AU2092099A - Method for removing accumulated solder from probe card probing features - Google Patents

Method for removing accumulated solder from probe card probing features

Info

Publication number
AU2092099A
AU2092099A AU20920/99A AU2092099A AU2092099A AU 2092099 A AU2092099 A AU 2092099A AU 20920/99 A AU20920/99 A AU 20920/99A AU 2092099 A AU2092099 A AU 2092099A AU 2092099 A AU2092099 A AU 2092099A
Authority
AU
Australia
Prior art keywords
probe card
removing accumulated
accumulated solder
probing features
card probing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU20920/99A
Other languages
English (en)
Inventor
Melissa K. Shell
Richard S. Yoshimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of AU2092099A publication Critical patent/AU2092099A/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/22—Secondary treatment of printed circuits
    • H05K3/26—Cleaning or polishing of the conductive pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
AU20920/99A 1998-01-02 1998-12-21 Method for removing accumulated solder from probe card probing features Abandoned AU2092099A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/002,479 US6121058A (en) 1998-01-02 1998-01-02 Method for removing accumulated solder from probe card probing features
US09002479 1998-01-02
PCT/US1998/027393 WO1999035505A2 (en) 1998-01-02 1998-12-21 Method for removing accumulated solder from probe card probing features

Publications (1)

Publication Number Publication Date
AU2092099A true AU2092099A (en) 1999-07-26

Family

ID=21700971

Family Applications (1)

Application Number Title Priority Date Filing Date
AU20920/99A Abandoned AU2092099A (en) 1998-01-02 1998-12-21 Method for removing accumulated solder from probe card probing features

Country Status (5)

Country Link
US (1) US6121058A (enExample)
JP (1) JP2002501177A (enExample)
KR (1) KR100367112B1 (enExample)
AU (1) AU2092099A (enExample)
WO (1) WO1999035505A2 (enExample)

