JP2002535703A - 気体の光透過率を最適化するための化学的フィルタリング - Google Patents
気体の光透過率を最適化するための化学的フィルタリングInfo
- Publication number
- JP2002535703A JP2002535703A JP2000593991A JP2000593991A JP2002535703A JP 2002535703 A JP2002535703 A JP 2002535703A JP 2000593991 A JP2000593991 A JP 2000593991A JP 2000593991 A JP2000593991 A JP 2000593991A JP 2002535703 A JP2002535703 A JP 2002535703A
- Authority
- JP
- Japan
- Prior art keywords
- medium
- gas
- polar hydrocarbon
- selecting
- carbon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005540 biological transmission Effects 0.000 title claims abstract description 35
- 238000001914 filtration Methods 0.000 title description 4
- 239000000126 substance Substances 0.000 title description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 55
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 39
- 238000000034 method Methods 0.000 claims abstract description 35
- 239000000203 mixture Substances 0.000 claims abstract description 7
- 229930195733 hydrocarbon Natural products 0.000 claims description 41
- 150000002430 hydrocarbons Chemical class 0.000 claims description 41
- 239000004215 Carbon black (E152) Substances 0.000 claims description 32
- 239000000356 contaminant Substances 0.000 claims description 25
- 238000005286 illumination Methods 0.000 claims description 9
- 229920001059 synthetic polymer Polymers 0.000 claims description 9
- 238000004891 communication Methods 0.000 claims description 7
- 238000001179 sorption measurement Methods 0.000 claims description 4
- 239000003463 adsorbent Substances 0.000 claims description 3
- 238000013022 venting Methods 0.000 claims 1
- 239000000463 material Substances 0.000 abstract description 15
- 238000003384 imaging method Methods 0.000 abstract description 7
- 239000007789 gas Substances 0.000 description 80
- 230000006835 compression Effects 0.000 description 35
- 238000007906 compression Methods 0.000 description 35
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 12
- 239000000758 substrate Substances 0.000 description 12
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
- 239000011324 bead Substances 0.000 description 9
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 9
- 239000002245 particle Substances 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 7
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- 239000003575 carbonaceous material Substances 0.000 description 6
- 238000012937 correction Methods 0.000 description 6
- 229910052757 nitrogen Inorganic materials 0.000 description 6
- 229920002120 photoresistant polymer Polymers 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000011148 porous material Substances 0.000 description 5
- 238000011144 upstream manufacturing Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 239000002253 acid Substances 0.000 description 4
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 4
- 239000000835 fiber Substances 0.000 description 4
- 238000000206 photolithography Methods 0.000 description 4
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- 230000002378 acidificating effect Effects 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 2
- RAHZWNYVWXNFOC-UHFFFAOYSA-N Sulphur dioxide Chemical compound O=S=O RAHZWNYVWXNFOC-UHFFFAOYSA-N 0.000 description 2
- 239000003570 air Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- SNRUBQQJIBEYMU-UHFFFAOYSA-N dodecane Chemical compound CCCCCCCCCCCC SNRUBQQJIBEYMU-UHFFFAOYSA-N 0.000 description 2
- 239000008187 granular material Substances 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 2
- 238000006552 photochemical reaction Methods 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- OQMIRQSWHKCKNJ-UHFFFAOYSA-N 1,1-difluoroethene;1,1,2,3,3,3-hexafluoroprop-1-ene Chemical group FC(F)=C.FC(F)=C(F)C(F)(F)F OQMIRQSWHKCKNJ-UHFFFAOYSA-N 0.000 description 1
- 239000010963 304 stainless steel Substances 0.000 description 1
- 244000060011 Cocos nucifera Species 0.000 description 1
- 235000013162 Cocos nucifera Nutrition 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical compound S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 description 1
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 1
- 229920002449 FKM Polymers 0.000 description 1
- 229920002821 Modacrylic Polymers 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 235000006040 Prunus persica var persica Nutrition 0.000 description 1
- 240000006413 Prunus persica var. persica Species 0.000 description 1
- 229920000297 Rayon Polymers 0.000 description 1
- 229910000589 SAE 304 stainless steel Inorganic materials 0.000 description 1
- 238000002835 absorbance Methods 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 229910000037 hydrogen sulfide Inorganic materials 0.000 description 1
- 238000001393 microlithography Methods 0.000 description 1
- 238000010943 off-gassing Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000003415 peat Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 239000002798 polar solvent Substances 0.000 description 1
- 229920002239 polyacrylonitrile Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- -1 polypropylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920003053 polystyrene-divinylbenzene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000002964 rayon Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- GCLGEJMYGQKIIW-UHFFFAOYSA-H sodium hexametaphosphate Chemical compound [Na]OP1(=O)OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])OP(=O)(O[Na])O1 GCLGEJMYGQKIIW-UHFFFAOYSA-H 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 229920003051 synthetic elastomer Polymers 0.000 description 1
- 239000005061 synthetic rubber Substances 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/909—Controlled atmosphere
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Epidemiology (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Public Health (AREA)
- Optics & Photonics (AREA)
- Filtering Materials (AREA)
- Filtering Of Dispersed Particles In Gases (AREA)
- Optical Filters (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Carbon And Carbon Compounds (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/231,737 US6313953B1 (en) | 1999-01-15 | 1999-01-15 | Gas chemical filtering for optimal light transmittance; and methods |
| US09/231,737 | 1999-01-15 | ||
| PCT/US2000/000214 WO2000042475A1 (en) | 1999-01-15 | 2000-01-05 | Chemical filtering for optimising the light transmittance of a gas |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002535703A true JP2002535703A (ja) | 2002-10-22 |
| JP2002535703A5 JP2002535703A5 (enExample) | 2007-02-22 |
Family
ID=22870471
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000593991A Pending JP2002535703A (ja) | 1999-01-15 | 2000-01-05 | 気体の光透過率を最適化するための化学的フィルタリング |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6313953B1 (enExample) |
| EP (1) | EP1153336B1 (enExample) |
| JP (1) | JP2002535703A (enExample) |
| KR (1) | KR100649386B1 (enExample) |
| CN (1) | CN1337014A (enExample) |
