JP2002501177A5 - - Google Patents

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Publication number
JP2002501177A5
JP2002501177A5 JP2000527836A JP2000527836A JP2002501177A5 JP 2002501177 A5 JP2002501177 A5 JP 2002501177A5 JP 2000527836 A JP2000527836 A JP 2000527836A JP 2000527836 A JP2000527836 A JP 2000527836A JP 2002501177 A5 JP2002501177 A5 JP 2002501177A5
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JP
Japan
Prior art keywords
probe mechanism
probe
mixture
lead
deposits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000527836A
Other languages
English (en)
Japanese (ja)
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JP2002501177A (ja
Filing date
Publication date
Priority claimed from US09/002,479 external-priority patent/US6121058A/en
Application filed filed Critical
Publication of JP2002501177A publication Critical patent/JP2002501177A/ja
Publication of JP2002501177A5 publication Critical patent/JP2002501177A5/ja
Pending legal-status Critical Current

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JP2000527836A 1998-01-02 1998-12-21 プローブカードのプローブ機構から堆積ハンダを取り除くための方法 Pending JP2002501177A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/002,479 1998-01-02
US09/002,479 US6121058A (en) 1998-01-02 1998-01-02 Method for removing accumulated solder from probe card probing features
PCT/US1998/027393 WO1999035505A2 (en) 1998-01-02 1998-12-21 Method for removing accumulated solder from probe card probing features

Publications (2)

Publication Number Publication Date
JP2002501177A JP2002501177A (ja) 2002-01-15
JP2002501177A5 true JP2002501177A5 (enExample) 2006-02-16

Family

ID=21700971

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000527836A Pending JP2002501177A (ja) 1998-01-02 1998-12-21 プローブカードのプローブ機構から堆積ハンダを取り除くための方法

Country Status (5)

Country Link
US (1) US6121058A (enExample)
JP (1) JP2002501177A (enExample)
KR (1) KR100367112B1 (enExample)
AU (1) AU2092099A (enExample)
WO (1) WO1999035505A2 (enExample)

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US8371316B2 (en) 2009-12-03 2013-02-12 International Test Solutions, Inc. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
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WO2012158238A2 (en) 2011-02-28 2012-11-22 University Of Iowa Research Foundation Anti-müllerian hormone changes in pregnancy and prediction ofadverse pregnancy outcomes and gender
WO2013040251A2 (en) 2011-09-13 2013-03-21 Asurgen, Inc. Methods and compositions involving mir-135b for distinguishing pancreatic cancer from benign pancreatic disease
US20130157884A1 (en) 2011-10-26 2013-06-20 Asuragen, Inc. Methods and compositions involving mirna expression levels for distinguishing pancreatic cysts
EP2771487A1 (en) 2011-10-27 2014-09-03 Asuragen, INC. Mirnas as diagnostic biomarkers to distinguish benign from malignant thyroid tumors
US9279830B2 (en) 2011-12-31 2016-03-08 Intel Corporation Test probe structures and methods including positioning test probe structures in a test head
US20150008950A1 (en) 2011-12-31 2015-01-08 Roy E. Swart Manufacturing advanced test probes
EP2870263A1 (en) 2012-07-03 2015-05-13 InteRNA Technologies B.V. Diagnostic portfolio and its uses
US20140100124A1 (en) 2012-10-04 2014-04-10 Asuragen, Inc. Diagnostic mirnas for differential diagnosis of incidental pancreatic cystic lesions
US9944992B2 (en) 2013-03-15 2018-04-17 The University Of Chicago Methods and compositions related to T-cell activity
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WO2014151551A1 (en) 2013-03-15 2014-09-25 Baylor Research Institute Ulcerative colitis (uc)-associated colorectal neoplasia markers
US9825000B1 (en) 2017-04-24 2017-11-21 International Test Solutions, Inc. Semiconductor wire bonding machine cleaning device and method
JP2021501594A (ja) 2017-11-03 2021-01-21 インテアールエヌエー テクノロジーズ ビー．ヴイ．ＩｎｔｅＲＮＡ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｂ．Ｖ． ニューロンの欠損に関連する状態及び／又は疾患を処置及び／又は診断するため、或いはニューロンの再生／発生のための、ｍｉＲＮＡ分子、等価物、アンタゴミル、又はそれらの供給源
WO2019104155A2 (en) 2017-11-22 2019-05-31 The University Of Chicago Chemical probe-dependent evaluation of protein activity and uses thereof
SG11202007923QA (en) 2018-02-23 2020-09-29 International Test Solutions Inc Novel material and hardware to automatically clean flexible electronic web rolls
JP7292921B2 (ja) * 2019-03-29 2023-06-19 株式会社日本マイクロニクス 多ピン構造プローブ体及びプローブカード
WO2020206285A1 (en) 2019-04-05 2020-10-08 Board Of Regents, The University Of Texas System Methods and applications for cell barcoding
KR20210151944A (ko) 2019-04-12 2021-12-14 더 리전트 오브 더 유니버시티 오브 캘리포니아 근육량 및 산화 대사를 증가시키기 위한 조성물 및 방법
US10792713B1 (en) 2019-07-02 2020-10-06 International Test Solutions, Inc. Pick and place machine cleaning system and method
US11756811B2 (en) 2019-07-02 2023-09-12 International Test Solutions, Llc Pick and place machine cleaning system and method
US11318550B2 (en) 2019-11-14 2022-05-03 International Test Solutions, Llc System and method for cleaning wire bonding machines using functionalized surface microfeatures
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WO2025248505A1 (en) 2024-05-31 2025-12-04 Wayne State University Methods for treating endometrial and ovarian hyperproliferative disorders

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JPH0827297B2 (ja) * 1993-10-29 1996-03-21 日本電子材料株式会社 プローブカード用プローブの洗浄液及びそれを用いた洗浄装置
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US5802714A (en) * 1994-07-19 1998-09-08 Hitachi, Ltd. Method of finishing a printed wiring board with a soft etching solution and a preserving treatment or a solder-leveling treatment
JP3188935B2 (ja) * 1995-01-19 2001-07-16 東京エレクトロン株式会社 検査装置
WO1996033419A2 (en) * 1995-04-19 1996-10-24 Philips Electronics N.V. Method of cleaning probe tips of probe cards and apparatus for implementing the method
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