JP2004506372A5 - - Google Patents

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Publication number
JP2004506372A5
JP2004506372A5 JP2002518627A JP2002518627A JP2004506372A5 JP 2004506372 A5 JP2004506372 A5 JP 2004506372A5 JP 2002518627 A JP2002518627 A JP 2002518627A JP 2002518627 A JP2002518627 A JP 2002518627A JP 2004506372 A5 JP2004506372 A5 JP 2004506372A5
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JP
Japan
Prior art keywords
current source
fet
self
circuit
source
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JP2002518627A
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English (en)
Japanese (ja)
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JP3881622B2 (ja
JP2004506372A (ja
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Priority claimed from US09/631,596 external-priority patent/US6331830B1/en
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Publication of JP2004506372A publication Critical patent/JP2004506372A/ja
Publication of JP2004506372A5 publication Critical patent/JP2004506372A5/ja
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Publication of JP3881622B2 publication Critical patent/JP3881622B2/ja
Anticipated expiration legal-status Critical
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JP2002518627A 2000-08-03 2001-07-31 切換型電流源ｄａｃのための自己トリミング電流源及び方法 Expired - Fee Related JP3881622B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/631,596 US6331830B1 (en) 2000-02-04 2000-08-03 Self-trimming current source and method for switched current source DAC
PCT/US2001/023952 WO2002013392A2 (en) 2000-08-03 2001-07-31 Self-trimming current source and method for switched current source dac

Publications (3)

Publication Number Publication Date
JP2004506372A JP2004506372A (ja) 2004-02-26
JP2004506372A5 true JP2004506372A5 (enExample) 2005-01-20
JP3881622B2 JP3881622B2 (ja) 2007-02-14

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002518627A Expired - Fee Related JP3881622B2 (ja) 2000-08-03 2001-07-31 切換型電流源ｄａｃのための自己トリミング電流源及び方法

Country Status (5)

Country Link
US (1) US6331830B1 (enExample)
EP (1) EP1388210B1 (enExample)
JP (1) JP3881622B2 (enExample)
DE (1) DE60114051T2 (enExample)
WO (1) WO2002013392A2 (enExample)

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US6507296B1 (en) * 2001-08-14 2003-01-14 Xilinx, Inc. Current source calibration circuit
US6777885B2 (en) * 2001-10-12 2004-08-17 Semiconductor Energy Laboratory Co., Ltd. Drive circuit, display device using the drive circuit and electronic apparatus using the display device
JP3923341B2 (ja) * 2002-03-06 2007-05-30 株式会社半導体エネルギー研究所 半導体集積回路およびその駆動方法
WO2004066248A1 (ja) * 2003-01-17 2004-08-05 Semiconductor Energy Laboratory Co., Ltd. 電流源回路、信号線駆動回路及びその駆動方法並びに発光装置
US7184799B1 (en) * 2003-05-14 2007-02-27 Marvell International Ltd. Method and apparatus for reducing wake up time of a powered down device
DE10325769B4 (de) * 2003-06-05 2007-01-04 Zentrum Mikroelektronik Dresden Ag Anordnung und Verfahren zum Abgleich einer kalibrierbaren Stromquelle
DE10350594B4 (de) * 2003-10-30 2009-07-30 Infineon Technologies Ag Verfahren zur Kalibrierung von Stromzellen für Digital-Analog-Wandlerschaltungen und Digital-Analog-Wandlerschaltung
US7106234B2 (en) * 2004-01-22 2006-09-12 University College Cork - National University Of Ireland Digital to analog converter with reduced output noise
US7498779B2 (en) * 2005-01-28 2009-03-03 Broadcom Corporation Voltage supply interface with improved current sensitivity and reduced series resistance
DE602005017260D1 (de) * 2005-07-27 2009-12-03 Verigy Pte Ltd Singapore Digital Analog Wandlung bei der die Ausgänge mehrerer Digital-Analog-Wandler aufsummiert werden
US7541953B2 (en) * 2005-12-23 2009-06-02 Alcatel-Lucent Usa Inc. Self-calibrating current source arrays
TWI287698B (en) * 2006-03-08 2007-10-01 Novatek Microelectronics Corp Apparatus for error compensation of self calibrating current source
CN100498637C (zh) * 2006-03-13 2009-06-10 联咏科技股份有限公司 自我校正电流源的误差补偿装置与方法
US7557743B2 (en) * 2006-12-08 2009-07-07 Kabushiki Kaisha Toshiba D/A converter
US7363186B1 (en) * 2006-12-22 2008-04-22 Kelsey-Haynes Company Apparatus and method for self calibration of current feedback
US9105673B2 (en) 2007-05-09 2015-08-11 Brooks Automation, Inc. Side opening unified pod
US7474243B1 (en) 2007-09-13 2009-01-06 Infineon Technologies Ag Semiconductor device including switch that conducts based on latched bit and next bit
US7545295B2 (en) * 2007-09-14 2009-06-09 Realtek Semiconductor Corp. Self-calibrating digital-to-analog converter and method thereof
US7514989B1 (en) * 2007-11-28 2009-04-07 Dialog Semiconductor Gmbh Dynamic matching of current sources
US7564385B2 (en) * 2007-12-18 2009-07-21 Atmel Corporation Current compensation for digital-to-analog converter
JP5233755B2 (ja) * 2009-03-05 2013-07-10 ヤマハ株式会社 Ｄ／ａ変換器の補正回路
US7804433B1 (en) * 2009-04-14 2010-09-28 Texas Instruments Incorporated Methods and apparatus for error cancelation in calibrated current sources
US8115519B2 (en) * 2010-02-12 2012-02-14 Bae Systems Information And Electronic Systems Integration Inc. Phase accumulator generating reference phase for phase coherent direct digital synthesis outputs
US7965212B1 (en) 2010-02-12 2011-06-21 Bae Systems Information And Electronic Systems Integration Inc. DAC circuit using summing junction delay compensation
US8583714B2 (en) * 2010-02-12 2013-11-12 Bae Systems Information And Electronic Systems Integration Inc. ROM-based direct digital synthesizer with pipeline delay circuit
US8125361B2 (en) 2010-07-12 2012-02-28 Teledyne Scientific & Imaging, Llc Digital-to-analog converter (DAC) calibration system
JP2012060618A (ja) * 2010-09-13 2012-03-22 Renesas Electronics Corp 半導体集積回路装置
JP6349759B2 (ja) * 2014-02-10 2018-07-04 株式会社ソシオネクスト デジタルアナログ変換回路、デジタルアナログ変換回路の補正方法
US9353017B2 (en) 2014-06-17 2016-05-31 Freescale Semiconductor, Inc. Method of trimming current source using on-chip ADC
US9035810B1 (en) * 2015-01-21 2015-05-19 IQ—Analog Corporation System and method for digital-to-analog converter calibration
US10116210B2 (en) 2015-09-04 2018-10-30 Dialog Semiconductor (Uk) Limited DAC servo
KR101794871B1 (ko) 2016-04-20 2017-11-08 울산과학기술원 트리밍 회로 및 그 제어 방법
US10468984B2 (en) 2016-07-01 2019-11-05 Dialog Semiconductor (Uk) Limited DC-DC switching converter with adaptive voltage positioning combined with digital-to-analog converter servo
US9960780B1 (en) * 2016-12-30 2018-05-01 Texas Instruments Incorporated Current source noise cancellation
US9985641B1 (en) 2017-05-26 2018-05-29 Keysight Technologies, Inc. Systems and methods for evaluating errors and impairments in a digital-to-analog converter
CN109391270B (zh) 2017-08-08 2023-09-26 恩智浦美国有限公司 具有含有电阻器阵列的子dac的数/模转换器（dac）
CN110557123A (zh) 2018-06-04 2019-12-10 恩智浦美国有限公司 分段式电阻型数模转换器
US10574247B1 (en) 2018-09-14 2020-02-25 Analog Devices Global Unlimited Company Digital-to-analog converter transfer function modification
US10340941B1 (en) * 2018-11-07 2019-07-02 Texas Instruments Incorporated Trim digital-to-analog converter (DAC) for an R2R ladder DAC
CN112583410A (zh) 2019-09-27 2021-03-30 恩智浦美国有限公司 分段式数模转换器
US11569838B2 (en) 2020-04-09 2023-01-31 Analog Devices International Unlimited Company High efficiency current source/sink DAC
US11563442B2 (en) * 2020-08-07 2023-01-24 Analog Devices International Unlimited Company Calibration of continuous-time residue generation systems for analog-to-digital converters
US11424752B2 (en) * 2020-11-06 2022-08-23 AyDeeKay LLC Interleaved analog-to-digital converter (ADC) gain calibration
CN115694507A (zh) 2021-07-29 2023-02-03 恩智浦美国有限公司 数模转换器
CN115733490A (zh) 2021-08-31 2023-03-03 恩智浦美国有限公司 自校准数模转换器
CN118199636A (zh) 2022-12-12 2024-06-14 恩智浦有限公司 自校准缓冲电压dac
US20250293695A1 (en) * 2024-03-14 2025-09-18 Qualcomm Incorporated Signal oscillation circuit with adaptive tuning for tail filters

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US5642116A (en) * 1995-03-06 1997-06-24 International Business Machines Corporation Self calibrating segmented digital-to-analog converter
FR2754959B1 (fr) * 1996-10-22 1998-12-24 Sgs Thomson Microelectronics Comparateur de phase a tres faible offset
US5793231A (en) * 1997-04-18 1998-08-11 Northern Telecom Limited Current memory cell having bipolar transistor configured as a current source and using field effect transistor (FET) for current trimming
US5955980A (en) * 1997-10-03 1999-09-21 Motorola, Inc. Circuit and method for calibrating a digital-to-analog converter
US6181210B1 (en) * 1998-09-21 2001-01-30 Broadcom Corporation Low offset and low glitch energy charge pump for PLL-based timing recovery systems

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