| AT (1) | ATE337573T1 (enExample) |
| AU (1) | AU2406100A (enExample) |
| DE (1) | DE60030254T2 (enExample) |
| WO (1) | WO2000042475A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001006548A1 (en) | 1999-07-16 | 2001-01-25 | Nikon Corporation | Exposure method and system |
| JP2001118783A (ja) * | 1999-10-21 | 2001-04-27 | Nikon Corp | 露光方法及び装置、並びにデバイス製造方法 |
| KR100742282B1 (ko) | 2006-02-06 | 2007-07-24 | 삼성전자주식회사 | 케미컬 필터 |
| WO2009058598A2 (en) * | 2007-11-01 | 2009-05-07 | Shawndra Products, Incorporated | Hydrogen sulfide filter |
| US20090230052A1 (en) * | 2008-03-11 | 2009-09-17 | Shawndra Products, Inc. | Hydrogen sulfide filter |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0620906A (ja) * | 1992-03-25 | 1994-01-28 | Matsushita Electric Ind Co Ltd | 環境制御装置および環境制御方法 |
| JPH0677114A (ja) * | 1992-07-01 | 1994-03-18 | Nikon Corp | 露光装置 |
| JPH06208947A (ja) * | 1993-01-08 | 1994-07-26 | Toshiba Corp | レジスト処理方法及びレジスト処理装置 |
| JPH08306599A (ja) * | 1995-04-27 | 1996-11-22 | Nikon Corp | 空気浄化装置及び露光装置 |
| JPH09266147A (ja) * | 1996-03-28 | 1997-10-07 | Nikon Corp | 空調装置及びそれを備えた露光装置 |
| JPH09275054A (ja) * | 1996-04-03 | 1997-10-21 | Nikon Corp | 半導体製造装置 |
| JPH09275055A (ja) * | 1996-04-03 | 1997-10-21 | Nikon Corp | 露光装置 |
| JPH09283401A (ja) * | 1996-04-09 | 1997-10-31 | Nikon Corp | 露光装置 |
| JPH11111593A (ja) * | 1997-10-01 | 1999-04-23 | Canon Inc | 環境制御装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3413059A (en) * | 1964-03-23 | 1968-11-26 | Bell Telephone Labor Inc | Gas lenses for ultrahigh frequency wave energy provided by opposing flows of gases |
| IT1237944B (it) * | 1990-01-05 | 1993-06-19 | Getters Spa | Metodo per determinare la fine della vita utile di un purificatore di gas inerte e relativa apparecchiatura |
| US5166530A (en) | 1991-12-20 | 1992-11-24 | General Signal Corporation | Illuminator for microlithographic integrated circuit manufacture |
| FR2696947B1 (fr) * | 1992-10-20 | 1994-11-25 | Ceramiques Tech Soc D | Module de filtration, de séparation, de purification de gaz ou de liquide, ou de transformation catalytique. |
| US5696623A (en) | 1993-08-05 | 1997-12-09 | Fujitsu Limited | UV exposure with elongated service lifetime |
| JP3448670B2 (ja) | 1993-09-02 | 2003-09-22 | 株式会社ニコン | 露光装置及び素子製造方法 |
| BE1007851A3 (nl) | 1993-12-03 | 1995-11-07 | Asml Lithography B V | Belichtingseenheid met een voorziening tegen vervuiling van optische componenten en een fotolithografisch apparaat voorzien van een dergelijke belichtingseenheid. |
| DE69535412D1 (de) * | 1994-04-08 | 2007-04-12 | Canon Kk | Verarbeitungssystem zur Herstellung von Halbleiterbauelementen |
| US5456740A (en) * | 1994-06-22 | 1995-10-10 | Millipore Corporation | High-efficiency metal membrane getter element and process for making |
| US5902551A (en) * | 1995-01-13 | 1999-05-11 | Semi-Gas Systems, Inc. | Process gas docking station with point-of-use filter for receiving removable purifier cartridges |
| US5810031A (en) * | 1996-02-21 | 1998-09-22 | Aeroquip Corporation | Ultra high purity gas distribution component with integral valved coupling and methods for its use |
| US5853962A (en) * | 1996-10-04 | 1998-12-29 | Eco-Snow Systems, Inc. | Photoresist and redeposition removal using carbon dioxide jet spray |
-
1999
- 1999-01-15 US US09/231,737 patent/US6313953B1/en not_active Expired - Lifetime
-
2000
- 2000-01-05 AT AT00902325T patent/ATE337573T1/de not_active IP Right Cessation
- 2000-01-05 AU AU24061/00A patent/AU2406100A/en not_active Abandoned
