GB9727281D0 - Method apparatus for testing optical/electronic integrated circuits - Google Patents
Method apparatus for testing optical/electronic integrated circuitsInfo
- Publication number
- GB9727281D0 GB9727281D0 GBGB9727281.9A GB9727281A GB9727281D0 GB 9727281 D0 GB9727281 D0 GB 9727281D0 GB 9727281 A GB9727281 A GB 9727281A GB 9727281 D0 GB9727281 D0 GB 9727281D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- integrated circuits
- electronic integrated
- method apparatus
- testing optical
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9727281A GB2332775A (en) | 1997-12-23 | 1997-12-23 | Testing optical/electronic integrated circuits |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9727281A GB2332775A (en) | 1997-12-23 | 1997-12-23 | Testing optical/electronic integrated circuits |
Publications (2)
Publication Number | Publication Date |
---|---|
GB9727281D0 true GB9727281D0 (en) | 1998-02-25 |
GB2332775A GB2332775A (en) | 1999-06-30 |
Family
ID=10824192
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9727281A Withdrawn GB2332775A (en) | 1997-12-23 | 1997-12-23 | Testing optical/electronic integrated circuits |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2332775A (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6756244B2 (en) * | 2002-01-29 | 2004-06-29 | Hewlett-Packard Development Company, L.P. | Interconnect structure |
US7391005B2 (en) | 2002-10-25 | 2008-06-24 | Gennum Corporation | Direct attach optical receiver module and method of testing |
US7224910B2 (en) * | 2002-10-25 | 2007-05-29 | Gennum Corporation | Direct attach optical receiver module and method of testing |
JP4847440B2 (en) * | 2004-03-08 | 2011-12-28 | シオプティカル インコーポレーテッド | Opto-electronic test apparatus and method at wafer level |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06232234A (en) * | 1993-01-29 | 1994-08-19 | Mitsubishi Electric Corp | Optical detection element |
US5631571A (en) * | 1996-04-03 | 1997-05-20 | The United States Of America As Represented By The Secretary Of The Air Force | Infrared receiver wafer level probe testing |
-
1997
- 1997-12-23 GB GB9727281A patent/GB2332775A/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
GB2332775A (en) | 1999-06-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |