cymer, Llc | Active spectral control during spectrum synthesis |
| US9715180B2 (en) | 2013-06-11 | 2017-07-25 | Cymer, Llc | Wafer-based light source parameter control |
| US10416471B2 (en) | 2016-10-17 | 2019-09-17 | Cymer, Llc | Spectral feature control apparatus |
| US9835959B1 (en) | 2016-10-17 | 2017-12-05 | Cymer, Llc | Controlling for wafer stage vibration |
| US9989866B2 (en) | 2016-10-17 | 2018-06-05 | Cymer, Llc | Wafer-based light source parameter control |
| US9997888B2 (en) | 2016-10-17 | 2018-06-12 | Cymer, Llc | Control of a spectral feature of a pulsed light beam |
| CN118011728A (zh) | 2017-10-19 | 2024-05-10 | 西默有限公司 | 在单次光刻曝光通过过程中形成多个空间图像 |
| DE102017126293A1 (de) * | 2017-11-09 | 2019-05-09 | Compact Laser Solutions Gmbh | Vorrichtung zur Verstellung eines optischen Bauelements |
| NL2022609A (en) | 2018-03-12 | 2019-09-18 | Asml Netherlands Bv | Control System and Method |
| JP7044894B2 (ja) | 2018-03-30 | 2022-03-30 | サイマー リミテッド ライアビリティ カンパニー | パルス光ビームのスペクトル特性選択及びパルスタイミング制御 |
| TWI749546B (zh) | 2019-05-14 | 2021-12-11 | 美商希瑪有限責任公司 | 用於調變光源波長的裝置及方法 |
| JP7382424B2 (ja) | 2019-05-22 | 2023-11-16 | サイマー リミテッド ライアビリティ カンパニー | 複数の深紫外光発振器のための制御システム |
| CN114144731B (zh) | 2019-07-23 | 2024-04-09 | 西默有限公司 | 补偿由重复率偏差引起的波长误差的方法 |
| WO2021234835A1 (ja) * | 2020-05-20 | 2021-11-25 | ギガフォトン株式会社 | 狭帯域化ガスレーザ装置、波長制御方法、及び電子デバイスの製造方法 |
| JP7553130B2 (ja) * | 2020-10-21 | 2024-09-18 | ギガフォトン株式会社 | レーザ装置及び電子デバイスの製造方法 |
| WO2022085146A1 (ja) | 2020-10-22 | 2022-04-28 | ギガフォトン株式会社 | レーザ装置、及び電子デバイスの製造方法 |
| EP4050416A1 (en) * | 2021-02-25 | 2022-08-31 | ASML Netherlands B.V. | Lithographic method |
| US20240004307A1 (en) * | 2020-12-24 | 2024-01-04 | Asml Netherlands B.V. | Lithographic method |
| JPWO2022219690A1 (enExample) * | 2021-04-12 | 2022-10-20 | ||
| WO2023135658A1 (ja) * | 2022-01-11 | 2023-07-20 | ギガフォトン株式会社 | 電子デバイスの製造方法、レーザ装置、及び波長シーケンス算出システム |
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-
2001
- 2001-12-21 US US10/036,925 patent/US6853653B2/en not_active Expired - Lifetime
-
2002
- 2002-07-11 JP JP2003516804A patent/JP4252896B2/ja not_active Expired - Lifetime
- 2002-07-11 WO PCT/US2002/022190 patent/WO2003011595A2/en not_active Ceased
- 2002-07-11 AU AU2002355718A patent/AU2002355718A1/en not_active Abandoned
- 2002-07-11 EP EP02752300A patent/EP1412182A4/en not_active Withdrawn
-
2004
- 2004-08-05 US US10/912,933 patent/US7298770B2/en not_active Expired - Fee Related
- 2004-08-09 US US10/915,517 patent/US7382815B2/en not_active Expired - Fee Related
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