- 2000-01-05 EP EP00902325A patent/EP1153336B1/en not_active Expired - Lifetime
- 2000-01-05 KR KR1020017008836A patent/KR100649386B1/ko not_active Expired - Fee Related
- 2000-01-05 DE DE60030254T patent/DE60030254T2/de not_active Expired - Lifetime
- 2000-01-05 CN CN00802807A patent/CN1337014A/zh active Pending
- 2000-01-05 JP JP2000593991A patent/JP2002535703A/ja active Pending
- 2000-01-05 WO PCT/US2000/000214 patent/WO2000042475A1/en not_active Ceased
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0620906A (ja) * | 1992-03-25 | 1994-01-28 | Matsushita Electric Ind Co Ltd | 環境制御装置および環境制御方法 |
| JPH0677114A (ja) * | 1992-07-01 | 1994-03-18 | Nikon Corp | 露光装置 |
| JPH06208947A (ja) * | 1993-01-08 | 1994-07-26 | Toshiba Corp | レジスト処理方法及びレジスト処理装置 |
| JPH08306599A (ja) * | 1995-04-27 | 1996-11-22 | Nikon Corp | 空気浄化装置及び露光装置 |
| JPH09266147A (ja) * | 1996-03-28 | 1997-10-07 | Nikon Corp | 空調装置及びそれを備えた露光装置 |
| JPH09275054A (ja) * | 1996-04-03 | 1997-10-21 | Nikon Corp | 半導体製造装置 |
| JPH09275055A (ja) * | 1996-04-03 | 1997-10-21 | Nikon Corp | 露光装置 |
| JPH09283401A (ja) * | 1996-04-09 | 1997-10-31 | Nikon Corp | 露光装置 |
| JPH11111593A (ja) * | 1997-10-01 | 1999-04-23 | Canon Inc | 環境制御装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE60030254D1 (de) | 2006-10-05 |
| ATE337573T1 (de) | 2006-09-15 |
| US6313953B1 (en) | 2001-11-06 |
| DE60030254T2 (de) | 2007-08-30 |
| AU2406100A (en) | 2000-08-01 |
| KR20010089824A (ko) | 2001-10-08 |
| EP1153336A1 (en) | 2001-11-14 |
| KR100649386B1 (ko) | 2006-11-24 |
| CN1337014A (zh) | 2002-02-20 |
| EP1153336B1 (en) | 2006-08-23 |
| WO2000042475A1 (en) | 2000-07-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN114502251B (zh) | 可重复使用的复合过滤材料及制备和使用其去除和破坏水中分子污染物的方法 | |
| US10668447B2 (en) | High capacity regenerable graphene-based sorbent | |
| CA2367818A1 (en) | Method and apparatus for renewable mercury sorption | |
| JP2002516738A (ja) | スタックフィルタアッセンブリおよび方法 | |
| WO2011099616A1 (ja) | 酸性添着剤を用いたケミカルフィルタ | |
| US7922791B2 (en) | Filtering system for a semiconductor processing tool | |
| JP2002535703A (ja) | 気体の光透過率を最適化するための化学的フィルタリング | |
| WO2000025896A1 (en) | Gas chemical filter having compression mechanism; and methods | |
| KR20220042446A (ko) | 분자 오염물 및 입자의 경감을 위한 진공 액추에이터 봉쇄 | |
| JP2004148257A (ja) | 可搬式超高純度アセチレン供給装置 | |
| JP2010142728A (ja) | 排ガス処理システム | |
| KR102790092B1 (ko) | 리간드-개질된 필터 및 액체 조성물로부터 금속을 감소시키는 방법 | |
| US20240300831A1 (en) | Reusable Composite Filter Material and Methods for Making and Using the Same for Removing and Destroying Molecular Contaminants from Water | |
| JP2000157826A (ja) | ケミカルフィルタ及びその交換判定法、並びに気体浄化装置 | |
| JPH0859214A (ja) | オゾン発生装置 | |
| JP3711376B2 (ja) | 気体清浄化方法および気体清浄化装置 | |
| WO2025240732A1 (en) | Methods for making and using reusable composite filter for removing and destroying molecular contaminants from water | |
| JPH09220425A (ja) | ケミカルフィルタ | |
| JP2009208055A (ja) | 光触媒フィルタユニット | |
| AU663775B2 (en) | Method and apparatus for use in photochemically oxidizing gaseous halogenated organic compounds | |
| CN116407914A (zh) | 一种金属制造产生的废气净化装置 | |
| CN108392892A (zh) | 一种石英杂质过滤器 | |
| JPH0386217A (ja) | 浄水装置 | |
| JPH10216477A (ja) | 気体の清浄化方法及びその装置 | |
| JPH0817705A (ja) | 露光装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20061226 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20061226 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20091109 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20100409 |