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US7761966B2 (en) * 2007-07-16 2010-07-27 Touchdown Technologies, Inc. Method for repairing a microelectromechanical system
WO2009011696A1 (en) * 2007-07-16 2009-01-22 Touchdown Technologies, Inc A device and method for reparing a microelectromechanical system
EP2990487A1 (en) 2008-05-08 2016-03-02 Asuragen, INC. Compositions and methods related to mirna modulation of neovascularization or angiogenesis
US8371316B2 (en) 2009-12-03 2013-02-12 International Test Solutions, Inc. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
WO2011108930A1 (en) 2010-03-04 2011-09-09 Interna Technologies Bv A MiRNA MOLECULE DEFINED BY ITS SOURCE AND ITS DIAGNOSTIC AND THERAPEUTIC USES IN DISEASES OR CONDITIONS ASSOCIATED WITH EMT
EP2591106A1 (en) 2010-07-06 2013-05-15 InteRNA Technologies B.V. Mirna and its diagnostic and therapeutic uses in diseases or conditions associated with melanoma, or in diseases or conditions associated with activated braf pathway
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WO2012158238A2 (en) 2011-02-28 2012-11-22 University Of Iowa Research Foundation Anti-müllerian hormone changes in pregnancy and prediction ofadverse pregnancy outcomes and gender
US9644241B2 (en) 2011-09-13 2017-05-09 Interpace Diagnostics, Llc Methods and compositions involving miR-135B for distinguishing pancreatic cancer from benign pancreatic disease
US20130157884A1 (en) 2011-10-26 2013-06-20 Asuragen, Inc. Methods and compositions involving mirna expression levels for distinguishing pancreatic cysts
EP2771487A1 (en) 2011-10-27 2014-09-03 Asuragen, INC. Mirnas as diagnostic biomarkers to distinguish benign from malignant thyroid tumors
US20150008950A1 (en) 2011-12-31 2015-01-08 Roy E. Swart Manufacturing advanced test probes
WO2013101238A1 (en) 2011-12-31 2013-07-04 Intel Corporation Test probes
EP2870263A1 (en) 2012-07-03 2015-05-13 InteRNA Technologies B.V. Diagnostic portfolio and its uses
WO2014055117A1 (en) 2012-10-04 2014-04-10 Asuragen, Inc. Diagnostic mirnas for differential diagnosis of incidental pancreatic cystic lesions
WO2014145612A1 (en) 2013-03-15 2014-09-18 Ajay Goel Tissue and blood-based mirna biomarkers for the diagnosis, prognosis and metastasis-predictive potential in colorectal cancer
EP3366785A3 (en) 2013-03-15 2018-09-19 Baylor Research Institute Ulcerative colitis (uc)-associated colorectal neoplasia markers
EP3404116B1 (en) 2013-03-15 2022-10-19 The University of Chicago Methods and compositions related to t-cell activity
US9825000B1 (en) 2017-04-24 2017-11-21 International Test Solutions, Inc. Semiconductor wire bonding machine cleaning device and method
CN111566212A (zh) 2017-11-03 2020-08-21 因特尔纳技术有限公司 miRNA分子，等同物，安塔够妙或其来源用于治疗和/或诊断与神经元缺陷相关的病症和/或疾病或用于神经元生成和/或再生
WO2019104155A2 (en) 2017-11-22 2019-05-31 The University Of Chicago Chemical probe-dependent evaluation of protein activity and uses thereof
US11434095B2 (en) 2018-02-23 2022-09-06 International Test Solutions, Llc Material and hardware to automatically clean flexible electronic web rolls
JP7292921B2 (ja) * 2019-03-29 2023-06-19 株式会社日本マイクロニクス 多ピン構造プローブ体及びプローブカード
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JP7566775B2 (ja) 2019-04-12 2024-10-15 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア 筋肉量及び酸化的代謝を増加させるための組成物及び方法
US10792713B1 (en) 2019-07-02 2020-10-06 International Test Solutions, Inc. Pick and place machine cleaning system and method
US11756811B2 (en) 2019-07-02 2023-09-12 International Test Solutions, Llc Pick and place machine cleaning system and method
US11211242B2 (en) 2019-11-14 2021-12-28 International Test Solutions, Llc System and method for cleaning contact elements and support hardware using functionalized surface microfeatures
US11318550B2 (en) 2019-11-14 2022-05-03 International Test Solutions, Llc System and method for cleaning wire bonding machines using functionalized surface microfeatures
US11035898B1 (en) 2020-05-11 2021-06-15 International Test Solutions, Inc. Device and method for thermal stabilization of probe elements using a heat conducting wafer
WO2024028794A1 (en) 2022-08-02 2024-02-08 Temple Therapeutics BV Methods for treating endometrial and ovarian hyperproliferative disorders
WO2025248505A1 (en) 2024-05-31 2025-12-04 Wayne State University Methods for treating endometrial and ovarian hyperproliferative disorders

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US4314855A (en) * 1979-12-17 1982-02-09 Bell Telephone Laboratories, Incorporated Method of cleaning test probes
JPH0244746A (ja) * 1988-08-04 1990-02-14 Hitachi Ltd ウエハプローバ
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JP3188935B2 (ja) * 1995-01-19 2001-07-16 東京エレクトロン株式会社 検査装置
EP0766829B1 (en) * 1995-04-19 2002-11-27 Koninklijke Philips Electronics N.V. Method of cleaning probe tips of probe cards
JPH11230989A (ja) * 1997-12-10 1999-08-27 Mitsubishi Electric Corp プローブカード用プローブ針のクリーニング方法およびクリーニング装置とそれに用いる洗浄液

Also Published As

Publication number Publication date
WO1999035505A3 (en) 2000-04-06
KR20010033836A (ko) 2001-04-25
JP2002501177A (ja) 2002-01-15
US6121058A (en) 2000-09-19
KR100367112B1 (ko) 2003-01-09
WO1999035505A2 (en) 1999-07-15

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase